Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
11/1998
11/10/1998US5835751 Structure and method for providing reconfigurable emulation circuit
11/10/1998US5835553 Semiconductor integrated circuit having a digital temperature sensor circuit
11/10/1998US5835516 Semiconductor laser device and method of fabricating semiconductor laser device
11/10/1998US5835431 Method and apparatus for wafer test of redundant circuitry
11/10/1998US5835425 Repairable semiconductor memory array
11/10/1998US5835416 Flash-erasable semiconductor memory device having an improved reliability
11/10/1998US5835415 Flash EEPROM memory systems and methods of using them
11/10/1998US5835408 Flash-erasable semiconductor memory device having an improved reliability
11/10/1998US5835404 DNA optical storage device utilizing non-radiative energy transfer
11/10/1998US5835398 Flat NOR type mask ROM having off-cells disposed at every predetermined number of memory cells
11/10/1998US5835355 Electronic package
11/10/1998US5835337 Stacked capacitor having a corrugated electrode
11/10/1998US5835335 Unbalanced bipolar electrostatic chuck power supplies and methods thereof
11/10/1998US5835334 For attracting/holding an object with front and back surfaces
11/10/1998US5835333 Negative offset bipolar electrostatic chucks
11/10/1998US5835284 Catadioptric optical system and adjusting method
11/10/1998US5835275 For projecting an image of an object onto a substrate
11/10/1998US5835225 Surface properties detection by reflectance metrology
11/10/1998US5835221 Process for fabricating a device using polarized light to determine film thickness
11/10/1998US5835198 Articulated platform mechanism for laser pattern generation on a workpiece
11/10/1998US5835196 System and method for alignment of integrated circuits multiple layers
11/10/1998US5835177 For a display device
11/10/1998US5835172 Thin film transistor liquid crystal display with main gate electrode contacting subsidiary gate electrodes and method of fabricating
11/10/1998US5835141 Single-polysilicon CMOS active pixel image sensor
11/10/1998US5834974 Differential amplifier with reduced current consumption
11/10/1998US5834966 Integrated circuit sensing and digitally biasing the threshold voltage of transistors and related methods
11/10/1998US5834941 Mobile charge measurement using corona charge and ultraviolet light
11/10/1998US5834938 Nondestructive inspection apparatus with superconducting magnetic sensor
11/10/1998US5834915 Sustrate housing and docking system
11/10/1998US5834861 LSI for signal transmission
11/10/1998US5834850 Encapsulated semiconductor device having metal foil covering, and metal foil
11/10/1998US5834848 Electronic device and semiconductor package
11/10/1998US5834847 Completely buried contact holes
11/10/1998US5834846 Semiconductor device with contact structure and method of manufacturing the same
11/10/1998US5834845 For connecting conductive regions to conductive regions
11/10/1998US5834844 Semiconductor device having an element with circuit pattern thereon
11/10/1998US5834840 Net-shape ceramic processing for electronic devices and packages
11/10/1998US5834838 Pin array set-up device
11/10/1998US5834836 Multi-layer bottom lead package
11/10/1998US5834835 Semiconductor device having an improved structure for storing a semiconductor chip
11/10/1998US5834830 LOC (lead on chip) package and fabricating method thereof
11/10/1998US5834829 Energy relieving crack stop
11/10/1998US5834827 Gate electrode is alpha constructed tantalum that contains hydrogen or nitrogen
11/10/1998US5834826 Protection against adverse parasitic effects in junction-isolated integrated circuits
11/10/1998US5834825 Semiconductor device having spiral wiring directly covered with an insulating layer containing ferromagnetic particles
11/10/1998US5834824 Use of conductive particles in a nonconductive body as an integrated circuit antifuse
11/10/1998US5834823 Transistor with constant voltage diode
11/10/1998US5834820 Formed in a semiconductor substrate
11/10/1998US5834819 Semiconductor read-only memory device for permanent storage of multi-level coded data
11/10/1998US5834818 Structure for making sub-lithographic images by the intersection of two spacers
11/10/1998US5834817 Field effect transistor with a shaped gate electrode
11/10/1998US5834816 MOSFET having tapered gate electrode
11/10/1998US5834814 Semiconductor integrated circuit
11/10/1998US5834812 Edge stripped BESOI wafer
11/10/1998US5834811 Salicide process for FETs
