Patents for B24B 37 - Lapping machines or devices; Accessories (20,836)
05/2006
05/11/2006WO2006049269A1 Polishing apparatus
05/11/2006WO2006049197A1 METHOD FOR PRODUCING CeO2 FINE PARTICLES AND POLISHING SLURRY CONTAINING SUCH FINE PARTICLES
05/11/2006WO2005092010A3 Chemical mechanical polishing retaining ring
05/11/2006WO2005090648A3 Electrolytic processing apparatus and electrolytic processing method
05/11/2006US20060099890 Simultaneous planarization of pole piece and coil materials for write head applications
05/11/2006US20060099887 Grinding jig set and grinding method
05/11/2006US20060099886 Electronic die positioning device and method
05/11/2006US20060096702 Apparatus for monitoring and controlling force applied on workpiece surface during electrochemical mechanical processing
05/10/2006EP1655776A1 Polishing method
05/10/2006EP1655103A1 Method of making an abrasive article
05/10/2006CN2778470Y 研磨装置 Grinding device
05/10/2006CN2778469Y Light resin ball grinder
05/10/2006CN2778468Y Grinding disc
05/10/2006CN1771587A Polishing pad and method for producing same
05/10/2006CN1771586A Material for purification of semiconductor polishing slurry, module for purification of semiconductor polishing slurry and process for producing semiconductor polishing slurry
05/10/2006CN1771355A Method and apparatus for local polishing control
05/10/2006CN1771110A Polishing pad apparatus and methods
05/10/2006CN1770403A Tubular polishing pressure ring
05/10/2006CN1769006A 抛光方法 Polishing method
05/10/2006CN1255859C Chemical machinery grinding equipment
05/10/2006CN1255854C Ammonium oxalate-containing polishing system and method
05/09/2006US7042581 Optical techniques for measuring layer thicknesses and other surface characteristics of objects such as semiconductor wafers
05/09/2006US7041599 High through-put Cu CMP with significantly reduced erosion and dishing
05/09/2006US7040971 Carrier head with a flexible membrane
05/09/2006US7040967 Multi-step, in-situ pad conditioning system and method for chemical mechanical planarization
05/09/2006US7040965 Methods for removing doped silicon material from microfeature workpieces
05/09/2006US7040964 Polishing media stabilizer
05/09/2006US7040963 Table of wafer polishing apparatus, method for polishing semiconductor wafer, and method for manufacturing semiconductor wafer
05/09/2006US7040958 Torque-based end point detection methods for chemical mechanical polishing tool which uses ceria-based CMP slurry to polish to protective pad layer
05/09/2006US7040957 Platen and manifold for polishing workpieces
05/09/2006US7040956 Control of chemical mechanical polishing pad conditioner directional velocity to improve pad life
05/09/2006US7040955 Chemical-mechanical planarization tool force calibration method and system
05/09/2006US7040952 Method for reducing or eliminating de-lamination of semiconductor wafer film layers during a chemical mechanical planarization process
05/04/2006US20060094345 Polishing pad, polishing apparatus having the same, and bonding apparatus
05/04/2006US20060094242 Chemical mechanical polishing method, and washing/rinsing method associated therewith
05/04/2006US20060090402 Polishing composition
05/04/2006DE112004001051T5 Substratpoliervorrichtung und Substratpolierverfahren Substrate polishing apparatus and substrate polishing method
05/04/2006DE102005049202A1 Polierzusammensetzung und Polierverfahren unter Verwendung derselben Polishing composition and polishing method using the same
05/04/2006DE10130750B4 Verfahren und Vorrichtung zur abrasiven Bearbeitung von Oberflächen auf Halbleiter-Wafern Method and device for the abrasive machining of surfaces on semiconductor wafers
05/03/2006EP1651388A2 Multi-layer polishing pad material for cmp
05/03/2006EP1651387A1 Polishing pad having edge surface treatment
05/03/2006EP1651386A1 In situ activation of a three-dimensional fixed abrasive article
05/03/2006CN1768417A Polishing pad, process for producing the same and method of polishing therewith
05/03/2006CN1766028A 抛光组合物 The polishing composition
05/03/2006CN1765579A Equipment and method for removing CMP pad from platen
05/03/2006CN1765578A Maintenance method of dedicated digit controlled machine tool plastic jacket
05/03/2006CN1254518C Cerium-based polishing material slurry and method for manufacturing the same
05/02/2006US7037839 Method for polishing organic film on semiconductor substrate by use of resin particles, and slurry
05/02/2006US7037838 Method for polishing a substrate surface
05/02/2006US7037451 Forming the abrasive silica*alumina particles in the aerosol stream, heating; use for chemical mechanical polishing integrated circuit; fine particles coupling with coatings by silanes, narrow particle size distribution, unagglomerated
05/02/2006US7037352 Polishing particle and method for producing polishing particle
