Patents for B24B 37 - Lapping machines or devices; Accessories (20,836)
09/2005
09/01/2005US20050191948 Polishing pads and planarizing machines for mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies, and methods for making and using such pads and machines
09/01/2005US20050191947 Retaining ring with shaped surface
09/01/2005US20050191946 Methods and apparatus for controlling the lapping of a slider based on an amplitude of a readback signal produced from an externally applied magnetic field
09/01/2005US20050191945 Polishing pad for use in chemical/mechanical planarization of semiconductor wafers having a transparent window for end-point determination and method of making
09/01/2005US20050191942 CMP apparatus and process sequence method
09/01/2005US20050191859 Method of evaluating film thickness, method of detecting polishing terminal, and device-manufacturing apparatus
09/01/2005US20050191858 Substrate processing method and apparatus
09/01/2005US20050191823 Polishing composition and polishing method
09/01/2005US20050189517 includes phosphors having a small particle size, narrow particle size distribution, spherical morphology and good crystallinity; utilized in cathode ray tube (CRT) screens for televisions and similar devices
09/01/2005US20050189322 Compositions and methods for chemical mechanical polishing silica and silicon nitride
09/01/2005US20050189235 Multi-phase polishing pad
09/01/2005US20050189065 Method of forming a layered polishing pad
09/01/2005DE10392995T5 Verfahren und Vorrichtung zum Polieren Substrats A method and apparatus for polishing substrate
09/01/2005DE10305711B4 Gimpelhalter und chemisch-mechanische Polieranlage mit einem solchen Gimpelhalter Gimpel holder and chemical mechanical polishing system with such Gimpel holder
08/2005
08/31/2005EP1568746A1 Polishing composition and polishing method
08/31/2005EP1568074A1 Carrier head for chemical mechanical polishing apparatus
08/31/2005EP1567606A1 A corrosion retarding polishing slurry for the chemical mechanical polishing of copper surfaces
08/31/2005EP1567306A1 Transparent microporous materials for cmp
08/31/2005EP1550152A4 Method and apparatus for applying differential removal rates to a surface of a substrate
08/31/2005CN2721317Y High-accuracy gravity planar grinding polisher with double rotary oscillation
08/31/2005CN1663028A Polishing body, polishing device, semiconductor device, and method of manufacturing semiconductor device
08/31/2005CN1661780A CMP apparatus and polishing method
08/31/2005CN1660951A 抛光组合物和抛光方法 Polishing composition and polishing method
08/31/2005CN1660923A Compositions and methods for chemical mechanical polishing silica and silicon nitride
08/31/2005CN1660543A Method of forming a layered polishing pad
08/31/2005CN1216953C Polishing composition for metal CMP and method of polishing susbstroote
08/30/2005US6937915 Apparatus and methods for detecting transitions of wafer surface properties in chemical mechanical polishing for process status and control
08/30/2005US6936543 CMP method utilizing amphiphilic nonionic surfactants
08/30/2005US6936541 Method for planarizing metal interconnects
08/30/2005US6936480 Method of controlling the chemical mechanical polishing of stacked layers having a surface topology
08/30/2005US6936304 Comprises luminophores/phosphors; vapor phase deposition
08/30/2005US6935938 Multiple-conditioning member device for chemical mechanical planarization conditioning
08/30/2005US6935935 Measuring apparatus
08/30/2005US6935932 Polishing apparatus and method
08/30/2005US6935931 thermoplastic polyurethane foam with an average pore size of about 50 mu m or less, and multi-modal pore size distribution; useful for chemical mechanical polishing
08/30/2005US6935930 Polishing apparatus and method, and wafer evacuation program
08/30/2005US6935929 Polishing machines including under-pads and methods for mechanical and/or chemical-mechanical polishing of microfeature workpieces
08/30/2005US6935926 System and method for reducing surface defects in integrated circuits
08/30/2005US6935922 Methods and systems for generating a two-dimensional map of a characteristic at relative or absolute locations of measurement spots on a specimen during polishing
08/30/2005US6935013 Apparatus and method for precise lapping of recessed and protruding elements in a workpiece
08/25/2005WO2005077999A1 Polyurethane polishing pad
08/25/2005WO2005077602A1 Base pad polishing pad and multi-layer pad comprising the same
08/25/2005US20050186892 Profile control platen
08/25/2005US20050186891 Multi-step, in-situ pad conditioning system and method for chemical mechanical planarization
08/25/2005US20050186887 Processing method and apparatus
08/25/2005US20050186691 Method of determining a flatness of an electronic device substrate, method of producing the substrate, method of producing a mask blank, method of producing a transfer mask, polishing method, electronic device substrate, mask blank, transfer mask, and polishing apparatus
08/25/2005US20050185180 Semiconductor processor control systems
08/25/2005US20050184465 Seal assembly manufacturing methods and seal assemblies manufactured thereby
08/24/2005EP1566421A2 CMP abrasive, liquid additive for CMP abrasive and method for polishing substrate.
