Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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02/28/2001 | CN1285628A Electric connector and method of making same |
02/28/2001 | CN1285620A Semiconductor device |
02/28/2001 | CN1285618A Improved technology for buried stripe self oriented to deep storage channel |
02/28/2001 | CN1285617A Method for making ferroelectric film, ferroelectric capacitor, ferroelectric memory and making method thereof |
02/28/2001 | CN1285616A Technology for making capacitor buried chip in channel dynamic RAM |
02/28/2001 | CN1285615A Probe card for testing semiconductor chip with many semiconductor device and method thereof |
02/28/2001 | CN1285614A Method for preparation of printed IC board |
02/28/2001 | CN1285613A Electronic element without lead pin and method for making the same |
02/28/2001 | CN1285612A Electronic Beam exposure mask, Exposure method and equipment and method for making semiconductor device |
02/28/2001 | CN1285611A Semiconductor device and making method thereof |
02/28/2001 | CN1285537A CPU heat-sink for personal computer |
02/28/2001 | CN1285526A Electro-optical device |
02/28/2001 | CN1285509A Method and apparatus for detecting micro-scrape |
02/28/2001 | CN1285423A Laser device and laser annealing method |
02/28/2001 | CN1285384A Process for preparation of metal oxide slurry adaptable to chemical-mechanical polishing of semiconductor |
02/28/2001 | CN1285261A Abrading tool |
02/28/2001 | CN1285253A Electric arc type ion plating device |
02/28/2001 | CN1062680C Method for making semiconductor device |
02/28/2001 | CN1062679C Method for forming element isolating film of semiconductor device |
02/27/2001 | US6195790 Electrical parameter evaluation system, electrical parameter evaluation method, and computer-readable recording medium for recording electrical parameter evaluation program |
02/27/2001 | US6195787 Layout designing method for semiconductor integrated circuits |
02/27/2001 | US6195786 Constrained register sharing technique for low power VLSI design |
02/27/2001 | US6195621 Non-invasive system and method for diagnosing potential malfunctions of semiconductor equipment components |
02/27/2001 | US6195619 System for aligning rectangular wafers |
02/27/2001 | US6195593 Reusable modules for complex integrated circuit devices |
02/27/2001 | US6195306 Semiconductor device |
02/27/2001 | US6195305 Semiconductor integrated circuit device |
02/27/2001 | US6195299 Semiconductor memory device having an address exchanging circuit |
02/27/2001 | US6195298 Semiconductor integrated circuit capable of rapidly rewriting data into memory cells |
02/27/2001 | US6195292 Semiconductor memory with floating gate type FET |
02/27/2001 | US6195264 Laminate substrate having joining layer of photoimageable material |
02/27/2001 | US6195263 Electronic control unit |
02/27/2001 | US6195258 Thermal board used for bonding wires in semiconductor manufacturing process |
02/27/2001 | US6195246 Electrostatic chuck having replaceable dielectric cover |
02/27/2001 | US6195228 Thin, horizontal-plane hall sensors for read-heads in magnetic recording |
02/27/2001 | US6195202 Laser microscope and a pattern inspection apparatus using such laser microscope |
02/27/2001 | US6195201 Reflective fly's eye condenser for EUV lithography |
02/27/2001 | US6195154 Projection exposure apparatus for transferring mask pattern onto photosensitive substrate |
02/27/2001 | US6195153 Scanning type exposure device having individually adjustable optical modules and method of manufacturing same |
02/27/2001 | US6195139 Electro-optical device |
02/27/2001 | US6194987 Inductance device |
02/27/2001 | US6194961 Microstructure including a circuit integrated in a substrate on one surface of which is arranged a flat coil |
02/27/2001 | US6194952 Transmission gate circuit |
02/27/2001 | US6194948 Method and an auxiliary circuit for preventing the triggering of a parasitic transistor in an output stage of an electronic circuit |
02/27/2001 | US6194907 Prober and electric evaluation method of semiconductor device |
02/27/2001 | US6194788 Flip chip with integrated flux and underfill |
02/27/2001 | US6194786 Integrated circuit package providing bond wire clearance over intervening conductive regions |
02/27/2001 | US6194784 Self-aligned contact process in semiconductor fabrication and device therefrom |
02/27/2001 | US6194783 Hillock-free aluminum-containing film consisting of aluminum having trace oxygen content formed by placing substrate in vacuum deposition chamber including aluminum-containing target, evacuating, applying electricity, introducing hydrogen |
02/27/2001 | US6194781 Semiconductor device and method of fabricating the same |
02/27/2001 | US6194780 Tape automated bonding method and bonded structure |
02/27/2001 | US6194779 Plastic mold type semiconductor device |
02/27/2001 | US6194776 Semiconductor circuit device having triple-well structure in semiconductor substrate, method of fabricating the same, and mask device for fabrication of the same |
