Patents for B24B 37 - Lapping machines or devices; Accessories (20,836)
02/2006
02/21/2006US7001257 Multi-chamber carrier head with a flexible membrane
02/21/2006US7001256 Carrier head with a non-stick membrane
02/21/2006US7001254 Apparatus and method for conditioning a contact surface of a processing pad used in processing microelectronic workpieces
02/21/2006US7001253 an abrasive, a carrier, and either boric acid, or a conjugate base in a non-buffered aqueous solution; abrasive can be fixed on a pad or suspended in solution; high speed polishing, planarization efficiency, uniformity
02/21/2006US7001252 Abrasive material
02/21/2006US7001251 Method and apparatus for releasably attaching a polishing pad to a chemical-mechanical planarization machine
02/21/2006US7001246 Method and apparatus for monitoring a metal layer during chemical mechanical polishing
02/21/2006US7001245 Substrate carrier with a textured membrane
02/21/2006US7001244 Polishing apparatus
02/21/2006US7001242 Method and apparatus of eddy current monitoring for chemical mechanical polishing
02/16/2006WO2006017008A1 Abrasive material having an antiloading coating
02/16/2006US20060035573 Polishing pad and method of making same
02/16/2006US20060035571 Polishing apparatus
02/16/2006US20060035564 Fine force actuator assembly for chemical mechanical polishing apparatuses
02/16/2006US20060035563 Method, apparatus and system for use in processing wafers
02/16/2006US20060032148 Method of manufacturing polishing slurry for use in precise polishing process
02/16/2006US20060032147 Method of preparing slurry composition for chemical mechanical polishing
02/16/2006DE19937784B4 Zweischeiben-Feinschleifmaschine Two slices of fine grinding
02/15/2006EP1625915A1 Double-sided polishing apparatus for thin workpieces, e.g. wafers
02/15/2006EP1625613A1 Substrate holding apparatus and polishing apparatus
02/15/2006CN1735481A Method of using a soft subpad for chemical mechanical polishing
02/15/2006CN1735480A Apparatus and methods for detecting transitions of wafer surface properties in chemical mechanical polishing for process status and control
02/15/2006CN1735478A Method and apparatus of eddy current monitoring for chemical mechanical polishing
02/15/2006CN1735477A Method and apparatus for processing sliders for use in disk drives and the like
02/15/2006CN1242460C Method for determinating endpoint and semiconductor wafer
02/14/2006US6998166 Polishing pad with oriented pore structure
02/14/2006US6998013 CMP apparatus polishing head with concentric pressure zones
02/14/2006US6997793 Polishing pad, polishing apparatus having the same, and bonding apparatus
02/14/2006US6997791 CMP polishing heads and methods of using the same
02/14/2006US6997789 Method and apparatus for planarizing a microelectronic substrate with a tilted planarizing surface
02/14/2006US6997788 Multi-tool, multi-slurry chemical mechanical polishing
02/14/2006US6997784 Storage device slider with sacrificial lapping extension
02/14/2006US6997782 Polishing apparatus and a method of polishing and cleaning and drying a wafer
02/14/2006US6997781 Fixed-abrasive chemical-mechanical planarization of titanium nitride
02/14/2006US6997778 Polishing apparatus
02/14/2006US6997776 Process for producing a semiconductor wafer
02/09/2006WO2006014411A1 Method and system for processing wafers
02/09/2006WO2006013996A1 Method of manufacturing polishing carrier and silicon substrate for magnetic recording medium, and silicon substrate for magnetic recording medium
02/09/2006US20060030503 Slurry for CMP, polishing method and method of manufacturing semiconductor device
02/09/2006US20060030244 Substrate polishing apparatus
02/09/2006US20060030243 Polishing composition
02/09/2006US20060030241 Pad backer and cmp process using the same
02/09/2006US20060030240 Method and apparatus for planarizing microelectronic workpieces
02/09/2006US20060027528 Ion bombardment of electrical lapping guides to decrease noise during lapping process
02/08/2006EP1622743A2 Whole-substrate spectral imaging system for cmp
02/08/2006CN1732068A Substrate holding mechanism, substrate polishing apparatus and substrate polishing method
02/08/2006CN1240802C Cerium based abrasive material and method for preparation thereof
02/08/2006CN1240797C Polishing agent and method for producing planar layers
02/07/2006US6995850 Monitoring apparatus for polishing pad and method thereof
02/07/2006US6995091 Process for chemically mechanically polishing wafers
02/07/2006US6995090 Polishing slurry for use in CMP of SiC series compound, polishing method, and method of manufacturing semiconductor device
