Patents
Patents for H01L 23 - Details of semiconductor or other solid state devices (226,155)
01/2002
01/01/2002US6335560 Semiconductor device having a mark section and a dummy pattern
01/01/2002US6335548 Semiconductor radiation emitter package
01/01/2002US6335494 Multiple power distribution for delta-I noise reduction
01/01/2002US6335493 Multilayer wiring board
01/01/2002US6335492 Tape carrier package with improved connecting terminals and a method of electrically interconnecting the tape carrier package to external circuitry
01/01/2002US6335491 Interposer for semiconductor package assembly
01/01/2002US6335417 Modified polyimide resin and thermosetting resin composition containing the same
01/01/2002US6335297 Forming insulating layer on semiconductor substrate, sequentially forming semiconductor layer and tungsten film on insulating layer, nitrifying tungsten film with heat treatment, selectively etching tungsten film and semiconductor
01/01/2002US6335289 Manufacturing method of semiconductor device
01/01/2002US6335279 Method of forming contact holes of semiconductor device
01/01/2002US6335273 Surface treatment of low-K SiOF to prevent metal interaction
01/01/2002US6335271 Method of forming semiconductor device bump electrodes
01/01/2002US6335265 Forming a catalyst layer on a bottom of first separation groove in front surface of semiconductor substrate, forming a first metal layer selectively in first separation groove by electroless plating
01/01/2002US6335250 Semiconductor device and method for the manufacture thereof
01/01/2002US6335229 Inductive fuse for semiconductor device
01/01/2002US6335228 Method for making an anti-fuse
01/01/2002US6335227 Method of fabricating a lead-on-chip (LOC) semiconductor device
01/01/2002US6335225 High density direct connect LOC assembly
01/01/2002US6335224 Protection of microelectronic devices during packaging
01/01/2002US6335223 Method for producing a resin-sealed semiconductor device
01/01/2002US6335107 Useful as an electrical connector
01/01/2002US6335104 Providing a copper pad surface; selectively depositing a protection layer of phosphorus or boron-containing metal alloy on the copper pad surface; depositing adhesion layer of noble metal
01/01/2002US6335077 For filling a via-hole formed in a green ceramic sheet
01/01/2002US6335050 Method of manufacturing a ferrite magnetic film structure having magnetic anisotropy
01/01/2002US6334915 Sheet which consists essentially of copper, nickel, silicon, magnesium, and at least one of manganese and chromium; having specified average grain size and size of intermetallic compound precipitate of nickel and silicon
01/01/2002US6334750 Fastener for a heat-radiator on a chip
01/01/2002US6334567 Component and method for production thereof
01/01/2002US6334481 Retainer for a cooling device
01/01/2002US6334480 Cooling device with micro cooling fin
01/01/2002US6334247 High density integrated circuit apparatus, test probe and methods of use thereof
01/01/2002CA2228486C Cooling structure for multi-chip module
12/2001
12/28/2001CA2350057A1 Planarized plastic modules for integrated circuits
12/27/2001WO2001099194A2 Semiconductor arrangement
12/27/2001WO2001099193A1 Semiconductor chip and semiconductor device using the semiconductor chip
12/27/2001WO2001099189A1 Method and apparatus for edge connection between elements of an integrated circuit
12/27/2001WO2001099188A2 Semiconductor package and method
12/27/2001WO2001099184A2 Dual damascene process utilizing a low-k dual dielectric
12/27/2001WO2001099172A1 Electrical insulation of chip wafers by liquid phase sio2 deposition
12/27/2001WO2001099168A1 Semiconductor device and method of manufacture thereof
12/27/2001WO2001099166A1 Thin film forming method
12/27/2001WO2001099148A2 Electrical fuses employing reverse biasing to enhance programming
12/27/2001WO2001098793A2 Systems for testing integraged circuits during burn-in
12/27/2001WO2001098724A1 Graphite-based heat sink
12/27/2001WO2001098398A1 Flame-retarded polyamides
12/27/2001WO2001098016A2 Laser system for processing target material
12/27/2001WO2001080304A8 Improved test structures and methods for inspecting and utilizing the same
12/27/2001WO2001069159A8 High performance heat exchange assembly
12/27/2001WO2001037338A3 Method for integrating a chip in a printed board and integrated circuit
12/27/2001WO2001001469A3 Process for designing a mask
