Patents for B24B 37 - Lapping machines or devices; Accessories (20,836)
07/2002
07/04/2002US20020084243 Composite material comprising a bonded laminate having a layer of macromolecular material bonded to the modified surface of a titanium sheet or a titanium alloy sheet, lightweight, high strength, corrosion resistant
07/04/2002US20020083650 Polishing of semiconductor substrates
07/04/2002US20020083577 Polishing member and apparatus
07/04/2002DE10062496A1 Halter für flache Werkstücke, insbesondere Halbleiterwafer Holder for flat workpieces, in particular semiconductor wafers
07/03/2002EP1218565A1 Cemented carbide wear part and lapping method
07/03/2002EP1218466A1 Compositions for and methods of reducing/eliminating scratches and defects in silicon dioxide cmp process
07/03/2002EP1218465A1 Polishing system with stopping compound and method of its use
07/03/2002EP1218464A1 Chemical mechanical polishing systems and methods for their use
07/03/2002EP1218310A1 A1 2?O 3?/SiC NANOCOMPOSITE ABRASIVE GRAINS, METHOD FOR PRODUCING THEM AND THEIR USE
07/03/2002EP1218144A1 Dissolution of metal particles produced by polishing
07/03/2002EP1218143A1 Method and apparatus for mechanical and chemical-mechanical planarization of microelectronic substrates with metal compound abrasives
07/03/2002CN2498383Y Hydraulic device of steel ball machining apparatus
07/03/2002CN1356369A Apparatus for preparing grinding liquid
07/03/2002CN1086976C Chemical and mechanical lapping device and method
07/02/2002US6413873 System for chemical mechanical planarization
07/02/2002US6413403 Controlling electrolyte flow and distribution of electric, magnetic or electromagnetic field; depositing, removing, polishing, and/or modifying conductive material; uniformity; chemical mechanical polishing
07/02/2002US6413388 Pad designs and structures for a versatile materials processing apparatus
07/02/2002US6413288 CMP polishing slurry dewatering and reconstitution
07/02/2002US6413156 Method and apparatus for polishing workpiece
07/02/2002US6413155 Polishing apparatus
07/02/2002US6413154 Polishing apparatus
07/02/2002US6413153 Finishing element including discrete finishing members
07/02/2002US6413152 Apparatus for performing chemical-mechanical planarization with improved process window, process flexibility and cost
07/02/2002US6413151 CMP slurry recycling apparatus and method for recycling CMP slurry
07/02/2002US6413149 For semiconductor wafers
07/02/2002US6413146 Polishing apparatus
06/2002
06/27/2002WO2002050893A2 Process for monitoring a process, planarizing a surface, and for quantifying the results of a planarization process
06/27/2002WO2002050336A2 Integrated mutli-step gap fill and all feature planarization for conductive materials
06/27/2002WO2002049806A1 Belt polishing device with double retainer ring
06/27/2002WO2002049805A1 Polishing platen with pressurized membrane
06/27/2002WO2002049804A1 Jet-induced finishing of a substrate surface
06/27/2002WO2002015237B1 Changing local compressibility of a wafer support member
06/27/2002WO2000063963A9 Non-abrasive conditioning for polishing pads
06/27/2002US20020081958 Polishing pad installation tool
06/27/2002US20020081956 Carrier head with vibration dampening
06/27/2002US20020081955 Wafer polishing apparatus
06/27/2002US20020081951 Apparatus and method for qualifying a chemical mechanical planarization process
06/27/2002US20020081950 Apparatus for enhanced rate chemical mechanical polishing with adjustable selectivity
06/27/2002US20020081948 Flexible bending member for a workpiece carrier apparatus
06/27/2002US20020081947 Platen design for improving edge performance in CMP applications
06/27/2002US20020081946 Base-pad for a polishing pad
06/27/2002US20020081945 Piezoelectric platen design for improving performance in CMP applications
06/27/2002US20020081943 Semiconductor substrate and lithographic mask processing
06/27/2002US20020081853 Abrasive slurry and process for a chemical-mechanical polishing of a precious-metal surface
06/27/2002US20020078632 Composition for forming polishing pad, crosslinked body for polishing pad, polishing pad using the same and method for producing thereof
06/27/2002DE10063491A1 Saure Polierslurry für das chemisch-mechanische Polieren von SiO¶2¶-Isolationsschichten Acid polishing slurry for chemical mechanical polishing of SiO¶2¶ insulating layers
06/27/2002DE10063488A1 Polierslurry für das chemisch-mechanische Polieren von Siliciumdioxid-Filmen Polishing slurry for chemical mechanical polishing of silicon dioxide films