02/07/2006US6994802 includes phosphors having a small particle size, narrow particle size distribution, spherical morphology and good crystallinity; utilized in cathode ray tube (CRT) screens for televisions and similar devices
02/07/2006US6994612 Methods for conditioning surfaces of polishing pads after chemical-mechanical polishing
02/07/2006US6994611 (CMP); polishing head for holding and applying first or second a wafer to the CMP pad surface; and a chemical dispenser for uniformly applying pad cleaning chemicals appropriate for either copper or oxide wafer surface across the CMP pad surface
02/07/2006US6994607 Polishing pad with window
02/07/2006US6993934 Dental glass powders
02/07/2006CA2497731C Magnetorheological polishing devices and methods
02/02/2006US20060025061 Polishing pad having grooves configured to promote mixing wakes during polishing
02/02/2006US20060025056 End effectors and methods for manufacturing end effectors with contact elements to condition polishing pads used in polishing micro-device workpieces
02/02/2006US20060025052 Method and apparatus of eddy current monitoring for chemical mechanical polishing
02/02/2006US20060022368 Method of fabricating polyurethane foam with micro pores and polishing pad therefrom
02/01/2006EP1622193A1 Polishing pad and method for producing same
02/01/2006EP1621595A1 Method of manufacturing polishing slurry for use in precise polishing process
02/01/2006EP1242557B8 Method of polishing or planarizing a substrate
02/01/2006CN2754814Y Rolling arm structure of grinder
02/01/2006CN1729082A 流动控制系统 Flow control system
02/01/2006CN1728343A Baffle and wafer grinding appts.
02/01/2006CN1240111C Device for eliminating stress by machining
02/01/2006CN1239962C Photosensitive object regenerative method and device, photosensitive object, image forming device
02/01/2006CN1239665C Polishing compound and method for preparation thereof, and polishing method
02/01/2006CN1239243C Process and apparatus for blending and distributing a slurry solution
01/2006
01/31/2006US6992009 Method of manufacturing a semiconductor device
01/31/2006US6991740 Method for reducing removal forces for CMP pads
01/31/2006US6991528 Polishing article for processing a substrate comprises a fabric layer having a conductive layer disposed thereover. The conductive layer has an exposed surface adapted to polish a substrate. The fabric layer may be woven or non-woven. The
01/31/2006US6991526 Control of removal profile in electrochemically assisted CMP
01/31/2006US6991520 Abrasive machine and method of abrading work piece
01/31/2006US6991517 Linear polishing sheet with window
01/31/2006US6991516 Chemical mechanical polishing with multi-stage monitoring of metal clearing
01/31/2006US6991515 Ultra fine particle film forming method and apparatus
01/31/2006US6991513 Magnetic head grinding device and method
01/31/2006US6991512 Apparatus for edge polishing uniformity control
01/26/2006WO2006009634A1 Continuous contour polishing of a multi-material surface
01/26/2006WO2006009304A1 Polishing apparatus and substrate processing method
01/26/2006WO2006009222A1 Plate glass crack detection method and detector, and plate glass polishing method and device
01/26/2006WO2006009160A1 Cmp polishing agent and method for polishing substrate
01/26/2006US20060019588 Polishing pad, polishing apparatus having the same, and bonding apparatus
01/26/2006US20060019584 Method and apparatus for conditioning a polishing pad
01/26/2006US20060019583 Method and apparatus for conditioning a polishing pad
01/26/2006US20060016128 Abrasive material having an antiloading coating
01/25/2006EP1618991A1 In-situ endpoint detection and process monitoring method and apparatus for chemical mechanical polishing
01/25/2006EP1294534B2 In-situ endpoint detection and process monitoring method and apparatus for chemical mechanical polishing
01/25/2006CN1726534A Method and apparatus for grounding a magnetic recording head
01/25/2006CN1726240A Polyol composition of the two-part system for foam grindstone, two-part curable composition for foam grindstone, foam grindstone, and process for production thereof
01/25/2006CN1726116A Polishing state monitoring apparatus and polishing apparatus and method
01/25/2006CN1238838C Processing method of polishing head
01/25/2006CN1238560C Solution used for platinum chemical mechanical polishing
01/25/2006CN1238455C Slurry for chemical mechanical polishing
01/25/2006CN1238161C Abrasive article having window system for polishing wafers, and using methods
01/24/2006US6989117 Polishing pads with polymer filled fibrous web, and methods for fabricating and using same
01/24/2006US6988942 Conductive polishing article for electrochemical mechanical polishing