Patents for B24B 37 - Lapping machines or devices; Accessories (20,836)
07/2001
07/26/2001WO2001053039A1 Dissolution of metal particles produced by polishing
07/26/2001US20010009841 Method and apparatus for mechanical and chemical-mechanical planarization of microelectronic substrates
07/26/2001US20010009840 Non-aqueous solvent and at least one acetylene glycol compound such as the ethylene oxide adduct of 2,4,7,9-tetramethyl-5-decyn-4,7-diol; finish grinding thin film type magnetic head
07/26/2001US20010009838 Laser interferometry endpoint detection with windowless polishing pad for chemical mechanical polishing process
07/26/2001US20010009811 Methods, apparatuses, and substrate assembly structures for fabricating microelectronic components using mechanical and chemical-mechanical planarization processes
07/26/2001DE10004578C1 Production of a semiconductor wafer comprises polishing the edges of the wafer with a cloth with the continuous introduction of an alkaline polishing agent using polishing plates, wetting with a film and cleaning and drying
07/25/2001EP1118432A2 Substrate polishing pad
07/25/2001EP1118431A2 Method and apparatus for detecting polishing endpoint with optical monitoring
07/25/2001EP1118429A1 Method and device for simultaneously grinding double surfaces, and method and device for simultaneously lapping double surfaces
07/25/2001EP1117506A1 Cmp polishing head with three chambers and method for using the same
07/25/2001CN1305393A Method and apparatus for recovery of water and slurry abrasives used for chemical and mechanical planarization
07/25/2001CN1068815C Abrasive construction for semiconductor wafer modification
07/25/2001CN1068814C Polishing pads
07/24/2001US6265314 Wafer edge polish
07/24/2001US6264789 System for dispensing polishing liquid during chemical mechanical polishing of a semiconductor wafer
07/24/2001US6264540 Method and apparatus for disposable bladder carrier assembly
07/24/2001US6264536 Reducing polish platen corrosion during integrated circuit fabrication
07/24/2001US6264533 Abrasive processing apparatus and method employing encoded abrasive product
07/24/2001US6264532 Ultrasonic methods and apparatus for the in-situ detection of workpiece loss
07/24/2001US6263605 Pad conditioner coupling and end effector for a chemical mechanical planarization system and method therefor
07/19/2001WO2001052307A2 Semiconductor workpiece proximity plating methods and apparatus
07/19/2001US20010008830 CMP polishing pad
07/19/2001US20010008827 Polishing apparatus
07/19/2001US20010008826 Apparatus and method for processing thin-film magnetic head material
07/19/2001US20010008801 A small amount of single-side lapping is repeated alternately on the two surfaces of a semiconductor silicon single crystal wafer to get to a predetermined total lapping stock removal
07/18/2001EP1116552A2 Polishing apparatus with thickness measuring means
07/18/2001EP1115806A1 Workpiece retainer and method for attaching/detaching workpiece by using the same
07/18/2001EP1115805A1 Polishing cloth and method for attaching/detaching the polishing cloth to/from polishing machine base plate
07/18/2001EP1115804A1 Polishing liquid for polishing components, preferably wafers, especially for chemically-mechanically polishing components of this type
07/18/2001EP1115803A1 Oxidizing polishing slurries for low dielectric constant materials
07/18/2001EP1115643A1 Apparatus for sensing the presence of a wafer
07/18/2001CN1303758A Process of grinding, electron component and variable capacitor
07/18/2001CN1303757A Clamping tool for working
07/17/2001US6261959 Method and apparatus for chemically-mechanically polishing semiconductor wafers
07/17/2001US6261958 Method for performing chemical-mechanical polishing
07/17/2001US6261851 Optimization of CMP process by detecting of oxide/nitride interface using IR system
07/17/2001US6261476 Hybrid polishing slurry
07/17/2001US6261168 Chemical mechanical planarization or polishing pad with sections having varied groove patterns
07/17/2001US6261165 Row carrier for precision lapping of disk drive heads and for handling of heads during the slider fab operation
07/17/2001US6261163 Web-format planarizing machines and methods for planarizing microelectronic substrate assemblies
07/17/2001US6261162 Polishing apparatus and method of manufacturing grinding plate
07/17/2001US6261159 Apparatus and method for the restoration of optical storage media
07/17/2001US6261158 Multi-step chemical mechanical polishing
07/17/2001US6261157 Selective damascene chemical mechanical polishing
07/17/2001US6261155 Method and apparatus for in-situ end-point detection and optimization of a chemical-mechanical polishing process using a linear polisher
07/17/2001US6261152 Heterdoyne Thickness Monitoring System
07/17/2001US6261151 System for real-time control of semiconductor wafer polishing
07/17/2001US6260709 Membrane filter element for chemical-mechanical polishing slurries
07/12/2001WO2001049454A1 Apparatus for polishing magnetic head and polishing method
07/12/2001WO2001049453A1 Method and apparatus for conditioning a polishing pad
07/12/2001WO2001049452A1 Method and apparatus for determining metal cmp endpoint using integrated polishing pad electrodes
