Patents for B24B 37 - Lapping machines or devices; Accessories (20,836)
04/2004
04/27/2004US6726545 Linear polishing for improving substrate uniformity
04/27/2004US6726540 Polishing cloth and method of manufacturing semiconductor device using the same
04/27/2004US6726538 Sample polishing apparatus and sample polishing method
04/27/2004US6726537 Polishing carrier head
04/27/2004US6726534 Preequilibrium polishing method and system
04/27/2004US6726532 Belt tensioning assembly for CMP apparatus
04/27/2004US6726530 End-point detection system for chemical mechanical polishing applications
04/27/2004US6726529 Low temperature chemical mechanical polishing of dielectric materials
04/22/2004WO2004034456A1 Method of forming wiring
04/22/2004WO2004033574A1 Cmp method utilizing amphiphilic non-ionic surfactants
04/22/2004WO2004033153A2 Retaining ring for holding semiconductor wafers in a chemical-mechanical polishing device
04/22/2004WO2004033152A1 Retaining ring for use on a carrier of a polishing apparatus
04/22/2004WO2004033151A1 Retaining ring for holding semiconductor wafers in a chemical-mechanical polishing device
04/22/2004WO2004033148A1 Both side grinding method and both side grinder of thin disc-like work
04/22/2004WO2004009289A3 Rising after chemical-mechanical planarization process applied on a wafer
04/22/2004US20040077297 Polishing apparatus and polishing method
04/22/2004US20040077294 Method and apparatus to provide a GMR lapping plate texturization using a photo-chemical process
04/22/2004US20040077292 Real-time polishing pad stiffness control using magnetically controllable fluid
04/22/2004US20040077167 Retaining ring for use on a carrier of a polishing apparatus
04/22/2004US20040076806 Porous ceramics and method for preparation thereof, and microstrip substrate
04/22/2004US20040074636 Flow completion system
04/22/2004US20040074517 Surfactants for chemical mechanical polishing
04/21/2004EP1410118A1 Method and system for endpoint detection
04/21/2004EP1409201A1 Fixed abrasive articles with wear indicators
04/21/2004EP1250215B1 System and method for controlled polishing and planarization of semiconductor wafers
04/21/2004CN1491269A Cerium based abrasive material and method for preparation thereof
04/21/2004CN1491146A Chemical mechanical machining and surface finishing
04/21/2004CN1146866C Crown forming method of flying head and its crown forming device
04/20/2004US6725120 Apparatus and methods with resolution enhancement feature for improving accuracy of conversion of required chemical mechanical polishing pressure to force to be applied by polishing head to wafer
04/20/2004US6723655 Methods for fabricating a semiconductor device
04/20/2004US6723643 Method for chemical mechanical polishing of thin films using end-point indicator structures
04/20/2004US6723144 Semiconductor device fabricating method
04/20/2004US6722965 Carrier head with flexible membranes to provide controllable pressure and loading area
04/20/2004US6722964 Polishing apparatus and method
04/20/2004US6722963 Apparatus for chemical-mechanical planarization of microelectronic substrates with a carrier and membrane
04/20/2004US6722962 Polishing system, polishing method, polishing pad, and method of forming polishing pad
04/20/2004US6722957 Method and apparatus for planarizing a microelectronic substrate with a tilted planarizing surface
04/20/2004US6722953 Abrasive liquid feed apparatus, method for feeding additive to abrasive liquid feed apparatus, and polishing apparatus
04/20/2004US6722951 Eliminates damage; performs intermittently low speed polishing under low torque prior to high speed continuous polishing at high torque
04/20/2004US6722950 Method and apparatus for electrodialytic chemical mechanical polishing and deposition
04/20/2004US6722949 Ventilated platen/polishing pad assembly for chemcial mechanical polishing and method of using
04/20/2004US6722948 Pad conditioning monitor
04/20/2004US6722947 Lapping machine, lapping method, and method of manufacturing magnetic head
04/20/2004US6722946 Advanced chemical mechanical polishing system with smart endpoint detection
04/20/2004US6722943 Planarizing machines and methods for dispensing planarizing solutions in the processing of microelectronic workpieces
04/20/2004US6722942 Chemical mechanical polishing with electrochemical control
04/20/2004US6722249 Method of fabricating a polishing pad having an optical window
04/15/2004WO2004030865A1 Methods and systems for controlling belt surface temperature and slurry temperature in linear chemical mechanical planarization
04/15/2004WO2004030860A2 Flow control system
