Patents for B24B 37 - Lapping machines or devices; Accessories (20,836)
06/2007
06/07/2007US20070128851 Fabrication of semiconductor interconnect structures
06/06/2007EP1560890B1 Cmp method utilizing amphiphilic non-ionic surfactants
06/06/2007EP1197293B1 Polishing device and method
06/06/2007CN2908035Y Multi-station semi-automatic inner pore digital controlled grinding device
06/06/2007CN1974636A Chemical mechanical polishing method and pulp, and method of manufacturing semiconductor device
06/06/2007CN1974129A Polishing method
06/06/2007CN1974124A Voltage mode current control method and system
06/06/2007CN1320610C CMP polishing pad including solid catalyst
06/06/2007CN1320078C Polishing composition
06/05/2007US7226864 Method for producing a silicon wafer
06/05/2007US7226547 Electroluminescent phosphor powders, methods for making phosphor powders and devices incorporating same
06/05/2007US7226337 Platen and head rotation rates for monitoring chemical mechanical polishing
06/05/2007US7226336 Method of producing a semiconductor device by dividing a semiconductor wafer into separate pieces of semiconductor chips
05/2007
05/31/2007WO2007061064A1 Polishing pad for device wafer
05/31/2007WO2007060869A1 Aqueous dispersion for chemical mechanical polishing and chemical mechanical polishing method
05/31/2007WO2007060859A1 Polishing fluid for polishing aluminum films and method for polishing aluminum films with the same
05/31/2007WO2007060673A2 Incorporation of particulate additives into metal working surfaces
05/31/2007WO2007042681A3 Abrasive aqueous suspension based on cerium and silica dioxide particles for polishing surfaces of materials
05/31/2007WO2006127780A3 Cmp retaining ring
05/31/2007WO2006108191A8 Seventy five millimeter silicon carbide wafer with low warp, bow, and ttv
05/31/2007US20070123153 Texturing slurry and texturing method by using same
05/31/2007US20070123152 Incorporation of particulate additives into metal working surfaces
05/31/2007US20070123151 Apparatus for optical inspection of wafers during polishing
05/31/2007US20070123150 Method of evaluating the quality of a lapping plate
05/31/2007US20070123149 Apparatus for evaluating the quality of a lapping plate
05/31/2007US20070122921 Copper Wiring Module Control
05/31/2007US20070122549 forming a solar cell conductive feature using monodisperse silver or silver alloy fine particles coated with a ceramic or metal; silver particles made in an aerosol stream and coated by vapor deposition
05/31/2007US20070120436 Motor
05/31/2007US20070120090 System for the Preferential Removal of Silicon Oxide
05/31/2007US20070119817 Manufacturing method of silicon wafer
05/31/2007DE112005001447T5 Doppelseitenpolierträger und Herstellungsverfahren desselben The same double-side polishing carriers and methods of manufacture
05/31/2007CA2631125A1 Incorporation of particulate additives into metal working surfaces
05/30/2007EP1708848A4 Chemical mechanical planarization process control utilizing in-situ conditioning process
05/30/2007CN2905325Y Hydraulic station of steel ball grinder
05/30/2007CN2905324Y Shuttle type towing polisher for circular hole inner wall polishing
05/30/2007CN2905323Y Upper and lower disc of double-disc grinding machine and workpiece drive mechanism
05/30/2007CN1972780A Polishing apparatus and polishing method
05/30/2007CN1970232A Method of manufacturing chemical mechanical polishing pad
05/30/2007CN1970229A Automatic regulation system for pressure and method
05/30/2007CN1970228A Barrier diaphragm supporting disc
05/30/2007CN1319132C Tantalum barrier removal solution
05/30/2007CN1319130C Apparatus for handling semiconductor substrate, method for handling semiconductor substrate
05/30/2007CN1318469C Method of fabricating polyurethane foam with micro pores and polishing pad therefrom
05/29/2007US7224064 Semiconductor device having conductive interconnections and porous and nonporous insulating portions
05/29/2007US7223690 Substrate processing method
05/29/2007US7223158 Method for polishing a semiconductor wafer
05/29/2007US7223154 Method for forming and using planarizing pads for mechanical and chemical-mechanical planarization of microelectronic substrates
05/29/2007US7223153 Apparatus and method for polishing semiconductor wafers using one or more polishing surfaces
05/24/2007WO2000020167A3 Method and apparatus for automatically polishing magnetic disks and other substrates
05/24/2007US20070117497 Friction reducing aid for CMP
05/24/2007US20070117394 Polishing slurry for CMP and polishing method
