Patents for G03F 9 - Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically (10,803)
02/1984
02/21/1984US4432635 Temperature-controlled support for semiconductor wafer
02/15/1984EP0100526A2 Apparatus for effecting alignment and spacing control of a mask and wafer for use in X-ray lithography
02/14/1984US4431923 Alignment process using serial detection of repetitively patterned alignment marks
01/1984
01/25/1984EP0098984A1 Step-and-repeat projection alignment and exposure system
01/18/1984EP0025036B1 Process for focusing a mask image onto a workpiece
01/17/1984US4426152 Method and machine for positioning films on base sheets
01/10/1984US4425537 X-Y Addressable workpiece positioner and mask aligner using same
01/10/1984US4425043 Device for detecting the position of an object
01/10/1984US4425037 For use in a microlithography system
01/04/1984EP0097380A2 A system for positioning a utilization device
01/03/1984US4423959 Positioning apparatus
12/1983
12/27/1983US4423127 Relative alighment of three or more superimposed patterns
12/27/1983US4422763 Automatic photomask alignment system for projection printing
12/27/1983CA1159579A2 Method for automatic mask alignment
12/27/1983CA1159578A2 Target for use in mask alignment
12/21/1983EP0096294A2 Alignment apparatus
12/21/1983EP0096224A1 Positioning method for mask set used in IC fabrication
12/13/1983US4420233 Projecting apparatus
12/13/1983US4420223 Optical apparatus having a mirror
12/06/1983US4419013 Phase contrast alignment system for a semiconductor manufacturing apparatus
12/06/1983US4418467 Semiconductor wafer with alignment marks and method for manufacturing semiconductor device
11/1983
11/22/1983CA1157313A1 Device for transporting and positioning printing plates
11/16/1983EP0094041A1 Reduction projection aligner system
11/15/1983US4414749 Alignment and exposure system with an indicium of an axis of motion of the system
11/15/1983CA1157128A1 Automatic wafer focusing and flattening system
10/1983
10/13/1983WO1983003484A1 A method and apparatus for captivating a substrate within a holder
10/12/1983EP0091234A2 Auto focus alignment and measurement system and method
10/12/1983EP0091233A2 Auto focus alignment and measurement system and method
10/12/1983EP0091199A1 Projection alignment apparatus
10/12/1983EP0091106A1 Process for eliminating undesired appearances of diffraction and/or interference, as well as process and apparatus for aligning
10/11/1983US4408885 Apparatus for the automatic alignment of two superimposed objects, e.g. a semiconductor wafer and mask
10/11/1983US4408874 Projection aligner with specific means for bending mirror
10/04/1983US4407933 Alignment marks for electron beam lithography
09/1983
09/27/1983US4406546 Photoelectric detecting device
09/20/1983US4405238 Alignment method and apparatus for x-ray or optical lithography
09/20/1983US4405229 Method of projecting printing on semiconductor substrate and workpiece including such substrate
09/20/1983CA1154175A1 Method and apparatus for mask/wafer alignment
09/14/1983EP0088691A1 Alignment apparatus for machines making integrated circuits
09/06/1983US4403336 X-Ray exposure apparatus
09/06/1983US4402610 Optical system for the automatic alignment of two motifs comprising alignment marks of the grating type, particularly in direct photorepetition on silicon
09/06/1983US4402596 Projection type exposure device
08/1983
08/16/1983US4398824 Wafer tilt compensation in zone plate alignment system
08/09/1983US4397543 Mask for imaging a pattern of a photoresist layer, method of making said mask, and use thereof in a photolithographic process
08/09/1983US4397078 Method and apparatus for measuring a gap distance between a mask and a wafer to be used in fabrication of semiconductor integrated circuits
08/09/1983EP0078323A4 Apparatus for projecting a series of images onto dies of a semiconductor wafer.
