Patents for B24B 37 - Lapping machines or devices; Accessories (20,836)
08/2000
08/22/2000US6106374 Acoustically agitated delivery
08/22/2000US6106371 Effective pad conditioning
08/22/2000US6106369 Polishing system
08/17/2000WO2000047369A1 Method of polishing semiconductor wafers
08/17/2000WO2000047368A1 Work holding disc for polishing, work polishing apparatus, and work polishing method
08/16/2000EP1027576A1 Method and apparatus for modeling substrate reflectivity during chemical mechanical polishing
08/15/2000US6103628 Reverse linear polisher with loadable housing
08/15/2000US6102788 Semiconductor wafer carrier stage for chemical mechanical polishing apparatus
08/15/2000US6102786 Polishing apparatus including turntable with polishing surface of different heights
08/15/2000US6102784 Method and apparatus for improved gear cleaning assembly in polishing machines
08/15/2000US6102782 System and apparatus for distributing flush fluid to processing equipment
08/15/2000US6102780 Substrate polishing apparatus and method for polishing semiconductor substrate
08/15/2000US6102779 Method and apparatus for improved semiconductor wafer polishing
08/15/2000US6102778 Wafer lapping method capable of achieving a stable abrasion rate
08/15/2000US6102777 Lapping apparatus and method for high speed lapping with a rotatable abrasive platen
08/15/2000US6102776 Apparatus and method for controlling polishing of integrated circuit substrates
08/15/2000US6102775 Film inspection method
08/15/2000US6102057 Lifting and rinsing a wafer
08/10/2000WO2000045993A1 Wafer holder and polishing device
08/10/2000WO2000032353A3 A polishing machine and method
08/09/2000EP1025955A2 Chemical mechanical polishing with a moving polishing sheet
08/09/2000EP1025954A2 Apparatus and methods of substrate polishing
08/09/2000CN1262639A Method and apparatus for polishing ophthalmic lenses
08/08/2000US6099697 Removing residual charges from the support surface of an electrostatic chuck
08/08/2000US6099394 Polishing system having a multi-phase polishing substrate and methods relating thereto
08/08/2000US6099393 Polishing method for semiconductors and apparatus therefor
08/08/2000US6099390 Polishing pad for semiconductor wafer and method for polishing semiconductor wafer
08/08/2000US6099388 Method and apparatus for repairing a damaged compact disc
08/08/2000US6099387 CMP of a circlet wafer using disc-like brake polish pads
08/08/2000US6099386 Control device for maintaining a chemical mechanical polishing machine in a wet mode
08/08/2000US6098901 Apparatus for dispensing slurry
08/08/2000US6098638 Polishing a surface of a semiconductor substrate using polishing cloth by supplying a slurry onto the surface of the substrate, polishing until substrate gets a thickness, causing zeta potential on the abrasive particles
08/03/2000WO2000044527A2 High quality optically polished aluminum mirror and process for producing
08/03/2000DE19853060A1 Cutting or grinding jig especially for preparing and polishing silicon wafers
08/02/2000CN1055037C Scraping method for fixed binding surface in position of grinding point
08/01/2000US6096162 Chemical mechanical polishing machine
08/01/2000US6096143 Wear resistance
08/01/2000US6095905 Polishing fixture and method
08/01/2000US6095904 Orbital motion chemical-mechanical polishing method and apparatus
08/01/2000US6095902 For polishing silicon semiconductor substrates
08/01/2000US6095898 Process and device for polishing semiconductor wafers
07/2000
07/27/2000WO2000043159A1 Improved polishing pads and methods relating thereto
07/27/2000DE19955387A1 Polishing agent feed to semiconductor disc polisher based on chemical-mechanical polishing (CMP) for flattening intermediate insulation foil
07/27/2000DE19902804A1 Lifetime self-indicate polishing pad for chemical mechanical polisher comprises a pad with body having multicolored indicate layers with a top surface
07/26/2000EP1022778A1 Method of dividing a wafer and method of manufacturing a semiconductor device
07/26/2000EP1022093A2 Endpoint detection with light beams of different wavelenghts
07/25/2000US6093651 Polish pad with non-uniform groove depth to improve wafer polish rate uniformity
07/25/2000US6093335 Method of surface finishes for eliminating surface irregularities and defects
07/25/2000US6093280 Chemical-mechanical polishing pad conditioning systems
07/25/2000US6093091 Holder for flat subjects in particular semiconductor wafers
07/25/2000US6093088 Surface polishing machine
07/25/2000US6093087 Wafer processing machine and a processing method thereby
