Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
11/1998
11/17/1998US5837059 Automatic positive pressure seal access door
11/17/1998US5837058 High temperature susceptor
11/17/1998US5837057 Film forming apparatus with particle prevention plate
11/17/1998US5837056 Method for growing III-V group compound semiconductor crystal
11/17/1998US5837053 Metal oxide
11/17/1998US5836806 Slurries for chemical mechanical polishing
11/17/1998US5836805 Method of forming planarized layers in an integrated circuit
11/17/1998US5836772 Interpoly dielectric process
11/17/1998US5836736 Semiconductor processing system with wafer container docking and loading station
11/17/1998US5836575 Wafer manual handpick station
11/17/1998US5836520 Apparatus for dispensing fluid in an array pattern
11/17/1998US5836454 Lead frame casing
11/17/1998US5836325 Running water type washing machine
11/17/1998US5836080 Positioning table
11/17/1998US5836071 Method to produce known good die using temporary wire bond, die attach and packaging
11/17/1998CA2165847C Process gas distribution system and method with automatic transducer zero calibration
11/17/1998CA2094519C Sub-micron device fabrication using multiple aperture filter
11/17/1998CA2061623C Sub-micron imaging
11/12/1998WO1998051138A1 Bent lead repair tool for electronic components
11/12/1998WO1998050960A1 Floating gate memory cell with charge leakage prevention
11/12/1998WO1998050958A1 Device based on quantic islands and method for making same
11/12/1998WO1998050954A1 Stacked semiconductor devices, particularly memory chips
11/12/1998WO1998050953A1 Electronic component having resilient contact elements at areas remote from corresponding terminals
11/12/1998WO1998050951A1 Semiconductor integrated circuit device and method for manufacturing the same
11/12/1998WO1998050948A1 Method for etching silicon wafer
11/12/1998WO1998050947A1 Methods for cleaning semiconductor surfaces
11/12/1998WO1998050946A1 Multiple single-wafer loadlock wafer processing apparatus and loading and unloading method therefor
11/12/1998WO1998050945A2 Low density film for low dielectric constant applications
11/12/1998WO1998050944A2 Method and apparatus for self-doping negative and positive electrodes for silicon solar cells and other devices
11/12/1998WO1998050606A1 Vertical furnace for the treatment of semiconductor substrates
11/12/1998WO1998050604A1 Silicon etching process for making microchannel plates
11/12/1998WO1998050516A1 Non-corrosive stripping and cleaning composition
11/12/1998WO1998050216A1 Method and apparatus for molding plastic packages
11/12/1998WO1998050200A1 Abrasive and method for polishing semiconductor substrate
11/12/1998WO1998050189A1 Apparatus and method for forming solder bonding pads
11/12/1998WO1998033199A3 Ion accelerator for use in ion implanter
11/12/1998WO1998032893A3 Wafer support system
11/12/1998WO1998020533A3 Method for using photoabsorptive coatings to enhance both blind and through micro-via entrance quality
11/12/1998DE19820465A1 Magnetoresistive effect element for magnetic head of magnetic recording device
11/12/1998DE19819217A1 Electronic component base plate
11/12/1998DE19819215A1 Resin-sealed flip-chip device
11/12/1998DE19810060A1 Bonding component to substrate especially by flip-chip technique
11/12/1998DE19800179A1 Transistor-containing semiconductor device e.g. memory device
11/12/1998DE19756529A1 Semiconductor module with substrate containing integrated circuit
11/12/1998DE19748910A1 High packing density EEPROM cell production
11/12/1998DE19745582A1 Semiconductor module with memory and logic circuitry
11/12/1998DE19743296C1 Open structure, especially photonic crystal production
11/12/1998DE19719699A1 High density dynamic random access memory formation
11/12/1998DE19719503A1 Semiconductor wafer chemical and mechanical polishing device
11/12/1998DE19718983A1 Application especially of photolithographic developer to surface
11/12/1998DE19718517A1 Microelectronic component with diamond layer
