Patents
Patents for H01L 23 - Details of semiconductor or other solid state devices (226,155)
05/2002
05/21/2002US6392143 Flexible package having very thin semiconductor chip, module and multi chip module (MCM) assembled by the package, and method for manufacturing the same
05/21/2002US6392004 Electronics
05/21/2002US6391932 Dielectric polyimide
05/21/2002US6391812 Silicon nitride sintered body and method of producing the same
05/21/2002US6391795 Low k dielectric composite layer for intergrated circuit structure which provides void-free low k dielectric material between metal lines while mitigating via poisoning
05/21/2002US6391785 Method for bottomless deposition of barrier layers in integrated circuit metallization schemes
05/21/2002US6391776 Method of depositing a copper seed layer which promotes improved feature surface coverage
05/21/2002US6391775 Method of forming embedded copper interconnections and embedded copper interconnection structure
05/21/2002US6391774 Fabrication process of semiconductor device
05/21/2002US6391771 Integrated circuit interconnect lines having sidewall layers
05/21/2002US6391770 Method of manufacturing semiconductor device
05/21/2002US6391764 Method for fabricating semiconductor device
05/21/2002US6391758 Method of forming solder areas over a lead frame
05/21/2002US6391745 Method for forming overlay verniers for semiconductor devices
05/21/2002US6391737 Method of simultaneously forming patterns on a die of an alignment mark and other dies
05/21/2002US6391726 Method of fabricating integrated circuitry
05/21/2002US6391685 Method of forming through-holes in a wafer and then dicing to form stacked semiconductor devices
05/21/2002US6391684 Lead frame and manufacturing method thereof
05/21/2002US6391683 Flip-chip semiconductor package structure and process for fabricating the same
05/21/2002US6391681 Semiconductor component having selected terminal contacts with multiple electrical paths
05/21/2002US6391680 LOC semiconductor assembled with room temperature adhesive
05/21/2002US6391678 Method for controlling solderability of a conductor and conductor formed thereby
05/21/2002US6391673 Method of fabricating micro electro mechanical system structure which can be vacuum-packed at wafer level
05/21/2002US6391669 Embedded structures to provide electrical testing for via to via and interface layer alignment as well as for conductive interface electrical integrity in multilayer devices
05/21/2002US6391666 Circuit and periphey zones; marking periphey zone to locate defect in package
05/21/2002US6391442 Elastomer; wax or waxlike melting point modifier; thermally conductive filler; heat transfer agent; microprocessor power assembly; heat sink
05/21/2002US6391422 Wiring substrate and stiffener therefor
05/21/2002US6391163 Method of enhancing hardness of sputter deposited copper films
05/21/2002US6391082 Composites of powdered fillers and polymer matrix
05/21/2002US6390854 Resin shield circuit device
05/21/2002US6390853 Laser wire bonding for wire embedded dielectrics to integrated circuits
05/21/2002US6390475 Electro-mechanical heat sink gasket for shock and vibration protection and EMI suppression on an exposed die
05/21/2002US6390356 Method of forming cylindrical bumps on a substrate for integrated circuits
05/21/2002US6390353 Multilayer; visible seal; electronic packages
05/21/2002US6390188 CPU heat exchanger
05/21/2002US6390182 Heat sink assembly
05/21/2002US6390181 Densely finned tungsten carbide and polycrystalline diamond cooling module
05/21/2002US6389817 Internal temperature control for a microdrive
05/21/2002US6389691 Methods for forming integrated redistribution routing conductors and solder bumps
05/21/2002US6389690 Method of coating printed circuit board
05/21/2002US6389689 Method of fabricating semiconductor package
05/21/2002US6389687 Method of fabricating image sensor packages in an array
05/16/2002WO2002039797A1 A dielectric spacing layer
05/16/2002WO2002039498A2 Methods and systems for positioning substrates
05/16/2002WO2002039497A1 Integrated circuit inductor structure and non-destructive etch depth measurement
05/16/2002WO2002039487A2 Device and method for encasing an electronic component
05/16/2002WO2002039483A2 Single metal programmability in a customizable integrated circuit device
05/16/2002WO2002039463A2 Methods and system for attaching substrates using solder structures
05/16/2002WO2002039241A2 Electrical component
05/16/2002WO2002039131A2 Method for locating defects and measuring resistance in a test structure
05/16/2002WO2002021594A3 Improved chip crack stop design for semiconductor chips
05/16/2002WO2002005298A3 Semiconductor inductor and methods for making the same
05/16/2002WO2001082361A3 Method of forming an integrated circuit package at a wafer level
05/16/2002US20020058778 Used as an underfilling sealant between such a semiconductor device and a circuit board to which the semiconductor device is electrically connected
05/16/2002US20020058756 Underfill sealants with improved adhesion, improved resistance to moisture absorption and improved resistance to stress cracking
05/16/2002US20020058743 Thermally conductive polymer composition and thermally conductive molded article
05/16/2002US20020058742 As underfill for flip-chip type semiconductor devices for optical communications
05/16/2002US20020058417 A) removing an oxide from a surface; and b) commencing application of a passivation layer to the surface within 5 seconds of the oxide removal.
