Patents
Patents for H01L 29 - Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having at least one potential-jump barrier or surface barrier; Capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. pn-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof (218,143)
01/2001
01/23/2001US6177703 Method and apparatus for producing a single polysilicon flash EEPROM having a select transistor and a floating gate transistor
01/23/2001US6177702 Semiconductor component with a split floating gate and tunnel region
01/23/2001US6177696 Integration scheme enhancing deep trench capacitance in semiconductor integrated circuit devices
01/23/2001US6177692 Solid-state image sensor output MOSFET circuit
01/23/2001US6177687 Semiconductor device having gate electrode shared between two sets of active regions and fabrication thereof
01/23/2001US6177685 Nitride-type III-V HEMT having an InN 2DEG channel layer
01/23/2001US6177363 Providing an oxide layer on a semiconductor substrate, depositing nitride layer on oxide layer to introduce defects in nitride layer such that a defect density is sufficiently large to provide a low interfacial trap density
01/23/2001US6177346 Integrated circuitry and method of forming a field effect transistor
01/23/2001US6177335 Method of forming polycide
01/23/2001US6177325 Self-aligned emitter and base BJT process and structure
01/23/2001US6177324 ESD protection device for STI deep submicron technology
01/23/2001US6177323 Method to form MOSFET with an elevated source/drain for PMOSFET
01/23/2001US6177322 High voltage transistor with high gated diode breakdown voltage
01/23/2001US6177321 Semiconductor device and fabrication method thereof
01/23/2001US6177314 Method of manufacturing a semiconductor device comprising a field effect transistor
01/23/2001US6177313 Method for forming a muti-level ROM memory in a dual gate CMOS process, and corresponding ROM memory cell
01/23/2001US6177311 Method for making a floating gate memory with improved interpoly dielectric
01/23/2001US6177303 Method of manufacturing a semiconductor device with a field effect transistor
01/23/2001US6177301 Method of fabricating thin film transistors for a liquid crystal display
01/23/2001US6177299 Transistor having substantially isolated body and method of making the same
01/23/2001US6177296 Method for forming vertical interconnect process for silicon segments with thermally conductive epoxy preform
01/23/2001US6176137 Pressure sensor
01/23/2001CA2105342C Method of forming silicon carbide
01/18/2001WO2001005205A1 Laminates for encapsulating devices
01/18/2001WO2001004961A1 Power semiconductor devices with buried insulating regions
01/18/2001WO2001004959A1 Single electron tunneling transistor having multilayer structure
01/18/2001WO2001004956A1 Semiconductor device and method of manufacturing same
01/18/2001WO2001004949A1 Nand type flash memory device
01/18/2001WO2001004948A1 New method of forming select gate to improve reliability and performance for nand type flash memory devices
01/18/2001WO2001004943A1 Multilayered body, method for fabricating multilayered body, and semiconductor device
01/18/2001WO2001004939A1 Semiconductor film, liquid-crystal display using semiconductor film, and method of manufacture thereof
01/18/2001WO2000057454A3 Improved integrated oscillators and tuning circuits
01/18/2001DE19933632A1 Verfahren zur Herstellung von Monolagen aus Silizium-Nanoclustern in Siliziumdioxid Process for the preparation of monolayers of silicon nanoclusters in silica
01/18/2001DE19932541A1 Production of a membrane used in sensors comprises applying an n-doped epitaxial layer on the front side of a p-doped silicon substrate, and etching a recess in the rear side of the substrate
01/18/2001DE19930583A1 Transistor with permeable base
01/18/2001DE19930125A1 Durch Feldeffekt gesteuerte vertikale Halbleiter-Struktur Controlled by vertical field effect semiconductor structure
01/18/2001DE10025213A1 Semiconductor device for protecting access e.g. to mobile telephone had circuit for encoding dispersion of polycrystalline substance in semiconductor element
01/18/2001CA2342363A1 Laminates for encapsulating devices
01/17/2001EP1069622A1 An InPSb channel HEMT on InP for RF applications
01/17/2001EP1069621A2 Voltage controlled semiconductor device
01/17/2001EP1069620A1 A flash memory array
01/17/2001EP1069619A2 Semiconductor integrated circuit device, production and operation method thereof
01/17/2001EP1069614A2 Method of fabricating an integrated circuit
01/17/2001EP1069465A1 Tft array substrate for liquid crystal display and method of producing the same, and liquid crystal display and method of producing the same
01/17/2001EP1069206A2 Nanoscale conductive connectors and method for making same
01/17/2001EP1068638A1 Wafer-pair having deposited layer sealed chambers
01/17/2001EP1068637A1 Reduced channel length lightly doped drain transistor using a sub-amorphous large tilt angle implant to provide enhanced lateral diffusion
