Patents
Patents for H01L 29 - Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having at least one potential-jump barrier or surface barrier; Capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. pn-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof (218,143)
07/1999
07/22/1999WO1999036964A1 Source-down fet
07/22/1999WO1999036963A1 Vertical igbt with an soi structure
07/22/1999WO1999036961A1 Power mosfet
07/22/1999WO1999036941A2 Trench isolation for micromechanical devices
07/22/1999WO1998057378A9 Latch-up free power mos-bipolar transistor
07/22/1999DE19840402A1 DMOS power element structure production
07/22/1999DE19818300C1 Lateral high voltage sidewall transistor
07/22/1999DE19801313A1 Source-down FET with buried gate
07/22/1999DE19801093A1 SOI insulated-gate bipolar transistor for integration in CMOS circuit
07/21/1999EP0930711A1 Bidirectional thyristor
07/21/1999EP0930656A2 Flash memory region and method of fabrication thereof
07/21/1999EP0930623A1 Polymer composite materials for electrostatic discharge protection
07/21/1999EP0929910A1 Vertical power mosfet
07/21/1999EP0497980B1 Optical valve device
07/21/1999CN1223475A Giant magnetic resistance P-N junction structure
07/21/1999CN1223472A High yield semiconductor device and method of fabricating the same
07/21/1999CN1223465A Semiconductor device and method for manufacturing the same
07/21/1999CN1223460A Semiconductor material
07/21/1999CN1223459A 半导体器件 Semiconductor devices
07/20/1999US5926741 Reoxidation after oxynitridation, reduces scattering of film thickness and prevents any lowering of the dielectric breakdown withstand voltage
07/20/1999US5926740 Graded anti-reflective coating for IC lithography
07/20/1999US5926730 Conductor layer nitridation
07/20/1999US5926725 Method of manufacturing semiconductor devices with a reverse tapered sectional configuration
07/20/1999US5926714 Method for fabricating a transistor
07/20/1999US5926712 Process for fabricating MOS device having short channel
07/20/1999US5926711 Method of forming an electrode of a semiconductor device
07/20/1999US5926705 Method for manufacturing a semiconductor device with stabilization of a bipolar transistor and a schottky barrier diode
07/20/1999US5926703 LDD device having a high concentration region under the channel
07/20/1999US5926702 Method of fabricating TFT array substrate
07/20/1999US5926699 Method of fabricating semiconductor device having stacked layer substrate
07/20/1999US5926698 Semiconductor memory device and method of fabricating the same
07/20/1999US5926418 Method for programming a memory cell
07/20/1999US5926402 Simulation method with respect to trace object that event occurs in proportion to probability and computer program product for causing computer system to perform the simulation
07/20/1999US5926372 For use with a high power switching module
07/20/1999US5926234 Liquid crystal display device
07/20/1999US5925923 Merged single polysilicon bipolar NPN transistor
07/20/1999US5925918 Gate stack with improved sidewall integrity
07/20/1999US5925914 Asymmetric S/D structure to improve transistor performance by reducing Miller capacitance
07/20/1999US5925912 Semiconductor apparatus having a conductive sidewall structure
07/20/1999US5925911 Semiconductor device in which defects due to LOCOS or heat treatment are suppressed
07/20/1999US5925910 DMOS transistors with schottky diode body structure
07/20/1999US5925909 Three-dimensional complementary field effect transistor process and structures
07/20/1999US5925908 Integrated circuit including a non-volatile memory device and a semiconductor device
07/20/1999US5925907 Semiconductor device including transistor with composite gate structure and transistor with single gate structure
07/20/1999US5925906 Floating gate type non-volatile semiconductor memory device having separate tunnel and channel regions controlled by a single gate structure
07/20/1999US5925904 Two-terminal electrically-reprogrammable programmable logic element
07/20/1999US5925903 Field-effect transistors and method of manufacturing the same
07/20/1999US5925902 Semiconductor device having a schottky film with a vertical gap formed therein
07/20/1999US5925900 Emitter-switched thyristor having a floating ohmic contact
07/20/1999US5925899 Vertical type insulated gate bipolar transistor having a planar gate structure
