Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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12/29/1998 | US5854159 Alumina sintered bodies and method for producing the same |
12/29/1998 | US5854141 Inorganic seal for encapsulation of an organic layer and method for making the same |
12/29/1998 | US5854140 Method of making an aluminum contact |
12/29/1998 | US5854137 Method for reduction of polycide residues |
12/29/1998 | US5854136 Three-step nitride etching process for better critical dimension and better vertical sidewall profile |
12/29/1998 | US5854135 Optimized dry etching procedure, using an oxygen containing ambient, for small diameter contact holes |
12/29/1998 | US5854134 Passivation layer for a metal film to prevent metal corrosion |
12/29/1998 | US5854133 Method for manufacturing a semiconductor device |
12/29/1998 | US5854132 Method for exposing photoresist |
12/29/1998 | US5854131 Integrated circuit having horizontally and vertically offset interconnect lines |
12/29/1998 | US5854130 Method of forming multilevel interconnects in semiconductor devices |
12/29/1998 | US5854128 Method for reducing capacitive coupling between conductive lines |
12/29/1998 | US5854127 Method of forming a contact landing pad |
12/29/1998 | US5854126 Method for forming metallization in semiconductor devices with a self-planarizing material |
12/29/1998 | US5854125 Dummy fill patterns to improve interconnect planarity |
12/29/1998 | US5854124 Method for opening contacts of different depths in a semiconductor wafer |
12/29/1998 | US5854123 Method for producing semiconductor substrate |
12/29/1998 | US5854122 Epitaxial layer for dissolved wafer micromachining process |
12/29/1998 | US5854121 Semiconductor fabrication employing barrier atoms incorporated at the edges of a trench isolation structure |
12/29/1998 | US5854120 Semiconductor device manufacturing method |
12/29/1998 | US5854119 Robust method of forming a cylinder capacitor for DRAM circuits |
12/29/1998 | US5854117 Method of manufacturing a varicap diode, a varicap diode, a receiver device, and a TV receiver set |
12/29/1998 | US5854116 Semiconductor apparatus |
12/29/1998 | US5854115 Formation of an etch stop layer within a transistor gate conductor to provide for reduction of channel length |
12/29/1998 | US5854114 Data retention of EEPROM cell with shallow trench isolation using thicker liner oxide |
12/29/1998 | US5854113 Method for fabricating power transistor using silicon-on-insulator (SOI) wafer |
12/29/1998 | US5854112 Transistor isolation process |
12/29/1998 | US5854111 ROM device using a schuckly diode |
12/29/1998 | US5854110 Process fabricating semiconductor device having two ion-implantations carried out by using a shared photo-resist mask |
12/29/1998 | US5854109 Silicide process for manufacturing a mask ROM |
12/29/1998 | US5854108 Method and system for providing a double diffuse implant junction in a flash device |
12/29/1998 | US5854107 Method for forming capacitor of semiconductor device |
12/29/1998 | US5854106 Method of forming a data storage capacitor with a wide electrode area for dynamic random access memory |
12/29/1998 | US5854105 Method for making dynamic random access memory cells having double-crown stacked capacitors with center posts |
12/29/1998 | US5854104 Process for fabricating nonvolatile semiconductor memory device having a ferroelectric capacitor |
12/29/1998 | US5854103 Manufacturing method of self-aligned silicide load for static random access memory |
12/29/1998 | US5854102 Vertical diode structures with low series resistance |
12/29/1998 | US5854101 Low mask count CMOS process with inverse-T gate LDD structure |
12/29/1998 | US5854100 Method of forming a new bipolar/CMOS pixel for high resolution imagers |
12/29/1998 | US5854099 DMOS process module applicable to an E2 CMOS core process |
12/29/1998 | US5854097 Method of manufacturing a semiconductor device |
12/29/1998 | US5854096 Process for fabricating semiconductor device |
12/29/1998 | US5854095 Dual source gas methods for forming integrated circuit capacitor electrodes |
12/29/1998 | US5854094 Process for manufacturing metal plane support for multi-layer lead frames |
12/29/1998 | US5854093 Direct attachment of silicon chip to circuit carrier |
12/29/1998 | US5854089 Semiconductor device by selectively controlling growth of an epitaxial layer without a mask |
12/29/1998 | US5854087 Method of manufacturing an optical semiconductor device |
12/29/1998 | US5854086 Method for manufacturing planar field effect transistors and planar high electron mobility transistors |
