Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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11/25/1998 | EP0880165A1 A method of manufacturing an integrated circuit with MOS transistors having high breakdown voltages, and with precision resistors |
11/25/1998 | EP0880163A2 Plasma processing method and apparatus |
11/25/1998 | EP0880162A2 Dual walled exhaust tubing for vacuum pump |
11/25/1998 | EP0880161A1 Electron flood apparatus for neutralising charge build-up on a substrate during ion implantation |
11/25/1998 | EP0880144A2 Read only memory |
11/25/1998 | EP0880075A1 Radiation sensitive resin composition |
11/25/1998 | EP0880074A1 An energy-sensitive resist material and a process for device fabrication using an energy-sensitive resist material |
11/25/1998 | EP0880073A1 Diamond films suitable for x-ray lithography and their manufacture |
11/25/1998 | EP0879997A2 Impurity removing apparatus |
11/25/1998 | EP0879904A1 Method and apparatus for producing single-crystalline diamond |
11/25/1998 | EP0879902A2 Treating method and apparatus utilizing chemical reaction |
11/25/1998 | EP0879678A1 A carrier head with a substrate detection mechanism for a chemical mechanical polishing system |
11/25/1998 | EP0879547A2 Model-based predictive control of thermal processing |
11/25/1998 | EP0879482A1 Short channel fermi-threshold field effect transistors including drain field termination region and methods of fabricating same |
11/25/1998 | EP0879481A1 Field effect controlled semiconductor component |
11/25/1998 | EP0879480A1 Read-only memory cell device with insulating trenches and method for the production thereof |
11/25/1998 | EP0879479A2 Separable connecting bridge (fuse) and connectable line interruption (anti-fuse) and process for producing and activating a fuse and an anti-fuse |
11/25/1998 | EP0879478A1 Electrically erasable and programmable read only memory (eeprom) having multiple overlapping metallization layers |
11/25/1998 | EP0879477A1 Electronic device manufacture by energy beam crystallisation |
11/25/1998 | EP0879400A1 Multiple field of view calibration plate for use in semiconductor manufacturing |
11/25/1998 | EP0879304A2 Production of bevelled galvanic structures |
11/25/1998 | EP0879303A1 Device and process for coating substrates |
11/25/1998 | EP0879115A1 Lapping and polishing method and apparatus for planarizing photoresist and metal microstructure layers |
11/25/1998 | EP0879113A1 Damage-free laser surface treatment method |
11/25/1998 | EP0701487B1 Device for lacquering or coating plates or panels |
11/25/1998 | EP0659282B1 Color filter system for display panels |
11/25/1998 | EP0548351B1 Method for producing integrated circuits having adjacent electrodes |
11/25/1998 | CN1200197A Off-state gate-oxide field reduction in CMOS |
11/25/1998 | CN1200196A Connecting structure of semiconductor element, liquid crystal display device using the structure, and electronic equipment using the display device |
11/25/1998 | CN1200075A Packing material, base material for adhesive tape, or separator |
11/25/1998 | CN1199931A Control system and method for semiconductor integrated circuit test process |
11/25/1998 | CN1199930A Semiconductor device and its producing method |
11/25/1998 | CN1199929A Semiconductor device having contact hole and method of manufacturing the same |
11/25/1998 | CN1199928A Semiconductor device and method for manufacturing the same |
11/25/1998 | CN1199926A Method of fabricating semiconductor device capable of providing mosfet which is improved in threshold voltage thereof |
11/25/1998 | CN1199925A Improved integrated multi-layer test pads and methods therefor |
11/25/1998 | CN1199924A Producing method for chip type semi-conductor device |
11/25/1998 | CN1199923A Semiconductor substrate with semi-insulating polysilicon gettering site layer and process of fabrication thereof |
11/25/1998 | CN1199922A Material for forming fine pattern and method for manufacturing semiconductor device using the same |
11/25/1998 | CN1199921A Semiconductor apparatus and method for fabricating the same |
11/25/1998 | CN1199920A Semiconductor substrate and method of manufacturing the same |
11/25/1998 | CN1040937C Superconducting circuit board |
11/24/1998 | US5842075 Developing solution feed system for semiconductor photolithography process having a gas removal device in a high solution feed pressure pipe section |
11/24/1998 | US5841893 In a semiconductor device manufacturing line |
11/24/1998 | US5841731 Semiconductor device having externally settable operation mode |
11/24/1998 | US5841720 Memory array |
11/24/1998 | US5841713 For semiconductor wafers |
