Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
10/2001
10/31/2001DE10019811A1 Integrierte Schaltung Integrated circuit
10/31/2001DE10019489A1 Package for surface-mounted electronic device
10/31/2001DE10019443A1 Vorrichtung zum Befestigen eines Halbleiter-Chips auf einem Chip-Träger Device for fixing a semiconductor chip on a chip carrier
10/31/2001CN2457739Y Material feeder for wafer test machine
10/31/2001CN2457738Y Micro laser beam scanning spectrum device based on laser beam induction current
10/31/2001CN1320359A Assembly device
10/31/2001CN1320353A Ceramic heater
10/31/2001CN1320351A Ceramic heater
10/31/2001CN1320277A Electronic switching device with at least two semiconductor components
10/31/2001CN1320276A Clad plate for lead frame,s lead frame using the same, and method of manufacturing the lead frame
10/31/2001CN1320274A Voltage-cycling recovery of process-damaged ferroelectric films
10/31/2001CN1320273A Assemby device
10/31/2001CN1320246A Clocked integrated semiconductor circuit and method for operating the same
10/31/2001CN1320214A Circuit configuration with a scan path that can be dactivated
10/31/2001CN1320173A Method for removing defects of single crystal material and single crystal material from which defects are removed by the method
10/31/2001CN1320136A Preparation of cross-linked 2-dimensional polymers with sidedness from alpha beta-lactones
10/31/2001CN1320101A Method of and apparatus for sealing an hermetic lid to a microelectronic machine
10/31/2001CN1320012A Method for producing multi-layer circuit board
10/31/2001CN1319949A Frequency regulation method for electronic component
10/31/2001CN1319948A Electronic element, electronic device and communication equipment
10/31/2001CN1319895A Semconductor device and making method thereof
10/31/2001CN1319894A Semiconductor IC
10/31/2001CN1319893A Electric capacitor structure and method for making same
10/31/2001CN1319891A Structure for preventing interconnected copper from being oxidized in low dielectric constant material
10/31/2001CN1319890A Semiconductor device and semiconductor assembly using same
10/31/2001CN1319888A Heat conduction itensified semicondcutor structure and making process
10/31/2001CN1319887A Structure of semiconductor device adherence layer and technology for forming same
10/31/2001CN1319886A Method for forming self-aligning contact structure in semiconductor IC device
10/31/2001CN1319885A Fixing clamp distribution board and electronic component assembly and making method thereof
10/31/2001CN1319884A Processaable isolation layer grid inlay technology used in sub 0.05 micrometer MOS device
10/31/2001CN1319883A Ultraviolet correcting method and device used in forming low K film
10/31/2001CN1319882A Method for forming pattern
10/31/2001CN1319881A Method for forming self-aligning contact welding disc in metal inlay grid technology
10/31/2001CN1319880A Reduction of iverse short channel effect
10/31/2001CN1319879A Semiconductor device and making method thereof
10/31/2001CN1319846A MRAM equipment containing differential check amplifier
10/31/2001CN1319832A Electric lighting device, its making method and electronic equipment
10/31/2001CN1319785A Exposure method and apparatus, method for making exposure apparatus and device
10/31/2001CN1319783A Method for isolating raster from electrostatic discharge
10/31/2001CN1319781A Semiconductor display device and making method thereof
10/31/2001CN1319683A Apparatus for treatment plasma
10/31/2001CN1319682A Free floating barrier and semiconductor technological system
10/31/2001CN1319636A Adhesion agent for electrode conection and connection method using same
10/31/2001CN1319474A Heating head for hot-pressing bonding and making method thereof
10/31/2001CN1319472A Power source for welding digital array transistor
10/31/2001CN1074168C Silicon semiconductor diode chip of all tangent plane junction glass passivation and making method
10/31/2001CN1074167C Semi-conductor device
10/31/2001CN1074166C Method for analyzing defects in semiconductor device
10/31/2001CN1074165C Optical mask with vernier
10/31/2001CN1074141C Low metal ions p-cresol oligomers and photosensitive compositions
10/31/2001CN1074139C Half-tone type phase shift mask and method for fabricating the same
10/31/2001CN1074078C Water purifier for drinking water
