Patents for B24B 37 - Lapping machines or devices; Accessories (20,836)
03/2001
03/20/2001US6203408 Variable pressure plate CMP carrier
03/20/2001US6203407 Method and apparatus for increasing-chemical-polishing selectivity
03/20/2001US6203404 Chemical mechanical polishing methods
03/15/2001WO2001017725A1 Polishing pad
03/15/2001DE19941903A1 Semiconductor wafers polishing method e.g. for manufacture of microelectronic devices, allows individual treatment of wafers by independent adjustment of pressure of polishing chambers
03/14/2001EP1083249A2 Electrodeposited copper foil with its surface prepared, process for producing the same and use thereof
03/14/2001CN1287469A Electro-deposition copper foil through surface processing and its producing method and use
03/14/2001CN1287042A Translating revoluting grinding head
03/14/2001CN1287041A Double-translating grinding mechanism with revoluting grinding head
03/13/2001US6201253 Method and apparatus for detecting a planarized outer layer of a semiconductor wafer with a confocal optical system
03/13/2001US6200834 Process for fabricating two different gate dielectric thicknesses using a polysilicon mask and chemical mechanical polishing (CMP) planarization
03/13/2001US6200414 Circulation system for supplying chemical for manufacturing semiconductor devices and circulating method thereof
03/13/2001US6200205 Lapping tool
03/13/2001US6200202 System and method for supplying slurry to a semiconductor processing machine
03/13/2001US6200201 Cleaning/buffer apparatus for use in a wafer processing device
03/13/2001US6200196 Polishing systems, methods of polishing substrates, and methods of preparing liquids for semiconductor fabrication processes
03/08/2001WO2001015867A1 Unsupported polishing belt for chemical mechanical polishing
03/08/2001WO2001015865A1 Apparatus and method for conditioning and monitoring media used for chemical-mechanical planarization
03/08/2001WO2001015864A1 Stacked polishing pad having sealed edge
03/08/2001WO2001015863A1 Windowless belt and method for in-situ wafer monitoring
03/08/2001WO2001015862A1 Spindle assembly for force controlled polishing
03/08/2001WO2001015861A1 Polishing pad and polisher
03/08/2001WO2001015860A1 Method and device for polishing semiconductor wafer
03/08/2001WO2001015856A1 Polishing pads and planarizing machines for mechanical and/or chemical-mechanical planarization of microelectronic substrate assemblies
03/08/2001WO2001015855A1 Method and apparatus for mechanical and chemical-mechanical planarization of microelectronic substrates with metal compound abrasives
03/08/2001DE19939258A1 Werkzeug und Verfahren zum abrasiven Bearbeiten einer im wesentlichen ebenen Fläche A method for abrasive machining tool and a substantially flat surface
03/07/2001EP1081200A1 Aqueous dispersion composition for chemical mechanical polishing for use in manufacture of semiconductor devices
03/07/2001EP1080842A1 Method and apparatus for grinding wafer
03/07/2001EP1080841A2 Carrier head, polishing apparatus using the carrier head, and method for sensing polished surface state
03/07/2001EP1080797A2 Method and apparatus for cleaning workpiece
03/07/2001CN1286158A Abrasive tool having metal bound phase
03/06/2001US6197692 Semiconductor wafer planarizing device and method for planarizing a surface of semiconductor wafer by polishing it
03/06/2001US6197218 Phosphor spherical particles of yttrium-gadolinium borate, zinc silicate, barium magnesium aluminate and barium aluminate in a liquid vehicle to be applied to a substrate; flat panel displays, e.g. plasma type; fluorescent lighting elements
03/06/2001US6196907 Slurry delivery system for a metal polisher
03/06/2001US6196906 Surface polishing apparatus and method of taking out workpiece
03/06/2001US6196905 Wafer polishing apparatus with retainer ring
03/06/2001US6196904 Polishing apparatus
03/06/2001US6196903 Workpiece carrier and polishing apparatus having workpiece carrier
03/06/2001US6196901 Method of double-side lapping a wafer and an apparatus therefor
03/06/2001US6196899 Polishing apparatus
03/06/2001US6196897 Automatic lapping method and a lapping apparatus using the same
03/01/2001WO2001014496A1 Compositions for insulator and metal cmp and methods relating thereto
03/01/2001WO2000054933B1 Chemical mechanical polishing head having floating wafer retaining ring and wafer carrier with multi-zone polishing pressure control
02/2001
02/28/2001EP1077790A1 A carrier head with a retaining ring for a chemical mechanical polishing system
02/28/2001EP1077789A1 Substrate retainer
02/28/2001EP0909311A4 Post clean treatment
02/28/2001CN1285384A Process for preparation of metal oxide slurry adaptable to chemical-mechanical polishing of semiconductor
02/27/2001US6194231 Method for monitoring polishing pad used in chemical-mechanical planarization process
02/27/2001US6194230 Endpoint detection by chemical reaction and light scattering
