| Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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| 12/05/2001 | EP1160360A1 Process for producting an epitaxial layer on a semiconductor wafer |
| 12/05/2001 | EP1160356A1 Electroless plating solution and method of forming wiring with the same |
| 12/05/2001 | EP1160355A2 Bubbler |
| 12/05/2001 | EP1160354A1 Apparatus and method for depositing semiconductor film |
| 12/05/2001 | EP1160344A1 Gold wire for semiconductor element connection and semiconductor element connection method |
| 12/05/2001 | EP1160300A2 Aqueous dispersion for chemical mechanical polishing |
| 12/05/2001 | EP1160215A1 Simplified gold vacuum vapor deposition |
| 12/05/2001 | EP1159762A1 Silicon carbide n-channel power lmosfet |
| 12/05/2001 | EP1159759A1 High-voltage capacitor voltage divider circuit having a high-voltage silicon-on-insulator (soi) capacitor |
| 12/05/2001 | EP1159758A1 Flash memory cell having a flexible element |
| 12/05/2001 | EP1159757A1 Method and apparatus for elimination of parasitic bipolar action in complementary oxide semiconductor (cmos) silicon on insulator (soi) circuits |
| 12/05/2001 | EP1159755A1 Method and device for rotating a wafer |
| 12/05/2001 | EP1159659A1 Four-phase charge pump with lower peak current |
| 12/05/2001 | EP1159651A1 A method for maximizing integrated circuit die production |
| 12/05/2001 | EP1159649A1 Electron beam resist |
| 12/05/2001 | EP1159630A1 Distributed interface for parallel testing of multiple devices using a single tester channel |
| 12/05/2001 | EP1159583A1 Method and system of measuring waviness in silicon wafers |
| 12/05/2001 | EP1159465A1 Processing chamber for atomic layer deposition processes |
| 12/05/2001 | EP1159464A1 Wafer processing reactor having a gas flow control system and method |
| 12/05/2001 | EP1159214A1 In/out load port transfer mechanism |
| 12/05/2001 | EP1159213A1 Integrated load port-conveyor transfer system |
| 12/05/2001 | EP1159212A1 Integrated intra-bay transfer, storage and delivery system |
| 12/05/2001 | EP1159103A1 Laser processing |
| 12/05/2001 | EP1149409A4 Method for forming a silicide region on a silicon body |
| 12/05/2001 | EP1051535B1 SUBSTRATE SUPPORT FOR SiC EPITAXY AND METHOD FOR PRODUCING AN INSERT FOR A SUSCEPTOR |
| 12/05/2001 | EP1048056A4 A single step electroplating process for interconnect via fill and metal line patterning |
| 12/05/2001 | EP0815588B1 Low temperature process for fabricating layered superlattice materials |
| 12/05/2001 | EP0792525B1 A varicap diode and method of manufacturing a varicap diode |
| 12/05/2001 | EP0774167B1 A power semiconductor device |
| 12/05/2001 | EP0758941B1 Semiconductor wafer polishing apparatus and method |
| 12/05/2001 | EP0725980B1 Method of fabrication of an integrated circuit chip containing eeprom and capacitor |
| 12/05/2001 | EP0698292B1 Method of forming a moulded lead frame |
| 12/05/2001 | EP0628832B1 Integrated circuit with register stages |
| 12/05/2001 | CN2463957Y Gold finger leading device for wafer tester |
| 12/05/2001 | CN2463956Y Wafer sorting device for wafer tester |
| 12/05/2001 | CN2463955Y Chip frame heat pressing device for chip binding machine |
| 12/05/2001 | CN1325549A Ferroelectric transistor, its use in storage cell system and its method of production |
| 12/05/2001 | CN1325548A Transistor array |
| 12/05/2001 | CN1325547A Semiconductor circuit |
| 12/05/2001 | CN1325545A High voltage shield |
| 12/05/2001 | CN1325544A Method for semiconductor manufacturing |
| 12/05/2001 | CN1325543A Silane-based nanoporous silica thin films |
| 12/05/2001 | CN1325542A Process for optimizing mechanical strength of nanoporous silica |
| 12/05/2001 | CN1325541A Nanoporous silica deposited through mixture |
| 12/05/2001 | CN1325540A Abrasive liquid for metal and method for polishing |
| 12/05/2001 | CN1325539A Component affixing method and apparatus |
| 12/05/2001 | CN1325326A Method of applicating paste |
| 12/05/2001 | CN1325139A Semiconductor circuit device and mfg. method |
| 12/05/2001 | CN1325138A Manufacture of wire holder in double electroplating mold |
| 12/05/2001 | CN1325137A Semiconductor device and mfg. method thereof |
| 12/05/2001 | CN1325136A Mfg. for producing plate-shape body and semiconductor device |
| 12/05/2001 | CN1325134A Voltage convertor for high-voltage signal input in low-voltage manufacture |
| 12/05/2001 | CN1325133A Apparatus for mounting semiconductor chip onto substrate |
