Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
12/1998
12/03/1998DE19822523A1 Non-volatile semiconductor memory cell
12/03/1998DE19822069A1 Laser diode controller for laser printer
12/03/1998DE19808350A1 Method for semiconductor wafer evaluation
12/03/1998DE19807052A1 Testchipschaltung für die On-Chip-Zeitcharakterisierung Chip test circuit for the on-chip time characterization
12/03/1998DE19754867A1 Projection illuminator for semiconductor component manufacture
12/03/1998DE19752413A1 Electrode production on semiconductor substrate
12/03/1998DE19752014A1 Integrated semiconductor module with embedded gate array, or cell array (ECA)
12/03/1998DE19750897A1 Bipolar transistor with insulated gate (IGBT)
12/03/1998DE19748503A1 Projection illumination arrangement for Large Scale Integrated Circuit manufacture
12/03/1998DE19748055A1 Apparatus for cutting out platelets
12/03/1998DE19744656A1 Semiconductor device with precisely dimensioned gate electrode
12/03/1998DE19722355A1 Verfahren zur Herstellung elektrischer Baugruppen und elektrische Baugruppe Method for manufacturing electrical components and electrical assembly
12/02/1998EP0881771A1 A BiCMOS Logic Gate
12/02/1998EP0881693A1 Reference voltage in an integrated circuit
12/02/1998EP0881692A2 Insulated gate semiconductor device and method of manufacturing the same
12/02/1998EP0881691A2 Quantum dot device
12/02/1998EP0881690A1 Stabilized bipolar transistor with electric insulating elements
12/02/1998EP0881689A1 PNP lateral bipolar electronic device and corresponding manufacturing process
12/02/1998EP0881687A1 Contact on P-type region
12/02/1998EP0881685A1 Layout for SRAM structure
12/02/1998EP0881683A2 Semiconductor device having a metal-insulator-metal capacitor
12/02/1998EP0881682A1 Overvoltage protection for an integrated MOS power transmission
12/02/1998EP0881681A1 Device protecting an integrated MOS device against voltage gradients
12/02/1998EP0881678A2 Improvements in or relating to porous dielectric structures
12/02/1998EP0881676A2 Flip chip packaging of memory chips
12/02/1998EP0881673A2 Sub-quarter-micron copper interconnections with improved electromigration resistance and reduced defect sensitivity
12/02/1998EP0881672A1 Isolation wall between power device
12/02/1998EP0881671A2 Method for fabricating semiconductor device
12/02/1998EP0881670A2 Sacrificial spacer for integrated circuit transistors
12/02/1998EP0881669A1 Manufacturing process of a germanium implanted HBT bipolar transistor
12/02/1998EP0881668A2 Deposition of an electrically insulating thin film with a low dielectric constant
12/02/1998EP0881667A2 A method for manufacturing compound semiconductor epitaxial wafer
12/02/1998EP0881666A2 P-type nitrogen compound semiconductor and method of manufacturing same
12/02/1998EP0881665A2 Treatment device for disk-like substrates, in particular silicon wafers
12/02/1998EP0881664A2 Treatment device for disk-like substrates, in particular silicon wafers
12/02/1998EP0881663A2 Method and apparatus for applying a protecting film to a semiconductor wafer
12/02/1998EP0881662A1 Plasma processing apparatus and plasma processing method
12/02/1998EP0881586A2 Method of simulating oxidation enhanced diffusion by solving partial differential equation
12/02/1998EP0881573A1 Semiconductor device with test circuit
12/02/1998EP0881542A1 Lithography system
12/02/1998EP0881540A1 Photoresist composition
12/02/1998EP0881539A1 Photoresist composition
12/02/1998EP0881538A2 Means for supporting a mask
12/02/1998EP0881486A2 Method for measuring physical phenomena or chemical phenomena and equipment thereof
12/02/1998EP0881040A2 Method and apparatus for in-situ monitoring of thickness using a multi-wavelength spectrometer during chemical-mechanical polishing
12/02/1998EP0881038A1 Wafer chuck and method of manufacturing a semiconductor wafer
12/02/1998EP0881035A1 Method for material removing machining of a wafer edge
12/02/1998EP0880818A1 Low voltage electrostatic clamp for substrates such as dielectric substrates
12/02/1998EP0880801A1 DIE ATTACHED SiC AND DIE ATTACH PROCEDURE FOR SiC
12/02/1998EP0880800A1 High dielectric constant barium-strontium-niobium oxides for integrated circuit applications