02/27/2001US6193908 Electroluminescent phosphor powders, methods for making phosphor powders and devices incorporating same
02/27/2001US6193588 Method and apparatus for planarizing and cleaning microelectronic substrates
02/27/2001US6193587 Apparatus and method for cleansing a polishing pad
02/27/2001US6193586 Method and apparatus for grinding wafers using a grind chuck having high elastic modulus
02/27/2001US6193585 Method of polishing a hard material-coated wafer
02/27/2001US6193584 Apparatus and method of device stripe height control
02/22/2001WO2001013416A1 Method and apparatus for depositing and controlling the texture of a thin film
02/22/2001WO2001012741A1 Polishing system with stopping compound and method of its use
02/22/2001WO2001012740A1 Polishing system and method of its use
02/22/2001WO2001012739A1 Chemical mechanical polishing systems and methods for their use
02/22/2001WO2001012387A1 Molded polishing pad having integral window
02/22/2001WO2001012385A1 Workpiece carrier with segmented and floating retaining elements
02/22/2001DE19937784A1 Zweischeiben-Feinschleifmaschine Two slices of fine grinding
02/22/2001CA2378793A1 Polishing system with stopping compound and method of its use
02/22/2001CA2378790A1 Polishing system and method of its use
02/22/2001CA2378771A1 Chemical mechanical polishing systems and methods for their use
02/21/2001EP1077241A2 Composition for use in a chemical-mechanical planarization process
02/21/2001EP1077111A1 Method and tool for abrasive machining of a substantially flat surface
02/21/2001EP1076681A1 A cutting and lubricating composition for use with a wire cutting apparatus
02/21/2001CN2420099Y 多头气门研磨机 Long valve grinding machine
02/20/2001US6191864 Method and apparatus for detecting the endpoint in chemical-mechanical polishing of semiconductor wafers
02/20/2001US6191038 Apparatus and method for chemical/mechanical polishing
02/20/2001US6191037 Methods, apparatuses and substrate assembly structures for fabricating microelectronic components using mechanical and chemical-mechanical planarization processes
02/20/2001US6190746 Polishing cloth and a method for attaching/detaching the polishing cloth to/from a base plate of a polishing machine
02/20/2001US6190494 Method and apparatus for electrically endpointing a chemical-mechanical planarization process
02/20/2001US6190443 Polishing composition
02/20/2001US6190236 Method and system for vacuum removal of chemical mechanical polishing by-products
02/20/2001US6190234 Endpoint detection with light beams of different wavelengths
02/20/2001US6189816 Method for producing a valve-seat body for a fuel injection valve, and corresponding fuel injection valve
02/20/2001US6189680 Rotary conveyor
02/15/2001WO2001010599A1 Method and apparatus for in-situ measurement of workpiece displacement during chemical mechanical polishing
02/15/2001WO2001010595A1 Method for manufacturing a magnetic disk comprising a glass substrate
02/15/2001WO2000044527A3 High quality optically polished aluminum mirror and process for producing
02/15/2001DE19938340C1 Production of semiconductor wafer comprises simultaneously polishing the front and rear sides of wafer between rotating polishing plates using an alkaline polishing sol and then an alcohol, cleaning, drying and applying an epitaxial layer
02/14/2001EP1075897A1 Lapping machine with two plates
02/14/2001EP1075675A1 Conductivity feedback control system for slurry blending
02/14/2001EP1075351A1 Apparatus and method for chemical-mechanical polishing (cmp) using a head having direct pneumatic wafer polishing pressure system
02/13/2001US6187730 Hydroxylamine-gallic compound composition and process
02/13/2001US6187681 Method and apparatus for planarization of a substrate
02/13/2001US6186880 Recyclable retaining ring assembly for a chemical mechanical polishing apparatus
02/13/2001US6186872 Polisher
02/13/2001US6186870 Variable abrasive polishing pad for mechanical and chemical-mechanical planarization
02/13/2001US6186865 Apparatus and method for performing end point detection on a linear planarization tool
02/07/2001EP1074343A1 Polishing method and apparatus
02/07/2001EP1073877A1 Endpoint detection in chemical mechanical polishing (cmp) by substrate holder elevation detection
02/07/2001EP1073542A1 Chemical mechanical polishing with multiple polishing pads
02/07/2001EP0975731A4 Ethylenediaminetetraacetic acid or its ammonium salt semiconductor process residue removal composition and process
02/06/2001US6184571 Method and apparatus for endpointing planarization of a microelectronic substrate
02/06/2001US6184139 Oscillating orbital polisher and method
02/06/2001US6183354 Carrier head with a flexible membrane for a chemical mechanical polishing system
02/06/2001US6183352 Slurry recycling apparatus and slurry recycling method for chemical-mechanical polishing technique