Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
10/2001
10/30/2001US6310362 Electro-optical device
10/30/2001US6310361 Electrical test structure on a semiconductor substrate and test method
10/30/2001US6310359 Structures containing quantum conductive barrier layers
10/30/2001US6310356 Fluid fine particle measuring system for processing semiconductors
10/30/2001US6310341 Projecting type charged particle microscope and projecting type substrate inspection system
10/30/2001US6310328 Rapid thermal processing chamber for processing multiple wafers
10/30/2001US6310327 Rapid thermal processing apparatus for processing semiconductor wafers
10/30/2001US6310323 Water cooled support for lamps and rapid thermal processing chamber
10/30/2001US6310300 Fluorine-free barrier layer between conductor and insulator for degradation prevention
10/30/2001US6310298 Printed circuit board substrate having solder mask-free edges
10/30/2001US6310228 Organic copper compound, liquid mixture containing the compound, and copper thin-film prepared using the solution
10/30/2001US6310120 A sealing material comprising a liquid epoxy resin, a curing agent, spherical silica, a soft x-ray non-transmissive spherical inorganic filler and a curing accelerator; improved thin-film infiltration and storage stability
10/30/2001US6310019 Cleaning agent for a semi-conductor substrate
10/30/2001US6310018 Anhydrous cleaning composition comprising 88 weight percent fluorinated solvent, 0.005 to 2 weight percent hydrogen fluoride or complex thereof, 0.01 to 5 weight percent of co-solvent; for semiconductor substrates
10/30/2001US6309983 Low temperature sacrificial oxide formation
10/30/2001US6309982 Method for minimizing copper diffusion by doping an inorganic dielectric layer with a reducing agent
10/30/2001US6309981 Edge bevel removal of copper from silicon wafers
10/30/2001US6309980 Semiconductor integrated circuit arrangement fabrication method
10/30/2001US6309979 Methods for reducing plasma-induced charging damage
10/30/2001US6309977 Method for the etchback of a conductive material
10/30/2001US6309976 Critical dimension controlled method of plasma descum for conventional quarter micron and smaller dimension binary mask manufacture
10/30/2001US6309975 Methods of making implanted structures
10/30/2001US6309974 Method for eliminating residual oxygen impurities from silicon wafers pulled from a crucible
10/30/2001US6309973 Semiconductor processing methods of forming a conductive projection and methods of increasing alignment tolerances
10/30/2001US6309972 Method of enhancing protection of dielectrics from plasma induced damages and equipment
10/30/2001US6309971 Hot metallization process
10/30/2001US6309970 Method of forming multi-level copper interconnect with formation of copper oxide on exposed copper surface
10/30/2001US6309969 Copper metallization structure and method of construction
10/30/2001US6309968 Method to improve intrinsic refresh time and dichlorosilane formed gate oxide reliability
10/30/2001US6309967 Method of forming a contact
10/30/2001US6309966 Apparatus and method of a low pressure, two-step nucleation tungsten deposition
10/30/2001US6309965 Multilayer
10/30/2001US6309964 Method for forming a copper damascene structure over tungsten plugs with improved adhesion, oxidation resistance, and diffusion barrier properties using nitridation of the tungsten plug
10/30/2001US6309963 Method for manufacturing semiconductor device
10/30/2001US6309962 Film stack and etching sequence for dual damascene
10/30/2001US6309961 Method of forming damascene wiring in a semiconductor device
10/30/2001US6309960 Method of fabricating a semiconductor device
10/30/2001US6309959 Formation of self-aligned passivation for interconnect to minimize electromigration
10/30/2001US6309958 Semiconductor device and method of manufacturing the same
10/30/2001US6309957 Method of low-K/copper dual damascene
10/30/2001US6309956 Fabricating low K dielectric interconnect systems by using dummy structures to enhance process
10/30/2001US6309955 Method for using a CVD organic barc as a hard mask during via etch
10/30/2001US6309954 Methods of forming flip chip bumps and related flip chip bump constructions
10/30/2001US6309952 Process for forming high voltage junction termination extension oxide
10/30/2001US6309951 Method for crystallizing amorphous silicon
10/30/2001US6309950 Methods for making silicon-on-insulator structures
10/30/2001US6309949 Semiconductor isolation process to minimize weak oxide problems
