Patents for H01L 29 - Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having at least one potential-jump barrier or surface barrier; Capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. pn-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof (218,143) |
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12/02/1998 | EP0881689A1 PNP lateral bipolar electronic device and corresponding manufacturing process |
12/02/1998 | EP0881688A1 PNP lateral bipolar electronic device |
12/02/1998 | EP0881687A1 Contact on P-type region |
12/02/1998 | EP0881682A1 Overvoltage protection for an integrated MOS power transmission |
12/02/1998 | EP0881681A1 Device protecting an integrated MOS device against voltage gradients |
12/02/1998 | EP0881672A1 Isolation wall between power device |
12/02/1998 | EP0881670A2 Sacrificial spacer for integrated circuit transistors |
12/02/1998 | EP0881669A1 Manufacturing process of a germanium implanted HBT bipolar transistor |
12/02/1998 | EP0881666A2 P-type nitrogen compound semiconductor and method of manufacturing same |
12/02/1998 | EP0846337A4 Self-aligned isolation and planarization process for memory array |
12/02/1998 | EP0818046A4 Capacitive absolute pressure sensor and method |
12/02/1998 | CN1200577A Semiconductor device and method of mfg. same |
12/02/1998 | CN1200576A Bilaterally controllable thyristor |
12/02/1998 | CN1200574A Nonvolatile semiconductor memory and method of fabrication |
12/02/1998 | CN1200573A Semiconductor memory device |
12/02/1998 | CN1200566A Method of mfg. semiconductor device |
12/01/1998 | US5844910 Flash-erase-type nonvolatile semiconductor storage device |
12/01/1998 | US5844832 Cell array structure for a ferroelectric semiconductor memory and a method for sensing data from the same |
12/01/1998 | US5844822 Simulation method for semiconductor device |
12/01/1998 | US5844820 Method for simulating properties of material having periodically repeated structure and systems utilizing the same |
12/01/1998 | US5844767 Level converting circuit for converting level of an input signal, internal potential generating circuit for generating internal potential, internal potential generating unit generating internal potential highly reliable semiconductor device and method of |
12/01/1998 | US5844647 Liquid crystal display device |
12/01/1998 | US5844641 Liquid crystal display device having storage capacitors and additional opaque electrodes |
12/01/1998 | US5844321 Semiconductor device comprising a chip which is provided with a via opening and is soldered on a support, and method of realizing this device |
12/01/1998 | US5844296 Space saving laser programmable fuse layout |
12/01/1998 | US5844293 Semiconductor device with improved dielectric breakdown strength |
12/01/1998 | US5844287 Monolithic sensor of fingerprints |
12/01/1998 | US5844286 Semiconductor acceleration sensor |
12/01/1998 | US5844285 Body contact structure for semiconductor device |
12/01/1998 | US5844279 Single-electron semiconductor device |
12/01/1998 | US5844278 Semiconductor device having a projecting element region |
12/01/1998 | US5844277 Power MOSFETs and cell topology |
12/01/1998 | US5844275 High withstand-voltage lateral MOSFET with a trench and method of producing the same |
12/01/1998 | US5844274 Semiconductor device including an element isolating film having a flat upper surface |
12/01/1998 | US5844273 Vertical semiconductor device and method of manufacturing the same |
12/01/1998 | US5844272 Semiconductor component for high voltage |
12/01/1998 | US5844271 Single layer polycrystalline silicon split-gate EEPROM cell having a buried control gate |
12/01/1998 | US5844269 EEPROM cell having reduced capacitance across the layer of tunnel oxide |
12/01/1998 | US5844268 Nonvolatile semiconductor memory device |
12/01/1998 | US5844261 InAlGaP devices |
12/01/1998 | US5844260 Compound semiconductor device constructed on a heteroepitaxial substrate |
12/01/1998 | US5844259 Vertical conduction MOS controlled thyristor with increased IGBT area and current limiting |
12/01/1998 | US5844258 Emitter switched thyristor |
12/01/1998 | US5844256 Semiconductor device comprising polysilicon interconnection layers separated by insulation films |
12/01/1998 | US5844253 High speed semiconductor phototransistor |
12/01/1998 | US5844251 High aspect ratio probes with self-aligned control electrodes |
12/01/1998 | US5844248 Circuit arrangement including photoelectric transducers for supplying a high voltage driving signal to an insulated gate bipolar transistor |
12/01/1998 | US5843849 Semiconductor wafer etching process and semiconductor device |