06/27/2002DE10062497A1 Halter für flache Werkstücke, insbesondere Halbleiterwafer Holder for flat workpieces, in particular semiconductor wafers
06/27/2002DE10060697A1 Producing semiconductor wafers used in the production of processor and storage components comprises polishing both sides of the wafer using polishing plates
06/27/2002DE10060696A1 Method by which edges of brittle hard materials may be ground has the tool subjected to ultrasonic frequencies
06/26/2002EP1217651A1 Acid polishing slurry for the chemical mechanical polishing of SiO2-isolation layers
06/26/2002EP1217650A1 Polishing slurry for the chemical mechanical polishing of silicon dioxide films
06/26/2002EP1217322A2 Heat Exchanger
06/26/2002EP1216316A1 Polishing of fluoride crystal optical lenses and preforms using cerium oxide for microlithography
06/26/2002EP1216118A1 Polishing pad treatment for surface conditioning
06/26/2002CN1355769A Improved ceria oxide powder
06/25/2002US6410441 Auto slurry deliver fine-tune system for chemical-mechanical-polishing process and method of using the system
06/25/2002US6410440 Method and apparatus for a gaseous environment providing improved control of CMP process
06/25/2002US6410439 Semiconductor polishing apparatus and method for chemical/mechanical polishing of films
06/25/2002US6409936 Integrated circuit; corundum abrasive particles; etchant; nonionic surfactant brij (polyoxyethylene cetyl ether)
06/25/2002US6409904 Method and apparatus for depositing and controlling the texture of a thin film
06/25/2002US6409780 Solid material with water and inorganic particles in a slurry
06/25/2002US6409586 Fixed abrasive polishing pad
06/25/2002US6409585 Polishing apparatus and holder for holding an article to be polished
06/25/2002US6409583 Apparatus for polishing wafers
06/25/2002US6409582 Polishing apparatus
06/25/2002US6409581 Belt polishing pad method
06/25/2002US6409580 Rigid polishing pad conditioner for chemical mechanical polishing tool
06/25/2002US6409579 Method and apparatus for conditioning a polish pad at the point of polish and for dispensing slurry at the point of polish
06/25/2002US6409577 Method for conditioning a polishing pad used in chemical-mechanical planarization of semiconductor wafers
06/25/2002US6409576 Polishing apparatus
06/20/2002WO2002049082A2 Process of shaping a semiconductor substrate and/or a lithographic mask
06/20/2002WO2002048279A1 Abrasive, abrasive slurry, and method for manufacturing abrasive
06/20/2002WO2002047870A1 Arrangement and method for mounting a backing film to a polish head
06/20/2002WO2002047868A1 Composition for texturing process
06/20/2002WO2002016080A3 Substrate supporting carrier pad
06/20/2002WO2000054935A9 Method and apparatus for endpoint detection for chemical mechanical polishing
06/20/2002US20020077053 Flexible polishing pad having reduced surface stress
06/20/2002US20020077051 Holder for flat workpieces, particularly semiconductor wafers
06/20/2002US20020077046 Holder for polished work and manufacturing method thereof
06/20/2002US20020077045 Apparatus and method for chemical-mechanical polishing (CMP) head having direct pneumatic wafer polishing pressure
06/20/2002US20020077044 Apparatus and method for lapping magnetic heads
06/20/2002US20020077039 Process for the surface polishing of silicon wafers
06/20/2002US20020077037 Fixed abrasive articles
06/20/2002US20020077036 Polishing pads and methods relating thereto
06/20/2002US20020077035 Ion exchange materials for chemical mechanical polishing
06/20/2002US20020077034 Substrate polishing article
06/20/2002US20020077031 Combined eddy current sensing and optical monitoring for chemical mechanical polishing
06/20/2002US20020076932 Method of polishing or planarizing a substrate
06/20/2002US20020074478 Holder for flat workpieces, particularly semiconductor wafers
06/20/2002US20020074311 Methods of endpoint detection for wafer planarization
06/20/2002CA2365593A1 Polishing slurry for the chemical-mechanical polishing of silica films
06/19/2002EP1215011A1 Arrangement and method for mounting a backing film to a polish head
06/19/2002EP1214175A1 Unsupported polishing belt for chemical mechanical polishing
06/19/2002EP1214174A1 Windowless belt and method for in-situ wafer monitoring
06/18/2002US6407000 Microelectronics
06/18/2002US6406364 Polishing solution feeder
06/18/2002US6406363 Unsupported chemical mechanical polishing belt
06/18/2002US6406362 Seal for use with a chemical mechanical planarization apparatus
06/18/2002US6406361 Carrier head for chemical mechanical polishing