| Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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| 02/08/2001 | WO2000052484A3 Interface independent test system |
| 02/08/2001 | WO1999043448A8 Methods of wet processing electronic components using process liquids with controlled levels of gases |
| 02/08/2001 | DE19956247A1 Chip component, useful for a memory chip stack, has chip contact pads connected through an adhesive dielectric strip to mounting element conductor lines and solder balls connected to mounting element contact vias |
| 02/08/2001 | DE19936005A1 FETs, especially for h.f. components, are produced by a low temperature self-aligned dummy gate sidewall-spaced process allowing various gate designs |
| 02/08/2001 | DE19935131A1 Verfahren zur Beseitigung von Redepositionen auf einem Wafer und Wafer, der frei von Redepositionen ist A method for removing redepositions on a wafer and wafer that is free of redepositions |
| 02/08/2001 | DE19932357A1 Preparation of samples of synthetic particles e.g. for analytical scanning electron or optical microscopy involves depositing material on oxide-coated silicon wafer structurized as required, removing excess to leave islands and separation |
| 02/08/2001 | DE19927748A1 Transport unit for electronic components incorporates at least one cutout which serves for accommodation of such components, and is provided at least in parts with a coating preventing contamination |
| 02/08/2001 | DE19927284A1 Making connection in highly-integrated microelectronic structure forms insulated base, etches opening down to contact area, and subsequently re-insulates, trenches and fills with conductive material |
| 02/08/2001 | DE19911463C1 Leseverstärkeranordnung mit Feldeffekttransistor mit kurzer Kanallänge und einstellbarer Einsatzspannung Sense amplifier arrangement with field-effect transistor with a short channel length, and adjustable threshold voltage |
| 02/08/2001 | DE10035976A1 Highly reliable test connection structure for large numbers of components on semiconductor wafer or components on PCB, is machine-assembled with great precision in silicon |
| 02/08/2001 | DE10024634A1 Electron beam patterning apparatus for use in manufacture of semiconductor device, sets up adjusting value of shaping lens such that detected position slippage of electron beam is minimum |
| 02/08/2001 | DE10022770A1 Integrated circuit current read-amplifier design, has output voltage level control circuit provided with first and second resistors and NMOS transistor connected to their point |
| 02/08/2001 | CA2345739A1 Method of dicing semiconductor wafer into chips, and structure of groove formed in dicing area |
| 02/08/2001 | CA2339813A1 Transport system with integrated transport carrier and directors |
| 02/07/2001 | EP1075168A1 Method for generating an elementary plasma in order to produce a uniform plasma for a target surface and device for generating such a plasma |
| 02/07/2001 | EP1075028A2 Photoelectric conversion device and process for its fabrication |
| 02/07/2001 | EP1075027A2 Contacting of metal interconnections of integrated semiconductor chips |
| 02/07/2001 | EP1075025A2 Electronic device and method of fabricating the same |
| 02/07/2001 | EP1075023A1 Unprocessed material storing device and carry-in/out stage |
| 02/07/2001 | EP1075022A1 Offset edges mold for plastic packaging of integrated semiconductor devices |
| 02/07/2001 | EP1075021A1 Method of making a high density module made from electronic components, modules, encapsulations and module so obtained |
| 02/07/2001 | EP1075019A1 Integrated circuit device and its manufacturing method |
| 02/07/2001 | EP1075018A1 Surface treating agent for micromachining and method for surface treatment |
| 02/07/2001 | EP1075016A2 Self-aligned precise high sheet RHO resistor for mixed-signal application |
| 02/07/2001 | EP1075015A2 A method and apparatus for thermal control of a semiconductor substrate |
| 02/07/2001 | EP1074992A1 Magnetic random access memory device |
| 02/07/2001 | EP1074844A2 Testing integrated circuits |
| 02/07/2001 | EP1074643A1 Single-crystal silicon wafer having few crystal defects and method for manufacturing the same |
| 02/07/2001 | EP1074642A2 Method of crystallizing a semiconductor thin film by laser irradiation |
| 02/07/2001 | EP1074639A1 Fabrication of clad hollow cathode magnetron sputter targets |
| 02/07/2001 | EP1074571A2 Liquid potting composition |
| 02/07/2001 | EP1074489A1 Arrangement and method for manually moving a container for storing objects through an environment |
| 02/07/2001 | EP1074366A1 Saw wire and abrasive cutting method for brittle workpieces |
| 02/07/2001 | EP1074343A1 Polishing method and apparatus |
| 02/07/2001 | EP1074287A2 Trap apparatus |
| 02/07/2001 | EP1074051A1 VERTICAL BIPOLAR TRANSISTOR, IN PARTICULAR WITH SiGe BASE HETEROJUNCTION AND METHOD FOR MAKING SAME |
| 02/07/2001 | EP1074047A1 Method for fabricating an electrically addressable silicon-on-sapphire light valve |
| 02/07/2001 | EP1074046A1 Elimination of poly cap for easy poly1 contact for nand floating gate memory |
| 02/07/2001 | EP1074045A1 Method for forming a multi-layered aluminum-comprising structure on a substrate |
| 02/07/2001 | EP1074044A1 Method for producing an soi (silicon on insulator) wafer for low-impedance high-voltage semiconductor components |
| 02/07/2001 | EP1074043A1 Process for ashing organic materials from substrates |
| 02/07/2001 | EP1074042A1 Synchronous multiplexed near zero overhead architecture for vacuum processes |
| 02/07/2001 | EP1074041A2 A high temperature multi-layered alloy heater assembly and related methods |
| 02/07/2001 | EP1074040A1 Method for using a hard mask for critical dimension growth containment |
