Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
03/2000
03/15/2000EP0986172A2 An integrated acoustic thin film resonator
03/15/2000EP0986106A1 Article comprising an inductor
03/15/2000EP0986102A2 Polycrystalline silicon carbide ceramic wafer and substrate
03/15/2000EP0986101A2 DRAM trench capacitor production method
03/15/2000EP0986100A1 Method for manufacturing electronic devices comprising non-volatile memory cells and LV transistors, with salicided junctions
03/15/2000EP0986098A1 Soldering material for die bonding
03/15/2000EP0986097A2 Method for reclaiming wafer substrate and polishing solution composition for reclaiming wafer substrate
03/15/2000EP0986096A2 Substrate-cleaning method and substrate-cleaning solution
03/15/2000EP0986095A2 Layered structure with a material layer and a diffusion barrier layer disposed at the grain boundary of the material layer and process for fabricating the same
03/15/2000EP0986094A2 Exposure method and device manufacturing method using the same
03/15/2000EP0986091A2 Time of flight energy measurement apparatus for an ion beam implanter
03/15/2000EP0986072A2 Process for treatment of a resist
03/15/2000EP0986067A2 Nonvolatile semiconductor memory
03/15/2000EP0985977A1 Integrated circuit device fabrication utilizing latent imagery
03/15/2000EP0985976A2 Illumination apparatus, projection exposure apparatus and projection exposure method
03/15/2000EP0985975A1 Positive-working chemical-amplification photoresist composition
03/15/2000EP0985643A2 Method for producing synthetic quartz glass for the use in ArF excimer laser lithography
03/15/2000EP0985513A2 Method of producing epoxy resin-encapsulated semiconductor device
03/15/2000EP0985494A2 Method of grinding semiconductor articles
03/15/2000EP0985232A2 Electronic devices comprising thin-film transistors
03/15/2000EP0985231A1 Lithographically defined microelectronic contact structures
03/15/2000EP0985229A1 Method for mos transistor isolation
03/15/2000EP0985228A1 Semiconductor device comprising a glass supporting body onto which a substrate with semiconductor elements and a metallization is attached by means of an adhesive
03/15/2000EP0985227A1 Method of manufacturing a patterned array of solder bumps
03/15/2000EP0985226A1 Method for manufacturing electric modules, and the electric module
03/15/2000EP0985225A2 Integrated circuit, components thereof and manufacturing method
03/15/2000EP0985224A1 Device and method for transporting separate substrates
03/15/2000EP0985154A1 Broadband impedance matching probe
03/15/2000EP0985060A1 Secondary edge reflector for horizontal reactor
03/15/2000EP0985059A1 Composition and method for polishing a composite comprising titanium
03/15/2000EP0985058A2 Stress tunable tantalum and tantalum nitride films
03/15/2000EP0985021A1 Non-corrosive stripping and cleaning composition
03/15/2000EP0985007A1 Oxygen-containing phosphor powders, methods for making phosphor powders and devices incorporating same
03/15/2000EP0984846A4 Polymeric polishing pad having photolithographically induced surface pattern(s) and methods relating thereto
03/15/2000EP0984846A1 Polymeric polishing pad having photolithographically induced surface pattern(s) and methods relating thereto
03/15/2000EP0865716B1 A high-frequency plasma process wherein the plasma is excited by an inductive structure in which the phase and anti-phase portions of the capacitive currents between the inductive structure and the plasma are balanced
03/15/2000EP0789981A4 Thermal reactor optimization
03/15/2000EP0764352A4 Microelectronic contacts and assemblies
03/15/2000EP0701499B1 Improved polishing pads and methods for their use
03/15/2000CN2369355Y Sealing adhesive device for semiconductor device
03/15/2000CN1247638A II-VI semiconductor device with bete buffer layer
03/15/2000CN1247636A Direct contact die attach
03/15/2000CN1247635A Via structure
03/15/2000CN1247633A Epoxy bleeding inhibitor and method of preventing epoxy bleeding
03/15/2000CN1247632A Well boosting threshold voltage rollup
03/15/2000CN1247486A Method for passivation of metallization layer
03/15/2000CN1247385A Semiconductor memory and its mfg. method
03/15/2000CN1247384A Semiconductor device and making method thereof
03/15/2000CN1247383A Buried wiring structure and its mfg. method
03/15/2000CN1247382A Surface protective sheet for chip back grinding and its application method
03/15/2000CN1247380A Abrasive sheet
03/15/2000CN1247107A Matrix cleaning method and its cleaning liquid
03/15/2000CN1050448C Highly intergrated semiconductor wiring structure and method for mfg. same
03/15/2000CN1050446C Method for preventing moisture from being absorbed into impurity-contained insulating layer
03/15/2000CN1050445C Method for prepn. of cubic nitriding boron single crystal-diamond thin film neterogeny P-N junction
03/15/2000CN1050444C Temp. controlling method for semiconductor device of power-ageing equipment
03/15/2000CN1050423C Visual inspection support appts. substrate inspection appts.
