Patents for B24B 37 - Lapping machines or devices; Accessories (20,836)
06/2005
06/14/2005US6905632 Powder of pyrogenically produced silicon dioxide doped with 0.01 and 3 wt. % aluminium oxide having an average particle diameter of not more than 0.1 mu m.
06/14/2005US6905526 Fabrication of an ion exchange polish pad
06/14/2005US6905402 Polishing pad for planarization
06/14/2005US6905399 Conditioning mechanism for chemical mechanical polishing
06/14/2005US6905398 Chemical mechanical polishing tool, apparatus and method
06/14/2005US6905397 Apparatus for enhanced rate chemical mechanical polishing with adjustable selectivity
06/14/2005US6905394 Apparatus and method for polishing row bars
06/14/2005US6905392 Polishing system having a carrier head with substrate presence sensing
06/14/2005CA2249965C Slurry mixing apparatus and method
06/09/2005WO2005053017A1 Semiconductor surface protecting sheet and method
06/09/2005WO2005052994A2 Protecting thin semiconductor wafers during back-grinding in high-volume production
06/09/2005WO2004111314A3 Algorithm for real-time process control of electro-polishing
06/09/2005WO2004108358A3 Conductive polishing article for electrochemical mechanical polishing
06/09/2005US20050124273 Method of forming a polishing pad for endpoint detection
06/09/2005US20050124269 Polishing head and polishing apparatus
06/09/2005US20050124267 Rinse apparatus and method for wafer polisher
06/09/2005US20050124266 End effectors and methods for manufacturing end effectors with contact elements to condition polishing pads used in polishing micro-device workpieces
06/09/2005US20050124264 Double side polishing device for wafer and double side polishing method
06/09/2005US20050124262 Processing pad assembly with zone control
06/09/2005US20050124165 Method for CMP removal rate compensation
06/09/2005US20050121141 Real time process control for a polishing process
06/08/2005EP1537949A2 Polishing apparatus including attitude controller for wafer carrier and turntable
06/08/2005EP1536920A1 Novel finishing pad design for multidirectional use
06/08/2005EP1536919A1 Method and apparatus for electromechanically and/or electrochemically-mechanically removing conductive material from a microelectronic substrate
06/08/2005EP1536918A1 A method of polishing a wafer of material
06/08/2005EP1278936B1 Tubing hanger with annulus bore
06/08/2005CN1625575A Manufacturing method of potishing pad use polyurethane foam and polyurethane foam
06/08/2005CN1624878A Method for polishing material layer on a semiconductor wafer
06/07/2005US6903021 Method of polishing a semiconductor device
06/07/2005US6903018 Methods and apparatuses for planarizing microelectronic substrate assemblies
06/07/2005US6902659 Deposition and polishing of a conductive material on a semiconductor wafer
06/07/2005US6902590 Chemical mechanical polishing compositions and methods relating thereto
06/07/2005US6902470 Apparatuses for conditioning surfaces of polishing pads
06/07/2005US6902466 Oscillating chemical mechanical planarization apparatus
06/02/2005WO2005049274A2 Retaining ring with shaped surface
06/02/2005WO2005000527A3 Multi-layer polishing pad material for cmp
06/02/2005US20050118938 Wafer processing machine
06/02/2005US20050118937 Polishing apparatus, polishing method, and semiconductor device fabrication method
06/02/2005US20050118936 Integrated pad and belt for chemical mechanical polishing
06/02/2005US20050118935 Substrate holding apparatus
06/02/2005US20050118933 Wafer polishing method
06/02/2005US20050118932 Adjustable gap chemical mechanical polishing method and apparatus
06/02/2005US20050118930 Carrier assemblies, planarizing apparatuses including carrier assemblies, and methods for planarizing micro-device workpieces
06/02/2005US20050118839 Chemical mechanical polish process control method using thermal imaging of polishing pad
06/02/2005US20050118821 Slurry for CMP, polishing method and method of manufacturing semiconductor device
06/02/2005US20050118820 CMP abrasive, liquid additive for CMP abrasive and method for polishing substrate
06/02/2005US20050117164 Method and apparatus for measuring thickness of thin film and device manufacturing method using same
06/02/2005US20050116369 Aerosol method and apparatus, particulate products, and electronic devices made therefrom
06/01/2005EP1535979A2 Compositions and methods for chemical mechanical polishing silica and silicon nitride
06/01/2005EP1535978A1 Polishing cloth and method of manufacturing semiconductor device
06/01/2005EP1535699A1 Polishing pad with high optical transmission window
