Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
01/2001
01/23/2001US6177295 Method of manufacturing semiconductor devices with “chip size package”
01/23/2001US6177294 Wiring layout method for semiconductor device and recording medium on which wiring layout program for semiconductor device is recorded
01/23/2001US6177292 Method for forming GaN semiconductor single crystal substrate and GaN diode with the substrate
01/23/2001US6177291 Method of making aggregate of semiconductor micro-needles
01/23/2001US6177288 Method of making integrated circuit packages
01/23/2001US6177286 Reducing metal voids during BEOL metallization
01/23/2001US6177285 Process for determining the crystal orientation in a wafer
01/23/2001US6177284 Conductive diffusion barrier layer, semiconductor device having the same, and manufacturing thereof
01/23/2001US6177235 Photolithography patterning first layer subjacent to second layer of photosensitive resin in fabrication of integrated circuits by forming porous antireflective layer, depositing second layer of photosensitive resin, exposing, developing
01/23/2001US6177233 Method of forming resist pattern
01/23/2001US6177225 Comprising a capped polybenzoxazole precursor polymer, a photosensitive agent, and a solvent
01/23/2001US6177218 Lithographic process for device fabrication using electron beam imaging
01/23/2001US6177204 Ferromagnetic GMR material and method of forming and using
01/23/2001US6177199 Forming a solution of a solvent and the organohydridosiloxane resin, dispensing the solution on a substrate, spinning the substrate, baking the substrate to remove the solvent, and curing the substrate to form the dielectric film
01/23/2001US6177184 Method of making an interface layer for stacked lamination sizing and sintering
01/23/2001US6177149 Method of forming titanium film by CVD
01/23/2001US6177147 Process and apparatus for treating a substrate
01/23/2001US6177145 Semiconductor processing method of making electrical contact to a node
01/23/2001US6177143 Electron beam treatment of siloxane resins
01/23/2001US6177135 Low temperature CVD processes for preparing ferroelectric films using Bi amides
01/23/2001US6177127 Method of monitoring emissivity
01/23/2001US6177040 Forming windows
01/23/2001US6177026 CMP slurry containing a solid catalyst
01/23/2001US6177023 Method and apparatus for electrostatically maintaining substrate flatness
01/23/2001US6176993 Process for recycling reaction system of electroplating passivation of wafers
01/23/2001US6176992 Method and apparatus for electro-chemical mechanical deposition
01/23/2001US6176986 Hot-press sintering a powdered barium strontium titinate having mean primary particle size of 1mu.m or less at a sintering temperature 1000 to 1300 degree c., for sintering time 1-10 hours under pressure in vacuum or in inert gas
01/23/2001US6176983 Methods of forming a semiconductor device
01/23/2001US6176981 Wafer bias ring controlling the plasma potential in a sustained self-sputtering reactor
01/23/2001US6176969 Baffle plate of dry etching apparatus for manufacturing semiconductor devices
01/23/2001US6176966 Method of die bonding electronic component and die bonding apparatus thereof
01/23/2001US6176944 Casting a pure cobalt metal having an intrinsic magnetic permeability and slowly cooling to form a sputter target comprising single hexagonal close packed phase, then hot working, slow cooling and cold working
01/23/2001US6176936 Semiconductors; reductive decomposition of a metal halide
01/23/2001US6176934 Inflatable door seal
01/23/2001US6176933 End point window assembly in an etching apparatus for fabricating semiconductor devices
01/23/2001US6176930 Apparatus and method for controlling a flow of process material to a deposition chamber
01/23/2001US6176926 Laser processing method
01/23/2001US6176925 Detached and inverted epitaxial regrowth & methods
01/23/2001US6176763 Method and apparatus for uniformly planarizing a microelectronic substrate
01/23/2001US6176668 In-situ substrate transfer shuttle
01/23/2001US6176667 Multideck wafer processing system
01/23/2001US6176438 Suck back valve having sensor for detecting diaphragm displacement amount
01/23/2001US6176431 Method for producing data carriers with embedded elements and an apparatus for carrying out the method
01/23/2001US6176417 Ball bonding method on a chip
01/23/2001US6176414 Linkage guided bond head
01/23/2001US6176374 Component carrier having a wave pattern tension reduction surface
01/23/2001US6176265 Valve unit having an insert molded inner valve block
01/23/2001US6176252 Apparatus for supplying liquid in semiconductor manufacturing process
