Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
07/2011
07/20/2011CN102132216A Mask holding mechanism
07/20/2011CN102132215A Optimization of focused spots for maskless lithography
07/20/2011CN102132214A Spectral purity filter and lithographic apparatus
07/20/2011CN102132213A Spectral purity filter, lithographic apparatus including such spectral purity filter and device manufacturing method
07/20/2011CN102132212A Positive-type photosensitive resin composition, method for producing resist pattern, and electronic component
07/20/2011CN102132174A Pattern-forming member and method of manufacturing same
07/20/2011CN102132173A Manufacturing method for pattern-forming body and processing apparatus using electromagnetic beam
07/20/2011CN102131958A Method of forming a microstructure
07/20/2011CN102131883A Photosensitive adhesive composition, and film adhesive, adhesive sheet, adhesive pattern, semiconductor wafer with adhesive layer and semiconductor device using the photosensitive adhesive composition
07/20/2011CN102131766A New propanoates and processes for preparing the same
07/20/2011CN102130024A Method for plating silver on front side of silicon wafer
07/20/2011CN102130009A Manufacturing method of transistor
07/20/2011CN102129971A Method and system for etching graphical sapphire substrate
07/20/2011CN102129968A Double-patterning method
07/20/2011CN102129890A Amorphous alloy-based optical focusing lens and preparation method thereof
07/20/2011CN102129182A Method and system for monitoring conservation time of photoresist
07/20/2011CN102129181A Full wafer width scanning using step and scan system
07/20/2011CN102129180A Micro-mirror device screening method, micro-mirror device screening device and no-mask exposure device
07/20/2011CN102129179A Immersion lithographic apparatus and a device manufacturing method
07/20/2011CN102129178A Photoetching mark structure for SiGeC device
07/20/2011CN102129177A Method and system for monitoring exposure energy of exposure machine station
07/20/2011CN102129176A Method for eliminating oblique error caused by surface shape of elongated lens
07/20/2011CN102129175A Rotating platform supported by air flotation
07/20/2011CN102129174A Method for repairing defocusing of imaging blocks on edge of wafer
07/20/2011CN102129173A Photoetching machine projection objective lens wave aberration field measurement method
07/20/2011CN102129172A Negative resist composition and patterning process
07/20/2011CN102129171A Photoresist composition
07/20/2011CN102129170A Attenuated phase shift mask production method
07/20/2011CN102129167A Photolithographic mask and photolithographic method
07/20/2011CN102129097A Backlight module, light guide device and light guide plate manufacturing method
07/20/2011CN102129094A Heat resistant flexible color filter
07/20/2011CN102128678A Device and method for measuring and correcting energy sensor
07/20/2011CN102127201A Water-solubility hyperbranched photosensitive organic silicon prepolymer and preparation method thereof
07/20/2011CN102127012A Pyridone compound
07/20/2011CN102126951A Crosslinkable compound and photosensitive composition comprising the same
07/20/2011CN102126948A Light sensitive monomer, liquid crystal material, liquid crystal display panel and manufacturing method thereof, and photoelectronic device and manufacturing method thereof
07/20/2011CN101776851B Three DOF micro-positioning workbench for nano-imprint lithography system
07/20/2011CN101750900B Method for determining photoetching procedure causing low yield rate in the unit of exposure area
07/20/2011CN101694561B Multi-mask photoetching machine silicon wafer stage system
07/20/2011CN101655666B Photoetching method and system
07/20/2011CN101598902B Lithographic apparatus and device manufacturing method
07/20/2011CN101587303B Lithographic apparatus and device manufacturing method
07/20/2011CN101583909B Radiation system and lithographic apparatus comprising the same
07/20/2011CN101576687B Liquid crystal directing agent, and production method of liquid crystal oriented film formed by same
07/20/2011CN101573664B Method and system for detecting existence of an undesirable particle during semiconductor fabrication
07/20/2011CN101551599B Double-stage switching system of photoetching machine wafer stage
07/20/2011CN101526685B Color film substrate and manufacture method thereof
07/20/2011CN101520606B Non-contact long-stroke multi-degree-of-freedom nanometer precision working table
07/20/2011CN101493655B Exposure method
07/20/2011CN101464634B Lithographic apparatus, workbench system and its control method
07/20/2011CN101446682B Preparation method of continuous diaphragm type micro deformable mirror based on SOI
07/20/2011CN101441411B Surface plasma resonance exposure photolithography method
07/20/2011CN101377622B Method for detecting photolithography equipment exhaust system and judging product CPK