06/01/2005EP1534795A2 Method for chemical mechanical polishing (cmp) of low-k dielectric materials
06/01/2005CN1622985A 钨抛光溶液 Tungsten polishing solution
06/01/2005CN1622290A Polishing cloth and method of manufacturing semiconductor device
06/01/2005CN1622289A Polishing pad with high optical transmission window
06/01/2005CN1204600C Method for cutting material on two-sided of semiconductor piece
05/2005
05/31/2005US6899804 Electrolyte composition and treatment for electrolytic chemical mechanical polishing
05/31/2005US6899762 Epitaxially coated semiconductor wafer and process for producing it
05/31/2005US6899612 Polishing pad apparatus and methods
05/31/2005US6899611 Polishing pad for a semiconductor device having a dissolvable substance
05/31/2005US6899610 Retaining ring with wear pad for use in chemical mechanical planarization
05/31/2005US6899607 Polishing systems for use with semiconductor substrates including differential pressure application apparatus
05/31/2005US6899603 Polishing apparatus
05/31/2005US6899602 Porous polyurethane polishing pads
05/31/2005US6899601 Method and apparatus for conditioning a polishing pad
05/31/2005US6899598 For chemical-mechanical polishing; combining a polymer resin with a supercritical gas to produce a single phase solution and forming a pad from the solution; gas is generated by subjecting a gas to an elevated temperature and pressure.
05/31/2005US6899597 Chemical mechanical polishing (CMP) process using fixed abrasive pads
05/31/2005US6899596 Chemical mechanical polishing of dual orientation polycrystalline materials
05/31/2005US6899595 Seal assembly manufacturing methods and seal assemblies manufactured thereby
05/31/2005US6899594 Relative lateral motion in linear CMP
05/31/2005US6899592 Polishing apparatus and dressing method for polishing tool
05/31/2005US6899116 Pressure vessel systems and methods for dispensing liquid chemical compositions
05/26/2005WO2005046935A1 Materials and methods for low pressure chemical-mechanical planarization
05/26/2005WO2005012592A3 Cvd diamond-coated composite substrate for making same
05/26/2005WO2005009679A3 Retainiing ring with trigger for chemical mechanical polishing apparatus
05/26/2005US20050113011 Chemical mechanical polishing pad
05/26/2005US20050113010 Chemical mechanical polishing apparatus
05/26/2005US20050113008 Polishing pad with high optical transmission window
05/26/2005US20050113007 Polishing apparatus and method of polishing work piece
05/26/2005US20050113006 Chemical mechanical polishing apparatus and method to minimize slurry accumulation and scratch excursions
05/26/2005US20050113002 CMP polishing heads retaining ring groove design for microscratch reduction
05/26/2005US20050113001 Semiconductor device fabrication method and apparatus
05/26/2005US20050113000 High selectivity colloidal silica slurry
05/26/2005US20050112998 Polishing apparatus
05/26/2005US20050112997 Advanced process control approach for Cu interconnect wiring sheet resistance control
05/26/2005US20050112893 Method for producing a silicon wafer
05/26/2005US20050112892 Chemical mechanical abrasive slurry and method of using the same
05/26/2005US20050112354 Polishing sheet and manufacturing method of elastic plastic foam sheet
05/26/2005US20050108947 An acidic aqueous solution of a quaternary C1 to C6 (cyclo)alkylammonium hydroxide, phthalic acid and monopotassium phthalate, polyacrylic acid, and an abraisive; improved selectivity in shallow trench isolation processes
05/25/2005EP1533352A1 Compositions and methods for polishing copper
05/25/2005EP1533077A1 Polishing apparatus and method of polishing work piece
05/25/2005EP1533076A1 Polishing pad having a groove arrangement for reducing slurry consumption
05/25/2005EP1533075A1 Polishing pad having slurry utilization enhancing grooves
05/25/2005EP1532222A1 Method and apparatus for chemically, mechanically, and/or electrolytically removing material from microelectronic substrates
05/25/2005EP1227912B1 Methods and apparatuses for planarizing microelectronic substrate assemblies
05/25/2005CN2701587Y Abrasive disc structure
05/25/2005CN2701586Y High precise ceramic ball grinding device
05/25/2005CN1620639A System and method for point of use delivery, control and mixing chemical and slurry for CMP/cleaning system
05/25/2005CN1620488A Cmp systems and methods utilizing amine-containing polymers
05/25/2005CN1620357A Method and system for controlling the chemical mechanical polishing of substrates by calculating an overpolishing time and/or a polishing time of a final polishing step