07/12/2001WO2001049449A2 Flexible polishing pad having reduced surface stress
07/12/2001US20010007810 Chemical mechanical polishing head assembly having floating wafer carrier and retaining ring
07/12/2001US20010007795 Method for polishing surface of semicon-ductor device substrate
07/12/2001US20010007772 Catalytic converter; light sensor
07/11/2001EP1114855A1 Diamond abrasive particles and method for preparing the same
07/11/2001EP1114697A2 Apparatus and method for controlled delivery of slurry to a region of a polishing device
07/11/2001EP1114695A2 Chemical mechanical planarization system
07/11/2001EP1114110A1 Wafer retainer and method for attaching/detaching the wafer retainer to/from polishing machine base plate
07/10/2001US6258711 Sacrificial deposit to improve damascene pattern planarization in semiconductor wafers
07/10/2001US6258205 Endpoint detection method and apparatus which utilize an endpoint polishing layer of catalyst material
07/10/2001US6258177 Apparatus for cleaning the grooves of lapping plates
07/10/2001US6258140 Polishing composition
07/10/2001US6258137 CMP products
07/10/2001US6258136 Fixed abrasives for optical polishing
07/10/2001US6257966 Wafer surface machining apparatus
07/10/2001US6257961 Rotational speed adjustment for wafer polishing method
07/10/2001US6257960 Lapping method and method for manufacturing lapping particles for use in the lapping method
07/10/2001US6257959 Apparatus and method for processing slider, load applying apparatus and auxiliary device for processing slider
07/10/2001US6257958 Method for cleaning semiconductor device probe
07/10/2001US6257955 Apparatus and method for heating a liquid or viscous polishing agent, and device for polishing wafers
07/10/2001US6257953 Method and apparatus for controlled polishing
07/05/2001WO2001048801A1 Method and apparatus for monitoring polishing state, polishing device, process wafer, semiconductor device, and method of manufacturing semiconductor device
07/05/2001WO2001048800A1 Semiconductor wafer processing apparatus and processing method
07/05/2001WO2001048114A1 Composition for polishing magnetic disk substrate and polishing method, and magnetic disk substrate polished thereby
07/05/2001WO2001047667A1 Method and apparatus for controlling abrasive flow machining
07/05/2001WO2001047666A1 Work piece carrier head for plating and polishing
07/05/2001WO2001047664A1 Wafer polishing method and wafer polishing device
07/05/2001US20010006936 Removing photoresist residue; does not corrode or attack titanium or other metallurgy, oxide or nitride layers on the substrate
07/05/2001US20010006882 Supply system for chemicals and its use
07/05/2001US20010006881 Polishing apparatus
07/05/2001US20010006879 Method and apparatus for supporting a polishing pad during chemical-mechanical planarization of microelectronic substrates
07/05/2001US20010006878 Method and apparatus for supporting a polishing pad during chemical-mechanical planarization of microelectronic substrates
07/05/2001US20010006877 Method and apparatus for supporting a polishing pad during chemical-mechanical planarization of microelectronic substrates
07/05/2001US20010006875 Method and apparatus for mechanical and chemical-mechanical planarization of microelectronic substrates
07/05/2001US20010006874 Apparatus and method for conditioning and monitoring media used for chemical-mechanical planarization
07/05/2001US20010006873 Apparatus and method for conditioning and monitoring media used for chemical-mechanical planarization
07/05/2001US20010006872 Apparatus and method for conditioning and monitoring media used for chemical-mechanical planarization
07/05/2001US20010006871 Apparatus and method for conditioning and monitoring media used for chemical-mechanical planarization
07/05/2001US20010006870 Apparatus and method for conditioning and monitoring media used for chemical-mechanical planarization
07/05/2001US20010006841 Process for forming a metal interconnect
07/05/2001US20010006225 A slurry used for chemical mechanical polishing of a substrate having a copper-containing film at the surface, which contains and abrasive, an oxidizer, and adhesive-inhibitor preventing adhesion of polishing product to
07/05/2001US20010006224 A slurry for chemical mechanical polishing of a substrate containing tantalum or tantalum nitride comprising a silica polishing grain and an inorganic salt to prevent dishing and erosion
07/05/2001US20010006031 Chemical meachanical polishing slurry for polishing copper metal or alloy film formed on tantalum or tantalum nitride film comprising an oxidizer, an organic acid and an alkanolamine
07/05/2001DE19961106A1 Device for holding a plane plate comprises a bearing surface whose diameter corresponds to the plate diameter, and a holding ring whose vertical protrusion corresponds to the plate thickness
07/04/2001EP1112816A2 Polishing pad and method of manufacture
07/04/2001EP1112147A1 Support for temporary fixation of a self-sticking abrasive and/or polishing sheet
07/04/2001EP1112145A1 Polishing pad for a semiconductor substrate
07/04/2001CN1301992A Leveling method
07/03/2001US6254718 Combined CMP and plasma etching wafer flattening system