12/02/1998EP0880799A1 Methods and apparatus for etching semiconductor wafers
12/02/1998EP0880798A1 System and method for cooling workpieces processed by an ion implantation system
12/02/1998EP0880797A1 Ion implantation system for implanting workpieces
12/02/1998EP0880794A1 Ion beam shield for implantation systems
12/02/1998EP0880793A1 Large area uniform ion beam formation
12/02/1998EP0880792A1 Loadlock assembly for an ion implantation system
12/02/1998EP0880754A2 Method and device for bonding a wire conductor
12/02/1998EP0880421A1 Method of bonding insulating wire and device for carrying out this method
12/02/1998EP0846337A4 Self-aligned isolation and planarization process for memory array
12/02/1998EP0839404A4 Electrostatic chuck assembly
12/02/1998EP0777762B1 Metal polyoxyalkylated precursor solutions in an octane solvent and method of making the same
12/02/1998EP0760873B1 Electrolytic method and device for the continuous and uniform metallization or etching of metal surfaces
12/02/1998EP0561765B1 Novel method of making, testing and test device for integrated circuits
12/02/1998CN1200773A Gas injection system for semiconductor processing
12/02/1998CN1200647A Product and method for placing particles on contact pads of electronic devices
12/02/1998CN1200577A Semiconductor device and method of mfg. same
12/02/1998CN1200575A Structure and mfg. method for NAND logical non crystalline silicon read-only memory device
12/02/1998CN1200574A Nonvolatile semiconductor memory and method of fabrication
12/02/1998CN1200573A Semiconductor memory device
12/02/1998CN1200571A Semiconductor memory device having memory cells similarly layouted and peripheral circuits symmetrically layouted in memory cell arrays
12/02/1998CN1200570A Anti-tamper bond wire shield for integrated circuit
12/02/1998CN1200568A Conducting wire frame and method for producing same
12/02/1998CN1200567A Semiconductor device
12/02/1998CN1200566A Method of mfg. semiconductor device
12/02/1998CN1200565A Method of mfg. semiconductor device
12/02/1998CN1200564A Mfg. method of semiconductor device
12/02/1998CN1200563A Drying apparatus and method for processing surface of substrate
12/02/1998CN1200562A Drying apparatus and method
12/02/1998CN1200561A Improvements relating to semiconductor device
12/02/1998CN1200560A Semiconductor substrate and process for producing same
12/02/1998CN1200559A Semiconductor substrate and mfg. method thereof
12/02/1998CN1200558A Static random access memory cell having pocket adjacent to sources of drive transistors
12/02/1998CN1200501A Method for feedforward corrections for off-specification conditions
12/02/1998CN1041035C Multi-chip module
12/01/1998USH1762 Wafer restraining system
12/01/1998US5845170 Developing method
12/01/1998US5845105 Method of simulating semiconductor manufacture with process functions according to user application
12/01/1998US5844913 Current mode interface circuitry for an IC test device
12/01/1998US5844910 Flash-erase-type nonvolatile semiconductor storage device
12/01/1998US5844853 Memory regulator control method with flexibility for a wide change in supply voltage
12/01/1998US5844850 Apparatus for analyzing a failure in a semiconductor wafer and method thereof
12/01/1998US5844843 Single chip data processing apparatus having a flash memory which is rewritable under the control of built-in CPU in the external write mode
12/01/1998US5844839 Programmable and convertible non-volatile memory array
12/01/1998US5844837 Static memory device including supplemental gate capacitance
12/01/1998US5844836 Memory cell having increased capacitance via a local interconnect to gate capacitor and a method for making such a cell
12/01/1998US5844832 Cell array structure for a ferroelectric semiconductor memory and a method for sensing data from the same
12/01/1998US5844818 Method for creating and using design shells for integrated circuit designs
12/01/1998US5844810 Scaled adaptive lithography
12/01/1998US5844782 Printed wiring board and electronic device using same
12/01/1998US5844779 Semiconductor package, and semiconductor device using the same
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