11/10/1998US5834810 Asymmetrical vertical lightly doped drain transistor and method of forming the same
11/10/1998US5834809 MIS transistor semiconductor device
11/10/1998US5834808 Non-volatile semiconductor memory device
11/10/1998US5834807 Nonvolatile memory device having an improved integration and reduced contact failure
11/10/1998US5834806 Raised-bitline, contactless, trenched, flash memory cell
11/10/1998US5834805 Dynamic random access memory circuit array and memory cell
11/10/1998US5834804 Improved diffusion barrier or buffer layer
11/10/1998US5834802 Metal semiconductor field effect transistors having improved intermodulation distortion using different pinch-off voltages
11/10/1998US5834800 Heterojunction bipolar transistor having mono crystalline SiGe intrinsic base and polycrystalline SiGe and Si extrinsic base regions
11/10/1998US5834799 Semiconductor device assembly
11/10/1998US5834798 Semiconductor device containing semiconductor region formed in active layer on sidewall of contact opening
11/10/1998US5834797 Transistor having first and second gate electrodes
11/10/1998US5834796 Amorphous silicon thin film transistor and method of preparing same
11/10/1998US5834795 Test pattern for measuring line width of electrode and method for measuring the same
11/10/1998US5834793 Semiconductor devices
11/10/1998US5834786 High current ribbon beam ion implanter
11/10/1998US5834773 Method and apparatus for testing the function of microstructure elements
11/10/1998US5834769 Atomic beam pattern forming method using atomic beam holography
11/10/1998US5834767 For detecting a surface position of an object
11/10/1998US5834737 Heat treating apparatus
11/10/1998US5834691 Lead frame, its use in the fabrication of resin-encapsulated semiconductor device
11/10/1998US5834642 Downstream monitor for CMP brush cleaners
11/10/1998US5834531 Positive photoresists of hydroxystyrene-hydroxyvinylcyclo-hexane copolymer crosslinked with an aliphatic vinyl ether to provide acid-labile acetal and/or ketal protective groups; heat resistance; resolution, uv radiation
11/10/1998US5834405 Superconducting multilayer ceramic substrate
11/10/1998US5834377 In situ method for CMP endpoint detection
11/10/1998US5834375 Chemical-mechanical polishing planarization monitor
11/10/1998US5834374 Method for controlling tensile and compressive stresses and mechanical problems in thin films on substrates
11/10/1998US5834372 Pretreatment of semiconductor substrate
11/10/1998US5834371 Method and apparatus for preparing and metallizing high aspect ratio silicon semiconductor device contacts to reduce the resistivity thereof
11/10/1998US5834370 Manufacture of semiconductor device containing polycide electrode
11/10/1998US5834369 Marginless patterning process for forming metal interconnect layer
11/10/1998US5834368 Composite is subjected to first primary and secondary heat treatments in a nitrogen atmosphere and then to a second heat treatment after removal of metal nitride film
11/10/1998US5834367 Simplified process; time required for burying the contact holes is greatly reduced without remarkably increasing the contact resistance between the barrier metal layer and the lower wiring layer and the buried conductive substances
11/10/1998US5834366 Method for fabricating microbump interconnect for bare semiconductor dice
11/10/1998US5834363 Method of manufacturing semiconductor wafer, semiconductor wafer manufactured by the same, semiconductor epitaxial wafer, and method of manufacturing the semiconductor epitaxial wafer
11/10/1998US5834362 Method of making a device having a heteroepitaxial substrate
11/10/1998US5834361 Multi-layer structure for II-VI group compound semiconductor on an InP substrate and method for forming the same
11/10/1998US5834360 Etching forms undercut region that reduces the formation of a bird's beak and reduces the conductive channel for oxidants during oxidation step
11/10/1998US5834359 Method of forming an isolation region in a semiconductor substrate
11/10/1998US5834358 Isolation regions and methods of forming isolation regions
11/10/1998US5834357 Fabricating method of making a fin shaped capacitor
11/10/1998US5834356 Method of making high resistive structures in salicided process semiconductor devices
11/10/1998US5834355 Method for implanting halo structures using removable spacer
11/10/1998US5834354 Ultra high density NOR gate using a stacked transistor arrangement
11/10/1998US5834353 Method of making deep sub-micron meter MOSFET with a high permitivity gate dielectric
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