Patents for B24B 37 - Lapping machines or devices; Accessories (20,836)
05/2002
05/02/2002US20020052172 Lapping machine, lapping method, and method of manufacturing magnetic head
05/02/2002US20020052171 Apparatus and methods for chemical mechanical polishing with an incrementally advanceable polishing sheet
05/02/2002US20020052169 Systems and methods to significantly reduce the grinding marks in surface grinding of semiconductor wafers
05/02/2002US20020052164 Lapping machine, lapping method, and row tool
05/02/2002US20020052116 Free Floating double side polishing of substrates
05/02/2002US20020052115 Method of eliminating agglomerate particles in a polishing slurry
05/02/2002US20020052064 Method and apparatus for processing a semiconductor wafer using novel final polishing method
05/02/2002US20020052052 Chemical-mechanical planarization machine and method for uniformly planarizing semiconductor wafers
05/02/2002US20020051135 Apparatus for optical inspection of wafers during polishing
05/02/2002EP1201368A2 Composition for forming polishing pad, crosslinked body for polishing pad, polishing pad using the same and method for producing thereof
05/02/2002EP1201365A2 Frequency measuring device, polishing device using the same and eddy current sensor
05/02/2002EP1200532A1 Cmp composition containing silane modified abrasive particles
05/02/2002EP1200352A1 Improved ceria powder
05/02/2002DE10062926A1 Machine for one sided surface machining by grinding, polishing or lapping at least one workpiece which has frame housing relevant machine tool using at least one workpiece holder
05/01/2002CN1083754C Apparatus and method for polishing flat surface using belted polishing pad
04/2002
04/30/2002US6380086 High-speed planarizing apparatus for chemical-mechanical planarization of semiconductor wafers
04/30/2002US6379538 Apparatus for separation and recovery of liquid and slurry abrasives used for polishing
04/30/2002US6379406 Water polish mixture, abrasive particles of metal oxide for ions
04/30/2002US6379235 Wafer support for chemical mechanical planarization
04/30/2002US6379231 Apparatus and methods for chemical mechanical polishing with an advanceable polishing sheet
04/30/2002US6379229 Polishing apparatus
04/30/2002US6379228 Polishing machine having a plurality of abrasive pads
04/30/2002US6379226 Method for storing carrier for polishing wafer
04/30/2002US6379225 Planarization process with abrasive polishing slurry that is selective to a planarized surface
04/30/2002US6379223 Method and apparatus for electrochemical-mechanical planarization
04/30/2002US6379222 Methods and apparatus for chemical mechanical planarization (CMP) of a semiconductor wafer
04/30/2002US6379221 Method and apparatus for automatically changing a polishing pad in a chemical mechanical polishing system
04/30/2002US6379219 Chemical mechanical polishing machine and chemical mechanical polishing method
04/30/2002US6379216 Rotary chemical-mechanical polishing apparatus employing multiple fluid-bearing platens for semiconductor fabrication
04/25/2002WO2002033737A2 Multiprobe detection system for chemical-mechanical planarization tool
04/25/2002WO2002033736A1 Chemical-mechanical polishing slurry and method
04/25/2002WO2002033023A1 Slurry for chemical-mechanical polishing copper damascene structures
04/25/2002WO2002032625A2 Abrasive article comprising a structured diamond-like carbon coating and method of using same to mechanically treat a substrate
04/25/2002WO2002032624A1 Segmented wafer polishing pad
04/25/2002US20020049033 Polishing pad comprising a filled translucent region
04/25/2002US20020049030 Wafer polishing device
04/25/2002US20020049029 System and method for chemical mechanical polishing
04/25/2002US20020049027 Fixed abrasive polishing pad
04/25/2002US20020049025 Method of abrading silicon substrate
04/25/2002US20020048958 Cleaning exposed surfaces of said conductive film and said barrier film; washing using a rinsing liquid; polishing until a portion of said insulator film is exposed; and washing exposed surfaces
04/25/2002US20020048214 Slurry dilution system with an ultrasonic vibrator capable of in-situ adjustment of slurry concentration
04/25/2002US20020047705 Frequency measuring device, polishing device using the same and eddy current sensor
04/25/2002US20020046435 Polishing cloth and method of manufacturing semiconductor device using the same
04/25/2002DE10139086A1 Verfahren zum Trennen eines plattenartigen Werkstückes, welches durch Adsorption an einem elastischen Adsorptionskissen gehalten wird A method of separating a plate-like workpiece which is held by adsorption on a sorbent elastic
04/24/2002EP1199135A1 Work holding panel for polishing, and device and method for polishing
04/24/2002EP0930955B1 Polishing pad contour indicator for mechanical or chemical-mechanical planarization
04/24/2002CN2487499Y General grinder capable of grinding multiple air valves at the same time
