Patents
Patents for H01L 29 - Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having at least one potential-jump barrier or surface barrier; Capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. pn-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof (218,143)
09/2000
09/26/2000US6124158 Method of reducing carbon contamination of a thin dielectric film by using gaseous organic precursors, inert gas, and ozone to react with carbon contaminants
09/26/2000US6124156 Process for manufacturing a CMOS circuit with all-around dielectrically insulated source-drain regions
09/26/2000US6124155 Electro-optical device and thin film transistor and method for forming the same
09/26/2000US6124154 Fabrication process for thin film transistors in a display or electronic device
09/26/2000US6124153 Method for manufacturing a polysilicon TFT with a variable thickness gate oxide
09/26/2000US6124148 Method of manufacturing semiconductor acceleration sensor
09/26/2000CA2097668C Movement actuator/sensor systems
09/25/2000CA2300592A1 Ohmic electrode, method of manufacturing the same and semiconductor device
09/21/2000WO2000056132A1 Low stress die attachment
09/21/2000WO2000055971A1 Methods and apparatus for bipolar elimination in silicon-on-insulator (soi) domino circuits
09/21/2000WO2000055921A1 A high power impatt diode
09/21/2000WO2000055920A1 Semiconductor element and semiconductor device
09/21/2000WO2000055918A1 Flash memory cell having a flexible element
09/21/2000WO2000055916A1 Methods and apparatus for fabricating a multiple modular assembly
09/21/2000WO2000055915A1 Web process interconnect in electronic assemblies
09/21/2000WO2000055897A1 Method of manufacturing a mis field-effect transistor
09/21/2000WO2000055896A1 Method of manufacturing a floating gate field-effect transistor
09/21/2000WO2000055683A1 Method for manufacturing liquid crystal display
09/21/2000WO2000055652A1 Calibration of sensors
09/21/2000WO2000055648A1 Hydrophone assembly
09/21/2000WO2000055646A1 Accelerometer transducer used for seismic recording
09/21/2000WO2000055638A1 Sensor design and process
09/21/2000WO2000055593A2 Sensor
09/21/2000WO2000055577A1 Integrated and multi-axis sensor assembly and packaging
09/21/2000WO2000055387A1 Method and apparatus for formation of thin film
09/21/2000WO2000055105A2 Explosive shear wave energy source
09/21/2000WO2000030185A8 Quantum well thermoelectric material on very thin substrate
09/21/2000DE10013327A1 Process for growing semiconductor crystals uses an organometallic compound, a molecular compound and diiodomethane to grow a p-doped compound semiconductor crystal
09/21/2000DE10011054A1 Layer structure arrangement used in the production of p-channel field effect transistors has silicon and germanium layers on a single crystalline substrate
09/21/2000CA2365886A1 Calibration of sensors
09/21/2000CA2365868A1 Hydrophone assembly
09/20/2000EP1037286A1 Symmetrical thyristor with reduced thickness and manufacturing method
09/20/2000EP1037285A1 Semiconductor device having a trench gate structure
09/20/2000EP1037284A2 Heterojunction bipolar transistor and method for fabricating the same
09/20/2000EP1037273A2 Sense amplifier comprising field effect transistor with short channel length and adjustable threshold voltage
09/20/2000EP1037270A1 Wiring structure of semiconductor device, electrode, and method for forming them
09/20/2000EP1037095A2 Active matrix substrate, method of manufacturing the same, and image sensor incorporating the same
09/20/2000EP1036418A2 Optimized border of semiconductor components
09/20/2000EP1036416A1 Electronic hybrid component and method for the production thereof
09/20/2000EP1036412A1 CO-PLANAR Si AND Ge COMPOSITE SUBSTRATE AND METHOD OF PRODUCING SAME
09/20/2000EP1036411A1 Semiconductor power device manufacture
09/20/2000EP1036409A2 Method of manufacturing a semiconductor device comprising a mos transistor
09/20/2000EP1036408A1 RELAXED In x?GA (1-x)?As GRADED BUFFERS
09/20/2000EP1036085A1 Self-addressable self-assembling microelectronic integrated systems, component devices, mechanisms, methods, and procedures for molecular biological analysis and diagnostics
09/20/2000EP1012971A4 Forward body bias transistor circuits
09/20/2000EP0979529A4 DESIGN AND FABRICATION OF ELECTRONIC DEVICES WITH InA1AsSb/A1Sb BARRIER
09/20/2000CN1267406A Forward body bias transistor circuit
09/20/2000CN1267397A Semiconductor structure comprising alpha silicon carbide zone, and use of said semiconductor structure
09/20/2000CN1267393A Method for thermal self-healing of SiC semiconductor area doped by means of implantation and SiC based semiconductor component
09/20/2000CN1267091A Semiconductor IC device
09/20/2000CN1266996A Active array display device and electro-optic element
