Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
11/2001
11/29/2001US20010045590 Nonvolatile semiconductor memory device and process for producing the same
11/29/2001US20010045589 Semiconductor device with memory and logic cells
11/29/2001US20010045587 Semiconductor memory device and fabrication method thereof
11/29/2001US20010045586 Method and device for improved salicide resistance on polysilicon gates
11/29/2001US20010045585 Non-volatile semiconductor memory device and method of manufacturing the same
11/29/2001US20010045583 Semiconductor memory device capable of performing stable operation for noise while preventing increase in chip area
11/29/2001US20010045580 Image sensor with a photodiode array
11/29/2001US20010045578 Semiconductor device
11/29/2001US20010045572 Semiconductor interated circuit and method of manufacturing the same
11/29/2001US20010045571 Cell architecture with local interconnect and method for making same
11/29/2001US20010045569 Potential detector and semiconductor integrated circuit
11/29/2001US20010045566 Semiconductor device and manufacturing method thereof
11/29/2001US20010045563 Method for producing insulated gate thin film semiconductor device
11/29/2001US20010045561 Nitride based semiconductor light emitting element
11/29/2001US20010045559 Semiconductor device and method of fabricating the same
11/29/2001US20010045558 Semiconductor device and a method of manufacturing the same
11/29/2001US20010045557 Semiconductor device and method of manufacturing the same
11/29/2001US20010045528 Electrostatic deflector for electron beam exposure apparatus
11/29/2001US20010045527 Electron-beam cured polymer mask for DRIE micro-machining
11/29/2001US20010045526 Stage device for an exposure apparatus and semiconductor device manufacturing method wich uses said stage device
11/29/2001US20010045524 Process for precise arrangement of micro-bodies
11/29/2001US20010045511 Method for sample separation and lift-out
11/29/2001US20010045443 Controlled attenuation capillary
11/29/2001US20010045419 Laser system and method for single pass micromachining of multilayer workpieces
11/29/2001US20010045417 Implementation of laser technology
11/29/2001US20010045360 Electroplating method using combination of vibrational flow in plating bath and plating current of pulse
11/29/2001US20010045354 Method of etching high aspect ratio openings in silicon
11/29/2001US20010045269 Cooling disk unit for use in a wafer chucking device
11/29/2001US20010045234 Water tank, cooling tower including the same and method of manufacturing semiconductor device
11/29/2001US20010045224 Substrate processing apparatus and substrate processing method
11/29/2001US20010045223 Semiconductor wafer cleaning apparatus and method of using the same
11/29/2001US20010045174 Container for conveying flat objects
11/29/2001US20010045012 Angled flying lead wire bonding process
11/29/2001US20010044999 Method for sealing and/or joining an end of a ceramic filter
11/29/2001US20010044979 Apparatus for processing a wafer
11/29/2001EP1144523A3 Preparations containing fine-particulate inorganic oxides
11/29/2001DE10125750A1 Halbleiterschaltungsanordnung und Verfahren zu deren Herstellung A semiconductor circuit arrangement, and processes for their preparation
11/29/2001DE10119411A1 Self-aligning double gate MOSFET with separate gates has channel region, first gate above channel region, second gate below channel region; gates are electrically mutually isolated
11/29/2001DE10119047A1 Temperature measurement in semiconductor device manufacture, involves determining radiant light intensity and correction factors corresponding to various optical losses, which are then substituted in specific formula
11/29/2001DE10110697A1 Vorrichtung und Verfahren zum Züchten von Halbleitereinkristallen An apparatus and method for growing semiconductor single crystals
11/29/2001DE10025833A1 Halbleiterschichtsystem und Verfahren zur Herstellung von einem Halbleiterschichtsystem mit erhöhter Resistenz gegen thermische Prozessierung Semiconductor layer system and method for the production of a semiconductor layer system with an increased resistance to thermal processing
11/29/2001DE10025550A1 Plasma etching process used in the production of Fe-RAMs comprises applying a polyimide mask before the structure is etched
11/29/2001DE10025346A1 Amorphous and/or polycrystalline growth for a composite semiconductor based comprises growing a first composite semiconductor layer in the gas phase on a substrate
11/29/2001DE10025289A1 Inductances have windings that windings that are not wound but produced e.g. by diffusion or implantation then divided, mounted around ferromagnetic circuit and recombined
11/29/2001DE10024883A1 Plasmaätzanlage Plasma etching
11/29/2001DE10024876A1 Vertikaler Transistor Vertical transistor
11/29/2001DE10024874A1 Polierflüssigkeit und Verfahren zur Strukturierung von Metallen und Metalloxiden Polishing liquid and method for patterning of metals and metal oxides
11/29/2001DE10024858A1 Holder for wafer has ring element and at least one holding ring for insertion into ring element, whereby wafer can be positioned inside ring element by holding ring
11/29/2001DE10024857A1 Production of a partially single crystalline silicon carbide layer in a silicon wafer comprises preparing a silicon wafer, implanting carbon ions into the wafer by ion implantation, and subjecting the wafer to a thermal radiation source