02/27/2001 | US6194775 Semiconductor element with thermally nitrided film on high resistance film and method of manufacturing the same |
02/27/2001 | US6194773 Vertical transistor having top and bottom surface isolation |
02/27/2001 | US6194772 High-voltage semiconductor device with trench structure |
02/27/2001 | US6194768 High dielectric constant gate dielectric with an overlying tantalum gate conductor formed on a sidewall surface of a sacrificial structure |
02/27/2001 | US6194767 X-ROM semiconductor memory device |
02/27/2001 | US6194766 Integrated circuit having low voltage and high voltage devices on a common semiconductor substrate |
02/27/2001 | US6194765 Integrated electrical circuit having at least one memory cell and method for fabricating it |
02/27/2001 | US6194764 Integrated semiconductor circuit with protection structure for protecting against electrostatic discharge |
02/27/2001 | US6194763 Semiconductor device having SOI-MOSFET |
02/27/2001 | US6194762 Complementary metal oxide semiconductor (CMOS) device comprising thin-film transistors arranged on a glass substrate |
02/27/2001 | US6194761 VDMOS transistor protected against over-voltages between source and gate |
02/27/2001 | US6194760 Double-diffused MOS transistor and method of fabricating the same |
02/27/2001 | US6194759 Semiconductor memory device |
02/27/2001 | US6194758 Semiconductor device comprising capacitor and method of fabricating the same |
02/27/2001 | US6194757 Semiconductor device having contact hole and method of manufacturing the same |
02/27/2001 | US6194756 Structure for isolating a junction from an adjacent isolation structure |
02/27/2001 | US6194755 Low-resistance salicide fill for trench capacitors |
02/27/2001 | US6194754 Amorphous barrier layer in a ferroelectric memory cell |
02/27/2001 | US6194753 Method of forming a perovskite structure semiconductor capacitor |
02/27/2001 | US6194752 Dielectric device, dielectric memory and method of fabricating the same |
02/27/2001 | US6194751 Ferroelectric based memory devices utilizing low Curie point ferroelectrics and encapsulation |
02/27/2001 | US6194748 MOSFET with suppressed gate-edge fringing field effect |
02/27/2001 | US6194747 Field effect transistor |
02/27/2001 | US6194746 Vertical diode structures with low series resistance |
02/27/2001 | US6194744 Method of growing group III nitride semiconductor crystal layer and semiconductor device incorporating group III nitride semiconductor crystal layer |
02/27/2001 | US6194742 Strain engineered and impurity controlled III-V nitride semiconductor films and optoelectronic devices |
02/27/2001 | US6194741 MOSgated trench type power semiconductor with silicon carbide substrate and increased gate breakdown voltage and reduced on-resistance |
02/27/2001 | US6194736 Quantum conductive recrystallization barrier layers |
02/27/2001 | US6194734 Method and system for operating a variable aperture in an ion implanter |
02/27/2001 | US6194732 Charged-particle-beam exposure methods with beam parallelism detection and correction |
02/27/2001 | US6194691 Heating furnace and manufacturing method therefor |
02/27/2001 | US6194680 Microwave plasma processing method |
02/27/2001 | US6194668 Multi-layer circuit board |
02/27/2001 | US6194628 Method and apparatus for cleaning a vacuum line in a CVD system |
02/27/2001 | US6194482 Casting resin of epoxy resin, isocyanurate siloxane, fillers, photo initiators and thermal initiators |
02/27/2001 | US6194365 Composition for cleaning and etching electronic display and substrate |
02/27/2001 | US6194328 H2 diffusion barrier formation by nitrogen incorporation in oxide layer |
02/27/2001 | US6194327 Using hydrogen gas and fluorine gas to etch an oxide in a rapid thermal process, wherein said fluorine gas and said hydrogen gas are in a non-plasma state |
02/27/2001 | US6194326 Low temperature rinse of etching agents |
02/27/2001 | US6194325 Plasma etching oxide layer over nitride layer exhibiting selectivity to nitride layer, comprising contacting oxide layer with mixture of gases comprising fluorine-substituted hydrocarbon etching gases, hydrogen gases |
02/27/2001 | US6194324 Method for in-situ removing photoresist material |
02/27/2001 | US6194323 Deep sub-micron metal etch with in-situ hard mask etch |
02/27/2001 | US6194322 Electrode for plasma processes and method for a manufacture and use thereof |
02/27/2001 | US6194321 Semiconductor processing methods utilizing boron and nitrogen, and semiconductor wafers comprising boron and nitrogen |
02/27/2001 | US6194320 Method for preparing a semiconductor device |
02/27/2001 | US6194319 Semiconductor processing method of reducing an etch rate of one portion of a doped material relative to another portion, and methods of forming openings |
02/27/2001 | US6194318 Manufacturing multiple layered structures of large scale integrated semiconductor devices |