12/01/1998 | US5843828 Method for fabricating a semiconductor device with bipolar transistor |
12/01/1998 | US5843827 Method of reducing dielectric damage from plasma etch charging |
12/01/1998 | US5843826 Deep submicron MOSFET device |
12/01/1998 | US5843825 Fabrication method for semiconductor device having non-uniformly doped channel (NUDC) construction |
12/01/1998 | US5843812 Method of making a PMOSFET in a semiconductor device |
12/01/1998 | US5843796 Method of making an insulated gate bipolar transistor with high-energy P+ im |
12/01/1998 | US5843225 Process for fabricating semiconductor and process for fabricating semiconductor device |
11/28/1998 | CA2215448A1 Amplifier, signal source circuit and power supply |
11/26/1998 | WO1998053506A1 Ferroelectric memory element and method of producing the same |
11/26/1998 | WO1998053505A2 Lateral mos semiconductor device |
11/26/1998 | WO1998053504A1 Single-electron memory component |
11/26/1998 | WO1998053503A1 Self-protect thyristor |
11/26/1998 | WO1998053502A1 Semiconductor device and method for manufacturing the same |
11/26/1998 | WO1998053497A1 Method for mos transistor isolation |
11/26/1998 | WO1998053492A1 Mofset in a trench and method of manufacture thereof |
11/26/1998 | WO1998053491A2 Manufacture of a semiconductor device with a mos transistor having an ldd structure |
11/26/1998 | WO1998053490A1 A one mask, power semiconductor device fabrication process |
11/26/1998 | WO1998053489A2 Integrated circuit, components thereof and manufacturing method |
11/26/1998 | WO1998028320A3 Affinity based self-assembly systems and devices for photonic and electronic applications |
11/26/1998 | DE19744228C1 Mass flow sensor with membrane and attached resistance element |
11/26/1998 | DE19734837A1 Self-aligning silicide manufacturing method |
11/26/1998 | CA2291114A1 Integrated circuit, components thereof and manufacturing method |
11/25/1998 | EP0880183A2 LDMOS power device |
11/25/1998 | EP0880182A2 Bidirectional controllable thyristor |
11/25/1998 | EP0880181A2 Low voltage-drop electrical contact for gallium (aluminium, indium) nitride |
11/25/1998 | EP0880169A1 Method of fabricating a field-effect transistor utilizing an SOI substrate |
11/25/1998 | EP0880165A1 A method of manufacturing an integrated circuit with MOS transistors having high breakdown voltages, and with precision resistors |
11/25/1998 | EP0879482A1 Short channel fermi-threshold field effect transistors including drain field termination region and methods of fabricating same |
11/25/1998 | EP0879481A1 Field effect controlled semiconductor component |
11/25/1998 | EP0879478A1 Electrically erasable and programmable read only memory (eeprom) having multiple overlapping metallization layers |
11/25/1998 | EP0879477A1 Electronic device manufacture by energy beam crystallisation |
11/25/1998 | EP0683930B1 Buried-ridge ii-vi laser diode and method of fabrication |
11/25/1998 | EP0659282B1 Color filter system for display panels |
11/25/1998 | EP0548351B1 Method for producing integrated circuits having adjacent electrodes |
11/25/1998 | CN1200197A Off-state gate-oxide field reduction in CMOS |
11/25/1998 | CN1199930A Semiconductor device and its producing method |
11/25/1998 | CN1199929A Semiconductor device having contact hole and method of manufacturing the same |
11/25/1998 | CN1199923A Semiconductor substrate with semi-insulating polysilicon gettering site layer and process of fabrication thereof |
11/24/1998 | US5841700 Source-coupling, split gate, virtual ground flash EEPROM array |
11/24/1998 | US5841693 Non-volatile memory using field effect transistors having dual floating gates for storing two bits per cell |
11/24/1998 | US5841197 Inverted dielectric isolation process |
11/24/1998 | US5841181 Semiconductor apparatus having field limiting rings |
11/24/1998 | US5841174 Semiconductor apparatus including semiconductor devices operated by plural power supplies |
11/24/1998 | US5841173 MOS semiconductor device with excellent drain current |
11/24/1998 | US5841172 SOI input protection circuit |
11/24/1998 | US5841171 SOI Semiconductor devices |
11/24/1998 | US5841170 Field effect transistor and CMOS element having dopant exponentially graded in channel |
11/24/1998 | US5841168 High performance asymmetrical MOSFET structure and method of making the same |
11/24/1998 | US5841167 MOS-technology power device integrated structure |
11/24/1998 | US5841166 Lateral DMOS transistor for RF/microwave applications |
11/24/1998 | US5841165 PMOS flash EEPROM cell with single poly |
11/24/1998 | US5841163 Integrated circuit memory devices having wide and narrow channel stop layers |