Patents for B24B 37 - Lapping machines or devices; Accessories (20,836)
04/2001
04/24/2001US6220930 Wafer polishing head
04/19/2001WO2001027990A1 A method and system for polishing semiconductor wafers
04/19/2001WO2001027350A1 Optimal offset, pad size and pad shape for cmp buffing and polishing
04/19/2001WO2000025984A9 Chemical mechanical polishing a substrate having a filler layer and a stop layer
04/18/2001EP1092505A2 Method of controlling a polishing machine
04/18/2001EP1092504A1 Apparatus and method for polishing workpiece
04/18/2001EP1091831A1 Improved polishing pad with reduced moisture absorption
04/18/2001EP1091829A2 Chemical mechanical polishing head having floating wafer retaining ring and wafer carrier with multi-zone polishing pressure control
04/18/2001EP1084001A4 Accurate positioning of a wafer
04/18/2001CN1291630A Polishing composition used for manufacturing storage hard disk and polishing method
04/17/2001US6218306 Method of chemical mechanical polishing a metal layer
04/17/2001US6217434 Polishing pads and methods relating thereto
04/17/2001US6217430 Pad conditioner cleaning apparatus
04/17/2001US6217429 Polishing pad conditioner
04/17/2001US6217427 Mobius strip belt for linear CMP tools
04/17/2001US6217426 CMP polishing pad
04/17/2001US6217425 Apparatus and method for lapping magnetic heads
04/17/2001US6217422 Light energy cleaning of polishing pads
04/17/2001US6217419 Chemical-mechanical polisher
04/17/2001US6217418 Polishing pad and method for polishing porous materials
04/17/2001US6217417 Method for polishing thin plate and plate for holding thin plate
04/17/2001US6217412 Method for characterizing polish pad lots to eliminate or reduce tool requalification after changing a polishing pad
04/17/2001US6217411 Polishing apparatus
04/17/2001US6217410 Apparatus for cleaning workpiece surfaces and monitoring probes during workpiece processing
04/12/2001WO2001025505A1 Cemented carbide wear part and lapping method
04/12/2001WO2001025366A1 Cmp products
04/12/2001WO2001024969A2 Fluid dispensing fixed abrasive polishing pad
04/12/2001WO2000053370A3 Method and apparatus for non-abrasive conditioning of polishing pads
04/12/2001CA2383656A1 Cemented carbide wear part and lapping method
04/11/2001EP1090334A1 System and method for controlling a multi-arm polishing tool
04/11/2001EP1090082A1 Cmp slurry containing a solid catalyst
04/11/2001EP1089851A1 Wafer edge polishing method and apparatus
04/11/2001EP1089801A1 Method and apparatus for recovery of water and slurry abrasives used for chemical and mechanical planarization
04/10/2001US6214734 Method of using films having optimized optical properties for chemical mechanical polishing endpoint detection
04/10/2001US6214732 Chemical mechanical polishing endpoint detection by monitoring component activity in effluent slurry
04/10/2001US6214704 Method of processing semiconductor wafers to build in back surface damage
04/10/2001US6213858 Belts for polishing semiconductors
04/10/2001US6213855 Self-powered carrier for polishing or planarizing wafers
04/10/2001US6213853 Integral machine for polishing, cleaning, rinsing and drying workpieces
04/10/2001US6213848 Method for determining a polishing recipe based upon the measured pre-polish thickness of a process layer
04/10/2001US6213846 Real-time control of chemical-mechanical polishing processes using a shaft distortion measurement
04/10/2001US6213845 Apparatus for in-situ optical endpointing on web-format planarizing machines in mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies and methods for making and using same
04/10/2001US6213844 Method for obtaining a desired film thickness using chemical mechanical polishing
04/05/2001WO2001024241A1 Method for chemical mechanical polishing
04/05/2001WO2001023486A1 Compositions for and methods of reducing/eliminating scratches and defects in silicon dioxide cmp process
04/05/2001WO2001023485A1 Polishing composition and method
04/05/2001WO2001023141A1 Polishing pad
04/05/2001WO2001023139A1 Polishing pad treatment for surface conditioning
04/05/2001WO2001023138A1 Wafer grinder
04/05/2001WO2001023135A2 Recyclable retaining ring assembly for a chemical mechanical polishing apparatus
04/05/2001US20010000166 Apparatus and method for feeding slurry
04/05/2001DE19945335A1 Al¶2¶O¶3¶/SiC-Nanokomposit-Schleifkörner, Verfahren zu ihrer Herstellung sowie ihre Verwendung Al¶2¶O¶3¶ / SiC nanocomposite abrasive grains, processes for their preparation and their use
