Patents for B24B 37 - Lapping machines or devices; Accessories (20,836)
05/2000
05/17/2000EP1000705A2 A scalable multipad design for improved CMP process
05/17/2000EP1000704A2 Flattening polishing device and flattening polishing method
05/17/2000EP0999918A1 Polishing semiconductor wafers
05/17/2000CN1253160A New type abrasive composition used in integrated circuit electronic industry
05/16/2000US6062968 Polishing pad for a semiconductor substrate
05/16/2000US6062964 Chemical mechanical polishing apparatus for controlling slurry distribution
05/16/2000US6062963 Retainer ring design for polishing head of chemical-mechanical polishing machine
05/16/2000US6062961 Wafer polishing head drive
05/16/2000US6062959 Polishing system including a hydrostatic fluid bearing support
05/16/2000US6062958 Variable abrasive polishing pad for mechanical and chemical-mechanical planarization
05/16/2000US6062955 Installation for improving chemical-mechanical polishing operation
05/16/2000US6062954 Semiconductor wafer surface flattening apparatus
05/16/2000US6062952 Planarization process with abrasive polishing slurry that is selective to a planarized surface
05/16/2000US6062949 Polishing amount control system and method for same
05/11/2000WO2000026613A1 Optical monitoring of radial ranges in chemical mechanical polishing a metal layer on a substrate
05/11/2000WO2000026609A2 Method and apparatus for measuring substrate layer thickness during chemical mechanical polishing
05/11/2000WO2000026443A2 Method and apparatus for electrochemical mechanical deposition
05/11/2000WO2000025984A1 Chemical mechanical polishing a substrate having a filler layer and a stop layer
05/11/2000WO2000025983A1 Use of zeta potential during chemical mechanical polishing for end point detection
05/11/2000WO2000025982A1 Apparatus and method for performing end point detection on a linear planarization tool
05/11/2000WO2000025981A1 Unpolished work holding board and production method thereof and work polishing method and device
05/11/2000WO2000025980A1 Method and apparatus for grinding wafer
05/10/2000EP0999013A1 Polishing grinding wheel and substrate polishing method with this grinding wheel
05/10/2000EP0999012A2 Method and apparatus for polishing substrate
05/10/2000EP0998536A1 Polishing agent for semiconductor substrates
05/09/2000US6060396 Polishing agent used for polishing semiconductor silicon wafers and polishing method using the same
05/09/2000US6059921 Chemical mechanical polishing apparatus and a polishing cloth for a chemical mechanical polishing apparatus
05/09/2000US6059920 Semiconductor device polishing apparatus having improved polishing liquid supplying apparatus, and polishing liquid supplying method
05/09/2000US6059643 Apparatus and method for polishing a flat surface using a belted polishing pad
05/09/2000US6059638 Magnetic force carrier and ring for a polishing apparatus
05/09/2000US6059636 Wafer polishing apparatus
05/04/2000WO2000024842A1 A chemical mechanical polishing slurry system having an activator solution
05/04/2000WO2000024550A1 Belt for polishing semiconductors
05/04/2000WO2000024548A1 Polishing apparatus and a semiconductor manufacturing method using the same
05/02/2000US6056851 Slurry supply system for chemical mechanical polishing
05/02/2000US6056632 Semiconductor wafer polishing apparatus with a variable polishing force wafer carrier head
05/02/2000US6056631 Chemical mechanical polish platen and method of use
05/02/2000US6056630 Polishing apparatus with carrier head pivoting device
04/2000
04/27/2000WO2000023534A1 Slurries of abrasive inorganic oxide particles and method for adjusting the abrasiveness of the particles
04/27/2000WO2000023230A1 Catastrophic error recovery apparatus and associated methods
04/27/2000WO2000023229A1 Wafer-polishing apparatus
04/27/2000WO2000023228A1 Wafer grinder and method of detecting grinding amount
04/27/2000WO1999064205A9 Method and apparatus for endpoint detection for chemical mechanical polishing
04/27/2000CA2347632A1 Slurries of abrasive inorganic oxide particles and method for adjusting the abrasiveness of the particles
04/26/2000EP0808230B1 Chemical-mechanical polishing of thin materials using a pulse polishing technique
04/25/2000US6054422 Polyoxyalkylene glycol
04/25/2000US6054388 Apparatus for lapping semiconductor wafers and method of lapping thereof
04/25/2000US6054017 Chemical mechanical polishing pad with controlled polish rate
04/25/2000US6053802 Stabilization of slurry used in chemical mechanical polishing of semiconductor wafers by megasonic pulse
