Patents
Patents for H01L 29 - Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having at least one potential-jump barrier or surface barrier; Capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. pn-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof (218,143)
01/2000
01/12/2000EP0970355A1 Batch fabricated semiconductor thin-film pressure sensor and method of making same
01/12/2000EP0875074A4 Semiconductor devices, and methods for same
01/12/2000CN1241297A High density electrical connectors
01/12/2000CN1241257A Pressure sensor component with tubing connection
01/12/2000CN1241034A Semiconductor device and method of manufacturing the same
01/12/2000CN1241031A Method for fabricating semiconductor memory device and structure thereof
01/12/2000CN1241028A Method for manufacturing semiconductor device capable of effectively carrying out hydrogen passivation
01/12/2000CN1241026A Improved SAC process flow method using isolating spacer
01/12/2000CN1241025A Manufacturing method of thin film transistor liquid crystal display
01/12/2000CN1241020A Method for fabricating MOS transistor
01/11/2000US6014328 Memory cell allowing write and erase with low voltage power supply and nonvolatile semiconductor memory device provided with the same
01/11/2000US6013950 Semiconductor diode with external field modulation
01/11/2000US6013942 Bipolar transistor structure
01/11/2000US6013941 Bipolar transistor with collector surge voltage protection
01/11/2000US6013938 Power control device
01/11/2000US6013936 Double silicon-on-insulator device and method therefor
01/11/2000US6013934 Semiconductor structure for thermal shutdown protection
01/11/2000US6013933 Semiconductor structure having a monocrystalline member overlying a cavity in a semiconductor substrate and process therefor
01/11/2000US6013930 Semiconductor device having laminated source and drain regions and method for producing the same
01/11/2000US6013929 Thin film transistor, having a nitride film on the gate insulation layer and an organic resin interlayer film on the transistor
01/11/2000US6013928 Semiconductor device having interlayer insulating film and method for forming the same
01/11/2000US6013927 Semiconductor structures for suppressing gate oxide plasma charging damage and methods for making the same
01/11/2000US6013926 Semiconductor device with refractory metal element
01/11/2000US6013923 Semiconductor switch array with electrostatic discharge protection and method of fabricating
01/11/2000US6013922 Semiconductor storage element having a channel region formed of an aggregate of spherical grains and a method of manufacturing the same
01/11/2000US6013577 Method of making an amorphous surface for a gate electrode during the fabrication of a semiconductor device
01/11/2000US6013573 Method of manufacturing an air bridge type structure for supporting a micro-structure
01/11/2000US6013554 Method for fabricating an LDD MOS transistor
01/11/2000US6013553 Zirconium and/or hafnium oxynitride gate dielectric
01/11/2000US6013552 Method of manufacturing a split-gate flash memory cell
01/11/2000US6013548 Self-aligned diffused source vertical transistors with deep trench capacitors in a 4F-square memory cell array
01/11/2000US6013544 Method for fabricating a semiconductor device
01/11/2000US6013543 Methods of forming thin film transistors
01/11/2000US6013310 Method for producing a thin film semiconductor device
01/11/2000US6013129 Production of heavily-doped silicon
01/11/2000CA2150679C Improved structure for cdse tft
01/06/2000WO2000001016A1 Thin-film transistor and method of manufacture thereof
01/06/2000WO2000001015A1 Semiconductor device and method of manufacture thereof
01/06/2000WO2000001008A1 Ulsi mos with high dielectric constant gate insulator
01/06/2000WO2000001005A1 Method for forming monocrystalline silicon layer, method for manufacturing semiconductor device, and semiconductor device
01/06/2000WO1999054936A8 Polymer devices
01/05/2000EP0969694A2 Pressure transducer and manufacturing method thereof
01/05/2000EP0969516A2 MOSFET with structured source/drain region and method for producing the same
01/05/2000EP0969515A2 Resonance phase transistor with transit time delay
01/05/2000EP0969504A1 Semiconductor device
01/05/2000EP0969126A2 Method of fabrication of Si nanostructures
01/05/2000EP0968537A2 A method of manufacturing a field-effect transistor substantially consisting of organic materials
01/05/2000EP0968534A1 High-threshold soi thin film transistor
01/05/2000EP0968533A1 High performance display pixel for electronic displays
01/05/2000EP0968532A1 Lateral silicon carbide semiconductor device having a drift region with a varying doping level
01/05/2000EP0968529A2 Semiconductor device and method of manufacturing such a device
