Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
09/2011
09/28/2011CN102203676A Scatterometer and lithographic apparatus
09/28/2011CN102203675A Illuminating optic for EUV microlithography
09/28/2011CN102203674A Lithographic apparatus, programmable patterning device and lithographic method
09/28/2011CN102203673A Photosensitive resin composition and base
09/28/2011CN102203672A Imprint lithography system and method
09/28/2011CN102203671A Strain and kinetics control during separation phase of imprint process
09/28/2011CN102203136A Photoinitiator mixtures
09/28/2011CN102201365A Method for producing semiconductor device
09/28/2011CN102201333A Photoresists and methods for use thereof
09/28/2011CN102200700A Stripping liquid as well as preparation method and application
09/28/2011CN102200699A Method for removing uncured photosensitive composition film or uncured photosensitive composition
09/28/2011CN102200698A Cable stage of silicon wafer stage of photo-etching machine
09/28/2011CN102200697A System and method for detecting wave aberration of photoetching projection objective
09/28/2011CN102200696A Method for determining optimal photoetching process parameters by using focusing and exposure matrix
09/28/2011CN102200695A System error self-corrected online detecting device of projection objective lens wave aberration of photo-etching machine
09/28/2011CN102200694A Light irradiation device
09/28/2011CN102200693A Illumination system and lithographic apparatus
09/28/2011CN102200692A Method for controlling exposure energy
09/28/2011CN102200691A Online measuring mark and method of projection objective lens image surface of photo-etching machine
09/28/2011CN102200690A On-line measuring mark of image plane of lithography machine projection objective and measuring method
09/28/2011CN102200689A Hybrid maglev gravity compensation apparatus
09/28/2011CN102200688A Photosensitive resin composition, black matrix prepared from the photosensitive resin composition, and application of the black matrix
09/28/2011CN102200687A Imprint apparatus and method of manufacturing an article
09/28/2011CN102200624A Photo-etching projection lens
09/28/2011CN102200428A High-precision vertical position measurement device
09/28/2011CN102199282A Hydrophilic monomer, hydrophilic photoresist composition, and formation method for resist pattern
09/28/2011CN102199119A Oxime ester photoinitiators
09/28/2011CN101986208B Support structure of lithographic apparatus
09/28/2011CN101840162B Exposure unit and pattern forming method
09/28/2011CN101533231B Off-axis alignment system and alignment method
09/28/2011CN101452083B Optical element and method for manufacturing same
09/28/2011CN101446770B Substrates and methods of using those substrates
09/28/2011CN101446763B Device for automatically adjusting dynamic balance of exposure roller
09/28/2011CN101405660B Processes for monitoring the levels of oxygen and/or nitrogen species in a substantially oxygen and nitrogen-free plasma ashing process
09/28/2011CN101344727B Focusing and leveling detection device and method
09/28/2011CN101258445B Lithographic method
09/28/2011CN101221363B Lithographic apparatus and device manufacturing method
09/28/2011CN101187776B Method for transferring self-assembled dummy pattern to substrate
09/28/2011CN101131546B Wet etching solution
09/28/2011CN101122739B Sub-wavelength continuous surface micro-structure preparation method based on negative refractive rate lens
09/28/2011CN101082770B Pattern forming method and pattern forming apparatus
09/27/2011USRE42741 Lithographic apparatus and device manufacturing method
09/27/2011US8027813 Method and system for reconstructing aberrated image profiles through simulation
09/27/2011US8027027 Exposure apparatus, and device manufacturing method
09/27/2011US8027018 Method and device for producing exposed structures
09/27/2011US8026048 Developing apparatus and developing method
09/27/2011US8026047 Resist pattern forming method, supercritical processing solution for lithography process, and antireflection film forming method
09/27/2011US8026046 Reliably reproducing a clock signal based on wobbling shapes of track grooves of respective information storage layers; in mastering step, metal dies for the information storage layers having a shape that specifies a track groove whose shape factor differs from one information storage layer to another
09/27/2011US8026045 Method of manufacturing wiring circuit board
09/27/2011US8026044 Method of forming fine patterns of semiconductor device
09/27/2011US8026043 Method of making a lithographic printing plate
09/27/2011US8026042 Polymer for organic anti-reflective coating layer and composition including the same
09/27/2011US8026041 Imageable elements useful for waterless printing