04/25/2000US6053801 Substrate polishing with reduced contamination
04/20/2000WO2000021715A2 Semiconductor wafer polishing apparatus with a variable polishing force wafer carrier head
04/20/2000WO2000021714A1 A carrier head with a flexible membrane for chemical mechanical polishing
04/19/2000EP0809557A4 Determining the coefficient of friction of a polishing pad
04/18/2000US6051500 Device and method for polishing a semiconductor substrate
04/18/2000US6051499 Rotation
04/18/2000US6051498 Method for manufacturing a semiconductor wafer which is coated on one side and provided with a finish
04/18/2000US6051495 Comprising a supports and a seasoning layer attached to the first surface of the support device, for seasoning a polishing pad with tungsten polishing by-product to polish tungsten
04/18/2000US6050885 Device for the chemical-mechanical polishing of an object, in particular a semiconductor wafer
04/18/2000US6050884 Polishing apparatus
04/18/2000US6050882 Carrier head to apply pressure to and retain a substrate
04/18/2000US6050879 Process for lapping air bearing surfaces
04/18/2000US6050878 Processing jig
04/13/2000WO2000020167A2 Method and apparatus for automatically polishing magnetic disks and other substrates
04/12/2000EP0992322A1 Polishing device
04/12/2000CN2373219Y Universal valve lapping machine
04/11/2000US6048577 Nano-sized alpha alumina particles having a silica coating thereon
04/11/2000US6048261 Polishing disc support and polishing process
04/11/2000US6048259 Wafer loading and unloading mechanism for loading robot
04/11/2000US6048256 Apparatus and method for continuous delivery and conditioning of a polishing slurry
04/11/2000US6048254 Lapping apparatus and process with annular abrasive area
04/06/2000WO2000018544A1 Apparatus and method for supplying slurry either to a polishing pad or to a return line
04/06/2000WO2000018543A1 Method of post cmp defect stability improvement
04/06/2000WO2000018542A1 Chemical mechanical polishing conditioner
04/06/2000DE19842954A1 Chemical mechanical polishing (CMP) system for semiconductor wafer
04/05/2000EP0990491A1 Slitter
04/05/2000EP0990486A1 Polishing solution feeder
04/05/2000EP0990485A2 Method for enhancing semiconductor wafer release
04/04/2000US6047224 Machining guide for magnetic recording reproduce heads
04/04/2000US6045605 Abrasive material for polishing a semiconductor wafer, and methods for manufacturing and using the abrasive material
04/04/2000US6045439 Forming a transparent window in a polishing pad for a chemical mechanical polishing apparatus
04/04/2000US6045437 Method and apparatus for polishing a hard disk substrate
04/04/2000US6045436 Process for the material-abrading machining of the edge of a semiconductor wafer
04/04/2000US6045435 Low selectivity chemical mechanical polishing (CMP) process for use on integrated circuit metal interconnects
04/04/2000US6045433 Apparatus for optical inspection of wafers during polishing
03/2000
03/30/2000WO2000017284A1 Workpiece retainer and method for attaching/detaching workpiece by using the same
03/30/2000WO2000017283A1 Oxidizing polishing slurries for low dielectric constant materials
03/30/2000WO2000017281A1 Polishing liquid for polishing components, preferably wafers, especially for chemically-mechanically polishing components of this type
03/30/2000DE19842709A1 Polierflüssigkeit zum Polieren von Bauelementen, vorzugsweise Wafern, insbesondere zum Chemisch-Mechanischen Polieren derartiger Bauelemente Polishing liquid for polishing devices, preferably wafers, in particular for mechanical chemical polishing of such devices
03/29/2000EP0988931A2 Carrier and polishing apparatus
03/29/2000CN2370998Y Grinder for cylinder open of T815 engine
03/29/2000CN1248496A Chemical and mechanical lapping device and method
03/28/2000US6043961 Magnetic recording medium and method for producing the same
03/28/2000US6043159 Chemical mechanical polishing process for layers of isolating materials based on silicon derivatives or silicon
03/28/2000US6043156 Method of making semiconductor wafers
03/28/2000US6042741 Water, abrasive particles, surfactant and compound which complexes with silica and silicon nitride containing functional groups having dissociable protons
03/28/2000US6042688 Carrier for double-side polishing
03/28/2000US6042457 Conditioner assembly for a chemical mechanical polishing apparatus
03/28/2000US6042455 Polishing apparatus
03/28/2000US6042454 System for detecting the endpoint of the polishing of a semiconductor wafer by a semiconductor wafer polisher
03/23/2000WO2000015387A1 Oscillating orbital polisher and method