Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
01/2002
01/31/2002US20020012716 Mold for resin-sealing of semiconductor devices
01/31/2002US20020012609 A non-ceramic solder for connecting a semiconductor to a conductive support; composed of a solder alloy and filler component which are proportioned so that the solder alloy has a intermediate overall coefficient of thermal expansion
01/31/2002US20020012581 Substrate processing apparatus and method for manufacturing a semiconductor device
01/31/2002US20020012374 Tunable laser with stabilized grating
01/31/2002US20020012285 Semiconductor memory device
01/31/2002US20020012274 Method of erasing a flash memory cell
01/31/2002US20020012273 Nonvolatile semiconductor memory device including a circuit for providing a boosted potential
01/31/2002US20020012272 Semiconductor device
01/31/2002US20020012270 Semiconductor memory device for effecting erasing operation in block unit
01/31/2002US20020012269 MRAM architectures for increased write selectivity
01/31/2002US20020012268 MRAM architectures for increased write selectivity
01/31/2002US20020012267 Non-volatile memory device
01/31/2002US20020012266 Random access semiconductor memory with reduced signal overcoupling
01/31/2002US20020012265 Semiconductor storage device
01/31/2002US20020012264 Ferroelectric non-volatile memory device
01/31/2002US20020012262 High-speed low-power semiconductor memory architecture
01/31/2002US20020012222 Dielectric-constant-enhanced capacitor
01/31/2002US20020012219 Electrostatic chucks and electrostatically adsorbing structures
01/31/2002US20020012212 Semiconductor integrated circuit
01/31/2002US20020012206 Thin film conductor layer, magnetoresistive element using the same and method of producing thin film conductor layer
01/31/2002US20020012123 Spatial averaging technique for ellipsometry and reflectometry
01/31/2002US20020012112 Cleaning method for use in exposure apparatus
01/31/2002US20020012108 Anti-vibration system for exposure apparatus
01/31/2002US20020012107 Projection exposure apparatus
01/31/2002US20020012100 Microlithographic reduction projection catadioptric objective
01/31/2002US20020012096 Manufacturing method for manufacturing electro-optical device, connection method for connecting terminals, electro-optical device, and electronic equipment
01/31/2002US20020012080 Liquid crystal display apparatus
01/31/2002US20020011983 Semiconductor device
01/31/2002US20020011894 256 Meg dynamic random access memory
01/31/2002US20020011893 Substrate electric potential sense circuit and substrate electric potential generator circuit
01/31/2002US20020011889 Semiconductor integral circuit
01/31/2002US20020011874 Semiconductor switch having a voltage detection function
01/31/2002US20020011869 Method, system, and method of using a component for setting the electrical characteristics of microelectronic circuit configurations
01/31/2002US20020011868 Very fine grain field programmable gate array architecture and circuitry
01/31/2002US20020011865 A test board for testing a semiconductor device utilizing first and second delay elements in a signal-transmission-path
01/31/2002US20020011859 Method for forming conductive bumps for the purpose of contrructing a fine pitch test device
01/31/2002US20020011854 Probe device
01/31/2002US20020011853 Probe stylus
01/31/2002US20020011847 Method for polysilicon crystlline line width measurement post etch in undoped-poly process
01/31/2002US20020011835 Low-temperature test equipment
01/31/2002US20020011827 Fabricating pixel electrode on thin film transistor side of substrate, so major part of each transistor is buried under electrode, allowing for active matrix addressing of polymeric electroluminescent pixels and maintaining high aperture ratio
01/31/2002US20020011826 Semiconductor integrated circuit device capable of stably generating internal voltage
01/31/2002US20020011760 Electronic device and method for producing the same
01/31/2002US20020011677 Semiconductor device and method of making the same
01/31/2002US20020011676 Semiconductor structure having stacked semiconductor devices
01/31/2002US20020011675 Semiconductor device and method of manufacturing the same
01/31/2002US20020011674 Integrated power circuits with distributed bonding and current flow
01/31/2002US20020011673 Process and structure for an interlock and high performance multilevel structures for chip interconnects and packaging technologies