03/14/2000US6038682 Fault tolerant data processing system fabricated on a monolithic substrate
03/14/2000US6038525 Process control for pulsed laser deposition using raman spectroscopy
03/14/2000US6038382 Method and apparatus for optimizing cell allocation
03/14/2000US6038180 Semiconductor memory capable of detecting memory cells with small margins as well as sense amplifier
03/14/2000US6038172 Memory device with dummy cell transistor
03/14/2000US6038171 Field emission erasable programmable read-only memory
03/14/2000US6038170 Semiconductor integrated circuit device including a plurality of divided sub-bit lines
03/14/2000US6038164 SRAM cell configuration and method for its fabrication
03/14/2000US6038163 Capacitor loaded memory cell
03/14/2000US6038161 Ferroelectric memory
03/14/2000US6038160 Ferroelectric semiconductor memory device
03/14/2000US6038158 Semiconductor memory
03/14/2000US6038136 Chip package with molded underfill
03/14/2000US6038133 Circuit component built-in module and method for producing the same
03/14/2000US6038029 Method and apparatus for alignment of a wafer
03/14/2000US6038020 Mask pattern verification apparatus employing super-resolution technique, mask pattern verification method employing super-resolution technique, and medium with program thereof
03/14/2000US6038019 Method for monitoring defects of semiconductor device
03/14/2000US6038018 Substrate inspecting apparatus, substrate inspecting system having the same apparatus and substrate inspecting method
03/14/2000US6038015 Electron-beam-projection-exposure apparatus with integrated mask inspection and cleaning portions
03/14/2000US6038013 Vibration isolator and exposure apparatus
03/14/2000US6038008 Method of making LCD having roughened steps of the protection layer
03/14/2000US6037967 Short wavelength pulsed laser scanner
03/14/2000US6037885 Digital/analog converter using a floating gate MOS neuron transistor with capacitive coupling
03/14/2000US6037833 Generator for generating voltage proportional to absolute temperature
03/14/2000US6037826 Control of saturation of integrated bipolar transistors
03/14/2000US6037813 Semiconductor device capable of selecting operation mode based on clock frequency
03/14/2000US6037794 Semiconductor device testing apparatus and testing method thereof
03/14/2000US6037793 Inspecting method and apparatus for semiconductor integrated circuit
03/14/2000US6037781 Measurement of electrical characteristics of semiconductor wafer
03/14/2000US6037718 Display unit having transistor of organic semiconductor stacked on organic electroluminescence element
03/14/2000US6037680 Stage apparatus and linear motor, and exposure apparatus and device production method using the stage apparatus
03/14/2000US6037670 Alignment mark and structure covering the same
03/14/2000US6037668 Integrated circuit having a support structure
03/14/2000US6037667 Socket assembly for use with solder ball
03/14/2000US6037666 Semiconductor integrated circuit having standard and custom circuit regions
03/14/2000US6037665 Mounting assembly of integrated circuit device and method for production thereof
03/14/2000US6037664 Dual damascene interconnect structure using low dielectric constant material for an inter-level dielectric layer
03/14/2000US6037663 Ohmic electrode structure for Inx Ga1-x As layer
03/14/2000US6037662 Chip scale package
03/14/2000US6037657 Carrier, semiconductor device, and method of their mounting
03/14/2000US6037656 Semiconductor integrated circuit device having short signal paths to terminals and process of fabrication thereof
03/14/2000US6037651 Semiconductor device with multi-level structured insulator and fabrication method thereof
03/14/2000US6037648 Semiconductor structure including a conductive fuse and process for fabrication thereof
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