Patents for B24B 37 - Lapping machines or devices; Accessories (20,836)
09/2001
09/18/2001US6290579 Fixed abrasive polishing pad
09/18/2001US6290578 Method for chemical mechanical polishing using synergistic geometric patterns
09/18/2001US6290577 Fluid pressure regulated wafer polishing head
09/18/2001US6290576 Semiconductor processors, sensors, and semiconductor processing systems
09/18/2001US6290572 Devices and methods for in-situ control of mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies
09/13/2001US20010021628 Methods and apparatuses for mechanical and chemical-mechanical planarization of microelectronic-device substrate assemblies on planarizing pads
09/13/2001US20010021627 Method and apparatus for supporting and cleaning a polishing pad for chemical-mechanical planarization of microelectronic substrates
09/13/2001US20010021622 Method and apparatus for detecting a planarized outer layer of a semiconductor wafer with a confocal optical system
09/13/2001US20010020348 Particle with a functional group capable of trapping a metal ion, an oxidizing agent and water for chemical mechanical polishing of a copper-based metal
09/13/2001DE10010287A1 Mixer arrangement, used in production of suspensions for chemical-mechanical polishing of wafers, comprises mixing container connected to one end of liquid pump, and feed and circulating systems
09/12/2001EP1131186A1 Lapping and polishing device
09/12/2001CN1312747A Waffer edge polishing method and apparatus
09/12/2001CN1312545A Method for polishing magnetic-head floating block
09/11/2001US6288648 Apparatus and method for determining a need to change a polishing pad conditioning wheel
09/11/2001US6287879 Endpoint stabilization for polishing process
09/11/2001US6287192 Slurry supply system for chemical mechanical polishing process having sonic wave generator
09/11/2001US6287185 Polishing pads and methods relating thereto
09/11/2001US6287178 Wafer carrier rinsing mechanism
09/11/2001US6287175 Method of mirror-finishing a glass substrate
09/11/2001US6287174 Polishing pad and method of use thereof
09/11/2001US6287173 Longer lifetime warm-up wafers for polishing systems
09/11/2001US6287172 Method for improvement of tungsten chemical-mechanical polishing process
09/11/2001US6287171 System and method for detecting CMP endpoint via direct chemical monitoring of reactions
09/11/2001US6287170 Multipoint bending apparatus for lapping heads of a data storage device
09/07/2001WO2001064396A1 Polishing pad surface texture formed by solid phase droplets
09/07/2001WO2001064395A2 A modular control system and method for a cmp tool
09/07/2001WO2001064391A2 Planarization system with a wafer transfer corridor and multiple polishing modules
09/06/2001US20010019940 Polishing pads and planarizing machines for mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies, and methods for making and using such pads and machines
09/06/2001US20010019939 Abrasive machine
09/06/2001US20010019938 Apparatus and methods for conditioning polishing pads in mechanical and/or chemical-mechanical planarization of microelectronic-device substrate assemblies
09/06/2001US20010019937 Method and apparatus for supporting and cleaning a polishing pad for chemical-mechanical planarization of microelectronic substrates
09/06/2001US20010019934 Polishing apparatus including holder and polishing head with rotational axis of polishing head offset from rotational axis of holder and method of using
09/06/2001US20010019895 Methods, apparatuses, and substrate assembly structures for fabricating microelectronic components using mechanical and chemical-mechanical planarization processes
09/06/2001US20010018790 Preventive maintenance apparatus for CMP top-ring's backing-film and the method thereof
09/05/2001EP1129821A1 Method and device for polishing semiconductor wafer
09/05/2001EP1129816A2 Method for polishing ceramics
09/05/2001EP1129237A2 Method and apparatus for electrochemical mechanical deposition
09/05/2001EP1129035A1 Aluminum oxide particles
09/05/2001EP1128934A1 Chemical-mechanical-polishing system with continuous filtration
09/05/2001EP1128932A1 Method and apparatus for conditioning a polishing pad used in chemical mechanical planarization
09/05/2001CN2445855Y Large diameter valve grinder
09/05/2001CN2445854Y Balance weight structure of rotary abrasive tool
09/05/2001CN2445853Y Rotary grinding disk base
09/04/2001US6285035 Apparatus for detecting an endpoint polishing layer of a semiconductor wafer having a wafer carrier with independent concentric sub-carriers and associated method
09/04/2001US6284114 Immersing electrodes in particulate bath;controlling electrical conditions; generating bubbles to make polishing pad
09/04/2001US6284092 CMP slurry atomization slurry dispense system
