Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
02/2002
02/13/2002EP1179620A1 Silicon carbide and method of manufacturing the same
02/13/2002EP1179619A1 Method for crystallising amorphous layers
02/13/2002EP1179618A2 Plating apparatus and plating liquid removing method
02/13/2002EP1179617A1 Apparatus for plating substrate, method for plating substrate, electrolytic processing method, and apparatus thereof
02/13/2002EP1179611A2 Chamber for transport of substrates
02/13/2002EP1179389A2 A wafer notch polishing machine and method of polishing an orientation notch in a wafer
02/13/2002EP1179381A2 Surface treatment apparatus
02/13/2002EP1179288A1 Manufacturing electronic components in a direct-write process using precision spraying and laser irradiation
02/13/2002EP1179287A1 Device and method for thermally treating substrates
02/13/2002EP1179218A1 Semiconductor device and method of manufacturing same
02/13/2002EP1179217A1 Secondary electron spectroscopy method and system
02/13/2002EP1178961A2 Apparatus and methods for collecting global data during a reticle inspection
02/13/2002EP1178872A1 Chemical mechanical planarization or polishing pad with sections having varied groove patterns
02/13/2002EP1080615B1 Multiple printed panel for electronics components, and method for constructing bumps, soldering frames, spacers and similar on said multiple printed panel.
02/13/2002EP0978125B1 System for optimizing memory repair time using test data
02/13/2002EP0868836A4 Fluorine assisted stripping and residue removal in sapphire downstream plasma asher
02/13/2002EP0864176B1 Structure for esd protection in semiconductor chips
02/13/2002CN2476812Y Structural light three-dimensional visual aiming generator
02/13/2002CN1336021A A method and a device for manufacturing a roll of items
02/13/2002CN1336010A Layered dielectric on silicon carbide semiconductor structures
02/13/2002CN1336009A Method for fabricating device chips from thin sheet of pyroelectric material
02/13/2002CN1336008A Specimen holding robotic arm end effector
02/13/2002CN1335945A Composition for antireflection coating
02/13/2002CN1335820A Mesoporous silica film from a solution containing a surfactant and methods of making same
02/13/2002CN1335805A Aerogel substrate and method for preparing the same
02/13/2002CN1335798A Method and apparatus for removal of mold flash
02/13/2002CN1335744A Modular card and its making process
02/13/2002CN1335700A Automatic guiding transporting apparatus system and its controlling method
02/13/2002CN1335674A On-chip signal filter with bonded lead inductance
02/13/2002CN1335648A MOS field effect tube (FEI) for reducing source-drain interelectrode resistance and its producing method
02/13/2002CN1335646A Surface adhered diode array and its manufacture
02/13/2002CN1335643A Linear conductor with air bearing
02/13/2002CN1335642A Chip connecting method for chip assembly
02/13/2002CN1335640A Method for producing thermal plate and semi-conductor device
02/13/2002CN1335626A Self-refreshing chip voltage generator
02/13/2002CN1335625A Storage cell with magnetic resistance storage effect for integrated memory
02/13/2002CN1335580A Chip corresponding method for chip loading equipment
02/13/2002CN1335522A Implementation of semiconductor light wave and optoelectronic device with unparallel cavity structure
02/13/2002CN1335511A Method and apparatus for searching conductor in conductor array with tight space
02/13/2002CN1335419A Electroplating method using with combination of electroplating liquid vibrating flow and pulse type electroplating current
02/13/2002CN1079169C Method of manufacturing semiconductor chip package
02/13/2002CN1079168C Method for measuring leakage current in junction region of semiconductor device
02/13/2002CN1079167C Wire welding method, semiconductor device, capillary and ball bump forming method and wire welding
02/13/2002CN1079166C Method for forming fine patterns of semiconductor device
02/13/2002CN1079165C Method for forming impurity junction regions of semiconductor device
02/12/2002WO2002001421A2 Lock-step cursors for feature alignment
02/12/2002USRE37546 Reactor and method of processing a semiconductor substrate
02/12/2002US6347386 System for optimizing the testing and repair time of a defective integrated circuit
02/12/2002US6347291 Substrate position location system
02/12/2002US6347258 Data structure of a product technology and a method of preparing the same
02/12/2002US6347187 Optical disc, recording apparatus, and computer-readable recording medium
02/12/2002US6347150 Method and system for inspecting a pattern
02/12/2002US6347062 Semiconductor memory device