07/20/2011CN101354529B Photomask data generation method, photomask generation method, exposure method, and device manufacturing method
07/20/2011CN101342840B Method for manufacturing integrated molding module directly with paper card design diagram
07/20/2011CN101313252B Developer solution and process for use
07/20/2011CN101303531B A wafer chuck and a method of forming a wafer chuck
07/20/2011CN101220927B Cover for shielding a portion of an arc lamp, arc lamp and etching device
07/20/2011CN101196645B RGBW colorful color filter structure and its production method
07/20/2011CN101192008B Coating method and coating device
07/20/2011CN101158813B Positive photoresist consumed reactive compound and light sensitive complexes thereof
07/20/2011CN101128774B Photosensitive resin composition for forming light shielding layer, light shielding layer and color filter
07/20/2011CN101111803B Positive dry film photoresist and composition for preparing the same
07/20/2011CN101038444B System and method for moving a component, lithographic apparatus and device manufacturing method
07/19/2011USRE42556 Apparatus for method for immersion lithography
07/19/2011US7982857 Stage apparatus, exposure apparatus, and exposure method with recovery device having lyophilic portion
07/19/2011US7982851 Method for measuring flare amount, mask for measuring flare amount, and method for manufacturing device
07/19/2011US7982850 Immersion lithographic apparatus and device manufacturing method with gas supply
07/19/2011US7982312 Method for fabricating dual damascene structures using photo-imprint lithography, methods for fabricating imprint lithography molds for dual damascene structures, materials for imprintable dielectrics and equipment for photo-imprint lithography used in dual damascene patterning
07/19/2011US7982189 Spectrometer for fluid analysis
07/19/2011US7982000 Composition comprising various proteorhodopsins and/or bacteriorhodopsins and use thereof
07/19/2011US7981985 Polymer and chemically amplified resist composition comprising the same
07/19/2011US7981824 For optical device; pure quartz bland doped with titanium or fluorine; trasmitting radiation in wavelength of 15 mn; obtained by flame hydrolysis; homogenizing
07/19/2011US7981814 Replication and transfer of microstructures and nanostructures
07/19/2011US7981595 Reduced pitch multiple exposure process
07/19/2011US7981594 Hardmask composition having antirelective properties and method of patterning material on susbstrate using the same
07/19/2011US7981592 Double patterning method
07/19/2011US7981591 Semiconductor buried grating fabrication method
07/19/2011US7981590 Method for producing a base material for screen printing, and base material of this type
07/19/2011US7981589 Fluorinated monomer, fluorinated polymer, resist composition and patterning process
07/19/2011US7981577 Microfiltration of dye, photopolymerization initiator and free radical polymerizable monomers prior to patterning exposure through mask; suppressing generation of minute contaminates; smooth, uniform thickness
07/19/2011CA2439696C Method and apparatus for texturing a metal sheet or strip
07/14/2011WO2011084288A1 Selective diffractive optical element and a system including the same
07/14/2011WO2011083872A1 Pattern forming method, actinic ray-sensitive or radiation-sensitive resin composition and resist film
07/14/2011WO2011083724A1 Liquid-immersion member, exposing device, exposing method, and device manufacturing method
07/14/2011WO2011083554A1 Polyamide or polyimide resin compositions that contain phosphine oxide, and cured products thereof
07/14/2011WO2011083411A1 Image projection apparatus and method
07/14/2011WO2011082872A1 Optical element having a plurality of reflective facet elements
07/14/2011WO2011062812A3 Magnification control for lithographic imaging system
07/14/2011WO2011062296A3 Exposure apparatus, exposing method, and device fabricating method
07/14/2011WO2011061501A3 Methanofullerene derivatives, photoresist composition containing it and method for forming a resist layer
07/14/2011WO2011034728A3 Laser ablation tooling via distributed patterned masks
07/14/2011WO2011031123A3 Isocyanurate compound for forming organic anti-reflective layer and composition including same
07/14/2011WO2011025305A3 Novel polyamic acid, polyimide, photosensitive resin composition comprising same, and dry film produced from the composition
07/14/2011WO2010147241A3 Exposure apparatus and device manufacturing method
07/14/2011WO2010147240A3 Exposure apparatus and device manufacturing method
07/14/2011US20110172349 Photosensitive insulating resin composition, cured product thereof and aba block copolymer
07/14/2011US20110172110 Tracers and assembly for labeling chemical or biological molecules methods and kits using the same
07/14/2011US20110171586 Resist processing method
07/14/2011US20110171585 Photolithography Method