Patents for B24B 37 - Lapping machines or devices; Accessories (20,836)
01/2007
01/04/2007US20070004321 Systems and methods for mechanical and/or chemical-mechanical polishing of microfeature workpieces
01/04/2007US20070004210 Polishing composition and polishing method
01/04/2007US20070000874 Method and apparatus for polishing a substrate
01/04/2007US20070000872 Method for chemically mechanically polishing organic film, method of manufacturing semiconductor device, and program therefor
01/04/2007DE10234956B4 Verfahren zum Steuern des chemisch mechanischen Polierens von gestapelten Schichten mit einer Oberflächentopologie A method for controlling the chemical mechanical polishing of stacked layers with a surface topology
01/03/2007EP1739729A1 Polishing pad for semiconductor wafer, polishing multilayered body for semiconductor wafer having same, and method for polishing semiconductor wafer
01/03/2007EP1738871A1 Polishing apparatus
01/03/2007EP1568074A4 Carrier head for chemical mechanical polishing apparatus
01/03/2007CN1890055A Chemical mechanical polishing method for reducing slurry reflux
01/03/2007CN1890054A Even nucleation between silicon and oxide surfaces for thin silicon nitride film growth
01/02/2007US7156975 Polishing method and electropolishing apparatus
01/02/2007US7156946 Wafer carrier pivot mechanism
01/02/2007US7156933 Configuration and method for mounting a backing film to a polish head
01/02/2007US7156888 Cerium-based abrasive material and method for preparation thereof
01/02/2007US7156727 Web-format polishing pads and methods for manufacturing and using web-format polishing pads in mechanical and chemical-mechanical planarization of microelectronic substrates
01/02/2007US7156726 Polishing apparatus and method for forming an integrated circuit
01/02/2007US7156725 Substrate polishing machine
01/02/2007US7156721 Polishing pad with flow modifying groove network
01/02/2007US7156720 Substrate holding apparatus
01/02/2007US7156719 Polishing apparatus
01/02/2007US7156717 situ finishing aid control
12/2006
12/28/2006US20060292967 Polishing apparatus
12/28/2006US20060289826 Hazardous substance decomposer and process for producing the same
12/27/2006EP1736574A1 Nitride crystal, epilayer-containing nitride crystal substrate, semiconductor device and method of manufacturing the same
12/27/2006CN1292464C Feedback control of a chemical mechanical polishing device providing manipulation of removal rate profiles
12/27/2006CN1292460C Slurry for CMP, polishing method and method of manufacturing semiconductor device
12/27/2006CN1292033C Methanol-containing silica-based CMP compositions
12/26/2006US7153777 Methods and apparatuses for electrochemical-mechanical polishing
12/26/2006US7153767 Chemical mechanical polishing stopper film, process for producing the same, and method of chemical mechanical polishing
12/26/2006US7153410 Alternating current, direct current power sources; switches
12/26/2006US7153335 Tunable composition and method for chemical-mechanical planarization with aspartic acid/tolyltriazole
12/26/2006US7153197 Method for achieving uniform CU CMP polishing
12/26/2006US7153196 Method of polishing using a polishing agent
12/21/2006US20060286904 Polishing System With In-Line and In-Situ Metrology
12/21/2006US20060286350 Chemical mechanical polishing pad having secondary polishing medium capacity control grooves
12/21/2006US20060283840 second slurry comprising a resin particle having a primary particle diameter ranging from 0.05 to 5 mu m, and a surfactant having a hydrophilic moiety to greatly minimize the number of defects that may be caused due to the residue of resist
12/21/2006US20060283839 Polishing equipment having a longer operating time length
12/21/2006US20060283092 Abrasive compounds for semiconductor planarization
12/20/2006EP1732732A1 Methods and apparatuses for electrochemical-mechanical polishing
12/20/2006CN1883044A Semiconductor surface protecting sheet and method
12/20/2006CN1883033A Protecting thin semiconductor wafers during back-grinding in high-volume production
12/20/2006CN1881540A A silica and a silica-based slurry
12/20/2006CN1881539A Aqueous dispersoid for chemical machinery grinding and grinding method and concocting reagent kit
12/20/2006CN1880020A Sandpaper for grinding supporting utensil membrane
12/20/2006CN1291462C Slurry for chemical-mechanical polishing method and system and its use
12/20/2006CN1291459C Chemical mechanical polishing method and related washing/flushing method
12/20/2006CN1290961C Aqueous dispersion body for chemically mechanical polishing and semiconductor device production method
12/20/2006CN1290667C Grinding method for shaping bended surface of workpiece
12/19/2006US7151056 Method and apparatus for forming a planarizing pad having a film and texture elements for planarization of microelectronic substrates
12/19/2006US7150674 Both-side grinding method and both-side grinding machine for thin disc work
12/19/2006US7150673 Method for estimating polishing profile or polishing amount, polishing method and polishing apparatus
