Patents for B24B 37 - Lapping machines or devices; Accessories (20,836)
08/2002
08/13/2002US6431952 Apparatus and methods for substantial planarization of solder bumps
08/08/2002WO2002061817A1 Working shape prediction method, working requirement determination method, working method, working system, method of manufacturing semiconductor device, computer program, and computer program storage medium
08/08/2002WO2002061810A1 Ammonium oxalate-containing polishing system and method
08/08/2002WO2002061008A2 Alkali metal-containing polishing system and method
08/08/2002WO2002060646A1 System for magnetorheological finishing of substrates
08/08/2002WO2002060643A2 Spherical drive assembly for chemical mechanical planarization
08/08/2002US20020106980 Abrasive article suitable for modifying a semiconductor wafer
08/08/2002US20020106979 Conditioning wheel for conditioning a semiconductor wafer polishing pad and method of manufacture thereof
08/08/2002US20020106978 Chemical mechanical machining and surface finishing
08/08/2002US20020106977 Fixed-abrasive chemical-mechanical planarization of titanium nitride
08/08/2002US20020106975 Fixed-abrasive chemical-mechanical planarization of titanium nitride
08/08/2002US20020106971 Method and apparatus for conditioning a polishing pad
08/08/2002US20020106900 Polishing slurry for the chemical-mechanical polishing of metal and dielectric structures
08/08/2002US20020106899 Method for applying uniform pressurized film across wafer
08/08/2002US20020106897 Polishing of metal substrates
08/08/2002US20020106829 Conditioning wheel for conditioning a semiconductor wafer polishing pad and method of manufacture thereof
08/08/2002US20020104764 Applying a voltage across a polishing pad and the substrate, while an electropolishing electrolyte is dispensed at an interface of the substrate and the polishing pad, and while pooling the electrolyte about the substrate
08/08/2002US20020104268 Slurry for chemical mechanical polishing
08/07/2002EP1229094A2 Polishing composition and polishing method employing it
08/07/2002EP1229093A1 Polishing composition and polishing method employing it
08/07/2002EP1228161A1 Cmp products
08/07/2002EP1228159A1 Improved cmp products
08/07/2002EP1227912A1 Methods and apparatuses for planarizing microelectronic substrate assemblies
08/07/2002EP1213094A9 Polishing apparatus having interlock function
08/07/2002CN1362906A Apparatus and method for the restoration of optical storage media
08/06/2002US6429132 Combination CMP-etch method for forming a thin planar layer over the surface of a device
08/06/2002US6429131 CMP uniformity
08/06/2002US6429130 Method and apparatus for end point detection in a chemical mechanical polishing process using two laser beams
08/06/2002US6428586 Transporting a backing layer to successive manufacturing stations, supplying a fluid phase polymer onto transported backing layer, shaping fluid phase polymer into surface layer having measured thickness, and curing polymer to solidify
08/06/2002US6428405 Abrasive pad and polishing method
08/06/2002US6428404 Web-format planarizing machines and methods for planarizing microelectronic substrate assemblies
08/06/2002US6428403 Polishing apparatus
08/06/2002US6428400 Drainage structure in polishing plant
08/06/2002US6428399 Polishing apparatus for polishing a hard material-coated wafer
08/06/2002US6428398 Method for wafer polishing and method for polishing-pad dressing
08/06/2002US6428397 Wafer edge polishing method and apparatus
08/06/2002US6428395 Method of polishing at least one surface of a silicon-based part
08/06/2002US6428394 Method and apparatus for chemical mechanical planarization and polishing of semiconductor wafers using a continuous polishing member feed
08/06/2002US6428389 Polishing apparatus
08/06/2002US6428388 Finishing element with finishing aids
08/06/2002US6428387 Method for chemical mechanical polishing using a high selective slurry
08/06/2002US6428386 Planarizing pads, planarizing machines, and methods for mechanical and/or chemical-mechanical planarization of microelectronic-device substrate assemblies
08/06/2002US6427991 Non-contact workpiece holder using vortex chuck with central gas flow
08/01/2002WO2002059947A2 Carrier head for holding a wafer and allowing processing on a front face thereof to occur
08/01/2002WO2002059943A2 Chemical mechanical polishing of copper-oxide damascene structures
08/01/2002WO2002059393A1 Composition for chemical mechanical planarization of copper, tantalum and tantalum nitride
08/01/2002WO2002058885A1 Pressure vessel systems and methods for dispensing liquid chemical compositions
08/01/2002US20020102931 Work holding member for mechanical abrasion, abrading method, and abrading machine
08/01/2002US20020102928 System for magnetorheological finishing of substrates
08/01/2002US20020102925 Surface polishing method and apparatus
08/01/2002US20020102924 Selective chemical-mechanical polishing properties of a cross-linked polymer and specific applications therefor