07/25/2000US6093086 Polishing head release mechanism
07/25/2000US6093085 Apparatuses and methods for polishing semiconductor wafers
07/25/2000US6093083 Row carrier for precision lapping of disk drive heads and for handling of heads during the slider fab operation
07/25/2000US6093082 Carrier head with a substrate detection mechanism for a chemical mechanical polishing system
07/25/2000US6093081 Polishing method and polishing apparatus using the same
07/20/2000DE19901749A1 Chemical-mechanical wafer polishing pad has angle and depth of curved grooves, which are calculated by boundary layer effect of streamlined groove function, used to design optimum structure for polishing pad
07/19/2000EP1020506A2 Water-laden solid matter of vapor-phase processed inorganic oxide particles and slurry for polishing and manufacturing method of semiconductor devices
07/19/2000EP1020500A1 Polishing slurry
07/19/2000EP1020254A1 Polishing method and polishing device
07/19/2000EP1020253A2 Polishing method for wafer and holding plate
07/19/2000EP1019949A1 Apparatus and method for cleaning semiconductor wafer
07/18/2000US6090475 Polishing pads useful in determining an end to the useful wear life thereof through different color layers
07/18/2000US6090239 Method of single step damascene process for deposition and global planarization
07/18/2000US6089966 Surface polishing pad
07/18/2000US6089965 Polishing pad
07/18/2000US6089961 Wafer polishing carrier and ring extension therefor
07/18/2000US6089960 Semiconductor wafer polishing mechanism
07/18/2000US6089959 Polishing method and polishing apparatus
07/13/2000DE10000240A1 Lapping tool has platform and shaft connected together via a rotatable connection, electrically conducting path extending from shaft to lower working surface of platform
07/12/2000EP1018400A2 Planarization apparatus and method
07/12/2000EP1017540A1 An abrasive means and a grinding process
07/12/2000CN2386919Y Polisher
07/11/2000US6086464 CMP platen plug
07/11/2000US6086460 Method and apparatus for conditioning a polishing pad used in chemical mechanical planarization
07/11/2000US6086457 Washing transfer station in a system for chemical mechanical polishing
07/11/2000US6086456 Polishing method using a hydrostatic fluid bearing support having fluctuating fluid flow
07/11/2000US6086454 Method of fabricating a semiconductor device using a CMP process
07/06/2000WO2000039844A1 Materials for polishing liquid for metal, polishing liquid for metal, method for preparation thereof and polishing method using the same
07/06/2000WO2000039843A1 Cmp abrasive, liquid additive for cmp abrasive and method for polishing substrate
07/06/2000WO2000039841A1 Method for storing carrier for polishing wafer
07/06/2000WO2000021715A3 Semiconductor wafer polishing apparatus with a variable polishing force wafer carrier head
07/05/2000EP1017090A1 Semiconductor wafer polishing device
07/05/2000EP1016133A1 Method of planarizing the upper surface of a semiconductor wafer
07/05/2000EP1015177A1 Polishing media magazine for improved polishing
07/05/2000EP1015176A1 Improved polishing pads and methods relating thereto
07/05/2000EP1015175A1 Abrasive articles comprising a fluorochemical agent for wafer surface modification
07/05/2000CN2385844Y Gem lapping machine
07/04/2000US6083839 Unique chemical mechanical planarization approach which utilizes magnetic slurry for polish and magnetic fields for process control
07/04/2000US6083419 Polishing composition including an inhibitor of tungsten etching
07/04/2000US6083090 Polishing apparatus for semiconductor wafers
07/04/2000US6083089 Method and apparatus for chemical mechanical polishing
07/04/2000US6083085 Method and apparatus for planarizing microelectronic substrates and conditioning planarizing media
07/04/2000US6083083 Separation type grinding surface plate and grinding apparatus using same
07/04/2000US6083082 Spindle assembly for force controlled polishing
07/04/2000US6083081 Lapping control sensor for magnetoresistive effect head, lapping control method using the sensor and manufacturing method of the sensor
06/2000
06/29/2000WO2000038223A1 Combination cmp-etch method for forming a thin planar layer over the surface of a device
06/29/2000WO2000037578A1 Cerium oxide slurry for polishing, process for preparing the slurry, and process for polishing with the slurry
06/29/2000DE19860090A1 Chemical-mechanical polishing unit for semiconductor elements, comprises a polishing table, a polishing plate with inner and outer ring sections, a wafer carrier, and a sludge supply tube