Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
02/2001
02/22/2001DE10036001A1 Vorrichtung und Verfahren zur Waferheizung Apparatus and method for wafer heating
02/22/2001DE10032311A1 Non-volatile ferroelectric memory comprises partial word lines, bit lines that cut the partial word lines, source/drain impurity regions formed on both sides of the word lines, and ferroelectric capacitors
02/22/2001DE10031626A1 Trench structure used in the production of MOSFETs comprises a trench formed in a substrate, a dielectric material covering a wall of the trench to form a dielectric layer
02/22/2001DE10031605A1 Liquid processing method used in the production of a semiconductor device comprises adding liquid to the object to be processed, contacting with a treatment fluid and removing the treatment fluid
02/22/2001DE10027132A1 Method and system of multi-band UV illumination of wafers for optical test and measurement systems employing microscopes with wafer images processed using special data processing algorithms
02/22/2001DE10027091A1 Negativ arbeitende Resistzusammensetzungen des chemischen Verstärkungstyps Negative-working resist compositions of chemical amplification type
02/22/2001DE10024361A1 Semiconductor device used as a DRAM of a capacitor-over-bitline has a lower insulating layer covering source/drain regions, an upper insulating layer and storage node contacts
02/22/2001DE10002639A1 Bandträger für einen BGA und eine Halbleitervorrichtung, die diesen benutzt Band carrier for BGA and a semiconductor device using this
02/22/2001CA2378793A1 Polishing system with stopping compound and method of its use
02/22/2001CA2378790A1 Polishing system and method of its use
02/22/2001CA2378771A1 Chemical mechanical polishing systems and methods for their use
02/21/2001EP1077494A2 Heterojunction bipolar transistor and method for fabricating the same
02/21/2001EP1077490A1 Improvements in or relating to integrated circuit dies
02/21/2001EP1077487A2 Trench capacitor DRAM cell with vertical transistor
02/21/2001EP1077486A1 Semiconductor device
02/21/2001EP1077485A2 Method to deposit a platinum seed layer for use in selective copper plating
02/21/2001EP1077484A2 Barrier layer for electroplating processes
02/21/2001EP1077483A2 Method of making an integrated circuit device having a planar interlevel dielectric layer
02/21/2001EP1077482A2 Semiconductor contacting device
02/21/2001EP1077481A2 Etching aluminium over refractory metal with successive plasmas
02/21/2001EP1077480A1 Method and apparatus to enchance properties of Si-O-C low K films
02/21/2001EP1077479A1 Post-deposition treatment to enchance properties of Si-O-C low K film
02/21/2001EP1077478A2 Method of making ferroelectric thin film, ferroelectric capacitor, ferroelectric memory and method for fabricating ferroelectric memory
02/21/2001EP1077477A1 Surface treatment of C-doped Si02 film to enhance film stability during 02 ashing
02/21/2001EP1077476A2 Oxygen free plasma stripping process
02/21/2001EP1077475A2 Method of micromachining a multi-part cavity
02/21/2001EP1077474A2 Backside etching in a scrubber
02/21/2001EP1077473A2 Method and apparatus for cleaning a surface of a semiconductor wafer
02/21/2001EP1077472A2 Etching apparatus
02/21/2001EP1077381A2 Probe card and method of testing wafer having a plurality of semiconductor devices
02/21/2001EP1077274A1 Lid cooling mechanism and method for optimized deposition of low-k dielectric using tri methylsilane-ozone based processes
02/21/2001EP1077243A2 Film adhesive composition for electronic packaging
02/21/2001EP1077241A2 Composition for use in a chemical-mechanical planarization process
02/21/2001EP1077240A1 Aqueous dispersion for chemical mechanical polishing
02/21/2001EP1077111A1 Method and tool for abrasive machining of a substantially flat surface
02/21/2001EP1077108A1 Polishing method and polishing apparatus
02/21/2001EP1076930A1 Surface acoustic wave device package and method
02/21/2001EP1076916A1 Flash memory cell with self-aligned gates and fabrication process
02/21/2001EP1076914A1 Electrostatic chuck formed by integral ceramic and metal sintering
02/21/2001EP1076913A1 Flip chip with integrated flux, mask and underfill
02/21/2001EP1076911A1 Method and apparatus for ionized physical vapor deposition
02/21/2001EP1076906A1 Lighting system, especially for extreme ultraviolet lithography
02/21/2001EP1076835A1 Broadband diffractive diffuser and associated methods
02/21/2001EP1076826A1 Method for producing micromechanical components
02/21/2001EP1076814A1 Chemical-mechanical-planarization (cmp) slurry quality control process and particle size distribution measuring systems
02/21/2001EP1076732A1 Injector for reactor
02/21/2001EP1076730A1 A method of etching an opening
02/21/2001EP1076500A1 Tiltable z-axis platform based on uni-directional tilt platform