01/31/2002US20020011672 Semiconductor device and semiconductor device manufacturing method
01/31/2002US20020011671 Semiconductor device and method of manufacturing the same
01/31/2002US20020011670 Semiconductor device manufacturing method including forming step of SOI structure and semiconductor device having SOI structure
01/31/2002US20020011669 Semiconductor device
01/31/2002US20020011668 Electronic package with bonded structure and method of making
01/31/2002US20020011667 Semiconductor device and method for manufacturing same
01/31/2002US20020011666 Selectively coating bond pads
01/31/2002US20020011664 Semiconductor element, manufacturing method thereof and BGA-type semiconductor device
01/31/2002US20020011663 Face-up semiconductor chip assemblies
01/31/2002US20020011662 Packaging substrate and semiconductor device
01/31/2002US20020011657 Semiconductor device, an interposer for the semiconductor device, and a method of manufacturing the same
01/31/2002US20020011656 Semiconductor device protective overcoat with enhanced adhesion to polymeric materials and method of fabrication
01/31/2002US20020011655 Chip-like electronic components, a method of manufacturing the same, a pseudo wafer therefor and a method of manufacturing thereof
01/31/2002US20020011654 Semiconductor device
01/31/2002US20020011653 High quality factor, integrated inductor and production method thereof
01/31/2002US20020011652 Wafer thickness compensation for interchip planarity
01/31/2002US20020011651 Semiconductor device and packaging method thereof
01/31/2002US20020011649 Fast bipolar transistor
01/31/2002US20020011648 Semiconductor device and method for making the same
01/31/2002US20020011647 Current-limiting device
01/31/2002US20020011646 On-chip inductors
01/31/2002US20020011644 Semiconductor device for reducing junction leakage current and narrow width effect, and fabrication method thereof
01/31/2002US20020011641 Partially transparent photovoltaic modules
01/31/2002US20020011636 Semiconductor device, manufacturing method thereof, and CMOS transistor
01/31/2002US20020011635 Semiconductor device and production method thereof
01/31/2002US20020011634 Method for fabricating semiconductor device
01/31/2002US20020011633 Semiconductor memory device and method of manufacturing the same
01/31/2002US20020011632 Static semiconductor memory device
01/31/2002US20020011631 Self-aligned metal silicide
01/31/2002US20020011630 Semiconductor device having semiconductor resistance element and fabrication method thereof
01/31/2002US20020011629 Method to form shallow junction transistors while eliminating shorts due to junction spiking
01/31/2002US20020011628 Semiconductor device
01/31/2002US20020011627 Thin film transistor having enhanced field mobility
01/31/2002US20020011625 Scalable tunnel oxide window with no isolation edges
01/31/2002US20020011624 Nonvolatile semiconductor memory device and fabrication method
01/31/2002US20020011623 Non-volatile semiconductor memory device and manufacturing method thereof
01/31/2002US20020011621 Semiconductor nonvolatile memory with low programming voltage
01/31/2002US20020011620 Capacitor having a TaON dielectric film in a semiconductor device and a method for manufacturing the same
01/31/2002US20020011619 Semiconductor device having both memory and logic circuit and its manufacture
01/31/2002US20020011618 Structure of a capacitor section of a dynamic random-access memory
01/31/2002US20020011617 Semiconductor device and method of producing the same
01/31/2002US20020011616 Semiconductor device and method of manufacturing the same
01/31/2002US20020011615 Ferroelectric memory device and method for producing the same
01/31/2002US20020011613 Semiconductor device and method for manufacturing the same
01/31/2002US20020011612 Semiconductor device and method for manufacturing the same
01/31/2002US20020011610 Semiconductor memory device having pairs of bit lines arranged on both sides of memory cells
01/31/2002US20020011609 Transistor
01/31/2002US20020011608 Self aligned method of forming a semiconductor memory array of floating gate memory cells, and a memory array made thereby
01/31/2002US20020011606 Semiconductor integrated circuit and designing method thereof
01/31/2002US20020011604 Semiconductor device for milliwave band oscillation, fabricating method therefor and oscillator therewith
01/31/2002US20020011603 Semiconductor device and method of manufacturing the same
01/31/2002US20020011599 Gallium nitride single crystal substrate and method of proucing same