04/15/2004US20040072522 Gradient polishing pad made from paper-making fibers for use in chemical/mechanical planarization of wafers
04/15/2004US20040072518 Platen with patterned surface for chemical mechanical polishing
04/15/2004US20040072517 Apparatus for polishing a semiconductor wafer and method therefor
04/15/2004US20040072516 Polishing pad having a grooved pattern for use in chemical mechanical polishing apparatus
04/15/2004US20040072515 Device for polishing optical disk
04/15/2004US20040072507 Polishing pads useful in chemical mechanical polishing of substrates in the presence of a slurry containing abrasive particles
04/15/2004US20040072506 Fixed abrasive article for use in modifying a semiconductor wafer
04/15/2004US20040072505 Polishing member and method of manufacturing semiconductor device
04/15/2004US20040072503 Dual mode hybrid control and method for CMP slurry
04/15/2004US20040072502 Subpad support with a releasable subpad securing element and polishing apparatus including the subpad support
04/15/2004US20040072500 Chemical mechanical polishing with friction-based control
04/15/2004US20040072499 Polishing apparatus
04/15/2004US20040072445 Effective method to improve surface finish in electrochemically assisted CMP
04/15/2004US20040070880 Method and apparatus for grounding a magnetic recording head
04/15/2004US20040070092 Method for simultaneous two-disk texturing
04/15/2004US20040069406 CMP apparatus polishing head with concentric pressure zones
04/15/2004US20040068937 Homogeneous fixed abrasive polishing pad
04/15/2004DE10247180A1 Haltering zum Halten von Halbleiterwafern in einer chemisch-mechanischen Poliervorrichtung Retaining ring for holding semiconductor wafers in a chemical mechanical polishing apparatus
04/15/2004DE10247179A1 Haltering zum Halten von Halbleiterwafern in einer chemisch-mechanischen Poliervorrichtung Retaining ring for holding semiconductor wafers in a chemical mechanical polishing apparatus
04/15/2004DE10245548A1 Semiconductor wafer polishing device,
04/14/2004EP1408538A1 Polishing element, cmp polishing device and productions method for semiconductor device
04/14/2004EP1407482A1 Method for chemical mechanical polishing (cmp) with altering the concentration of oxidizing agent in slurry
04/14/2004EP0990486B1 Polishing solution feeder
04/14/2004CN2611103Y Drum-like abrasive cloth grinder lapping machine
04/14/2004CN2611102Y Drum-like abrasive cloth grinder lapping machine having device for clip-removal and dust-collection
04/14/2004CN2611101Y Air valve polishing tool
04/14/2004CN1489509A Polishing pad with built-in optical sensor
04/14/2004CN1489508A FIxed abrasive article for use in modifying semiconductor wafer
04/14/2004CN1489507A Water carrier with groove for decoupling retainer ring from wafer
04/14/2004CN1488470A 抛光机 Polishing Machine
04/13/2004US6721628 Closed loop concentration control system for chemical mechanical polishing slurry
04/13/2004US6720266 Methods and apparatuses for monitoring and controlling mechanical or chemical-mechanical planarization of microelectronic substrate assemblies
04/13/2004US6720264 Prevention of precipitation defects on copper interconnects during CMP by use of solutions containing organic compounds with silica adsorption and copper corrosion inhibiting properties
04/13/2004US6720250 Method of manufacturing a semiconductor device using a slurry for chemical mechanical polishing of copper
04/13/2004US6719874 Active retaining ring support
04/13/2004US6719823 Polishing systems, methods of polishing substrates, and methods of cleaning polishing slurry from substrate surfaces
04/13/2004US6719819 Polishing composition
04/13/2004US6719818 Apparatus and method for in-situ endpoint detection for chemical mechanical polishing operations
04/13/2004US6719619 Quick coupler for mounting a rotational disk
04/13/2004US6719618 Polishing apparatus
04/13/2004US6719617 Slurry homogenizer and supply system
04/13/2004US6719615 Versatile wafer refining
04/13/2004US6719611 Jet-induced finishing of a substrate surface
04/13/2004US6719610 Method and device for grinding particulates
04/13/2004US6719608 Fabrication of devices with fibers engaged to grooves on substrates
04/13/2004US6718612 Method for manufacturing a magnetic disk comprising a glass substrate using a protective layer over a glass workpiece
04/08/2004WO2004028746A2 Brazed diamond tools and methods for making the same
04/08/2004WO2004028745A1 Polishing pad for planarization
04/08/2004WO2004028744A1 Polishing pad with window for planarization
04/08/2004WO2004028743A1 Polishing apparatus, polishing head, and polishing method
04/08/2004WO2002064315A8 Polishing disk with end-point detection port