11/29/2001DE10024709A1 Lamp for thermal treatment of substrates has at least two filaments, each with at least one winding section extending along longitudinal lamp axis and arranged adjacent to other filament
11/29/2001DE10024699A1 Plasmaätzanlage Plasma etching
11/29/2001DE10024111A1 Verfahren zur Herstellung eines Bauelements aus übereinander gestapelten miteinander verlöteten Platten A method for producing a component of stacked plates soldered together
11/29/2001DE10023539A1 Verfahren zum Herstellen eines Bauteils A method for manufacturing a component
11/29/2001DE10023012A1 Silicon wafer used in the production of electronic components has crystal-originated particles in its surface which change in morphology in such a way that there is no destructive influence on the gate oxide material
11/29/2001DE10023002A1 Verfahren zur beidseitigen Politur von Halbleiterscheiben und Läuferscheiben zur Durchführung des Verfahrens Method for two-sided polishing of semiconductor wafers and rotor disks for performing the method
11/29/2001DE10022384A1 Production of a power diode used in a semiconductor component comprises carrying out the steps of forming the carbon-hydrogen layer and etching the carbon-hydrogen layer in the same apparatus
11/29/2001DE10007642A1 Separating substrate with defined preferred break points involves applying separating blade to preferred break points with substrate held on rubber mat by suction
11/29/2001DE10004387A1 CMOS compatible lateral DMOS transistor has drift space region depleted of free charge carriers if drain voltage lower than gate isolator breakdown voltage
11/29/2001CA2408959A1 Method for making an extreme ultraviolet microlithography transmission modulator and resulting modulator
11/28/2001EP1158629A2 Laser oscillation apparatus
11/28/2001EP1158584A2 Semiconductor device having semiconductor resistance element and fabrication method thereof
11/28/2001EP1158582A1 Pin diode with insulated gate and manufacturing method thereof
11/28/2001EP1158581A1 Method for manufacturing soi wafer, and soi wafer
11/28/2001EP1158580A2 Method of crystallizing a silicon layer
11/28/2001EP1158579A1 Wire bonding capillary for forming bump electrodes
11/28/2001EP1158578A1 Bump electrode on an integrated circuit and manufacturing method thereof
11/28/2001EP1158577A2 Method for forming an insulating film with low dielectric constant
11/28/2001EP1158576A2 Method for etching a compound metal oxide film and processing apparatus
11/28/2001EP1158575A2 Method for fabricating a semiconductor device including a step of etching an organic film to form a pattern
11/28/2001EP1158574A1 Ultraviolet radiation producing apparatus
11/28/2001EP1158573A1 Method and apparatus for forming interconnection
11/28/2001EP1158572A1 Implantation method for forming an integrated circuit with two sorts of MOSFETs on a substrate
11/28/2001EP1158571A2 Carrier shape measurement device
11/28/2001EP1158570A1 Vertical interconnect process for silicon segments
11/28/2001EP1158569A2 Heater sealed with carbon wire heating element
11/28/2001EP1158568A2 Plasma assisted semiconductor substrate processing chamber
11/28/2001EP1158565A2 Toroidal plasma source for plasma processing
11/28/2001EP1158538A2 Method for reading electrical fuses and antifuses
11/28/2001EP1158529A1 Memory-logic semiconductor device
11/28/2001EP1158528A1 Semiconductor device with memory and logic cells
11/28/2001EP1158524A1 Semiconductor memory device having a boosted voltage generating circuit
11/28/2001EP1158363A1 Positive resist composition and onium salts of saccharin derivatives
11/28/2001EP1158361A1 Photomask, method for manufacturing the same, projection aligner using the photomask, and projection exposing method
11/28/2001EP1158340A2 High-frequency circuit and its module for communication devices
11/28/2001EP1158317A1 Echelle grating and use of an echelle grating
11/28/2001EP1158302A2 Method and apparatus for probing a conductor of an array of closely-spaced conductors
11/28/2001EP1158291A1 Ellipsometric metrology method and apparatus for samples contained in a chamber or the like
11/28/2001EP1158257A1 Method and device for drying substrate
11/28/2001EP1158073A1 Plating method, wiring forming method and devices therefor
11/28/2001EP1158071A2 Method for depositing a layer on a surface of a substrate
11/28/2001EP1158008A2 Curable hybrid electron donor compounds containing vinyl ether
11/28/2001EP1157783A2 Polishing method and polishing apparatus
11/28/2001EP1157782A2 Polishing apparatus
11/28/2001EP1157598A1 Method and apparatus for deposition of diamond-like carbon coatings from a hall-current ion source
11/28/2001EP1157597A1 Method of generating euv radiation, method of manufacturing a device by means of said radiation, euv radiation source unit, and lithographic projection apparatus provided with such a radiation source unit
11/28/2001EP1157596A1 Method of generating extremely short-wave radiation, method of manufacturing a device by means of said radiation, extremely short-wave radiation source unit and lithographic projection apparatus provided with such a radiation source unit
11/28/2001EP1157595A1 Method of generating extremely short-wave radiation, method of manufacturing a device by means of said radiation, extremely short-wave radiation source unit and lithographic projection apparatus provided with such a radiation source unit
11/28/2001EP1157467A1 Electronic component with reduced inductive coupling
11/28/2001EP1157460A1 Surface wave device connected to a base with conductive adhesive
11/28/2001EP1157454A1 Power supply with flux-controlled transformer