07/20/1999US5925895 Silica
07/20/1999US5925894 Thin film transistor with asymmetrically arranged gate electrode and offset region
07/20/1999US5925465 Graphite-based carbon material obtained by bending at least one carbon atom layer of graphite in a selected region along lines; the bending can be accomplished with a probes of an atomic force microscope; nanostructure for microelectronics
07/15/1999WO1999035695A1 Silicon on insulator high-voltage switch
07/15/1999WO1999035692A1 Subscriber interface protection circuit
07/15/1999WO1999035687A1 Low-inductance, gate-controlled thyristor
07/15/1999WO1999035685A1 Integrated cmos transistor formation
07/15/1999WO1999035680A1 Low energy boron implantation for p+ poly gate
07/15/1999WO1999035679A1 Method for making asymmetrical gate oxide thicknesses
07/15/1999WO1999035477A1 Micromechanical component
07/15/1999WO1999027582A3 Optimized border of semiconductor components
07/15/1999WO1999026293A3 Semiconductor component and manufacturing method for semiconductor component
07/15/1999DE19900313A1 Semiconductor device, e.g. insulated gate bipolar transistor device
07/15/1999DE19860505A1 Electrostatic discharge protection circuit
07/15/1999DE19832271A1 Semiconductor device, especially MOS transistor for DRAM
07/15/1999DE19821191A1 Semiconductor device plug, especially polysilicon via plug e.g. of bit line via or node via for capacitor
07/15/1999DE19801095A1 Power MOSFET, especially source-down power MOSFET used in automobile
07/15/1999DE19800574A1 Mikromechanisches Bauelement Micromechanical component
07/15/1999DE19800469A1 Niederinduktiv angesteuerter, gategesteuerter Thyristor Low inductance is overdriven, gate-controlled thyristor
07/14/1999EP0929105A2 Metal gate sub-micron mos transistor and method of making same
07/14/1999EP0929096A2 Metal patterning by formation of etchable plural metal compositions
07/14/1999EP0928497A1 A novel process for reliable ultra-thin oxynitride formation
07/14/1999EP0928485A1 Two-transistor flash eprom cell
07/14/1999EP0928456A1 System and method for predicting the behavior of a component
07/14/1999EP0838084A4 Multilayer high vertical aspect ratio thin film structures
07/14/1999EP0804807B1 Flat panel imaging device
07/14/1999EP0760966B1 Large aperture ratio array architecture for active matrix liquid crystal displays
07/14/1999EP0728359A4 Flash eprom integrated circuit architecture
07/14/1999EP0647971B1 Thin film transistor and display using the transistor
07/14/1999CN1223015A Display
07/14/1999CN1223014A Substrate with conductor formed of low-resistance aluminum alloy
07/14/1999CN1222789A Solid-state relay
07/14/1999CN1222768A 半导体器件 Semiconductor devices
07/14/1999CN1222766A Semiconductor device and method of manufacturing the same
07/14/1999CN1222763A Semiconductor device equipped with antifuse elements and method for manufacturing FPGA
07/14/1999CN1222761A Moldless semiconductor device and photovoltaic device module making use of same
07/14/1999CN1222759A Method of manufacturing semiconductor device
07/14/1999CN1222752A Semiconductor device and method for its preparation
07/14/1999CN1044172C Mos composite static induction thyristor
07/13/1999US5924009 Using titanium tetrachloride
07/13/1999US5924002 Method of manufacturing a semiconductor device having ohmic electrode
07/13/1999US5923999 Method of controlling dopant diffusion and metal contamination in thin polycide gate conductor of mosfet device
07/13/1999US5923997 Doping an amorphous silicon film; crystallizing by heating
07/13/1999US5923987 Method for forming MOS devices with retrograde pocket regions and counter dopant regions at the substrate surface
07/13/1999US5923985 MOS field effect transistor and its manufacturing method
07/13/1999US5923983 Integrated circuit gate conductor having a gate dielectric which is substantially resistant to hot carrier effects
07/13/1999US5923982 Method of making asymmetrical transistor with lightly and heavily doped drain regions and ultra-heavily doped source region using two source/drain implant steps
07/13/1999US5923981 Cascading transistor gate and method for fabricating the same
07/13/1999US5923980 Trench transistor with localized source/drain regions implanted through voids in trench
07/13/1999US5923979 Planar DMOS transistor fabricated by a three mask process