12/14/2006WO2006133249A2 Integrated chemical mechanical polishing composition and process for single platen processing
12/14/2006WO2006132725A1 Conditioning element for electrochemical mechanical processing
12/14/2006WO2006132055A1 Semiconductor abrasive
12/14/2006WO2006081286A3 Multi-layer polishing pad for low-pressure polishing
12/14/2006WO2006080796A8 Cerium oxide abrasive and slurry containing the same
12/14/2006US20060281395 Retaining ring with flange for chemical mechanical polishing
12/14/2006US20060280930 Polishing pad and method of producing the same
12/14/2006US20060280929 Polishing pad and method of producing the same
12/14/2006DE10208166B4 Verfahren zur Herstellung von Metallleitungen mit verbesserter Gleichförmigkeit auf einem Substrat A process for the production of metal pipes with improved uniformity on a substrate
12/13/2006EP1549464B1 Retaining ring for holding semiconductor wafers in a chemical-mechanical polishing device
12/13/2006CN1290162C Polishing compound and method for polishing substrate
12/13/2006CN1289627C Silica and silica-based slurry
12/13/2006CN1289626C Cerium-based polish and cerium-based polish slurry
12/13/2006CN1289620C Paste used for polishing copper base metal
12/13/2006CN1289619C Silica-based slurry
12/13/2006CN1289263C Fixed abrasive article for use in modifying semiconductor wafer and apparatus and modification method
12/12/2006US7148189 Halides and salts on silica, alumina, titania and polishing films for integrated circuits
12/12/2006US7147544 Glass-ceramics
12/12/2006US7147543 Carrier assemblies, planarizing apparatuses including carrier assemblies, and methods for planarizing micro-device workpieces
12/12/2006US7147541 Thickness control method and double side polisher
12/07/2006WO2004053942A3 Measuring alignment between a wafer chuck and polishing/plating receptacle
12/07/2006US20060276115 Apparatus and method for conditioning polishing surface, and polishing apparatus and method of operation
12/07/2006US20060276113 Polishing cloth, polishing apparatus and method of manufacturing semiconductor devices
12/07/2006US20060275939 Composition and method for temporarily fixing solids
12/07/2006US20060274326 Method and apparatus for measuring a polishing condition
12/07/2006DE102005034119B3 Semiconductor wafer processing e.g. lapping, method for assembly of electronic components, involves processing wafer until it is thinner than rotor plate and thicker than layer, with which recess of plate is lined for wafer protection
12/07/2006DE102005026547A1 Vorrichtung zum Drahttrennläppen Apparatus for Drahttrennläppen
12/07/2006DE102005026546A1 Wire separation lapping method involves detecting operating parameters of feed rate, pendulum angle, wire tension and deflection angle and regulating one parameter during separation process, such that contact length of wire is kept constant
12/06/2006CN1874874A Pad assembly for electrochemical mechanical processing
12/06/2006CN1873925A Chemical machanical grinding method, and equipment for preventing rudimental grinding pulp
12/06/2006CN1288722C Chemical and mechanical polishing size and chemical and mechanical polishing method using said size
12/05/2006US7144848 Cleaning compositions containing hydroxylamine derivatives and processes using same for residue removal
12/05/2006US7144815 Chemical mechanical polishing slurry
12/05/2006US7144814 Abrasive composition for the integrated circuits electronics industry
12/05/2006US7144518 Providing magnetic heads which include CoFe elements; providing a slurry including Al2O3 and H2O2; adjusting the concentration of H2O2 in slurry to within a range of 6 12% by volume; polishing CoFe elements using slurry; and balancing mechanical polishing action
12/05/2006US7144304 Method and apparatus for planarizing a microelectronic substrate with a tilted planarizing surface
12/05/2006US7144301 Method and system for planarizing integrated circuit material
12/05/2006US7144298 Method for manufacturing semiconductor device and apparatus for manufacturing thereof
11/2006
11/30/2006WO2006127780A2 Cmp retaining ring
11/30/2006WO2006127054A1 Smart conditioner rinse station
11/30/2006WO2006126432A1 Polishing composition for silicon wafer
11/30/2006WO2006126420A1 Method for detecting polishing end in cmp polishing device, cmp polishing device, and semiconductor device manufacturing method
11/30/2006US20060270328 Method of producing polishing cloth
11/30/2006US20060270325 Polishing pad and chemical mechanical polishing apparatus using the same
11/30/2006US20060270323 Polishing apparatus
11/30/2006US20060270237 Apparatus and method for pre-conditioning CMP polishing pad
11/29/2006EP1726402A1 Wafer polishing apparatus and method for polishing wafers
11/29/2006EP1372907B1 Apparatus and methods for aligning a surface of an active retainer ring with a wafer surface during chemical-mechanical polishing
11/29/2006CN2841246Y 研磨垫 Polishing pad
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