04/04/2001EP1088869A1 Aqueous dispersion for chemical mechanical polishing
04/04/2001EP1088622A2 Platen with web release apparatus
04/04/2001CN2425898Y Circulation rotary bucket for working bearing race
04/04/2001CN2425897Y Reciprocative feeding bucket for working bearing race
04/04/2001CN1290289A Optical polishing formulation
04/04/2001CN1290202A Polishing carrier, surface polishing device, and surface polishing method
04/04/2001CN1289811A Polishing compositions
04/04/2001CN1289810A Polishing composition and method for manufacturing rigid memory disks
04/04/2001CN1289628A Filter and using method thereof
04/03/2001US6210604 For x-ray image intensifiers
04/03/2001US6210525 Apparatus and methods for chemical-mechanical polishing of semiconductor wafers
04/03/2001US6210260 Carrier and CMP apparatus
04/03/2001US6210257 Web-format polishing pads and methods for manufacturing and using web-format polishing pads in mechanical and chemical-mechanical planarization of microelectronic substrates
04/03/2001US6210256 Continuous pad feeding method for chemical-mechanical polishing
04/03/2001US6210255 Carrier head for chemical mechanical polishing a substrate
04/03/2001US6210254 Method of manufacturing a polymeric polishing pad having photolithographically induced surface pattern(s)
03/2001
03/29/2001WO2001021724A1 Slurry solution for polishing copper or tungsten
03/29/2001WO2000074896A8 Method of modifying a surface of a structured wafer
03/29/2001WO2000034008A9 A polishing pad with a partial adhesive coating
03/28/2001CN2424875Y Lapping mechanism of lapping machine
03/28/2001CN1288920A 抛光组合物 The polishing composition
03/27/2001US6208425 Endpoint detector and method for measuring a change in wafer thickness in chemical-mechanical polishing of semiconductor wafers
03/27/2001US6207572 Reverse linear chemical mechanical polisher with loadable housing
03/27/2001US6206770 Wafer carrier head for prevention of unintentional semiconductor wafer rotation
03/27/2001US6206769 Method and apparatus for stopping mechanical and chemical mechanical planarization of substrates at desired endpoints
03/27/2001US6206768 Adjustable and extended guide rings
03/27/2001US6206767 Planetary gear system parallel planer
03/27/2001US6206765 Non-rotational dresser for grinding stones
03/27/2001US6206760 Method and apparatus for preventing particle contamination in a polishing machine
03/27/2001US6206759 Polishing pads and planarizing machines for mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies, and methods for making and using such pads and machines
03/27/2001US6206758 Method for increasing working life of retaining ring in chemical-mechanical polishing machine
03/27/2001US6206757 Polishing systems, methods of polishing substrates, and methods of preparing liquids for semiconductor fabrication processes
03/27/2001US6206756 Using an acidic solution containing a tungsten oxidizing component, also contains a complexing agent to complex tungsten or oxidation product thereof.
03/27/2001US6206754 Endpoint detection apparatus, planarizing machines with endpointing apparatus, and endpointing methods for mechanical or chemical-mechanical planarization of microelectronic substrate assemblies
03/27/2001US6205658 Method for formation of metal wiring
03/22/2001WO2001020304A2 Self-clearing optical measurement apparatus and methods of use
03/22/2001WO2001019935A1 Slurry for forming insoluble silicate during chemical-mechanical polishing
03/22/2001WO2001019568A1 Drive device for a grinding, lapping or buffing-tool body
03/22/2001WO2001019567A1 Method and system for chemical mechanical polishing with a cylindrical polishing pad
03/22/2001DE19944551A1 Workpiece chuck for chemical-mechanical polishing of semiconductor disc has fluid film between seating and surface of semiconductor disc held in seating
03/21/2001EP1085067A1 Polishing composition and polishing process
03/21/2001EP1084009A1 Cmp pad conditioner arrangement and method therefor
03/21/2001EP1084001A1 Accurate positioning of a wafer
03/21/2001CN1288252A Piezoelectric actuated chemical mechanical polishing tray
03/20/2001US6203417 Chemical mechanical polishing tool components with improved corrosion resistance
03/20/2001US6203414 Polishing apparatus
03/20/2001US6203413 Apparatus and methods for conditioning polishing pads in mechanical and/or chemical-mechanical planarization of microelectronic-device substrate assemblies
03/20/2001US6203412 Submerge chemical-mechanical polishing