05/02/2006US7037184 Polishing pad for use in chemical-mechanical planarization of semiconductor wafers and method of making same
05/02/2006US7037179 Methods and apparatuses for making and using planarizing pads for mechanical and chemical-mechanical planarization of microelectronic substrates
05/02/2006US7037178 Methods for conditioning surfaces of polishing pads after chemical-mechanical polishing
05/02/2006US7037177 Method and apparatus for conditioning a chemical-mechanical polishing pad
05/02/2006US7037175 Method of sharpening cutting edges
05/02/2006US7037174 Methods for reducing delamination during chemical mechanical polishing
05/02/2006US7037172 Advanced wafer planarizing
05/02/2006CA2403860C Tubing head seal assembly
04/2006
04/27/2006WO2006044466A1 Method of sharpening cutting edges
04/27/2006WO2006020153A3 Methods for producing in-situ grooves in chemical mechanical planarization (cmp) pads, and novel cmp pad designs
04/27/2006WO2005024287A3 Working surface and system for production thereof
04/27/2006US20060086056 Aqueous slurry composition for chemical mechanical planarization
04/26/2006EP1650278A2 Composition for selectively polishing silicon nitride layer and polishing method employing it
04/26/2006EP1649075A2 Cvd diamond-coated composite substrate and method for making same
04/26/2006EP1648658A2 Cell, system and article for electrochemical mechanical processing (ecmp)
04/26/2006EP1490830B1 Abrasive articles and methods for the manufacture and use of same
04/26/2006CN2774706Y Grinder
04/26/2006CN1253740C Appts. for and method of maching of optical connector end
04/25/2006US7033252 Wafer carrier with pressurized membrane and retaining ring actuator
04/25/2006US7033251 Carrier assemblies, polishing machines including carrier assemblies, and methods for polishing micro-device workpieces
04/25/2006US7033250 Method for chemical mechanical planarization
04/25/2006US7033248 Systems and methods for monitoring characteristics of a polishing pad used in polishing micro-device workpieces
04/25/2006US7033246 Systems and methods for monitoring characteristics of a polishing pad used in polishing micro-device workpieces
04/25/2006US7033245 Lapping apparatus and lapping method
04/20/2006WO2006042010A1 Method and apparatus for improved chemical mechanical planarization
04/20/2006WO2006041889A2 Conductive pad design modification for better wafer-pad contact
04/20/2006WO2006041727A1 A chemical mechanical polishing pad and method for selective metal and barrier polishing
04/20/2006WO2006041248A1 Loading device for chemical mechanical polisher of semiconductor wafer
04/20/2006WO2006040864A1 Abrasive pad
04/20/2006US20060084369 Polishing apparatus
04/20/2006US20060084367 Method of sharpening cutting edges
04/20/2006US20060084365 Polishing pad
04/20/2006US20060084270 Composition for selectively polishing silicon nitride layer and polishing method employing it
04/20/2006US20060081460 Method and apparatus for electrochemical planarization of a workpiece
04/20/2006US20060080896 edge polishing a semiconductor substrate using a mixture containing imidazole and the imidazole derivative contribute to an improvement of the polishing ability; silica abrasives, tetramethylammonium hydroxide, a water-soluble polymer, a chelating agent, and water, and containing no oxidizing agent
04/19/2006EP1647359A1 Polishing pad
04/19/2006EP1646478A1 Method for epiready surface treatment on sic thin films
04/19/2006EP1345734B1 Crosslinked polyethylene polishing pad for chemical-mechnical polishing and polishing apparatus
04/19/2006CN1760307A Polishing composition and polishing method using the same
04/19/2006CN1760240A 抛光垫 Polishing pad
04/18/2006US7030018 Methods and systems for monitoring a parameter of a measurement device during polishing, damage to a specimen during polishing, or a characteristic of a polishing pad or tool
04/18/2006US7029747 nonporous uniform transparent polymer elastic support layer and a semitransparent polishing layer that has a higher hardness than the support layer; both made of compatible materials so that a structural border between the layers does not exist; open pores defined by the embedded liquid microelements
04/18/2006US7029596 Computer integrated manufacturing control system for oxide chemical mechanical polishing
04/18/2006US7029509 Performance; efficiency
04/18/2006US7029508 Catalyst attached to solid and used to promote free radical formation in CMP formulations
04/18/2006US7029386 Retaining ring assembly for use in chemical mechanical polishing
04/18/2006US7029383 Polishing head of chemical mechanical polishing apparatus
04/18/2006US7029382 Apparatus for chemical-mechanical polishing (CMP) head having direct pneumatic wafer polishing pressure
04/18/2006US7029381 Apparatus and method for chemical mechanical polishing of substrates