| 12/05/2001 | CN1325132A Inactivation method of plastic packel GaAs chip |
| 12/05/2001 | CN1325131A Ion-beam injector with function of removing dirts at home position |
| 12/05/2001 | CN1325130A Coating and developing system |
| 12/05/2001 | CN1325129A Film-forming device |
| 12/05/2001 | CN1325128A Synthesis of halved rotary composite material |
| 12/05/2001 | CN1324909A Electronic donor compound capable of solidifying |
| 12/05/2001 | CN1324906A Polishing liquid for structurizing treatment of metal and metal oxide and method thereof |
| 12/05/2001 | CN1324718A Special forming process of IC package and Sb-Bi refrigerating base board |
| 12/05/2001 | CN1324706A System and method for rebuilding lighting condition on welder of integrated circuit |
| 12/05/2001 | CN1075894C Photolithography method and photolithography system for performing the method |
| 12/05/2001 | CN1075841C Process for etching diamond film pattern with reactive ion beam |
| 12/04/2001 | US6327695 Automated design of on-chip capacitive structures for suppressing inductive noise |
| 12/04/2001 | US6327693 Interconnect delay driven placement and routing of an integrated circuit design |
| 12/04/2001 | US6327558 Apparatus for simulating electrical characteristics of a circuit including a ferroelectric device and a method for simulating electrical characteristics of a circuit including a ferroelectric device |
| 12/04/2001 | US6327540 Method of detecting end point of process, end point detector, computer memory product and chemical mechanical polishing apparatus |
| 12/04/2001 | US6327517 Apparatus for on-the-fly center finding and notch aligning for wafer handling robots |
| 12/04/2001 | US6327512 Method and apparatus using positional data detected in a non-contact manner to transfer a substrate from a first position to a second position |
| 12/04/2001 | US6327379 Pattern inspection method and apparatus |
| 12/04/2001 | US6327332 Exposure method |
| 12/04/2001 | US6327213 Semiconductor integrated circuit device having a hierarchical power source configuration |
| 12/04/2001 | US6327211 Inverter having a variable threshold potential |
| 12/04/2001 | US6327198 Semiconductor memory device having a test mode setting circuit |
| 12/04/2001 | US6327186 Non-volatile semiconductor memory including memory cells having different charge exchange capability |
| 12/04/2001 | US6327180 Semiconductor memory device for effecting erasing operation in block unit |
| 12/04/2001 | US6327179 Semiconductor memory device and method for producing same |
| 12/04/2001 | US6327174 Method of manufacturing mask read-only memory cell |
| 12/04/2001 | US6327172 Ferroelectric non-volatile memory device |
| 12/04/2001 | US6327166 Semiconductor device |
| 12/04/2001 | US6327135 Thin film capacitors on gallium arsenide substrate |
| 12/04/2001 | US6327125 Integrated circuit with removable ESD protection |
| 12/04/2001 | US6327026 Exposure apparatus and positioning apparatus |
| 12/04/2001 | US6327025 Projection exposure apparatus for transferring mask pattern onto photosensitive substrate |
| 12/04/2001 | US6327022 Projection exposure method and apparatus |
| 12/04/2001 | US6327021 Mask inspection system and method of manufacturing semiconductor device |
| 12/04/2001 | US6327006 TFT-LCD having shielding layers on TFT-substrate |
| 12/04/2001 | US6326936 Electrode means, comprising polymer materials, with or without functional elements and an electrode device formed of said means |
| 12/04/2001 | US6326834 Pump circuit boosting a supply voltage |
| 12/04/2001 | US6326815 Sense amplifier of semiconductor integrated circuit |
| 12/04/2001 | US6326798 Electric beam tester and image processing apparatus |
| 12/04/2001 | US6326792 Method and apparatus for lifetime prediction of dielectric breakdown |
| 12/04/2001 | US6326755 System for parallel processing of workpieces |
| 12/04/2001 | US6326732 Apparatus and method for non-contact stress evaluation of wafer gate dielectric reliability |
| 12/04/2001 | US6326700 Low profile semiconductor package and process for making the same |
| 12/04/2001 | US6326699 Semiconductor device |
| 12/04/2001 | US6326698 Semiconductor devices having protective layers thereon through which contact pads are exposed and stereolithographic methods of fabricating such semiconductor devices |
| 12/04/2001 | US6326697 Hermetically sealed chip scale packages formed by wafer level fabrication and assembly |
| 12/04/2001 | US6326695 Twisted bit line structures and method for making same |