Patents for B24B 37 - Lapping machines or devices; Accessories (20,836)
05/2001
05/31/2001DE10057998A1 Polishing method involves inclining tool at defined angle in direction perpendicular to holding surface and in tool displacement direction, then in direction to reduce elastic deformation
05/30/2001EP1103346A2 Method and apparatus for electrochemical-mechanical planarization
05/29/2001US6239188 Mixing expanded microballoons having a size of 10 to 50 mum and expanded microballoons having a size of 80 to 100 mum with the prepolymer and active hydrogen-containing compound and curing the mixture.
05/29/2001US6238590 Tribochemical polishing of ceramics and metals
05/29/2001US6238450 Milling slurry of agglomerated ceria at an alkaline ph to increase the bet surface area to that suitable for optical and chemo-mechanical polishing processes
05/29/2001US6238279 Magnetic filtration for slurry used in chemical mechanical polishing of semiconductor wafers
05/29/2001US6238276 Sizing lapping apparatus
05/29/2001US6238274 Polishing method for a device
05/29/2001US6238273 Methods for predicting polishing parameters of polishing pads and methods and machines for planarizing microelectronic substrate assemblies in mechanical or chemical-mechanical planarization
05/29/2001US6238271 Methods and apparatus for improved polishing of workpieces
05/29/2001US6238270 Method for conditioning a polishing pad used in chemical-mechanical planarization of semiconductor wafers
05/25/2001WO2001036555A1 Composition and method for planarizing surfaces
05/25/2001WO2001036554A1 Composition and method for planarizing surfaces
05/25/2001WO2001036138A1 Combined electrolytic polishing and abrasive super-finishing process
05/25/2001WO2000051782B1 Apparatus and method for chemical-mechanical polishing (cmp) using a head having direct pneumatic wafer polishing pressure system
05/24/2001US20010001756 Chemical mechanical polishing with multiple polishing pads
05/24/2001US20010001755 System for real-time control of semiconductor wafer polishing
05/24/2001US20010001738 Preconditioning polishing pads for chemical-mechanical polishing
05/23/2001EP1101566A2 Workpiece carrier and polishing apparatus having workpiece carrier
05/23/2001DE19954355A1 Polishing plate for lapping, grinding or polishing disc-shaped workpieces, e.g. silicon or silicon carbide substrate wafers, has its upper layer cut through by a cooling labyrinth
05/23/2001CN1296434A Modular machine tool for polishing and planting substrates
05/23/2001CN1296177A Optimizing chemical-mechanical planing process by testing oxide/nitride interface
05/23/2001CN1296049A Compositions for chemical-mechanical polishing
05/22/2001US6236542 Substrate independent superpolishing process and slurry
05/22/2001US6235635 Linear CMP tool design using in-situ slurry distribution and concurrent pad conditioning
05/22/2001US6235425 Apparatus and method for treating a cathode material provided on a thin-film substrate
05/22/2001US6234883 Method and apparatus for concurrent pad conditioning and wafer buff in chemical mechanical polishing
05/22/2001US6234879 Method and apparatus for wafer chamfer polishing
05/22/2001US6234878 Endpoint detection apparatus, planarizing machines with endpointing apparatus, and endpointing methods for mechanical or chemical-mechanical planarization of microelectronic substrate assemblies
05/22/2001US6234877 Method of chemical mechanical polishing
05/22/2001US6234876 Chemical-mechanical polish machines and fabrication process using the same
05/22/2001US6234875 Method of modifying a surface
05/22/2001US6234874 Wafer processing apparatus
05/22/2001US6234870 Serial intelligent electro-chemical-mechanical wafer processor
05/22/2001US6234868 Apparatus and method for conditioning a polishing pad
05/17/2001WO2001034346A1 Chemical mechanical polishing apparatus components with enhanced corrosion resistance
05/17/2001DE19956250C1 Production of a number of semiconductor wafers comprise simultaneously polishing a front side and a rear side of each wafer and evaluating each wafer for further processing according to quality criteria
05/16/2001EP1099471A1 Apparatus and method for precise mixing, delivery and transfer of chemicals
05/15/2001US6232043 Rule to determine CMP polish time
05/15/2001US6231673 Manufacturing method of semiconductor wafer, semiconductor manufacturing apparatus, and semiconductor device
05/15/2001US6231434 Polishing pads and methods relating thereto
05/15/2001US6231428 Chemical mechanical polishing head assembly having floating wafer carrier and retaining ring
05/15/2001US6231427 Linear polisher and method for semiconductor wafer planarization
05/15/2001US6230389 Method for fabricating a magnetoresistive (MR) stripe height lapping monitor with improved linearity
05/10/2001WO2001032794A1 A ta barrier slurry containing an organic additive
05/10/2001WO2001032793A2 Use of cesium hydroxide in a dielectric cmp slurry
05/10/2001WO2001032362A1 Method and apparatus for deposition on and polishing of a semiconductor surface
05/10/2001WO2001032361A1 Method and apparatus for lapping of workpieces