11/12/1998CA2259631A1 Floating gate memory cell with charge leakage prevention
11/11/1998EP0877544A1 Apparatus and method for mounting semiconductor chips on a substrate
11/11/1998EP0877482A1 Electronically tuned matching network using predictor-corrector control system
11/11/1998EP0877425A2 Field effect device with polycrystalline silicon channel
11/11/1998EP0877424A2 Interconnect method and structure for semiconductor devices
11/11/1998EP0877423A2 Integrated circuit package
11/11/1998EP0877422A1 Dual-level metalization method for integrated circuit ferroelectric devices
11/11/1998EP0877421A2 Sputter deposition and annealing of copper alloy metallization M
11/11/1998EP0877420A2 Method of forming a polysilicon buried contact and a structure thereof
11/11/1998EP0877419A2 Methods of electroplating solder bumps of uniform height on integrated circuit substrates
11/11/1998EP0877418A2 Edge-polishing apparatus and method
11/11/1998EP0877417A1 Method for fabrication of electrodes and other electrically-conductive structures
11/11/1998EP0877416A1 Integrated structure comprising a polysilicon element with large grain size
11/11/1998EP0877415A2 Method and system for the deposition of a multi-layer film
11/11/1998EP0877414A2 Wafer support devices for use in wafer processing chambers
11/11/1998EP0877413A2 Method and apparatus for selectively marking a semiconductor wafer
11/11/1998EP0877411A1 Magnetron source with magnet assembly
11/11/1998EP0877410A1 Deposition chamber and method for depositing low dielectric constant films
11/11/1998EP0877330A2 Circuit verification process for semiconductor devices
11/11/1998EP0877308A2 Control apparatus and control method
11/11/1998EP0877297A2 Exposure method and device manufacturing method
11/11/1998EP0877246A2 In situ monitoring of contaminants in semiconductor processing chambers
11/11/1998EP0877100A1 Process for fabricating solid-solution of layered perovskite materials
11/11/1998EP0877098A1 Method and system for depositing films
11/11/1998EP0876853A2 Brush for scrubbing semiconductor wafers
11/11/1998EP0876702A1 Integrated magnetic levitation and rotation system
11/11/1998EP0876689A2 Method of forming electrical interconnects using isotropic conductive adhesives and connections formed thereby
11/11/1998EP0876681A1 Semiconductor neuron with variable input weights
11/11/1998EP0876680A1 Electrostatic clamp with lip seal for clamping substrates
11/11/1998EP0876677A1 Ion source for an ion beam arrangement
11/11/1998EP0876242A1 A polishing pad and a method for making a polishing pad with covalently bonded particles
11/11/1998EP0859686A4 Fabricating interconnects and tips using sacrificial substrates
11/11/1998CN1198840A Method for transferring conductor pattern to film carrier, mask used for the method and film carrier
11/11/1998CN1198839A Method and mold for manufacturing semiconductor device, semiconductor device, and method for mounting the device
11/11/1998CN1198596A Film transistor and making method thereof and LCD device using it
11/11/1998CN1198595A Semiconductor device and making method thereof
11/11/1998CN1198594A 多芯片模块 A multi-chip module
11/11/1998CN1198593A 多芯片模块 A multi-chip module
11/11/1998CN1198592A Semiconductor device
11/11/1998CN1198591A Integrated circuit and making method
11/11/1998CN1198590A Method for making capacitor used for analog function
11/11/1998CN1198589A Process equipment for making large scale integrated circuit
11/11/1998CN1198588A Etching method for device layer in semiconductor
11/11/1998CN1198587A Improved substrate structure for covering holes in semiconductor device and forming method thereof
11/11/1998CN1198586A Substrate working device and method
11/11/1998CN1198573A Semiconductor memory device
11/11/1998CN1198534A Picking up and putting on device of mechanic finger system for testing semiconductor device
11/11/1998CN1198480A Plasma intensified chemical vapour deposition device and method for making said deposition
11/10/1998US5835987 Semiconductor substrate
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