08/24/2005EP1274807B1 Polishing agent and method for producing planar layers
08/24/2005CN2719493Y Automatic wheel-replacing device for grinding machine
08/24/2005CN1659688A Polishing fluid and method of polishing
08/24/2005CN1659252A Metal oxide powder for high precision polishing and method of preparation thereof
08/24/2005CN1659249A Method for chemical mechanical polishing (cmp) of low-k dielectric materials
08/24/2005CN1216112C Polishing composition and polishing method for its use
08/23/2005US6934040 Optical techniques for measuring layer thicknesses and other surface characteristics of objects such as semiconductor wafers
08/23/2005US6932896 Applying a reverse bias that will cause removal of, or reduction in the size of, conductive particles on the work-piece-surface-influencing device; brushes rotating in a different direction during electrodeposition; wafers/circuits
08/23/2005US6932687 Planarizing pads for planarization of microelectronic substrates
08/23/2005US6932684 Reciprocal blade lapping machine
08/23/2005US6932679 Apparatus and method for loading a wafer in polishing system
08/23/2005US6932677 Polishing pad, method of manufacturing glass substrate for use in data recording medium using the pad, and glass substrate for use in data recording medium obtained by using the method
08/23/2005US6932676 Blasting apparatus and process for accelerating blast media
08/23/2005US6932672 Apparatus for in-situ optical endpointing on web-format planarizing machines in mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies and methods for making and using same
08/23/2005US6932671 Method for controlling a chemical mechanical polishing (CMP) operation
08/18/2005US20050181712 Apparatus and method for conditioning a contact surface of a processing pad used in processing microelectronic workpieces
08/18/2005US20050181709 Rinse apparatus and method for wafer polisher
08/18/2005US20050181708 Removal of embedded particles during chemical mechanical polishing
08/18/2005US20050181706 Method and control system for improving cmp process by detecting and reacting to harmonic oscillation
08/18/2005US20050181609 Polishing fluid and polishing method
08/18/2005US20050178743 A multilayer pad having a plurality of independent electrical biasable zones, attaching to exterior power source from one layer; controlling the rate of copper material removal from printed circuits, determining each polishing time in each zone; electrical apparatus for making semiconductors
08/18/2005DE10393369T5 Poliervorrichtung, Polierkopf und Polierverfahren Polishing machine, polishing head and polishing method
08/18/2005DE102005002167A1 Gerilltes Polierkissen und Verfahren Grooved polishing pad and method
08/18/2005DE102005000645A1 Treatment of substrate for manufacture of semiconductor device comprises chemically mechanically polishing substrate in intermediate polishing step then in final polishing step
08/18/2005DE102004058708A1 Polierkopf und Poliervorrichtung Polishing head and polishing machine
08/18/2005DE102004004556A1 Verfahren zur Herstellung der Halbleiterscheibe A process for producing the semiconductor wafer
08/17/2005EP1563952A1 Surface treatment method for vacuum member
08/17/2005EP1141154B1 Polishing composition and method
08/17/2005CN2717615Y Grinding apparatus for optical fibre connector plug pin body ends
08/17/2005CN2717614Y Electronic air door grinding machine
08/17/2005CN1655907A Lapping carrier for use in fabricating sliders
08/17/2005CN1654169A Chemical mechanical polishing pad, production method thereof, and chemical mechanical polishing process
08/17/2005CN1215199C Solution for chemical machinery brightening of ruthenium
08/16/2005US6931330 Methods for monitoring and controlling chemical mechanical planarization
08/16/2005US6930782 End point detection with imaging matching in semiconductor processing
08/16/2005US6930478 Method for monitoring a metal layer during chemical mechanical polishing using a phase difference signal
08/16/2005US6930420 Motor
08/16/2005US6930054 Slurry composition for use in chemical mechanical polishing of metal wiring
08/16/2005US6930037 Process for forming a metal interconnect
08/16/2005US6930023 Semiconductor wafer thinning method, and thin semiconductor wafer
08/16/2005US6929755 Method of and apparatus for chemical mechanical polishing and slurry supplying device
08/16/2005US6929533 Methods for enhancing within-wafer CMP uniformity
08/16/2005US6929532 Method and apparatus for filtering a chemical polishing slurry of a wafer fabrication process
08/16/2005US6929531 System and method for metal residue detection and mapping within a multi-step sequence
08/16/2005US6929530 Apparatus for in-situ optical endpointing on web-format planarizing machines in mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies and methods for making and using same
08/16/2005US6929529 Polishing apparatus
08/11/2005WO2005072338A2 Multi-step pad conditioningh system and method for chemical planarization
08/11/2005WO2005072332A2 Chemical mechanical planarization process control utilizing in-situ conditioning process
08/11/2005US20050176354 Flexible membrane for a polishing head and chemical mechanical polishing (CMP) apparatus having the same
08/11/2005US20050176351 System, method, and apparatus for non-traditional kinematics/tooling for efficient charging of lapping plates
08/11/2005US20050176349 Load cup for chemical mechanical polishing