Patents
Patents for H01L 23 - Details of semiconductor or other solid state devices (226,155)
08/2004
08/26/2004WO2004073066A1 Line element and semiconductor circuit applied with line element
08/26/2004WO2004073063A1 Electronic device and semiconductor device
08/26/2004WO2004073062A2 Method of manufacturing a reinforced semiconductor wafer
08/26/2004WO2004073059A1 Method for planarizing bumped die
08/26/2004WO2004073047A2 Uv-blocking layer for reducing uv-induced charging of sonos dual-bit flash memory devices in beol processing
08/26/2004WO2004073031A2 Alternative flip chip in leaded molded package design and method for manufacture
08/26/2004WO2004073023A2 Low voltage nmos-based electrostatic discharge clamp
08/26/2004WO2004073019A2 Semiconductor die package with reduced inductance and reduced die attach flow out
08/26/2004WO2004073016A2 On-carrier impedance transform network
08/26/2004WO2004073013A2 Electronic component comprising a semiconductor chip and method for producing said component
08/26/2004WO2004072998A2 Protecting resin-encapsulated components
08/26/2004WO2004072146A1 Process for producing high-purity epoxy resin and epoxy resin composition
08/26/2004WO2004051134A3 Vacuum heat insulator and its manufacturing method
08/26/2004WO2004042791A3 Method and apparatus for monitoring integrated circuit fabrication
08/26/2004WO2004037712A3 Method for producing a packaged integrated circuit with a microcavity
08/26/2004WO2004034467A3 Sublithographic nanoscale memory architecture
08/26/2004WO2004034422A3 Wafer coating and singulation method
08/26/2004WO2004015744A3 Via programmable gate array interconnect architecture
08/26/2004WO2003079752A3 Unit cell architecture for electrical interconnects
08/26/2004WO2003061006B1 Stacked die in die bga package
08/26/2004US20040167801 Analyte monitoring device and methods of use
08/26/2004US20040166702 Semiconductor device having external contact terminals and method for using the same
08/26/2004US20040166693 Sputtering target compositions, and methods of inhibiting copper diffusion into a substrate
08/26/2004US20040166682 Semiconductor device for charge-up damage evaluation and charge-up damage evaluation method
08/26/2004US20040166680 Method of manufacturing semiconductor device
08/26/2004US20040166674 Method for making damascene interconnect with bilayer capping film
08/26/2004US20040166670 Method for forming three-dimensional structures on a substrate
08/26/2004US20040166666 Semiconductor device and method of manufacturing the same
08/26/2004US20040166665 Method of decreasing the K value in SIOC layer deposited by chemical vapor deposition
08/26/2004US20040166663 Method for constructing a wafer-interposer assembly
08/26/2004US20040166662 MEMS wafer level chip scale package
08/26/2004US20040166661 Method for forming copper bump antioxidation surface
08/26/2004US20040166660 Semiconductor device, method of manufacturing the same, circuit board, and electronic instrument
08/26/2004US20040166659 Top layers of metal for high performance IC's
08/26/2004US20040166657 Semiconductor device and its manufacturing method
08/26/2004US20040166646 Methods for use in forming a capacitor and structures resulting from same
08/26/2004US20040166630 Stitch and select implementation in twin MONOS array
08/26/2004US20040166617 Mounted circuit substrate and method for fabricating the same for surface layer pads that can withstand pad erosion by molten solder applied over a plurality of times
08/26/2004US20040166609 Semiconductor device having a carbon fiber reinforced resin as a heat radiation plate having a concave portion
08/26/2004US20040166607 Methods for fabricating interposers including upwardly protruding DAMS
08/26/2004US20040166605 Fabrication method of semiconductor integrated circuit device
08/26/2004US20040166444 forming marks nonparallel to the direction of generation of a factor that hinders reading; consecutive marks have different portions subjected to hindrance to reading, and the results of reading of the marks are compared with each other
08/26/2004US20040166329 Method for fabricating a thin line structure, multilayered structure and multilayered intermediate structure
08/26/2004US20040166326 Polyphenol resin, method for producing the same, epoxy resin composition and use thereof
08/26/2004US20040166325 substantially free of halogen, phosphorous, and antimony
08/26/2004US20040166241 Molding compositions containing quaternary organophosphonium salts
08/26/2004US20040165975 Apparatus for and method of packaging semiconductor devices
08/26/2004US20040165362 Chip scale package structures and method of forming conductive bumps thereon
08/26/2004US20040165361 Module component and method of manufacturing the same
08/26/2004US20040165356 Leadless leadframe electronic package and sensor module incorporating same
08/26/2004US20040165355 CPU cooling structure
08/26/2004US20040165354 Heat radiating structure for electronic device
08/26/2004US20040165353 Electrically isolated module
08/26/2004US20040165352 Housing structure of electronic device and heat radiation method therefor
08/26/2004US20040165350 Heat sink assembly with heat pipe
08/26/2004US20040165349 Duct for cooling multiple components in a processor-based device
08/26/2004US20040165336 Multi-layered unit including electrode and dielectic layer
08/26/2004US20040165334 Multi-layered unit
08/26/2004US20040165327 Circuitry for protecting electronic circuits against electrostatic discharges and methods of operating the same
08/26/2004US20040165098 Camera module
08/26/2004US20040164981 Solid state imaging device, semiconductor wafer, optical device module, method of solid state imaging device fabrication, and method of optical device module fabrication
08/26/2004US20040164760 Wireless radio frequency technique design and method for testing
08/26/2004US20040164722 Integrated circuit leadframes patterned for measuring the accurate amplitude of changing currents
08/26/2004US20040164432 Cascaded die mountings with spring-loaded contact-bond options
08/26/2004US20040164431 substrate having a first side configured to receive a semiconductor chip and a second side having conductive pads arranged in an array of rows and columns, wherein at least one edge of said array is not fully populated with pads.
