| Patents for G01Q 30 - Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices (4,691) |
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| 02/26/2014 | EP2701178A2 Electron beam exposure system |
| 02/26/2014 | CN101855534B Method and apparatus of automatic scanning probe imaging |
| 02/25/2014 | US8658974 Environmental cell for a particle-optical apparatus |
| 02/18/2014 | US8656510 System, apparatus, and method for simultaneous single molecule atomic force microscopy and fluorescence measurements |
| 02/11/2014 | US8646345 Mounting systems for a surface forces apparatus |
| 02/11/2014 | US8646344 Mounting systems for a surface forces apparatus |
| 02/05/2014 | CN102053169B Method for manufacturing failure analysis sample in interconnection structure |
| 02/04/2014 | US8646111 Coupled mass-spring systems and imaging methods for scanning probe microscopy |
| 01/30/2014 | WO2014017326A1 Scanning probe microscope |
| 01/30/2014 | WO2014016952A1 Holder for probe microscope, probe microscope and specimen measurement method |
| 01/30/2014 | DE102010015966B4 Quasi-in-situ-Rastersondenmikroskop (QIS-SPM) mit einer selbsttätig betriebenen Reaktionskammer und Verfahren zum Betrieb Quasi-in-situ scanning probe microscope (SPM QIS) with an automatically operated reaction chamber and method of operating |
| 01/22/2014 | CN203405477U Micro in-situ mechanical tester based on scanning electron microscope |
| 01/22/2014 | CN103529244A Method based on atomic force microscope for researching microscopic characteristics of asphalt |
| 01/14/2014 | US8629985 Displacement measurement method and apparatus thereof, stage apparatus, and probe microscope |
| 01/09/2014 | WO2014008456A1 Apparatus and method for atomic force microscopy |
| 01/09/2014 | WO2014006734A1 Force probe microscope and height distribution measurement method |
| 01/08/2014 | EP2682760A1 Apparatus and method for atomic force microscopy in controlled atmosphere |
| 01/01/2014 | EP2678695A2 Integrated microscope and related methods and devices |
| 01/01/2014 | CN103487602A Anatomization method for integrated circuit chip |
| 12/31/2013 | US8618520 Method and apparatus for processing a micro sample |
| 12/25/2013 | CN203365463U AFM sample height-automatically adjustable device |
| 12/25/2013 | CN103472265A Method for observing TSV (through-silicon-via) copper crystalline grains |
| 12/19/2013 | WO2013186622A1 Mounting systems for a surface forces apparatus |
| 12/19/2013 | US20130340125 Band excitation method applicable to scanning probe microscopy |
| 12/19/2013 | CA2876127A1 Mounting systems for a surface forces apparatus |
| 12/17/2013 | US8607622 High frequency deflection measurement of IR absorption |
| 12/12/2013 | US20130333077 Integrated Microscope and Related Methods and Devices |
| 12/11/2013 | CN203337681U Parallel force continuously self-loading compression device sample |
| 12/10/2013 | US8604430 Method and an apparatus of an inspection system using an electron beam |
| 11/27/2013 | CN103412148A Soundproof box applied to atomic force microscope |
| 11/12/2013 | US8583403 Method of measuring an anisotropic surface diffusion tensor or surface energy anisotropies |
| 11/12/2013 | US8583396 Impedance-scanning quartz crystal microbalance |
| 11/05/2013 | US8574892 Methods and apparatus for nucleic acid sequencing by signal stretching and data integration |
| 10/31/2013 | WO2013161545A1 Composite microscope combining scanning probe microscope and optical microscope; control device, control method, and control program therefor; and recording medium |
| 10/30/2013 | CN102520212B Device for thinning multi-layer material and method for thinning to-be-detected sample |
| 10/30/2013 | CN102495237B In-situ processing test device for material interface |
| 10/24/2013 | WO2013157419A1 Compound microscope |
| 10/23/2013 | CN103364594A Sample applied to atomic force nano probe test and manufacturing method thereof |
| 10/16/2013 | CN203241437U Parallel force continuous self-loading device sample |
| 10/15/2013 | US8558173 Method of inspecting pattern and inspecting instrument |
| 10/10/2013 | WO2013149696A1 Touch-screen based scanning probe microscopy (spm) |
| 10/09/2013 | EP2648004A1 Touch-screen based scanning probe microscopy (SPM) |
| 10/09/2013 | EP1520292B1 Software synchronization of multiple scanning probes |
| 10/09/2013 | CN203232049U Apparatus capable of adjusting AFM sample horizontal distance |
| 10/09/2013 | CN103344789A Thin sample transmission filtration-reflection receiving type contrast separation imaging method in scanning electron microscope |
| 10/09/2013 | CN102346152B Sample failure analysis method |
| 10/03/2013 | WO2013148320A1 Non-vector space sensing and control systems and methods for video rate imaging and manipulation |
| 10/03/2013 | WO2013148204A1 Microscope objective mechanical testing instrument |
| 10/02/2013 | EP2643658A1 Mechanical testing instruments including onboard data |