10/30/2001US6309948 Method for fabrication of a semiconductor device
10/30/2001US6309947 Method of manufacturing a semiconductor device with improved isolation region to active region topography
10/30/2001US6309946 Reduced RC delay between adjacent substrate wiring lines
10/30/2001US6309945 Process for producing semiconductor substrate of SOI structure
10/30/2001US6309944 Overlay matching method which eliminates alignment induced errors and optimizes lens matching
10/30/2001US6309943 Precision marking and singulation method
10/30/2001US6309942 STI punch-through defects and stress reduction by high temperature oxide reflow process
10/30/2001US6309941 Methods of forming capacitors
10/30/2001US6309939 Method of manufacturing a semiconductor device
10/30/2001US6309938 Deuterated bipolar transistor and method of manufacture thereof
10/30/2001US6309937 Method of making shallow junction semiconductor devices
10/30/2001US6309936 Integrated formation of LDD and non-LDD semiconductor devices
10/30/2001US6309935 Methods of forming field effect transistors
10/30/2001US6309934 Fully self-aligned high speed low power MOSFET fabrication
10/30/2001US6309933 Method of fabricating T-shaped recessed polysilicon gate transistors
10/30/2001US6309932 Process for forming a plasma nitride film suitable for gate dielectric application in sub-0.25 μm technologies
10/30/2001US6309931 Method of making a semiconductor device with sidewall insulating layers in the capacitor contact hole
10/30/2001US6309930 SRAM cell arrangement and method for manufacturing same
10/30/2001US6309929 Method of forming trench MOS device and termination structure
10/30/2001US6309928 Split-gate flash cell
10/30/2001US6309927 Method of forming high K tantalum pentoxide Ta2O5 instead of ONO stacked films to increase coupling ratio and improve reliability for flash memory devices
10/30/2001US6309926 Thin resist with nitride hard mask for gate etch application
10/30/2001US6309925 Method for manufacturing capacitor
10/30/2001US6309924 Method of forming self-limiting polysilicon LOCOS for DRAM cell
10/30/2001US6309923 Method of forming the capacitor in DRAM
10/30/2001US6309922 Method for fabrication of on-chip inductors and related structure
10/30/2001US6309921 Semiconductor device and method for fabricating semiconductor device
10/30/2001US6309920 Bipolar transistor which can be controlled by field effect and method for producing the same
10/30/2001US6309919 Method for fabricating a trench-gated vertical CMOS device
10/30/2001US6309918 Manufacturable GaAs VFET process
10/30/2001US6309917 Thin film transistor manufacturing method and thin film transistor
10/30/2001US6309916 Method of molding plastic semiconductor packages
10/30/2001US6309915 Semiconductor chip package with expander ring and method of making same
10/30/2001US6309914 Method for making a semiconductor package
10/30/2001US6309913 Technique for attaching die to leads
10/30/2001US6309912 Method of interconnecting an embedded integrated circuit
10/30/2001US6309911 Method of fabricating semiconductor device
10/30/2001US6309910 Microelectronic components with frangible lead sections
10/30/2001US6309909 Semiconductor device and method of manufacturing the same
10/30/2001US6309908 Package for an electronic component and a method of making it
10/30/2001US6309907 Method of fabricating transistor with silicon oxycarbide gate
10/30/2001US6309906 Photovoltaic cell and method of producing that cell
10/30/2001US6309903 Method for manufacturing fringe field switching mode liquid crystal display device
10/30/2001US6309902 Method for coating semiconductor element with resin, coating resin, and liquid crystal display device
10/30/2001US6309899 Method and system for removing a die from a semiconductor package
10/30/2001US6309898 Method for manufacturing semiconductor device capable of improving manufacturing yield
10/30/2001US6309897 Method and apparatus providing a circuit edit structure through the back side of an integrated circuit die
10/30/2001US6309896 Method of manufacturing a ferroelectric film
10/30/2001US6309895 Method for fabricating capacitor containing amorphous and polycrystalline ferroelectric films and method for forming amorphous ferroelectric film
10/30/2001US6309894 Semiconductor memory and method of manufacturing the same
10/30/2001US6309808 Heat mode recording element
10/30/2001US6309801 Applying layer, masking, etching
10/30/2001US6309800 Irradiating a mask to enlarge circuit pattern