09/19/2000US6122196 Semiconductor non-volatile storage device capable of a high speed reading operation
09/19/2000US6122192 Non-volatile semiconductor memory device and fabrication method thereof
09/19/2000US6121950 Control system for display panels
09/19/2000US6121683 Electronic device and integrated circuit
09/19/2000US6121670 Single-chip contact-less read-only memory (ROM) device and the method for fabricating the device
09/19/2000US6121669 Integrated RC filters
09/19/2000US6121666 Split gate oxide asymmetric MOS devices
09/19/2000US6121659 Buried patterned conductor planes for semiconductor-on-insulator integrated circuit
09/19/2000US6121657 Semiconductor integrated circuit device having gates arranged in a lattice
09/19/2000US6121656 Semiconductor memory device mounted with a light emitting device
09/19/2000US6121655 Nonvolatile semiconductor memory device and method for fabricating the same and semiconductor integrated circuit
09/19/2000US6121654 Memory device having a crested tunnel barrier
09/19/2000US6121652 Semiconductor device including active matrix circuit
09/19/2000US6121649 Semiconductor device with ferroelectric capacitors
09/19/2000US6121648 Ferroelectric based memory devices utilizing hydrogen getters and recovery annealing
09/19/2000US6121647 A perovskite crystalline lead, titanium and a rare earth oxide used in a semiconductor device, e.g., nonvolatile memories; infrared sensors; optical modulators, switches, integrated circuits; reduced leakage; reverse polarity
09/19/2000US6121641 Compound semiconductor field-effect transistor with improved current flow characteristic
09/19/2000US6121633 Latch-up free power MOS-bipolar transistor
09/19/2000US6121632 Thin-film transistor array and method for manufacturing same
09/19/2000US6121631 Test structure to determine the effect of LDD length upon transistor performance
09/19/2000US6121157 Semiconductor device and its manufacture
09/19/2000US6121153 Semiconductors with crystallization and dopes of mixtures of gallium arsenide with aluminum or indium
09/19/2000US6121137 Forming a titanium film over silicon substrate, annealing to form silicide and single crystal silicon film, then diffusion
09/19/2000US6121127 Methods and devices related to electrodes for p-type group III nitride compound semiconductors
09/19/2000US6121125 Method of forming polycide gate
09/19/2000US6121122 Method of contacting a silicide-based schottky diode
09/19/2000US6121116 Flash memory device isolation method and structure
09/19/2000US6121115 Methods of fabricating integrated circuit memory devices having wide and narrow channel stop layers
09/19/2000US6121104 Charge cancellation technique for integrated circuit resistors
09/19/2000US6121102 Method of electrical connection through an isolation trench to form trench-isolated bipolar devices
09/19/2000US6121101 Process for fabricating bipolar and BiCMOS devices
09/19/2000US6121100 Method of fabricating a MOS transistor with a raised source/drain extension
09/19/2000US6121099 Selective spacer formation for optimized silicon area reduction
09/19/2000US6121096 Implant process utilizing as an implant mask, spacers projecting vertically beyond a patterned polysilicon gate layer
09/19/2000US6121094 Substrates with dielectric layer over metal layer, oxygen layer, heat treatment of metal layer after oxygen impregnation, forming source/drain region
09/19/2000US6121092 Silicide blocking process to form non-silicided regions on MOS devices
09/19/2000US6121089 Methods of forming power semiconductor devices having merged split-well body regions therein
09/19/2000US6121088 Method of manufacture of undoped polysilicon as the floating-gate of a split-gate flash cell
09/19/2000US6121087 Integrated circuit device with embedded flash memory and method for manufacturing same
09/19/2000US6121077 Silicon-on-insulator transistors having improved current characteristics and reduced electrostatic discharge susceptibility
09/19/2000US6121076 Method for producing semiconductor device
09/19/2000US6121075 Fabrication of two-dimensionally arrayed quantum device
09/19/2000US6121072 Method of fabricating nonvolatile memory device
09/19/2000US6119675 Method for sawing wafers employing multiple indexing techniques for multiple die dimensions
09/19/2000CA2199523C Method of manufacturing semiconductor device
09/14/2000WO2000054339A1 Thin-film transistor, panel, and methods for producing them
09/14/2000WO2000054338A1 High speed ge channel heterostructures for field effect devices
09/14/2000WO2000054335A1 Semiconductor device comprising a non-volatile memory
09/14/2000WO2000054319A1 Method of manufacturing a semiconductor device comprising a bipolar transistor and a capacitor