05/10/2001US20010001053 Apparatus and method for treating a cathode material provided on a thin-film substrate
05/10/2001DE19962564C1 Polishing cloth for semiconductor substrate discs has upper and lower layers provided with segments spaced via separation channels and intermediate porous layer for uniform distribution of polishing medium
05/10/2001DE10007389A1 Semiconductor disk removal device in double-sided polishing machine, having rotary drive for suction head, and drive and lift drive for arm, on which suction head is arranged
05/09/2001EP1097026A1 Polishing pads for a semiconductor substrate
05/09/2001EP0931118A4 Composition and method for polishing a composite comprising titanium
05/09/2001CN2429299Y Hand grinder for sealing surface of valve
05/08/2001US6228771 Chemical mechanical polishing process for low dishing of metal lines in semiconductor wafer fabrication
05/08/2001US6227956 Pad quick release device for chemical mechanical polishing
05/08/2001US6227955 Carrier heads, planarizing machines and methods for mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies
05/08/2001US6227950 Dual purpose handoff station for workpiece polishing machine
05/08/2001US6227949 Two-slurry CMP polishing with different particle size abrasives
05/08/2001US6227948 Polishing pad reconditioning via polishing pad material as conditioner
05/08/2001US6227947 Apparatus and method for chemical mechanical polishing metal on a semiconductor wafer
05/08/2001US6227946 Robot assisted method of polishing, cleaning and drying workpieces
05/08/2001US6227939 Temperature controlled chemical mechanical polishing method and apparatus
05/03/2001WO2001030538A1 Work polishing method and work polishing device
05/03/2001US20010000775 Carrier head with a flexible membrane for a chemical mechanical polishing system
05/03/2001US20010000774 Polishing head with removable subcarrier
05/03/2001US20010000773 Method for determining a polishing recipe based upon the measured pre-polish thickness of a process layer
05/03/2001US20010000772 Method and apparatus for uniformly planarizing a microelectronic substrate
05/03/2001US20010000770 Wafer polishing head
05/03/2001US20010000753 Apparatus and method for chemical/mechanical polishing
05/03/2001US20010000586 Chemical mechanically polishing the silicon layer with an oxide polishing slurry, then the silicon layer is chemical mechanically polished with a silicon-polishing slurry until the substrate is planarized
05/02/2001EP1095992A2 CMP slurry for planarizing metals
05/02/2001EP1095734A1 Polishing device
05/02/2001EP0930978A4 Composition and method for polishing a composite
05/02/2001EP0706582B1 Improved compositions and methods for polishing
05/02/2001CN2428260Y LD disc grinding and repairing machine
05/02/2001CN1065164C Cover operating device and its grinding groove and grinding device
05/01/2001US6225224 System for dispensing polishing liquid during chemical mechanical polishing of a semiconductor wafer
05/01/2001US6224712 Polishing apparatus
05/01/2001US6224472 Retaining ring for chemical mechanical polishing
05/01/2001US6224470 Pad cleaning brush for chemical mechanical polishing apparatus and method of making the same
05/01/2001US6224465 Methods and apparatus for chemical mechanical planarization using a microreplicated surface
05/01/2001US6224464 Polishing method and polisher used in the method
05/01/2001US6224461 Method and apparatus for stabilizing the process temperature during chemical mechanical polishing
05/01/2001US6224460 Laser interferometry endpoint detection with windowless polishing pad for chemical mechanical polishing process
04/2001
04/26/2001WO2001029145A1 Improved cmp products
04/26/2001WO2001028739A1 Device for polishing outer peripheral edge of semiconductor wafer
04/26/2001US20010000497 Using a buffing pad having a geometrically optimized shape along with optimizing the buff head diameter, offset and overlays for chemical and mechanical polishing of semiconductor wafer
04/26/2001US20010000490 Rotating a polishing pad affixed to a platen at a first rotational speed, supplying an abrasive material over a surface of polishing pad, pressing the wafer against pad surface while at the same time rotating wafer at second speed
04/26/2001DE10012840A1 Production of semiconductor wafers comprises simultaneously polishing front and rear sides of each wafer between polishing plates covered with cloth, evaluating and then re-polishing
04/26/2001CA2383504A1 Improved cmp products
04/25/2001EP1093666A1 A technique for chemical mechanical polishing silicon
04/24/2001US6221818 Hydroxylamine-gallic compound composition and process
04/24/2001US6221199 Apparatus and method for removing an adhesive bonded pad
04/24/2001US6221118 Cerium oxide abrasive and method of polishing substrates
04/24/2001US6220944 Carrier head to apply pressure to and retain a substrate
04/24/2001US6220942 CMP platen with patterned surface
04/24/2001US6220941 Method of post CMP defect stability improvement
04/24/2001US6220936 In-site roller dresser
04/24/2001US6220934 Method for controlling pH during planarization and cleaning of microelectronic substrates