01/23/2001US6176120 Methods of analyzing water soluble contaminants generated during microelectronic device manufacturing processes
01/23/2001US6176066 Hook and loop fastener strapping for semiconductor carrying trays
01/23/2001US6176023 Device for transporting flat objects and process for transferring said objects between said device and a processing machine
01/23/2001US6176008 Jig for mounting fine metal balls
01/23/2001US6175984 Apparatus for cleaning precision components
01/23/2001US6175983 Substrate washing apparatus and method
01/23/2001CA2301118C A homogenization enhancing thermoplastic foam extrusion screw
01/23/2001CA2171375C Manufacturing method of a silicon wafer having a controlled bmd concentration in the bulk and a good dz layer
01/23/2001CA2121042C Thermal sensor
01/23/2001CA2105342C Method of forming silicon carbide
01/18/2001WO2001005205A1 Laminates for encapsulating devices
01/18/2001WO2001005203A1 Underfilling material for semiconductor package
01/18/2001WO2001005197A2 High-speed symmetrical plasma treatment system
01/18/2001WO2001005020A1 Radio frequency power source for generating an inductively coupled plasma
01/18/2001WO2001004970A1 Ferromagnetic double quantum well tunnel magneto-resistance device
01/18/2001WO2001004963A1 Encapsulation of a device
01/18/2001WO2001004961A1 Power semiconductor devices with buried insulating regions
01/18/2001WO2001004960A1 Semiconductor device and method for the same manufacturing
01/18/2001WO2001004956A1 Semiconductor device and method of manufacturing same
01/18/2001WO2001004955A1 Monolithic low dielectric constant platform for passive components and method
01/18/2001WO2001004954A1 Semiconductor devices and process for manufacture
01/18/2001WO2001004952A1 Semiconductor device arrangement having configuration via adjacent bond pad coding
01/18/2001WO2001004951A1 Low-capacitance bond pads for high speed devices
01/18/2001WO2001004949A1 Nand type flash memory device
01/18/2001WO2001004948A1 New method of forming select gate to improve reliability and performance for nand type flash memory devices
01/18/2001WO2001004947A1 Method of compensating for material loss in a metal silicide layer in contacts of integrated circuit devices
01/18/2001WO2001004946A1 Semiconductor device and method for producing the same
01/18/2001WO2001004945A1 Electrostatic chuck and its manufacturing method
01/18/2001WO2001004944A2 Method and apparatus for simultaneously cleaning and annealing a workpiece
01/18/2001WO2001004943A1 Multilayered body, method for fabricating multilayered body, and semiconductor device
01/18/2001WO2001004942A1 Chemical vapor deposition of silicon oxide films using alkylsiloxane oligomers with ozone
01/18/2001WO2001004941A1 Fabrication process for dishing-free cu damascene structures
01/18/2001WO2001004940A1 Method for doping gallium nitride (gan) substrates and the resulting doped gan substrate
01/18/2001WO2001004939A1 Semiconductor film, liquid-crystal display using semiconductor film, and method of manufacture thereof
01/18/2001WO2001004937A2 Method and apparatus for directing constituents through a processing chamber
01/18/2001WO2001004936A1 Method of cleaning a semiconductor device processing chamber after a copper etch process
01/18/2001WO2001004935A1 Apparatus and method for transferring a workpiece
01/18/2001WO2001004934A1 Semiconductor wafer carrier
01/18/2001WO2001004933A1 Method for separating two elements and device therefor
01/18/2001WO2001004932A1 Handling system
01/18/2001WO2001004931A2 Method and apparatus for providing uniform gas delivery to substrates in cvd and pecvd processes
01/18/2001WO2001004930A2 Thermal processing chamber for heating and cooling wafer-like objects
01/18/2001WO2001004929A2 A method of forming a film in a chamber
01/18/2001WO2001004928A2 Improved apparatus and method for plating wafers, substrates and other articles
01/18/2001WO2001004927A2 Methodologies to reduce process sensitivity to the chamber wall condition
01/18/2001WO2001004926A1 Methods and apparatus for alignment of ion beam systems using beam current sensors
01/18/2001WO2001004716A1 A system and method for a digital mass flow controller
01/18/2001WO2001004715A1 System and method of operation of a digital mass flow controller
01/18/2001WO2001004707A1 Photoresist removal process using forming gas plasma
01/18/2001WO2001004682A1 Broad band ultraviolet catadioptric imaging system
01/18/2001WO2001004652A1 Apparatus for electrical testing of a substrate having a plurality of terminals
01/18/2001WO2001004643A2 Wafer-level burn-in and test cartridge and methods