08/01/2002US20020102923 Polishing composition and polishing method for polishing a substrate to be used for a memory hard disk employing it
08/01/2002US20020102921 Fixed abrasive polishing pad
08/01/2002US20020102917 Polishing method using dynamic feedback recipe
08/01/2002US20020102853 Articles for polishing semiconductor substrates
08/01/2002US20020100895 For polishing multiple metal layers and thin-films where one of the layers or films is comprises of copper or a copper containing alloy
08/01/2002US20020100743 Multi-step polish process to control uniformity when using a selective slurry on patterned wafers
08/01/2002DE10122283A1 Chemisch-mechanisches Polierverfahren Chemical mechanical polishing method
08/01/2002DE10103062A1 Chemisch-mechanisches Polierverfahren für emulsionsfreie feste Schleifkissen Chemical mechanical polishing method for emulsion-free solid abrasive pad
08/01/2002CA2431591A1 Composition for chemical mechanical planarization of copper, tantalum and tantalum nitride
07/2002
07/31/2002EP1226220A1 Polishing system and method of its use
07/31/2002CN2502842Y Diesel engine valve lapping machine
07/31/2002CN1361923A Polishing mixture and process for reducing the incorporation of copper into silicon wafers
07/30/2002US6426297 Differential pressure chemical-mechanical polishing in integrated circuit interconnects
07/30/2002US6426296 Method and apparatus for obtaining a precision thickness in semiconductor and other wafers
07/30/2002US6426295 Mixing surfactant of at least 100 parts per million to slurries to form polishing solution, chemical-mechanical planarizing of semiconductor wafer using polishing solution to form microelectronic substrate
07/30/2002US6426294 Polishing conductive material film comprising copper or copper alloy using aqueous composition comprising pyridine-based carboxylic acid and acid having one carboxyl and one hydroxyl group or oxalic acid, abrasive grains and oxidizing agent
07/30/2002US6425816 Polishing pads and methods relating thereto
07/30/2002US6425815 Fixed abrasive polishing pad
07/30/2002US6425812 Polishing head for chemical mechanical polishing using linear planarization technology
07/30/2002US6425810 Polishing apparatus
07/30/2002US6425809 Polishing apparatus
07/30/2002US6425806 Method and apparatus for dry-in, dry-out polishing and washing of a semiconductor device
07/30/2002US6425804 Pressurized delivery system for abrasive particulate material
07/30/2002US6425803 Scored polishing pad and methods relating thereto
07/30/2002US6425802 Apparatus for supplying flush fluid
07/30/2002US6425801 Polishing process monitoring method and apparatus, its endpoint detection method, and polishing machine using same
07/25/2002WO2002057382A2 A cmp polishing pad including a solid catalyst
07/25/2002WO2002057071A2 Catalytic reactive pad for metal cmp
07/25/2002WO2002057052A1 Abrasive free polishing in copper damascene applications
07/25/2002WO2002023613A3 Metal cmp process with reduced dishing
07/25/2002WO2001089767A3 A chemical-mechanical polishing system for the manufacture of semiconductor devices
07/25/2002US20020098790 Open structure polishing pad and methods for limiting pore depth
07/25/2002US20020098789 Polishing pad and methods for improved pad surface and pad interior characteristics
07/25/2002US20020098786 Retention plate for polishing semiconductor substrate
07/25/2002US20020098785 Method and apparatus for releasably attaching a polishing pad to a chemical-mechanical planarization machine
07/25/2002US20020098784 Abrasive free polishing in copper damascene applications
07/25/2002US20020098782 Polishing pads and methods relating thereto
07/25/2002US20020098780 Apparatus for polishing a semiconductor wafer and method therefor
07/25/2002US20020098779 Method and apparatus for enhanced CMP using metals having reductive properties
07/25/2002US20020098778 Polishing pad, polishing apparatus and polishing method using the same
07/25/2002US20020098777 Multizone carrier with process monitoring system for chemical-mechanical planarization tool
07/25/2002US20020098702 Apparatus and methods for chemical-mechanical polishing of semiconductor wafers
07/25/2002US20020098701 Polishing method
07/25/2002US20020098700 In closed container without generating hydrogen gas; a dry acid, iron, and an inhibited carbon dioxide generating compound (an encapsulated carbonate or bicarbonate); activated by injection of water; delayed carbon dioxide generation
07/25/2002US20020098698 Method for polishing semiconductor device
07/25/2002US20020098696 Method and apparatus for chemical-mechanical planarization of microelectronic substrates with selected planarizing liquids
07/25/2002US20020096659 Polishing composition and polishing method employing it
07/25/2002US20020095874 Slurry for chemical mechanical polishing
07/25/2002US20020095872 For polishing a metal film formed on an insulating film with a concave on a substrate