05/16/2002US20020058411 Semiconductor device having low dielectric layer and method of manufacturing thereof
05/16/2002US20020058407 Structure of critical dimension bar
05/16/2002US20020058405 A structure to reduce line-line capacitance with low k material
05/16/2002US20020058403 Method of forming overmolded chip scale package and resulting product
05/16/2002US20020058401 Metal line deterioration due to electromigration is minimized to improve its reliability.
05/16/2002US20020058396 Use of a reference fiducial on a semiconductor package to monitor and control a singulation method
05/16/2002US20020058395 High density flip chip memory arrays
05/16/2002US20020058390 Semiconductor device and method for fabricating the same
05/16/2002US20020058384 Laminated structure and a method of forming the same
05/16/2002US20020058368 Electrostatic discharge (ESD); dummy gate electrode and a first impurity layer are defined by patterning the sacrificial layer
05/16/2002US20020058360 Method of encapsulating semiconductor devices utilizing a dispensing apparatus with rotating orifices
05/16/2002US20020058359 Method of attaching a semiconductor chip to a leadframe with a footprint of about the same size as the chip and packages formed thereby
05/16/2002US20020058358 Method and structure for manufacturing improved yield semiconductor packaged devices
05/16/2002US20020058356 Semiconductor package and mount board, and mounting method using the same
05/16/2002US20020058354 Layout method for thin and fine ball grid array package substrate with palting bus
05/16/2002US20020058347 Semiconductor package with a controlled impedance bus and method of forming same
05/16/2002US20020058346 TFI probe I/O wrap test method
05/16/2002US20020058163 Graded composition diffusion barriers for chip wiring applications
05/16/2002US20020058151 Surface electrode structure on ceramic multi-layer substrate and process for producing the same
05/16/2002US20020058150 Method for processing a semiconductor substrate having a copper surface disposed thereon and structure formed
05/16/2002US20020058145 Light-transmissive epoxy resin composition and semiconductor device
05/16/2002US20020058142 Low dielectric constant material having thermal resistance, insulation film between semiconductor layers using the same, and semiconductor device
05/16/2002US20020058137 Dielectric spacing layer
05/16/2002US20020058131 Reducing warpage by use of low temperature sinterable ceramic and an inorganic particle which constrains the shrinkage and which is not sintered at a sintering temperature
05/16/2002US20020057884 Heater module and optical waveguide module
05/16/2002US20020057610 Vertical power devices having insulated source electrodes in discontinuous deep trenches
05/16/2002US20020057560 Shielding case and electronic device having the same
05/16/2002US20020057558 Perimeter matrix ball grid array circuit package with a populated center
05/16/2002US20020057555 Electronic unit
05/16/2002US20020057554 Method and apparatus for thermal and mechanical management of a power regulator module and microprocessor in contact with a thermally conducting plate
05/16/2002US20020057553 Stacked intelligent power module package
05/16/2002US20020057394 Liquid crystal display units
05/16/2002US20020057176 Integrated circuit inductor structure and non-destructive etch depth measurement
05/16/2002US20020057129 Semiconductor integrated circuit
05/16/2002US20020056927 Method of making semiconductor device having first and second sealing resins
05/16/2002US20020056926 Low-pin-count chip package and manufacturing method thereof
05/16/2002US20020056924 Semiconductor package having an insulating region on an edge of a chip to prevent shorts
05/16/2002US20020056923 Semiconductor device with a radiation absorbing conductive protection layer and method of fabricating the same
05/16/2002US20020056922 Semiconductor device, production method thereof, and coil spring cutting jig and coil spring guiding jig applied thereto
05/16/2002US20020056921 Semiconductor device having improved contact hole structure, and method of manufacturing the same
05/16/2002US20020056920 High- frequency semiconductor device and method of manufacturing the same
05/16/2002US20020056919 Semiconductor device with reduced number of intermediate interconnection pattern and method of forming the same