08/26/2004US20040164430 conductive patterns, which are to be electrodes, are exposed from side surfaces of an insulating resin that seals the entire circuit device; fillets of a brazing material are formed at the sides of the device when circuit device is mounted.
08/26/2004US20040164429 Chip carrier film, method of manufacturing the chip carrier film and liquid crystal display using the chip carrier film
08/26/2004US20040164428 Method of manufacturing a semiconductor device and a semiconductor device
08/26/2004US20040164427 Optimization of routing layers and board space requirements for ball grid array package implementations including array corner considerations
08/26/2004US20040164426 Each electrically conductive adhesive bump connects a bonding pad and a corresponding bump pad, and has a smaller diameter at the central portion thereof than at the end portions thereof.
08/26/2004US20040164425 one package includes a plurality of chips, each of which is capable of functioning as one memory chip; dicing line interposed between basic chips that configures a part of the memory chip; bump connecting the logic chip and the memory chip
08/26/2004US20040164424 Flexibility enhanced integrated circuit carrier
08/26/2004US20040164422 Semiconductor integrated circuit having pads layout for increasing signal integrity and reducing chip size
08/26/2004US20040164421 Metallic strain-absorbing layer for improved fatigue resistance of solder-attached devices
08/26/2004US20040164420 Sputtering target compositions, and methods of inhibiting copper diffusion into a substrate
08/26/2004US20040164419 Multilevel copper interconnects with low-k dielectrics and air gaps
08/26/2004US20040164418 Semiconductor device having a pillar structure
08/26/2004US20040164417 Semiconductor device and manufacturing method thereof
08/26/2004US20040164415 Electrode employing nitride-based semiconductor of III-V group compound, and producing method thereof
08/26/2004US20040164414 Semiconductor device package and method of making the same
08/26/2004US20040164413 Underfilled, encapsulated semiconductor die assemblies and methods of fabrication
08/26/2004US20040164411 Semiconductor package and method for fabricating the same
08/26/2004US20040164410 Die package
08/26/2004US20040164409 Soft error resistant semiconductor device
08/26/2004US20040164408 Noise eliminating system on chip and method of making same
08/26/2004US20040164407 Semiconductor device, power amplifier device and PC card
08/26/2004US20040164406 Discrete circuit component having an up-right circuit die with lateral electrical connections
08/26/2004US20040164405 Heatsink arrangement for semiconductor device
08/26/2004US20040164404 Semiconductor package with heat dissipating structure
08/26/2004US20040164403 Semiconductor device with semiconductor chip formed by using wide gap semiconductor as base material
08/26/2004US20040164402 metal coupling member is deformable to absorb a stress generated between the semiconductor chip and the heat dissipation member, both of which are joined through metal-metal bonding.
08/26/2004US20040164401 Module with adhesively attached heat sink
08/26/2004US20040164400 Electronic component having at least one semiconductor chip on a circuit carrier and method for producing the same
08/26/2004US20040164399 Semiconductor device and manufacturing method therefor
08/26/2004US20040164398 System-on-a-chip with multi-layered metallized through-hole interconnection
08/26/2004US20040164397 Power ring architecture for embedded low drop off voltage reglators
08/26/2004US20040164396 Interconnect substrate and method of manufacture thereof, electronic component and method of manufacturing thereof, circuit board and electronic instrument
08/26/2004US20040164395 sealed in a resin package and having its terminals exposed on a bottom surface of the package.
08/26/2004US20040164394 Multi-chip package and method for manufacturing the same
08/26/2004US20040164393 Stacked semiconductor module