08/02/1983US4396976 System for interfacing a computer to a machine
07/1983
07/26/1983US4395117 Printing apparatus having an in-focus detector
07/26/1983CA1150850A1 Registration process
07/20/1983EP0083710A1 Alignment system for lithographic proximity printing
07/19/1983CA1150418A1 Automatic mask alignment
07/12/1983US4393131 Method for captivating a substrate within a holder
07/05/1983US4391511 Light exposure device and method
07/05/1983US4391494 Apparatus for projecting a series of images onto dies of a semiconductor wafer
07/05/1983US4391034 Thermally compensated shadow mask
07/04/1983EP0073235A4 Reregistration system for a charged particle beam exposure system.
06/1983
06/28/1983US4390929 Precise lamp positioner
06/28/1983US4390279 Alignment device in an IC projection exposure apparatus
06/21/1983US4389094 Process for casting on a support the faithfull reproduction of a mask pierced with periodically distributed slits
06/21/1983US4389084 Observing apparatus
06/21/1983CA1148392A1 Optical focusing system
06/15/1983EP0081233A1 Automatic focusing apparatus
06/14/1983US4388386 Mask set mismatch
05/1983
05/31/1983US4385839 Automatic alignment system
05/31/1983US4385838 Alignment device
05/24/1983US4385238 Reregistration system for a charged particle beam exposure system
05/18/1983EP0079070A1 Automatic wafer alignment method, method for determining the location of edges and wafer alignment system
05/17/1983US4383760 Device for positioning an object relative to a carrier means
05/17/1983US4383757 Optical focusing system
05/11/1983EP0078461A2 Printing frame for positioning exactly visually-manually and for holding a plate-like workpiece
05/11/1983EP0078323A1 Apparatus for projecting a series of images onto dies of a semiconductor wafer.
05/10/1983US4382676 Positioning machine of original films on a base sheet
05/04/1983EP0077888A2 Method and device for manufacturing microfiche masks
05/04/1983EP0077878A1 Exposure process for transferring a mask pattern to a wafer
04/1983
04/26/1983US4380946 Film punch registration
04/19/1983US4380395 Reduction projection aligner system
04/12/1983US4379818 Artwork alignment for decorating machine
03/1983
03/22/1983US4377627 Reference marker pattern on semiconductor, radiation beam
03/22/1983US4377028 Method for registering a mask pattern in a photo-etching apparatus for semiconductor devices
03/15/1983US4376584 Pattern printing including aligning masks and monitoring such alignment
03/15/1983US4376581 Method of positioning disk-shaped workpieces, preferably semiconductor wafers
03/15/1983US4376580 Projection aligner with bending mirror
03/09/1983EP0073235A1 Reregistration system for a charged particle beam exposure system
03/01/1983US4375285 Device for transporting and positioning printing plates
03/01/1983CA1142276A1 Wafer orienting apparatus
02/1983
02/22/1983US4374915 High contrast alignment marker for integrated circuit fabrication
02/09/1983EP0071171A1 Suction device
02/01/1983US4371953 Analog read only memory
02/01/1983US4371923 Computer system architecture
02/01/1983US4371264 Optical system for aligning two patterns and photo-repeater using such a system
02/01/1983CA1140373A1 Process for casting on a support the faithful shadow of a mask pierced with periodically distributed slits, and the application of this process particularly in photolithography
01/1983
01/25/1983US4370720 Coordinate rotation for numerical control system
01/25/1983US4370059 Method and machine for positioning an object photoelectrically using a register mark
01/19/1983EP0069823A1 Process and apparatus for the mutual positioning (registration) of objects in X-ray and ion beam lithography
01/12/1983EP0069529A2 Chip alignment method
01/11/1983CA1139441A1 Optical imaging system provided with an opto-electronic detection system for determining a deviation between the image plane of the imaging system and a second plane on which an image is to be formed
01/04/1983US4367046 Optical system for aligning two patterns and a photorepeater embodying such a system
01/04/1983US4367009 Optical scanning apparatus with beam splitter to provide plural light beams
12/1982
12/28/1982US4365500 Web bending fixture
12/14/1982US4364110 Computerized machine control system
12/14/1982US4363962 Focussing apparatus with plural emitter-detector pairs