01/05/2000EP0968528A2 Method of manufacturing a semiconductor device comprising a field effect transistor
01/05/2000EP0968527A1 Method for producing a vertical mos-transistor
01/05/2000EP0968526A2 Method of forming etched structures comprising implantation steps
01/05/2000EP0761015B1 Semiconductor device of the type sealed in glass comprising a semiconductor body connected to slugs by means of a silver-aluminium bonding layer
01/05/2000EP0752159B1 Semiconductor device provided with a microcomponent having a fixed and a movable electrode
01/05/2000DE19929656A1 Non-volatile ferromagnetic memory achieves high access speed without danger of damaging a reference cell
01/05/2000DE19923259A1 Semiconductor memory in substrate of first conductivity
01/05/2000DE19828669A1 Lateral IGBT with SOI construction
01/05/2000CN1240537A Patterns of electrically conducting polymers and their application as electrodes or electrical contacts
01/05/2000CN1240536A Memory cell arrangement and process for manufacturing the same
01/04/2000US6011725 Two bit non-volatile electrically erasable and programmable semiconductor memory cell utilizing asymmetrical charge trapping
01/04/2000US6011723 Nonvolatile semiconductor memory device including a circuit for providing a boosted potential
01/04/2000US6011714 Semiconductor circuit capable of storing a plurality of analog or multi-valued data
01/04/2000US6011600 Transistor matrix device wherein light is shielded by gaps between n-th and n+1-th picture element electrodes by n+1-th capacitance bus line
01/04/2000US6011301 Stress reduction for flip chip package
01/04/2000US6011298 High voltage termination with buried field-shaping region
01/04/2000US6011297 Use of multiple slots surrounding base region of a bipolar junction transistor to increase cumulative breakdown voltage
01/04/2000US6011293 Semiconductor device having a structure for detecting a boosted potential
01/04/2000US6011290 Short channel length MOSFET transistor
01/04/2000US6011289 Metal oxide stack for flash memory application
01/04/2000US6011288 Flash memory cell with vertical channels, and source/drain bus lines
01/04/2000US6011285 C-axis oriented thin film ferroelectric transistor memory cell and method of making the same
01/04/2000US6011283 Pillar emitter for BiCMOS devices
01/04/2000US6011282 Charge coupled device with a buried channel two-phase driven two-layer electrode structure
01/04/2000US6011281 Semiconductor device having an ohmic contact and a Schottky contact, with a barrier layer interposed between the ohmic contact and the Schottky contact
01/04/2000US6011280 IGBT power device with improved resistance to reverse power pulses
01/04/2000US6011279 Silicon carbide field controlled bipolar switch
01/04/2000US6011278 Lateral silicon carbide semiconductor device having a drift region with a varying doping level
01/04/2000US6011277 Gate insulated field effect transistors and method of manufacturing the same
01/04/2000US6011276 Thin film transistor and fabrication method thereof
01/04/2000US6011273 Thin-film semiconductor device having pressure sensitive and non-sensitive regions
01/04/2000US6011272 Silicided shallow junction formation and structure with high and low breakdown voltages
01/04/2000US6011271 Semiconductor device and method of fabricating the same
01/04/2000US6010954 Cmos gate architecture for integration of salicide process in sub 0.1 . .muM devices
01/04/2000US6010952 Process for forming metal silicide contacts using amorphization of exposed silicon while minimizing device degradation
01/04/2000US6010946 Semiconductor device with isolation insulating film tapered and method of manufacturing the same
01/04/2000US6010940 Methods for fabricating CVD TiN barrier layers for capacitor structures
01/04/2000US6010936 Semiconductor device fabrication method
01/04/2000US6010931 Planarization technique for DRAM cell capacitor electrode
01/04/2000US6010928 High density transistor component and its manufacturing method
01/04/2000US6010924 Process for fabricating a thin film transistor
01/04/2000US6010922 Semiconductor device with increased distance between channel edges and a gate electrode
01/04/2000US6010921 Method of fabricating a field-effect transistor utilizing an SOI substrate
12/1999
12/30/1999DE19929926A1 Memory of multilevel quantum dot structure with conductive layers removed to form mask for source/drain
12/30/1999DE19928547A1 Pressure sensor especially of semiconductor type
12/30/1999DE19907719A1 Semiconductor device with DPSA structure
12/30/1999DE19820758C1 Herstellverfahren für mikromechanische Bauelemente Production process for micromechanical devices
12/29/1999WO1999067827A2 Semiconductor structure and procedure for minimising non-idealities
12/29/1999WO1999067826A1 Lateral high-voltage transistor