| 02/07/2001 | EP1074039A1 Gate insulator comprising high and low dielectric constant parts |
| 02/07/2001 | EP1073917A2 Method and device for optically examining structured surfaces of objects |
| 02/07/2001 | EP1073877A1 Endpoint detection in chemical mechanical polishing (cmp) by substrate holder elevation detection |
| 02/07/2001 | EP1073876A1 Measuring a diffracting structure, broadband, polarized, ellipsometric, and an underlying structure |
| 02/07/2001 | EP1073779A1 Reduced impedance chamber |
| 02/07/2001 | EP1073777A2 Film deposition system |
| 02/07/2001 | EP1042808A4 Reduced capacitance transistor with electro-static discharge protection structure and method for forming the same |
| 02/07/2001 | EP0975731A4 Ethylenediaminetetraacetic acid or its ammonium salt semiconductor process residue removal composition and process |
| 02/07/2001 | CN1283308A Semiconductor integrated circuit |
| 02/07/2001 | CN1283306A GaN signale crystalline substrate and method of producing the same |
| 02/07/2001 | CN1283155A Method for minimizing critical dimension growth of feature on semiconductor wafer |
| 02/07/2001 | CN1282983A Manufacturing method of semi-conductor device |
| 02/07/2001 | CN1282982A Manufacturing method of semi-conductor device |
| 02/07/2001 | CN1282981A 湿处理装置 Wet processing device |
| 02/07/2001 | CN1282980A Method of manufacturing semi-conductor device |
| 02/07/2001 | CN1282963A Magnetic storage structure possessing improved half selection plentiful quantity |
| 02/07/2001 | CN1282889A Composition used for forming inorganic envelope and method to form inorganic envelope |
| 02/07/2001 | CN1282801A Chemical vapour phase deposition equipment and method of synthesizing nanometer pipe using said equipment |
| 02/07/2001 | CN1282775A Chemicomechanically grinding composition and method |
| 02/07/2001 | CN1282645A Nickel alloy film used for reducting the formation of compound between metals in soldering flux |
| 02/07/2001 | CN1061785C Multi-layer interlined structure for integrated circuit and manfacturing method thereof |
| 02/07/2001 | CN1061784C 树脂密封型半导体器件 Resin-sealed type semiconductor device |
| 02/07/2001 | CN1061783C Method for manufacturing semiconductor device |
| 02/07/2001 | CN1061782C Wiring structure of semiconductor device and method for manufacturing the same |
| 02/07/2001 | CN1061705C Precision control oxygen precipitation in silicone |
| 02/07/2001 | CN1061635C Method for forming boron phosphorous silicate glass film |
| 02/07/2001 | CA2314813A1 Apparatus monitoring the deposition of a liquid-to-pasty medium on a substrate |
| 02/06/2001 | US6185707 IC test software system for mapping logical functional test data of logic integrated circuits to physical representation |
| 02/06/2001 | US6185511 Method to accurately determine classification codes for defects during semiconductor manufacturing |
| 02/06/2001 | US6185472 Semiconductor device manufacturing method, manufacturing apparatus, simulation method and simulator |
| 02/06/2001 | US6185370 Heating apparatus for heating an object to be processed |
| 02/06/2001 | US6185324 Semiconductor failure analysis system |
| 02/06/2001 | US6185322 Inspection system and method using separate processors for processing different information regarding a workpiece such as an electronic device |
| 02/06/2001 | US6185144 Semiconductor memory device with reduced power consumption and stable operation in data holding state |
| 02/06/2001 | US6185143 Magnetic random access memory (MRAM) device including differential sense amplifiers |
| 02/06/2001 | US6185138 Method and apparatus for testing random access memory devices |
| 02/06/2001 | US6185120 Semiconductor memory device |
| 02/06/2001 | US6185085 System for transporting and electrostatically chucking a semiconductor wafer or the like |
| 02/06/2001 | US6184986 Depositing a material of controlled, variable thickness across a surface for planarization of that surface |
| 02/06/2001 | US6184976 Apparatus and method for measuring an aerial image using transmitted light and reflected light |
| 02/06/2001 | US6184974 Apparatus and method for evaluating a target larger than a measuring aperture of a sensor |
| 02/06/2001 | US6184972 Substrate transport apparatus, substrate holding apparatus and substrate processing apparatus |
| 02/06/2001 | US6184970 Master plate transporting system |
| 02/06/2001 | US6184966 Semiconductor device and method for producing the same |
| 02/06/2001 | US6184963 TFT active matrix LCD devices employing two superposed conductive films having different dimensions for the scanning signal lines |
| 02/06/2001 | US6184960 Method of making a reflective type LCD including providing a protective metal film over a connecting electrode during at least one portion of the manufacturing process |
| 02/06/2001 | US6184946 Active matrix liquid crystal display |
| 02/06/2001 | US6184945 Liquid crystal display apparatus in which electrode film forming capacitor in cooperation with pixel electrode is connected to gate wiring via connecting path |
| 02/06/2001 | US6184927 Methods of forming ferroelectric capacitors having a diffusion barrier layer |
| 02/06/2001 | US6184755 Article comprising a variable inductor |
| 02/06/2001 | US6184702 Crosstalk prevention circuit |
| 02/06/2001 | US6184699 Photolithographically patterned spring contact |
| 02/06/2001 | US6184697 Semiconductor integrated circuit testing apparatus with reduced installation area |
| 02/06/2001 | US6184686 Contamination and residuals inspection system |
| 02/06/2001 | US6184676 Cooling system for test head |
| 02/06/2001 | US6184625 Ion beam processing apparatus for processing work piece with ion beam being neutralized uniformly |