Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
12/2001
12/11/2001US6330697 Apparatus and method for performing a defect leakage screen test for memory devices
12/11/2001US6330526 Characteristic variation evaluation method of semiconductor device
12/11/2001US6330352 Inspection data analyzing system
12/11/2001US6330297 Semiconductor integrated circuit device capable of reading out chip-specific information during testing and evaluation
12/11/2001US6330205 Virtual channel synchronous dynamic random access memory
12/11/2001US6330191 Semiconductor storage device and production method thereof
12/11/2001US6330190 Semiconductor structure for flash memory enabling low operating potentials
12/11/2001US6330189 Nonvolatile semiconductor memory device
12/11/2001US6330187 Nonvolatile memory device and method for manufacturing the same
12/11/2001US6330184 Method of operating a semiconductor device
12/11/2001US6330181 Method of forming a gate device with raised channel
12/11/2001US6330179 Semiconductor memory device and method of manufacturing the same
12/11/2001US6330173 Semiconductor integrated circuit comprising step-up voltage generation circuit
12/11/2001US6330166 Electronic-component mounting structure
12/11/2001US6330164 Interconnect assemblies and methods including ancillary electronic component connected in immediate proximity of semiconductor device
12/11/2001US6330162 IC card module, manufacturing method therefor, hybrid integrated circuit module, and manufacturing method thereof
12/11/2001US6330145 Apparatus and method for contacting a sensor conductive layer
12/11/2001US6330137 Magnetoresistive read sensor including a carbon barrier layer and method for making same
12/11/2001US6330053 Image alignment method in checking reticle pattern
12/11/2001US6329899 Formation of thin film resistors
12/11/2001US6329870 Reference voltage generating circuitry
12/11/2001US6329869 Semiconductor device with less influence of noise
12/11/2001US6329720 Tungsten local interconnect for silicon integrated circuit structures, and method of making same
12/11/2001US6329719 Semiconductor device
12/11/2001US6329718 Method for reducing stress-induced voids for 0.25mμ and smaller semiconductor chip technology by annealing interconnect lines and using low bias voltage and low interlayer dielectric deposition rate and semiconductor chip made thereby
12/11/2001US6329717 Integrated circuit having selectivity deposited silicon oxide spacer layer formed therein
12/11/2001US6329716 Contact electrode for N-type gallium nitride-based compound semiconductor and method for forming the same
12/11/2001US6329713 Integrated circuit chip carrier assembly comprising a stiffener attached to a dielectric substrate
12/11/2001US6329712 High density flip chip memory arrays
12/11/2001US6329711 Semiconductor device and mounting structure
12/11/2001US6329707 Twin transistor device with improved collector-base isolation
12/11/2001US6329704 Ultra-shallow junction dopant layer having a peak concentration within a dielectric layer
12/11/2001US6329703 Contact between a monocrystalline silicon region and a polycrystalline silicon structure and method for producing such a contact
12/11/2001US6329702 High frequency carrier
12/11/2001US6329700 Semiconductor wafer and semiconductor device
12/11/2001US6329699 Bipolar transistor with trenched-groove isolation regions
12/11/2001US6329698 Forming a self-aligned epitaxial base bipolar transistor
12/11/2001US6329697 Semiconductor device including a charge-dispersing region and fabricating method thereof
12/11/2001US6329696 Semiconductor device with electric converter element
12/11/2001US6329695 Merged sidewall spacer formed between series-connected MOSFETs for improved integrated circuit operation
12/11/2001US6329694 Semiconductor device with ESD protective circuit
12/11/2001US6329693 Semiconductor memory device and method of manufacturing the same
12/11/2001US6329692 Circuit and method for reducing parasitic bipolar effects during eletrostatic discharges
12/11/2001US6329689 Semiconductor devices comprising semiconductive material substrates and insulator layers over the substrates
12/11/2001US6329688 Nonvolatile semiconductor memory device and method of manufacturing the same
12/11/2001US6329687 Two bit flash cell with two floating gate regions
12/11/2001US6329686 Method of fabricating conductive straps to interconnect contacts to corresponding digit lines by employing an angled sidewall implant and semiconductor devices fabricated thereby
12/11/2001US6329685 Self aligned method of forming a semiconductor memory array of floating gate memory cells and a memory array made thereby
12/11/2001US6329684 Capacitor structures, DRAM cells and integrated circuitry