10/31/2001CN1074035C Chemical mechanical polishing slurry for metal layers
10/31/2001CN1073912C Improved polishing pads and methods for their use
10/31/2001CN1073911C Apparatus for polishing dielectric layer formed on substrate
10/31/2001CN1073909C Chemical mechanical polishing method suitable for highly accurate panarization
10/31/2001CN1073907C Semiconductor wafer polishing apparatus and method
10/30/2001US6311315 Semiconductor integrated circuit, design method and computer-readable recording medium
10/30/2001US6311309 Methods and apparatus for simulating a portion of a circuit design
10/30/2001US6311139 Method for estimating yield of integrated circuit device
10/30/2001US6311091 Substitute processing apparatus with power distribution control for reduced power consumption during apparatus start up
10/30/2001US6311016 Substrate temperature measuring apparatus, substrate temperature measuring method, substrate heating method and heat treatment apparatus
10/30/2001US6310934 X-ray projection exposure apparatus and a device manufacturing method
10/30/2001US6310933 Charge transferring device and charge transferring method which can reduce floating diffusion capacitance
10/30/2001US6310826 Semiconductor device having a test circuit
10/30/2001US6310815 Multi-bank semiconductor memory device suitable for integration with logic
10/30/2001US6310807 Semiconductor integrated circuit device including tester circuit for defective memory cell replacement
10/30/2001US6310798 Semiconductor memory and method for manufacture thereof
10/30/2001US6310755 Electrostatic chuck having gas cavity and method
10/30/2001US6310727 Beam homogenizer, laser illumination apparatus, and semiconductor device
10/30/2001US6310688 Method for measuring the parameter of a rough film
10/30/2001US6310685 Apparatus and method for holding a green sheet and system and method for inspecting a green sheet
10/30/2001US6310684 Method of measuring spherical aberration in projection system
10/30/2001US6310680 Method of adjusting a scanning exposure apparatus and scanning exposure apparatus using the method
10/30/2001US6310670 Thin-film transistor (TFT) liquid crystal display (LCD) devices having field-induced LDD regions
10/30/2001US6310667 Liquid crystal display device and fabrication method thereof
10/30/2001US6310495 Clock wave noise reducer
10/30/2001US6310487 Semiconductor integrated circuit and testing method thereof
10/30/2001US6310486 Integrated test cell
10/30/2001US6310483 Longitudinal type high frequency probe for narrow pitched electrodes
10/30/2001US6310403 Method of manufacturing components and component thereof
10/30/2001US6310402 Semiconductor die having input/output cells and contact pads in the periphery of a substrate
10/30/2001US6310399 Semiconductor memory configuration with a bit-line twist
10/30/2001US6310397 Butted contact resistance of an SRAM by double VCC implantation
10/30/2001US6310395 Electronic component with anodically bonded contact
10/30/2001US6310390 BGA package and method of fabrication
10/30/2001US6310389 Semiconductor package
10/30/2001US6310384 Low stress semiconductor devices with thermal oxide isolation
10/30/2001US6310380 Electrostatic discharge protection transistor structure with a trench extending through the source or drain silicide layers
10/30/2001US6310378 High voltage thin film transistor with improved on-state characteristics and method for making same
10/30/2001US6310377 Semiconductor device having an SOI structure
10/30/2001US6310376 Semiconductor storage device capable of improving controllability of density and size of floating gate
10/30/2001US6310375 Trench capacitor with isolation collar and corresponding manufacturing method
10/30/2001US6310374 Nonvolatile semiconductor memory device having extracting electrode
10/30/2001US6310373 Metal insulator semiconductor structure with polarization-compatible buffer layer
10/30/2001US6310369 Charge-to-voltage converter with adjustable conversion factor
10/30/2001US6310368 Semiconductor device and method for fabricating same
10/30/2001US6310367 MOS transistor having a tensile-strained SI layer and a compressive-strained SI-GE layer
10/30/2001US6310366 Retrograde well structure for a CMOS imager
10/30/2001US6310363 Thin-film transistor and semiconductor device using thin-film transistors with N and P impurities in the source and drain regions