02/21/2001CN1285007A Method for selectively depositing bismuth based ferroelectric films
02/21/2001CN1285006A Free floating shield and semiconductor processing system
02/21/2001CN1284790A Surface acoustic wave device suitable for installing flip-chip
02/21/2001CN1284748A Semiconductor device having nitrogen gate containing insulating film and manufacturing method
02/21/2001CN1284747A Semiconductor device and method for manufacture of the same
02/21/2001CN1284745A Manufacture of dielectric layer
02/21/2001CN1284744A Wafer defect detecting and characteristics analyzing method
02/21/2001CN1284743A Method of manufacturing transistor for semiconductor device
02/21/2001CN1284742A Method for manufacturing semiconductor device with semiconductor layer
02/21/2001CN1284741A Laser device, laser annealing method and method for manufacturing semiconductor device
02/21/2001CN1284740A Method for electronic beam exposing and method for maaufacture of semiconductor device
02/21/2001CN1284694A Manufacture of electro-optical device
02/21/2001CN1284613A Collecting device
02/21/2001CN1284526A Film adhesion agent composition for electronic encapsulation
02/21/2001CN1062233C Wafer shipper
02/20/2001USRE37059 Wiring pattern of semiconductor integrated circuit device
02/20/2001US6192510 Method of preparing a partial one-shot electron beam exposure mask and method of direct-writing patterns by use of a partial one-shot electron beam exposure mask
02/20/2001US6192496 System for verifying signal timing accuracy on a digital testing device
02/20/2001US6192330 Method and apparatus for string model simulation of a physical semiconductor process including use of specific depth angles and segment list with removal of redundant segments
02/20/2001US6192291 Method of controlling semiconductor fabricating equipment to process wafers of a single lot individually
02/20/2001US6192290 System and method of manufacturing semicustom integrated circuits using reticle primitives from a library and interconnect reticles
02/20/2001US6192289 Method and apparatus for analyzing cuts
02/20/2001US6192287 Method and apparatus for fault detection and control
02/20/2001US6192000 Semiconductor memory device having decreased layout area and method of manufacturing the same
02/20/2001US6191994 Semiconductor device
02/20/2001US6191990 Semiconductor integrated circuit device having stabilizing capacitors connected between power lines of main amplifiers
02/20/2001US6191980 Single-poly non-volatile memory cell having low-capacitance erase gate
02/20/2001US6191978 Non-volatile semiconductor memory device
02/20/2001US6191975 Non-volatile NAND type semiconductor memory device with stacked gate memory cells and a stacked gate select transistor
02/20/2001US6191967 Voltage supply device having self-testing circuit
02/20/2001US6191962 Step-up power supply circuit and semiconductor integrated circuit device
02/20/2001US6191952 Compliant surface layer for flip-chip electronic packages and method for forming same
02/20/2001US6191946 Heat spreader with excess solder basin
02/20/2001US6191880 Radial polarization-rotating optical arrangement and microlithographic projection exposure system incorporating said arrangement
02/20/2001US6191864 Method and apparatus for detecting the endpoint in chemical-mechanical polishing of semiconductor wafers
02/20/2001US6191858 Position detecting method and apparatus using optical system with oblique optical axes
02/20/2001US6191844 Scanning exposure apparatus in which light exposure is a function of the speed of the mask or substrate stage
02/20/2001US6191843 Exposure device, method of making and using same, and objects exposed by the exposure device
02/20/2001US6191817 Charge transfer device and method of driving the charge transfer device
02/20/2001US6191647 Low noise integrated circuit device for reducing a noise on LSI power supply nets to supply electric charges required to operate IC
02/20/2001US6191604 Integrated circuit testing device
02/20/2001US6191598 High resolution analytical probe station
02/20/2001US6191596 Method for detecting a contact position between an object to be measured and measuring pins
02/20/2001US6191498 Power-supplying device for generating different voltage outputs
02/20/2001US6191494 Semiconductor device and method of producing the same
02/20/2001US6191493 Resin seal semiconductor package and manufacturing method of the same
02/20/2001US6191491 Semiconductor integrated circuit device
02/20/2001US6191489 Micromechanical layer stack arrangement particularly for flip chip or similar connections
02/20/2001US6191488 Flip chip type semiconductor package and method of injecting resin into device thereof
02/20/2001US6191487 Semiconductor and flip chip packages and method having a back-side connection
02/20/2001US6191485 Semiconductor device
02/20/2001US6191484 Method of forming planarized multilevel metallization in an integrated circuit