12/29/1998 | US5854085 Multi-layer tab tape having distinct signal, power and ground planes, semiconductor device assembly employing same, apparatus for and method of assembling same |
12/29/1998 | US5853948 Positive photoresist compositions and multilayer resist materials using the same |
12/29/1998 | US5853947 Quinonediazide positive photoresist utilizing mixed solvent consisting essentially of 3-methyl-3-methoxy butanol and propylene glycol alkyl ether acetate |
12/29/1998 | US5853925 Lateral diffusion confirming pattern and a method of measuring a lateral diffusion |
12/29/1998 | US5853922 Phase shifting mask, manufacturing method thereof, and exposure method using such a phase shifting mask |
12/29/1998 | US5853921 Methods of fabricating phase shift masks by controlling exposure doses |
12/29/1998 | US5853840 Dummy wafer |
12/29/1998 | US5853812 Method and apparatus for processing substrates |
12/29/1998 | US5853808 Method of using siloxane polymers |
12/29/1998 | US5853804 Gas control technique for limiting surging of gas into a CVD chamber |
12/29/1998 | US5853803 Resist processing method and apparatus |
12/29/1998 | US5853771 Molding die set and mold package |
12/29/1998 | US5853607 CVD processing chamber |
12/29/1998 | US5853604 Method of planarizing an insulating layer in a semiconductor device |
12/29/1998 | US5853603 Manufacturing process of a microelectronic device containing, on a substrate, a plurality of interconnected elements |
12/29/1998 | US5853602 Method of dry etching for patterning refractory metal layer improved in etching rate, anisotropy and selectivity to silicon oxide |
12/29/1998 | US5853533 Wafer slice base peeling system |
12/29/1998 | US5853532 Wafer ring supply and return device |
12/29/1998 | US5853523 Plasma-etching electrode plate |
12/29/1998 | US5853522 Drip chemical delivery apparatus |
12/29/1998 | US5853521 Multi-cathode electron beam plasma etcher |
12/29/1998 | US5853517 Method for coining solder balls on an electrical circuit package |
12/29/1998 | US5853500 Method for fabricating thin films of barium strontium titanate without exposure to oxygen at high temperatures |
12/29/1998 | US5853496 Transfer machine, transfer method, cleaning machine, and cleaning method |
12/29/1998 | US5853491 Method for reducing metal contamination of silicon wafers during semiconductor manufacturing |
12/29/1998 | US5853486 Treatment system and treatment apparatus with multi-stage carrier storage chambers |
12/29/1998 | US5853484 Gas distribution system and method for chemical vapor deposition apparatus |
12/29/1998 | US5853483 Substrate spin treating method and apparatus |
12/29/1998 | US5853480 Apparatus for fabricating a single-crystal semiconductor |
12/29/1998 | US5853479 Apparatus for drawing single crystals by the czochralski method |
12/29/1998 | US5853478 Method for forming crystal and crystal article obtained by said method |
12/29/1998 | US5853471 Composition for anti-reflection coating |
12/29/1998 | US5853317 Polishing pad and polishing apparatus having the same |
12/29/1998 | US5853298 Initiator connector for airbag systems |
12/29/1998 | US5853284 Notched wafer aligning apparatus |
12/29/1998 | US5853214 Aligner for a substrate carrier |
12/29/1998 | US5853176 Vacuum chamber and method of manufacturing the vacuum chamber |
12/29/1998 | US5852871 Method of making raised contacts on electronic components |
12/29/1998 | US5852870 Method of making grid array assembly |
12/29/1998 | CA2143522C Method for manufacturing a grain boundary type josephson junction device |
12/29/1998 | CA2058143C Direct microcircuit decoupling |
12/26/1998 | CA2238158A1 Nozzle-injector for arc plasma deposition apparatus |
12/24/1998 | DE19827454A1 CMOS logic circuit, e.g. inverter or NAND=gate |
12/24/1998 | DE19826735A1 Power supply circuit for integrated circuit with several operating frequency modes |
12/24/1998 | DE19825266A1 Semiconductor device capacitor production |
12/24/1998 | DE19803479A1 Polysilicon thin film transistor |
12/24/1998 | DE19801999A1 Semiconductor device, e.g. IGBT |
12/24/1998 | DE19757889A1 Semiconductor memory device, e.g. DRAM, with test mode |
12/24/1998 | DE19756409A1 Semiconductor component e.g. transistor production process |
12/24/1998 | DE19756185A1 Coupling contact structure for integrated circuit pack |
12/24/1998 | DE19727693A1 Verfahren und Vorrichtung zur Herstellung elektrisch leitfähiger Durchgänge in Halbleiter-Bauelementen Method and device for producing electrically conductive passages in semiconductor devices |
12/24/1998 | DE19726665A1 In situ end point determination during chemical-mechanical polishing |