| 10/02/2013 | CN203224513U Device capable of adjusting angle of AFM sample |
| 10/02/2013 | CN203224512U Device capable of adjusting height of AFM sample |
| 10/02/2013 | CN103336148A Forming method of sample positioning marks |
| 10/02/2013 | CN103336147A High-frequency vibration clamp device for scanning ion conductance microscope |
| 10/02/2013 | CN103336146A Sample moving platform based on piezoceramic scanner and control method thereof |
| 10/01/2013 | US8549660 Cantilever-based optical fiber probe interfacial force microscope for partial immersion in liquid |
| 09/26/2013 | WO2013142489A1 Scanning probe microscope with improved feature location capabilities |
| 09/25/2013 | CN103323298A Double piston type intact loess scanning electron microscope sample preparation method |
| 09/25/2013 | CN102269771B Method for preparing observational sample of transmission electron microscope |
| 09/25/2013 | CN101545874B Environmental cell for a particle-optical apparatus |
| 09/17/2013 | US8536862 Apparatus and method of obtaining field by measurement |
| 09/11/2013 | CN103293340A Scanning electron microscope magnetic resistance measurement sample stage and nano single magnetic transport property measuring instrument |
| 09/06/2013 | WO2013130739A2 Interactive comparative display of information |
| 09/04/2013 | CN103278661A Parallel force continuous self loading compression device sample |
| 09/03/2013 | US8528111 Method for positioning an atomic force microscopy tip in a cell |
| 09/03/2013 | US8524488 Methods and devices for determining a cell characteristic, and applications employing the same |
| 08/28/2013 | CN103267874A Liquid level automatic control system of atomic force microscope liquid phase imaging |
| 08/15/2013 | US20130212750 Zero thermal expansion, low heat transfer, variable temperature sample assembly for probe microscopy |
| 08/13/2013 | US8506909 Device for receiving a test sample |
| 08/08/2013 | US20130205454 Scanning probe microscope |
| 08/06/2013 | US8505109 Measuring probe device for a probe microscope, measuring cell and scanning probe microscope |
| 08/06/2013 | US8499621 Scanning probe microscopy inspection and modification system |
| 08/01/2013 | US20130198913 Apparatus for mechanically robust thermal isolation of components |
| 07/31/2013 | CN203101425U Sample stage for scanning various sample sections by using atomic force microscope |
| 07/31/2013 | CN203101424U Compressing device matched with atomic force microscopy |
| 07/31/2013 | CN203101423U Stretching device matched with atomic force microscopy |
| 07/16/2013 | US8487253 Scanning electron microscope |
| 07/11/2013 | WO2013102561A1 Method for measuring the near-field signal |
| 07/11/2013 | US20130180018 Quantitative characterization of metallic and semiconductor single-walled carbon nanotube ratios |
| 07/10/2013 | EP2613159A1 Method for measuring the near-field signal |
| 07/04/2013 | US20130174300 High-scan rate positioner for scanned probe microscopy |
| 07/02/2013 | US8479311 Device and method for an atomic force microscope for the study and modification of surface properties |
| 07/02/2013 | US8479309 Ultra-low damping imaging mode related to scanning probe microscopy in liquid |
| 06/27/2013 | WO2013093732A1 Optical and atomic force microscopy integrated system for multi-probe spectroscopy measurements applied in a wide spatial region with an extended range of force sensitivity. |
| 06/26/2013 | CN102445567B Monitoring method of environmental magnetic shield of electronic scanning microscope |
| 06/11/2013 | US8459102 Digital Q control for enhanced measurement capability in cantilever-based instruments |
| 06/05/2013 | CN202975047U Atomic force microscope (AFM) dustproof moistureproof cover |
| 05/28/2013 | USRE44240 Electron beam exposure system |
| 05/28/2013 | US8448502 Band excitation method applicable to scanning probe microscopy |
| 05/23/2013 | WO2013074146A1 Method and apparatus for signal path equalization in a scanning acoustic microscope |
| 05/23/2013 | WO2013073186A1 Sealed-type afm cell |
| 05/22/2013 | CN103116039A Film sampling compressing device used with atomic force microscopes |
| 05/16/2013 | US20130125269 Method And Apparatus Of Tuning A Scanning Probe Microscope |
| 05/15/2013 | CN103105510A Film sample stretching device used for being matched with atomic force microscope (AFM) |
| 05/14/2013 | US8443459 Fast-scanning SPM scanner and method of operating same |
| 05/07/2013 | US8438661 Scanning probe microscope |
| 05/07/2013 | US8438660 Micro contact prober |
| 05/01/2013 | CN102590558B Movable temperature control system for environmental scanning electron microscope |
| 04/30/2013 | US8430991 Apparatus for producing near field optical head |
| 04/24/2013 | EP2584363A1 Scanning method for scanning a sample with a probe |
| 04/24/2013 | EP2584362A1 Scanning method for scanning a sample with a probe |