01/17/2001EP1068636A1 Ultra-high resolution liquid crystal display on silicon-on-sapphire
01/17/2001EP1068149A1 Method for construction of nanotube matrix material
01/17/2001CN2415461Y 贴片二极管 SMD diode
01/17/2001CN1280687A Method and system for improving a transistor model
01/17/2001CN1280388A Silicon complementary metal oxide semiconductor body contact on insulator formed by grating
01/17/2001CN1280383A Method for producing semiconductor unit, method for producing solar cell and anodizing process equipment
01/17/2001CN1280308A Film transistor array and its producing method
01/16/2001US6175481 Semiconductor device having a deactivation fuse
01/16/2001US6175395 Liquid crystal display device having light shielding layer forms over a TFT and form of an acrylic resin having carbon black particles with diameter of 1mm
01/16/2001US6175394 Capacitively coupled field effect transistors for electrostatic discharge protection in flat panel displays
01/16/2001US6175393 Active-matrix type liquid crystal display device and method of compensating for defective pixel
01/16/2001US6175348 Electro-optical device
01/16/2001US6175143 Schottky barrier
01/16/2001US6175140 Semiconductor device using a shallow trench isolation
01/16/2001US6175137 Monolithic resistor having dynamically controllable impedance and method of manufacturing the same
01/16/2001US6175136 Method of forming CMOS device with improved lightly doped drain structure
01/16/2001US6175135 Trench contact structure of silicon on insulator
01/16/2001US6175134 Thin film transistors
01/16/2001US6175133 Flash memory cell and method of fabricating the same
01/16/2001US6175127 Stack capacitor having a diffusion barrier
01/16/2001US6175123 Semiconductor devices with quantum-wave interference layers
01/16/2001US6174807 Method of controlling gate dopant penetration and diffusion in a semiconductor device
01/16/2001US6174794 Method of making high performance MOSFET with polished gate and source/drain feature
01/16/2001US6174792 Method of manufacturing a semiconductor device
01/16/2001US6174779 Method for manufacturing a lateral bipolar transistor
01/16/2001US6174778 Method of fabricating metal oxide semiconductor
01/16/2001US6174773 Method of manufacturing vertical trench misfet
01/16/2001US6174772 Optimal process flow of fabricating nitride spacer without inter-poly oxide damage in split gate flash
01/16/2001US6174763 Three-dimensional SRAM trench structure and fabrication method therefor
01/16/2001US6174759 Method of manufacturing a semiconductor device
01/16/2001US6174754 Methods for formation of silicon-on-insulator (SOI) and source/drain-on-insulator(SDOI) transistors
01/16/2001US6174751 Method of manufacturing resin encapsulated semiconductor device
01/16/2001US6174745 Method for making a TFT active matrix for a protection system screen
01/16/2001US6174416 Micromechanical component production method
01/16/2001CA2156727C High saturation current, low leakage current fermi threshold field effect transistor
01/11/2001WO2001003263A1 Light and/or electron element
01/11/2001WO2001003208A1 Nanoscopic wire-based devices, arrays, and methods of their manufacture
01/11/2001WO2001003204A1 Diode comprising a metal semiconductor contact and a method for the production thereof
01/11/2001WO2001003203A1 Non-volatile semiconductor memory cell, comprising a separate tunnel window and a method for producing the same
01/11/2001WO2001003202A1 Vertical semiconductor device and method for producing the same
01/11/2001WO2001003201A1 Lateral thin-film silicon-on-insulator (soi) device having a gate electrode and a field plate electrode
01/11/2001WO2001003199A2 Vertical semiconductor structure, controlled by field-effect
01/11/2001WO2001003198A1 Memory cell arrangement
01/11/2001WO2001003197A1 Tunnel contact and method for the production thereof
01/11/2001WO2001003196A1 Ferroelectric transistor
01/11/2001WO2001003195A1 Electric semiconductor element with a contact hole
01/11/2001WO2001003194A1 Heterojunction iii-v transistor, in particular hemt field effect transistor or heterojunction bipolar transistor
01/11/2001WO2001003193A1 Semiconductor element
01/11/2001WO2000021118A3 Method for producing a double gate of a vertical mosfet
01/11/2001DE19930781A1 Diode mit Metall-Halbleiterkontakt und Verfahren zu ihrer Herstellung Diode metal-semiconductor contact and procedures for their preparation
01/11/2001DE19930586A1 Nichtflüchtige Halbleiter-Speicherzelle mit separatem Tunnelfenster und dazugehöriges Herstellungsverfahren Non-volatile semiconductor memory cell with a separate tunnel window and associated manufacturing processes
01/11/2001DE19929618A1 Verfahren zur Herstellung einer nichtflüchtigen Halbleiter-Speicherzelle mit separatem Tunnelfenster A method of manufacturing a nonvolatile semiconductor memory cell with a separate tunnel window
01/11/2001DE19928761A1 Semiconducting chip has strain, displacement and/or compression stresses and forces arising during and after mounting of pressed material body kept as small as possible