04/24/2002CN1346300A Modular controlled platen preparation system and method
04/24/2002CN1083618C New Chemical mechanical polishing process for layers of isolating material based on silicon derivatives or silicon
04/23/2002US6376378 Polishing apparatus and method for forming an integrated circuit
04/23/2002US6375791 Method and apparatus for detecting presence of residual polishing slurry subsequent to polishing of a semiconductor wafer
04/23/2002US6375693 Chemical-mechanical planarization of barriers or liners for copper metallurgy
04/23/2002US6375559 Polishing system having a multi-phase polishing substrate and methods relating thereto
04/23/2002US6375553 Polishing chucks, semiconductor wafer polishing chucks, abrading methods, polishing methods, semiconductor wafer polishing methods, and methods of forming polishing chucks
04/23/2002US6375551 Angstrom polishing of calcium fluoride optical VUV microlithography lens elements and preforms
04/23/2002US6375550 Method and apparatus for enhancing uniformity during polishing of a semiconductor wafer
04/23/2002US6375549 Polishing head for wafer, and method for polishing
04/23/2002US6375548 Chemical-mechanical polishing methods
04/23/2002US6375544 System and method for reducing surface defects integrated in circuits
04/23/2002US6375541 Polishing fluid polishing method semiconductor device and semiconductor device fabrication method
04/23/2002US6375540 End-point detection system for chemical mechanical posing applications
04/23/2002US6375539 Lapping machine, lapping method, and row tool
04/23/2002CA2248910C Dispensing system and method for dispensing an aqueous solution
04/18/2002WO2002031874A1 Abrasive cloth, polishing device and method for manufacturing semiconductor device
04/18/2002WO2002031866A2 Infrared end-point system for cmp
04/18/2002WO2002031231A1 Semiconductor production device and production method for semiconductor device
04/18/2002WO2002031079A1 Abrasive material
04/18/2002WO2002031072A1 Cmp slurry composition and a method for planarizing semiconductor device using the same
04/18/2002WO2002030618A1 Activated slurry cmp system and methods for implementing the same
04/18/2002WO2002030617A1 Polishing pad comprising a filled translucent region
04/18/2002WO2001064391A3 Planarization system with a wafer transfer corridor and multiple polishing modules
04/18/2002US20020045413 Substrate cleaning apparatus and substrate polishing apparatus with substrate cleaning apparatus
04/18/2002US20020045412 Method for supplying slurry to polishing apparatus
04/18/2002US20020045410 Polishing apparatus
04/18/2002US20020045409 Method and apparatus for planarizing and cleaning microelectronic substrates
04/18/2002US20020045407 Method and apparatus for releasably attaching a polishing pad to a chemical-mechanical planarization machine
04/18/2002US20020045406 Using a purge gas in a chemical mechanical polishing apparatus with an incrementally advanceable polishing sheet
04/18/2002US20020045405 Method of forming ink fill slot of ink-jet printhead
04/18/2002US20020045349 Method for chemical-mechanical-polishing a substrate
04/18/2002US20020045348 Semiconductor wafer treating method and device for removing deposit on a semiconductor wafer
04/18/2002US20020043027 Preventing formation of pits in copper wiring in chemical mechanical polishing of substrates for semiconductors, photomasks and memory hard disks
04/18/2002DE10046933A1 Process for the chemical-mechanical polishing of silicon wafers comprises rotating a silicon surface to be cleaned on a polishing plate covered with a polishing cloth with continuous
04/17/2002EP1197296A2 Pad conditioning disk
04/17/2002EP1197293A1 Polishing device and method
04/17/2002EP1197292A2 Substrate holding apparatus
04/17/2002CN1345264A Polishing body, polisher, plishing method and method for producing semiconductor device
04/17/2002CN1083154C Grinding method, and method for manufacturing semiconductor device and device for making semiconductor
04/17/2002CN1082867C Device for grinding bar carrying a few slides
04/17/2002CN1082866C Wafer polishing apparatus and plishing method
04/16/2002US6372111 Chemical mechanical planarization
04/16/2002US6371836 Groove cleaning device for chemical-mechanical polishing
04/16/2002US6370763 Manufacturing method for magnetic heads
04/11/2002WO2002029859A2 Method and apparatus for electrochemical planarization of a workpiece
04/11/2002WO2002028979A1 Cerium based abrasive material and method for producing cerium based abrasive material
04/11/2002WO2002028598A1 Method for conditioning polishing pads
04/11/2002WO2002028597A1 Method and apparatus for electrochemical planarization of a workpiece
04/11/2002WO2002028596A1 Web-style pad conditioning system and methods for implementing the same
04/11/2002WO2002028595A1 Polishing apparatus and method with a refreshing polishing belt and loadable housing
04/11/2002WO2002015237A3 Changing local compressibility of a wafer support member
04/11/2002WO2002002274A3 Base-pad for a polishing pad