12/27/2001US20010056162 Comprising a maleimide compound or polymer modified by a maleimide compound, free-radical catalyst and photoinitiator; single chip packaging; reworking
12/27/2001US20010055891 High density semiconductors
12/27/2001US20010055873 Semiconductor device and fabrication method thereof
12/27/2001US20010055872 Semiconductor device having multilayer wiring structure and method for manufacturing the same
12/27/2001US20010055868 Apparatus and method for metal layer streched conducting plugs
12/27/2001US20010055866 Lead structure and method of manufacture
12/27/2001US20010055856 Method of dicing a wafer from the back side surface thereof
12/27/2001US20010055850 Method of forming a capacitor and an electrical connection thereto, and method of forming DRAM circuitry
12/27/2001US20010055848 Fuse area structure having guard ring surrounding fuse opening in semiconductor device and method of forming the same
12/27/2001US20010055839 Method of fabricating a dielectric antifuse structure
12/27/2001US20010055837 Method of attaching a leadframe to singulated semiconductor dice
12/27/2001US20010055834 Method of making semiconductor packages at wafer level
12/27/2001US20010055825 Laser marking techniques
12/27/2001US20010055819 Method of manufacturing a semiconductor device comprising a semiconductor body having a surface provided with a coil having magnetic core
12/27/2001US20010055714 Electronic power device
12/27/2001US20010055703 Method for the controlling of certain second phases in aluminum nitride
12/27/2001US20010055605 Printed circuits; containing cockroach repellent
12/27/2001US20010055230 Semiconductor memory and memory board therewith
12/27/2001US20010055203 Package substrate
12/27/2001US20010055201 Circuit configuration having at least one nanoelectronic component and method for fabricating the component
12/27/2001US20010055199 Heat sink
12/27/2001US20010055198 Heat sink
12/27/2001US20010054905 Probe card assembly and kit
12/27/2001US20010054771 Method for making projected contact structures for engaging bumped semiconductor devices
12/27/2001US20010054769 Protective layers prior to alternating layer deposition
12/27/2001US20010054768 Bonding pad structure of a semiconductor device and method of fabricating the same
12/27/2001US20010054766 Process for making a planar integrated circuit interconnect
12/27/2001US20010054765 Semiconductor device and method and apparatus for manufacturing the same
12/27/2001US20010054764 Semiconductor device having a wiring layer of damascene structure and method for manufacturing the same
12/27/2001US20010054762 Semiconductor device and method of fabricating the same
12/27/2001US20010054761 Dual-dies packaging structure and packaging method
12/27/2001US20010054760 Semiconductor integrated circuit
12/27/2001US20010054759 Semiconductor device
12/27/2001US20010054757 Multi-layer wiring board substrate and semiconductor device using the multi-layer wiring substrate
12/27/2001US20010054756 Multi-layered semiconductor device and method for producing the same
12/27/2001US20010054754 Surface-mounting type electronic circuit unit suitable for miniaturization and easy to manufacture
12/27/2001US20010054753 Semiconductor package and mount board, and mounting method using the same
12/27/2001US20010054752 High current capacity semiconductor device package and lead frame with large area connection posts and modified outline
12/27/2001US20010054751 Semiconductor device and liquid crystal module
12/27/2001US20010054750 Semiconductor leadframes plated with lead-free solder and minimum palladium
12/27/2001US20010054745 Metal fuse in copper dual damascene
12/27/2001US20010054739 Vertical component peripheral structure
12/27/2001US20010054731 Semiconductor device having a lower electrode aperture that is larger than the photolithography resolution of the capacitor pattern
12/27/2001US20010054721 Semiconductor integrated circuit and semiconductor integrated circuit wiring layout method
12/27/2001US20010054710 System and method for inspecting semiconductor device
12/27/2001US20010054709 Chemically synthesized and assembled electronic devices
12/27/2001US20010054640 Wire bonding apparatus for connecting semiconductor devices
12/27/2001US20010054600 Method and apparatus for simulating standard test wafers
12/27/2001US20010054513 Package substrate
12/27/2001US20010054481 Method for making multilayer board having a cavity
12/27/2001US20010054390 Wafer support system