Patents for B24B 37 - Lapping machines or devices; Accessories (20,836)
09/2004
09/30/2004US20040188244 Electro-chemical machining apparatus
09/30/2004US20040188083 Flow completion system
09/30/2004US20040187393 Polishing composition
09/29/2004EP1349705B1 Polishing pad and method of use thereof
09/29/2004CN2644093Y High-speed grinder
09/29/2004CN1533595A Polishing method and grinding fluid
09/29/2004CN1533420A Additive compositon, slurry composition including the same, and method of polishing an object using the slurry composition
09/29/2004CN1533316A Projected gimbal point drive
09/29/2004CN1532245A 抛光组合物 The polishing composition
09/29/2004CN1532025A Grinder with easily detached grinding sheet
09/29/2004CN1168575C Method for repairing and maintaining grinding board by using double-board grinding machine
09/28/2004US6799136 Method of estimation of wafer polish rates
09/28/2004US6798529 In-situ method and apparatus for end point detection in chemical mechanical polishing
09/28/2004US6797626 Method of polishing copper layer of substrate
09/28/2004US6797624 Solution for ruthenium chemical mechanical planarization
09/28/2004US6797623 Methods of producing and polishing semiconductor device and polishing apparatus
09/28/2004US6797190 Wafer carrier assembly for a chemical mechanical polishing apparatus and a polishing method using the same
09/28/2004US6797132 Apparatus for plating and polishing a semiconductor workpiece
09/28/2004US6796887 Wear ring assembly
09/28/2004US6796885 Pad conditioner coupling and end effector for a chemical mechanical planarization system and method therfor
09/28/2004US6796883 Controlled lubricated finishing
09/28/2004US6796881 Sensing the presence of a wafer
09/28/2004US6796880 Linear polishing sheet with window
09/28/2004US6796879 Dual wafer-loss sensor and water-resistant sensor holder
09/28/2004US6796877 Abrading machine
09/28/2004US6796703 Conductivity feedback control system for slurry bending
09/23/2004WO2004080654A1 Polishing tool and polishing apparatus
09/23/2004US20040185756 Method of planarizing substrates
09/23/2004US20040185755 Method of reducing defectivity during chemical mechanical planarization
09/23/2004US20040185753 Pattern-electroplated lapping plates for reduced loads during single slider lapping and process for their fabrication
09/23/2004US20040185639 Ic chip manufacturing method
09/23/2004US20040185187 comprises liquid crystal compounds for fixing a pad for chemical mechanical polishing of semiconductor wafers
09/23/2004US20040184890 Fluid transport system with vibrators
09/23/2004US20040182721 Process control in electro-chemical mechanical polishing
09/23/2004US20040182720 Measuring thickness equivalent data of a film on a wafer, making a cathode member smaller than the surface face a region, interposing an electrolytic solution between the surface and the cathode member, applying a voltage using the cathode member as a cathode and the film an anode, electrolytic polishing
09/23/2004DE10218483B4 Vorrichtung zur gleichzeitig beidseitigen Material abtragenden Bearbeitung von Werkstücken Apparatus for simultaneous bilateral material-removing machining of workpieces
09/22/2004EP1459371A1 Methods for planarization of group viii metal-containing surfaces using complexing agents
09/22/2004EP1459370A2 Methods for planarization of group viii metal-containing surfaces using oxidizing gases
09/22/2004EP1459368A1 Novel use of alkaline earth metal salts
09/22/2004EP1458830A1 Polishing pad
09/22/2004EP1458829A1 Methods for planarization of metal-containing surfaces using halogens and halide salts
09/22/2004EP1458522A1 Apparatus and methods for controlling wafer temperature in chemical mechanical polishing
09/22/2004EP1458520A1 Methods for planarization of group viii metal-containing surfaces using a fixed abrasive article
09/22/2004CN2643479Y Wafer polishing cramp ring
09/22/2004CN1531748A Method for chemical mechanical polishing (CMP) with altering concentration of oxidizing agent in slurry
09/22/2004CN1531747A Planarization of substrates using electrochemical mechanical polishing
09/22/2004CN1531473A Conductive polishing article for electrochemical mechanical polishing
09/22/2004CN1530205A Reflective resistant layer for polsihig pad window
09/22/2004CN1168123C Correction of metal inlaid wiring form
09/21/2004US6794605 Method for fabricating chemical mechanical polshing pad using laser
09/21/2004US6794289 Method and apparatuses for making and using bi-modal abrasive slurries for mechanical and chemical-mechanical planarization of microelectronic-device substrate assemblies
09/21/2004US6794285 Slurry for CMP, and method of manufacturing semiconductor device