05/24/2007US20070113977 Revolution member supporting apparatus and semiconductor substrate processing apparatus
05/23/2007EP1788620A1 Method for producing silicon wafer
05/23/2007EP1347824B1 Process and apparatus for blending and distributing a slurry solution
05/23/2007CN1968785A Real time polishing process monitoring
05/23/2007CN1966594A Polishing composition for metal cmp
05/23/2007CN1966210A Polishing apparatus and method of polishing work
05/23/2007CN1317742C Chemical mechanical planarization compositions for reducing erosion in semiconductor wafers
05/22/2007US7220475 Polishing sheet and polishing work method
05/22/2007US7220166 Methods and apparatus for electromechanically and/or electrochemically-mechanically removing conductive material from a microelectronic substrate
05/22/2007US7220163 Method and apparatus for measuring abrasion amount and pad friction force of polishing pad using thickness change of slurry film
05/18/2007WO2007055901A1 Method for manufacturing microporous cmp materials having controlled pore size
05/18/2007WO2007055678A2 Polishing pad with microporous regions
05/18/2007WO2007055401A1 Method for depositing reflective multilayer film of reflective mask blank for euv lithography and method for producing reflective mask blank for euv lithography
05/18/2007WO2007055278A1 Polishing agent for silicon oxide, liquid additive, and method of polishing
05/18/2007WO2007055124A1 Method of polishing work and apparatus therefor
05/17/2007US20070111641 Methods and apparatus for electromechanically and/or electrochemically-mechanically removing conductive material from a microelectronic substrate
05/17/2007US20070111638 Pad assembly for electrochemical mechanical polishing
05/17/2007US20070111637 Substrate holding apparatus and polishing apparatus
05/17/2007US20070108067 Polishing apparatus and method of polishing work
05/17/2007US20070108066 Voltage mode current control
05/17/2007US20070107182 Orthopaedic component manufacturing method and equipment
05/16/2007EP1785228A1 Apparatus and method for polishing work using electrolytic reduced water
05/16/2007EP1784270A1 Working surface, and system and method for production thereof
05/16/2007CN2900082Y Steel wire winding tube structure of hard material slicer
05/16/2007CN2900081Y Roller shaft assembling structure of hard material slicer
05/16/2007CN2900079Y Numerical control precision round bench grinder special for non-metal
05/16/2007CN1316571C Chemically machinery milling technique and device
05/16/2007CN1315615C Tool for applying resilient tape and related method
05/15/2007US7217989 Composition for selectively polishing silicon nitride layer and polishing method employing it
05/15/2007US7217662 Method of processing a substrate
05/15/2007US7217305 Polishing body
05/15/2007US7217179 Polishing pad
05/15/2007US7217175 Polishing apparatus and polishing method
05/10/2007WO2007052862A1 Chemical mechanical polishing slurry composition for polishing polycrystalline silicon film and method for preparing the same
05/10/2007WO2007052623A1 Abrasive material and process for producing the same
05/10/2007WO2007052555A1 Cerium polishing agent
05/10/2007WO2006013996A8 Method of manufacturing polishing carrier and silicon substrate for magnetic recording medium, and silicon substrate for magnetic recording medium
05/10/2007US20070105491 Wafer Carrier Pivot Mechanism
05/10/2007US20070104605 Silver-containing particles, method and apparatus of manufacture, silver-containing devices made therefrom
05/10/2007US20070102664 polish the polycrystalline silicon surface with a slurry comprising a non-ionic perfluoroalkyl sulfonyl surfactant; planarization of integrated circuit in semiconductor manufacturing processes; prevent the problem of dishing and improve the within-wafer-non-uniformity
05/10/2007US20070102116 Feedback control of chemical mechanical polishing device providing manipulation of removal rate profiles
05/09/2007EP1570512A4 Slurry composition for secondary polishing of silicon wafer
05/09/2007CN1958236A Method for processing grooves of grinding pads in chemico-mechanical polishing
05/09/2007CN1958232A Surface treatment method for golf bar head
05/09/2007CN1314514C Wafer carrier structure for chemical and mechanical grinder
05/08/2007US7214623 Planarization system and method using a carbonate containing fluid
05/08/2007US7214125 Method for controlling pH during planarization and cleaning of microelectronic substrates
05/08/2007US7214124 Equipment and method for polishing both sides of a rectangular substrate
05/08/2007US7214122 Substrate polishing apparatus
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