12/11/2001US6329683 Semiconductor memory device and manufacturing method thereof which make it possible to improve reliability of cell-capacitor and also to simplify the manufacturing processes
12/11/2001US6329682 Capacitor over bit line memory cell and process
12/11/2001US6329681 Semiconductor integrated circuit device and method of manufacturing the same
12/11/2001US6329680 Semiconductor integrated circuit device and process for manufacturing the same
12/11/2001US6329677 Field effect transistor
12/11/2001US6329675 Self-aligned bipolar junction silicon carbide transistors
12/11/2001US6329674 Composite structure with a growth substrate having a diamond layer and a plurality of microelectronic components, and process for producing such a composite structure
12/11/2001US6329671 Semiconductor device and method of manufacturing the same
12/11/2001US6329670 Conductive material for integrated circuit fabrication
12/11/2001US6329669 Semiconductor device able to test changeover circuit which switches connection between terminals
12/11/2001US6329665 Charged particle beam lithography apparatus for forming pattern on semi-conductor
12/11/2001US6329664 Ion implantation apparatus for wafers
12/11/2001US6329663 Method and apparatus for cleaning a glass substrate for a color filter
12/11/2001US6329659 Correction device for correcting the lens defects in particle-optical apparatus
12/11/2001US6329650 Space charge neutralization of an ion beam
12/11/2001US6329643 Method of temperature-calibrating heat treating apparatus
12/11/2001US6329642 Semiconductor device and semiconductor chip
12/11/2001US6329640 Heating apparatus for bump bonding, bump bonding method and bump forming apparatus, and semiconductor wafer
12/11/2001US6329608 Key-shaped solder bumps and under bump metallurgy
12/11/2001US6329607 Microelectronic lead structures with dielectric layers
12/11/2001US6329606 Grid array assembly of circuit boards with singulation grooves
12/11/2001US6329605 Components with conductive solder mask layers
12/11/2001US6329540 Volatile organogallium compound and deposition of gallium nitride film using same
12/11/2001US6329438 Introducing rinsing solution into pores of sponge material; and changing hydrostatic pressure of the rinsing solution in pores of sponge material
12/11/2001US6329306 Fine patterning utilizing an exposure method in photolithography
12/11/2001US6329305 Method for producing devices having piezoelectric films
12/11/2001US6329304 Floating wafer reactor and method for the regulation of the temperature thereof
12/11/2001US6329303 Thin film forming method, thin film forming apparatus and method for manufacturing semiconductor device
12/11/2001US6329302 Removal of a top IC die from a bottom IC die of a multichip IC package with preservation of interconnect
12/11/2001US6329301 Method and apparatus for selective removal of material from wafer alignment marks
12/11/2001US6329300 Method for manufacturing conductive pattern layer by two-step wet etching process
12/11/2001US6329299 Compositions and methods for the selective etching of tantalum-containing films for wafer reclamation
12/11/2001US6329298 Apparatus for treating samples
12/11/2001US6329297 Dilute remote plasma clean
12/11/2001US6329296 Metal catalyst technique for texturing silicon solar cells
12/11/2001US6329295 Semiconductor device capable of having amorphous carbon fluoride film of low dielectric constant as interlayer insulation material and method of manufacturing the same
12/11/2001US6329294 Method for removing photoresist mask used for etching of metal layer and other etching by-products
12/11/2001US6329293 Method for cleaning a polymer
12/11/2001US6329292 Etching holes in integrated circuits with spaced electrodes and dielectric material
12/11/2001US6329291 Method of forming a lower storage node of a capacitor for dynamic random access memory
12/11/2001US6329290 Method for fabrication and structure for high aspect ratio vias
12/11/2001US6329289 Method and apparatus for forming copper wiring
12/11/2001US6329288 Semiconductor device and manufacturing method thereof
12/11/2001US6329287 Process for manufacturing an integrated circuit structure with metal salicide regions and metal salicide exclusion regions
12/11/2001US6329286 Methods for forming conformal iridium layers on substrates
12/11/2001US6329285 Plug fabricating method
12/11/2001US6329284 Manufacturing process of a semiconductor device
12/11/2001US6329283 Method of fabricating self-align-contact
12/11/2001US6329282 Method of improving the texture of aluminum metallization for tungsten etch back processing
12/11/2001US6329281 Methods for fabricating a multilevel interconnection for an integrated circuit device utilizing a selective overlayer
12/11/2001US6329280 Interim oxidation of silsesquioxane dielectric for dual damascene process