09/04/2001US6284091 Unique chemical mechanical planarization approach which utilizes magnetic slurry for polish and magnetic fields for process control
09/04/2001US6283840 Cleaning and slurry distribution system assembly for use in chemical mechanical polishing apparatus
09/04/2001US6283836 Non-abrasive conditioning for polishing pads
09/04/2001US6283834 Diaphragm-support disc for a polishing machine and method of operating a polishing machine
09/04/2001US6283829 In situ friction detector method for finishing semiconductor wafers
09/04/2001US6283828 Wafer polishing apparatus
09/04/2001US6283827 Non-contacting support for a wafer
09/04/2001US6283822 Polishing apparatus
08/2001
08/30/2001WO2001063655A1 Chemical-mechanical polishing device, damascene wiring forming device, and damascene wiring forming method
08/30/2001WO2001063019A1 Pad designs and structures with improved fluid distribution
08/30/2001WO2001063018A1 Pad designs and structures for a versatile materials processing apparatus
08/30/2001WO2001062441A1 Mixing device and mixing method
08/30/2001WO2001062440A1 Polishing pad with a transparent portion
08/30/2001WO2001062436A1 Method and apparatus for polishing outer peripheral chamfered part of wafer
08/30/2001US20010018322 Backing members and planarizing machines for mechanical and chemical-mechanical planarization of microelectronic-device substrate assemblies, and methods of making and using such backing members
08/30/2001US20010018318 Methods and apparatuses for mechanical and chemical-mechanical planarization of microelectronic-device substrate assemblies on planarizing pads
08/30/2001US20010018270 Comprising silica abrasive and polycarboxylic acid to polish substrate of tantulum-containing metal film formed on dielectric film; accuracy
08/30/2001US20010017401 Method and apparatus for endpointing planarization of a microelectronic substrate
08/30/2001US20010017007 Polishing composition
08/29/2001EP1127658A2 Apparatus for mixing slurry
08/29/2001EP1126952A1 Belt for polishing semiconductors
08/29/2001EP1126950A1 Apparatuses and methods for polishing semiconductor wafers
08/29/2001CN2444710Y Steel ball fine grinding plate
08/29/2001CN1310657A CMP pad conditioner arrangement and method therefor
08/28/2001US6281129 Corrosion-resistant polishing pad conditioner
08/28/2001US6281128 Wafer carrier modification for reduced extraction force
08/28/2001US6280490 Polishing composition and method for producing a memory hard disk
08/28/2001US6280308 Wafer suction pad
08/28/2001US6280306 Wafer polishing apparatus and wafer manufacturing method
08/28/2001US6280304 Abrasive machine
08/28/2001US6280300 Filter apparatus
08/28/2001US6280299 Combined slurry dispenser and rinse arm
08/28/2001US6280297 Apparatus and method for distribution of slurry in a chemical mechanical polishing system
08/28/2001US6280296 Surface polishing method and apparatus wherein axis of autorotation of workpiece is revolved about an axis within circumscribed circle of the workpiece
08/28/2001US6280295 Apparatus and method to polish a wafer using abrasive flow machining
08/28/2001US6280292 Polishing apparatus
08/28/2001US6280290 Method of forming a transparent window in a polishing pad
08/28/2001US6280289 Method and apparatus for detecting an end-point in chemical mechanical polishing of metal layers
08/28/2001US6280288 Process for determining optimum grinding conditions
08/28/2001US6280079 Method of mixing slurries
08/23/2001WO2001061746A2 Test structure for metal cmp process control
08/23/2001WO2001060567A1 Process for reducing surface variations for polished wafer
08/23/2001WO2001060242A2 Test structure for metal cmp process control
08/23/2001US20010016470 Polishing apparatus and polishing method
08/23/2001US20010016469 Copper chemical-mechanical polishing process using a fixed abrasive polishing pad and a copper layer chemical-mechanical polishing solution specifically adapted for chemical-mechanical polishing with a fixed abrasive pad
08/23/2001US20010016468 Lapping method and method for manufacturing lapping particles for use in the lapping method
08/23/2001US20010016466 System for real-time control of semiconductor wafer polishing
08/23/2001US20010015811 Test structure for metal CMP process control
08/23/2001US20010015801 Polishing pad surface condition evaluation method and an apparatus thereof and a method of producing a semiconductor device
08/22/2001EP1125999A1 Polishing composition
08/22/2001EP1125688A1 Polishing apparatus and a semiconductor manufacturing method using the same
08/22/2001EP1125686A1 Work holding disc for polishing, work polishing apparatus, and work polishing method
08/22/2001EP1124912A1 A chemical mechanical polishing slurry system having an activator solution
08/22/2001EP1124666A1 Use of zeta potential during chemical mechanical polishing for end point detection