09/27/2011US8026040 Silicone coating composition
09/27/2011US8026039 Radiation-sensitive resin composition
09/27/2011US8026038 Metal oxide-containing film-forming composition, metal oxide-containing film, metal oxide-containing film-bearing substrate, and patterning method
09/27/2011US8026037 Si-polymers and photoresists comprising same
09/27/2011US8026036 Photosensitive resin composition and circuit substrate employing the same
09/27/2011US8026035 Etch-resistant disilane and saturated hydrocarbon bridged silicon-containing polymers, method of making the same, and method of using the same
09/27/2011US8026024 Mask blank and method for manufacturing transfer mask
09/27/2011US8026022 Long-length fiber Bragg creating sequential UV writing by probing phase mask
09/27/2011US8025833 Curable composition for nanoimprint, and patterning method
09/27/2011US8025831 Imprinting of supported and free-standing 3-D micro- or nano-structures
09/27/2011US8025830 UV nanoimprint lithography process and apparatus
09/27/2011US8025732 Apparatus for processing a substrate
09/27/2011CA2466611C Heat-curable resin composition
09/22/2011WO2011116039A1 Method and system for modifying substrate patterned features using ion implantation
09/22/2011WO2011115488A1 Active vibration isolation system, arrangement and method
09/22/2011WO2011115233A1 Extreme ultraviolet light generation system
09/22/2011WO2011115217A1 Radiation-sensitive resin composition and resist pattern formation method
09/22/2011WO2011115190A1 Radiation-sensitive resin composition
09/22/2011WO2011115157A1 Resist removal device and resist removal method
09/22/2011WO2011115139A1 Electron-beam exposure method and electron-beam exposure device
09/22/2011WO2011115138A1 Radiation-sensitive resin composition and resist pattern formation method
09/22/2011WO2011115125A1 Color developing photosensitive composition, lithographic printing original plate, and method for producing same
09/22/2011WO2011115100A1 Photocurable/thermosetting resin composition, dry film thereof and cured substance therefrom, and printed circuit board using same
09/22/2011WO2011114995A1 Silane coupling agent, negative-type photosensitive resin composition, curable film and touch panel component
09/22/2011WO2011114889A1 Extreme ultraviolet light source device and location adjustment method for light focusing optical means
09/22/2011WO2011114887A1 Irradiance distribution detection method in extreme ultraviolet light source device, and location adjustment method for light focusing optical means
09/22/2011WO2011114885A1 Method of cleaning electronic material and cleaning system
09/22/2011WO2011114883A1 Resist pattern formation device, resist pattern formation method, and wafer lens production method
09/22/2011WO2011114846A1 Photosensitive conductive paste and method for forming conductive pattern
09/22/2011WO2011114593A1 Photosensitive resin composition and photosensitive element using same, resist pattern formation method and printed circuit board manufacturing method
09/22/2011WO2011113706A1 Fabrication method of cylindrical gratings
09/22/2011WO2011113704A2 Photorepeater for extreme-ultraviolet lithography
09/22/2011WO2011113682A1 Method and apparatus for alignment optimization with respect to plurality of layers
09/22/2011WO2011113663A1 Inspection for lithography
09/22/2011WO2011113591A2 Optical collector for collecting extreme ultraviolet radiation, method for operating such an optical collector, and euv source with such a collector
09/22/2011WO2011113347A1 Nanometer-precision six-degree-of-freedom magnetic suspension micro-motion table and application thereof
09/22/2011WO2011091891A3 Arrangement for and method of characterising the polarisation properties of an optical system
09/22/2011WO2011080308A4 Capacitive sensing system
09/22/2011WO2011052954A3 Composition for cleaning photoresist pattern and forming protective film
09/22/2011WO2011050442A9 Gallotannic compounds for lithographic printing plate coating compositions
09/22/2011WO2011006265A4 Copolymers for near-infrared radiation-sensitive coating compositions for positive-working thermal lithographic printing plates
09/22/2011US20110230058 Composition for forming resist underlayer film with reduced outgassing
09/22/2011US20110229832 Pattern forming method using developer containing organic solvent and rinsing solution for use in the pattern forming method
09/22/2011US20110229831 Apparatus for processing substrate and method of doing the same
09/22/2011US20110229830 Inspection Method For Lithography
09/22/2011US20110229829 Lithography material and lithography process
09/22/2011US20110229828 Aromatic ring containing polymer, underlayer composition including the same, and associated methods