09/21/2004US6794206 Method of polishing a film
09/21/2004US6793837 Process for material-removing machining of both sides of semiconductor wafers
09/21/2004US6793565 Orbiting indexable belt polishing station for chemical mechanical polishing
09/21/2004US6793561 Removable/disposable platen top
09/21/2004US6793559 Composition and method for polishing rigid disks
09/21/2004US6793558 Method and apparatus for planarizing a microelectronic substrate with a tilted planarizing surface
09/21/2004US6793557 Removable lapping guide for magnetic recording head and method of use
09/16/2004WO2004078411A2 Method and apparatus for local polishing control
09/16/2004WO2004078410A2 Agent for increasing selection ratio of polishing rates
09/16/2004WO2004069470A3 Cmp pad with composite transparent window
09/16/2004US20040180612 Boron-containing polishing system and method
09/16/2004US20040180611 Glass substrate for data recording medium, manufacturing method thereof and polishing pad used in the method
09/16/2004US20040180610 Polishing apparatus and polishing method
09/16/2004US20040180608 Ion bombardment of electrical lapping guides to decrease noise during lapping process
09/16/2004US20040180607 Polishing method and polishing apparatus
09/16/2004US20040179310 Embedded lapping guide
09/16/2004US20040177563 For chemical-mechanical polishing; combining a polymer resin with a supercritical gas to produce a single phase solution and forming a pad from the solution; gas is generated by subjecting a gas to an elevated temperature and pressure.
09/16/2004DE10308064A1 Mechanism for chemo-mechanical polishing (CMP) of semiconductor wafers with polishing medium specified supply, polishing plate and polishing head, which presses wafer onto plate, with supply appliance for polishing medium
09/15/2004EP1455988A1 Air platen for leading edge and trailing edge control
09/15/2004CN2640700Y Double-side grinding precision grinding equipment
09/15/2004CN1167109C Mechanical chemical polishing method for aluminium or aluminium alloy conducting layer
09/15/2004CN1166986C Leveling method
09/14/2004US6790883 Composition for polishing pad and polishing pad using the same
09/14/2004US6790769 CMP slurry and method of manufacturing semiconductor device
09/14/2004US6790768 Methods and apparatus for polishing substrates comprising conductive and dielectric materials with reduced topographical defects
09/14/2004US6790763 Substrate processing method
09/14/2004US6790135 Finishing machine having a sandpaper positioning function
09/14/2004US6790130 Semiconductor processing methods of removing conductive material
09/14/2004US6790129 Method for polishing angular substrates
09/14/2004US6790128 Fluid conserving platen for optimizing edge polishing
09/14/2004US6790127 Apparatus and method for feeding slurry
09/14/2004US6790125 Backside integrated circuit die surface finishing technique and tool
09/14/2004US6790123 Method for processing a work piece in a multi-zonal processing apparatus
09/10/2004WO2004077538A1 Polishing device, polishing method, and semiconductor device producing method
09/10/2004WO2004077520A2 Wafer polishing and pad conditioning methods
09/10/2004WO2004076574A2 Cmp composition comprising a sulfonic acid and a method for polishing noble metals
09/10/2004WO2004076126A1 Materials and methods for chemical-mechanical planarization
09/10/2004WO2004042529A3 Method and apparatus for processing sliders for use in disk drives and the like
09/10/2004WO2004028746A3 Brazed diamond tools and methods for making the same
09/09/2004US20040177297 Apparatus with resolution enhancement feature for improving accuracy of conversion of required chemical mechanical polishing pressure to force to be applied by polishing head to wafer
09/09/2004US20040176018 Systems and methods for monitoring characteristics of a polishing pad used in polishing micro-device workpieces
09/09/2004US20040176017 Apparatus and methods for abrading a work piece
09/09/2004US20040176014 Chemical mechanical polishing apparatus with non-conductive elements
09/09/2004US20040176013 Multi-chambered, compliant apparatus for restraining workpiece and applying variable pressure thereto during lapping to improve flatness characteristics of workpiece
09/09/2004US20040175951 Substrate carrier with a textured membrane
09/09/2004US20040174029 Workpiece handling end-effector and a method for processing workpieces using a workpiece handling end-effector
09/09/2004US20040173461 Method and apparatus for local polishing control
09/09/2004US20040173307 Apparatus and method for supplying chemicals in chemical mechanical polishing systems