02/12/2002US6347054 Method of operating flash memory
02/12/2002US6347053 Nonviolatile memory device having improved threshold voltages in erasing and programming operations
02/12/2002US6347050 Semiconductor memory cell and method of manufacturing the same
02/12/2002US6347049 Low resistance magnetic tunnel junction device with bilayer or multilayer tunnel barrier
02/12/2002US6347048 Semiconductor memory device
02/12/2002US6346978 SOI TFT array substrate for LCD projection display
02/12/2002US6346915 Plasma processing method and apparatus
02/12/2002US6346845 Fuse circuits and methods that can sense the state of a fuse that is programmed but not open
02/12/2002US6346844 Coupling for active semi-conductor components
02/12/2002US6346822 Semiconductor integrated circuit having diagnosis function
02/12/2002US6346821 Method for nondestructive measurement of minority carrier diffusion length and minority carrier lifetime in semiconductor devices
02/12/2002US6346820 Characteristics evaluation circuit for semiconductor wafer and its evaluation method
02/12/2002US6346750 Resistance-reducing conductive adhesives for attachment of electronic components
02/12/2002US6346749 Semiconductor device
02/12/2002US6346748 Electronic circuit structure with photoresist layer that has non-precision openings formed by a laser
02/12/2002US6346747 Method for fabricating a thermally stable diamond-like carbon film as an intralevel or interlevel dielectric in a semiconductor device and device made
02/12/2002US6346746 Capacitor and electrode structures for a semiconductor device
02/12/2002US6346741 Compositions and structures for chemical mechanical polishing of FeRAM capacitors and method of fabricating FeRAM capacitors using same
02/12/2002US6346739 Static charge dissipation pads for sensors
02/12/2002US6346738 Fuse option circuit of integrated circuit and method thereof
02/12/2002US6346737 Shallow trench isolation process particularly suited for high voltage circuits
02/12/2002US6346736 Trench isolated semiconductor device
02/12/2002US6346735 Semiconductor sensor structure and method of manufacturing the same
02/12/2002US6346734 Modified gate conductor processing for poly length control in high density DRAMS
02/12/2002US6346733 Nonvolatile memory device
02/12/2002US6346732 Semiconductor device with oxide mediated epitaxial layer
02/12/2002US6346731 Semiconductor apparatus having conductive thin films
02/12/2002US6346730 Liquid crystal display device having a pixel TFT formed in a display region and a drive circuit formed in the periphery of the display region on the same substrate
02/12/2002US6346729 Pseudo silicon on insulator MOSFET device
02/12/2002US6346728 Plural transistor device with multi-finger structure
02/12/2002US6346726 Low voltage MOSFET power device having a minimum figure of merit
02/12/2002US6346725 Contact-less array of fully self-aligned, triple polysilicon, source-side injection, nonvolatile memory cells with metal-overlaid wordlines
02/12/2002US6346724 Semiconductor memory device having a capacitor over bit-line structure and method for manufacturing the same
02/12/2002US6346723 Semiconductor memory device having memory cell area and peripheral circuit area
02/12/2002US6346718 Electro-optic device, drive substrate for electro-optic device and method of manufacturing the same
02/12/2002US6346687 Energy beam processing method and processing apparatus therefor
02/12/2002US6346682 Rambus handler
02/12/2002US6346490 Process for treating damaged surfaces of low k carbon doped silicon oxide dielectric material after plasma etching and plasma cleaning steps
02/12/2002US6346489 Precleaning process for metal plug that minimizes damage to low-κ dielectric
02/12/2002US6346488 Process to provide enhanced resistance to cracking and to further reduce the dielectric constant of a low dielectric constant dielectric film of an integrated circuit structure by implantation with hydrogen ions
02/12/2002US6346487 Apparatus and method for forming an oxynitride insulating layer on a semiconductor wafer
02/12/2002US6346486 Transistor device and method of forming the same
02/12/2002US6346485 Semiconductor wafer processing method and semiconductor wafers produced by the same
02/12/2002US6346484 Method for selective extraction of sacrificial place-holding material used in fabrication of air gap-containing interconnect structures
02/12/2002US6346483 Film forming method and film formed by the method
02/12/2002US6346482 Semiconductor device having an improved contact structure and a manufacturing method thereof
02/12/2002US6346480 Method for forming aluminum interconnection