11/24/1998 | US5841708 Semiconductor memory device having small chip size and redundancy access time |
11/24/1998 | US5841693 Non-volatile memory using field effect transistors having dual floating gates for storing two bits per cell |
11/24/1998 | US5841692 Magnetic tunnel junction device with antiferromagnetically coupled pinned layer |
11/24/1998 | US5841690 Semiconductor memory |
11/24/1998 | US5841688 Matched delay word line strap |
11/24/1998 | US5841660 Method and apparatus for modeling process control |
11/24/1998 | US5841624 For covering a support surface of a workpiece support chuck |
11/24/1998 | US5841623 Chuck for substrate processing and method for depositing a film in a radio frequency biased plasma chemical depositing system |
11/24/1998 | US5841619 Interface circuit for use in a semiconductor integrated circuit |
11/24/1998 | US5841611 Magnetoresistance effect device and magnetoresistance effect type head, memory device, and amplifying device using the same |
11/24/1998 | US5841569 Method of manufacturing an array of thin film actuated mirrors |
11/24/1998 | US5841532 Method for evaluating oxygen concentrating in semiconductor silicon single crystal |
11/24/1998 | US5841515 Substrate container cassette, interface mechanism, and substrate processing |
11/24/1998 | US5841490 Liquid crystal display device and its fabricating method |
11/24/1998 | US5841294 Method for measuring leakage current in junction region of semiconductor device |
11/24/1998 | US5841291 For providing power and ground potentials |
11/24/1998 | US5841271 Test mode power circuit for integrated-circuit chip |
11/24/1998 | US5841250 Stage apparatus and linear motor, and exposure apparatus and device production method using the stage apparatus |
11/24/1998 | US5841199 Structure of semiconductor device |
11/24/1998 | US5841197 Inverted dielectric isolation process |
11/24/1998 | US5841196 Fluted via formation for superior metal step coverage |
11/24/1998 | US5841195 In an integrated circuit |
11/24/1998 | US5841192 Injection molded ball grid array casing |
11/24/1998 | US5841191 Integrated circuit package |
11/24/1998 | US5841189 Semiconductor device and manufacturing method thereof |
11/24/1998 | US5841188 Tape carrier structure for a tape carrier package |
11/24/1998 | US5841187 Molded electronic component |
11/24/1998 | US5841186 Composite dielectric films |
11/24/1998 | US5841185 Semiconductor device having CMOS transistors |
11/24/1998 | US5841182 Capacitor structure in a bonded wafer and method of fabrication |
11/24/1998 | US5841181 Semiconductor apparatus having field limiting rings |
11/24/1998 | US5841179 Conductive layer with anti-reflective surface portion |
11/24/1998 | US5841175 Semiconductor device in which an increase in threshold voltage, resulting from back-gate bias effect is mitigated, and method of manufacturing the same |
11/24/1998 | US5841174 Semiconductor apparatus including semiconductor devices operated by plural power supplies |
11/24/1998 | US5841173 MOS semiconductor device with excellent drain current |
11/24/1998 | US5841172 SOI input protection circuit |
11/24/1998 | US5841171 SOI Semiconductor devices |
11/24/1998 | US5841170 Field effect transistor and CMOS element having dopant exponentially graded in channel |
11/24/1998 | US5841169 Integrated circuit containing devices dielectrically isolated and junction isolated from a substrate |
11/24/1998 | US5841168 High performance asymmetrical MOSFET structure and method of making the same |
11/24/1998 | US5841167 MOS-technology power device integrated structure |
11/24/1998 | US5841166 Lateral DMOS transistor for RF/microwave applications |
11/24/1998 | US5841165 PMOS flash EEPROM cell with single poly |
11/24/1998 | US5841164 Test structure for dielectric film evaluation |
11/24/1998 | US5841163 Integrated circuit memory devices having wide and narrow channel stop layers |
11/24/1998 | US5841162 Non-volatile semiconductor memory with floating gate and control gate and fabrication process therefor |
11/24/1998 | US5841161 Flash memory and method for fabricating the same |
11/24/1998 | US5841160 Semiconductor device having a capacitor electrode made of iridium |
11/24/1998 | US5841157 Semiconductor integrated circuit including a high density cell |
11/24/1998 | US5841156 Quantum well laser, transistor; improved lattice constant |
11/24/1998 | US5841155 Semiconductor device containing two joined substrates |
11/24/1998 | US5841153 SRAM semiconductor device |
11/24/1998 | US5841110 Method and apparatus for improved temperature control in rapid thermal processing (RTP) systems |