Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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10/21/1998 | CN1196288A Polishing apparatus |
10/21/1998 | CN1040385C Mass simultaneous sealing and electrical connection of electronic devices |
10/21/1998 | CN1040381C Double-channel thin-film transistor and making method thereof |
10/21/1998 | CN1040380C Integrated circuit with energy storage passive circuit component |
10/21/1998 | CN1040377C Semiconductor integral circuit unit |
10/20/1998 | US5826129 Substrate processing system |
10/20/1998 | US5826004 Input/output device with self-test capability in an integrated circuit |
10/20/1998 | US5825914 Component detection method |
10/20/1998 | US5825844 Optical arrangement and illumination method |
10/20/1998 | US5825783 Semiconductor integrated circuit device with large-scale memory and controller embedded on one semiconductor chip and method of testing the device |
10/20/1998 | US5825714 Semiconductor memory device having noise killer circuit |
10/20/1998 | US5825712 Semiconductor integrated circuit |
10/20/1998 | US5825707 Semiconductor device and SRAM having plural power supply voltages |
10/20/1998 | US5825696 Semiconductor memory device including an SOI substrate |
10/20/1998 | US5825689 Nonvolatile semiconductor memory device having data detecting circuit for memory cells block |
10/20/1998 | US5825688 Non-volatile semiconductor storage apparatus |
10/20/1998 | US5825684 Sram cell structure |
10/20/1998 | US5825673 Device, method, and software products for extracting circuit-simulation parameters |
10/20/1998 | US5825668 Monitoring method and apparatus of surface area of semiconductor wafer |
10/20/1998 | US5825653 Method for overall regulation of a former of a paper machine or equivalent |
10/20/1998 | US5825647 Correction method and correction apparatus of mask pattern |
10/20/1998 | US5825632 Oxides of silicon, boron and alkali metal |
10/20/1998 | US5825629 Print circuit board product with stencil controlled fine pitch solder formation for fine and coarse pitch component attachment |
10/20/1998 | US5825623 Packaging assemblies for encapsulated integrated circuit devices |
10/20/1998 | US5825609 Compound electrode stack capacitor |
10/20/1998 | US5825607 Apparatus for supporting a workpiece |
10/20/1998 | US5825500 Unit for transferring to-be-inspected object to inspection position |
10/20/1998 | US5825499 Method for checking wafers having a lacquer layer for faults |
10/20/1998 | US5825483 Multiple field of view calibration plate having a reqular array of features for use in semiconductor manufacturing |
10/20/1998 | US5825468 For a semiconductor device |
10/20/1998 | US5825449 Liquid crystal display device and method of manufacturing the same |
10/20/1998 | US5825437 Controlling the number of hillock defects |
10/20/1998 | US5825249 Multistage source follower amplifier having a wide bandwidth and low power consumption |
10/20/1998 | US5825205 Level-shift circuit for driving word lines of negative gate erasable type flash memory |
10/20/1998 | US5825203 Variable logic integrated circuit device having connections through switch matrix and top layers for inter-cell connections |
10/20/1998 | US5825194 Method of testing an integrated circuit |
10/20/1998 | US5825193 Semiconductor integrated circuit device |
10/20/1998 | US5825191 IC fault location tracing apparatus and method |
10/20/1998 | US5825171 Universal burn-in board |
10/20/1998 | US5825105 Magnetic levitation and systems for the support and conveyance of useful payloads |
10/20/1998 | US5825093 Attachment system and method therefor |
10/20/1998 | US5825092 Integrated circuit with an air bridge having a lid |
10/20/1998 | US5825090 High power semiconductor device and method of making same |
10/20/1998 | US5825087 Integral mesh flat plate cooling module |
10/20/1998 | US5825083 Semiconductor device |
10/20/1998 | US5825081 Tape carrier and assembly structure thereof |
10/20/1998 | US5825079 Semiconductor diodes having low forward conduction voltage drop and low reverse current leakage |
10/20/1998 | US5825078 Hermetic protection for integrated circuits |
10/20/1998 | US5825077 Interconnect decoupling scheme |
10/20/1998 | US5825076 Integrated circuit non-etch technique for forming vias in a semiconductor wafer and a semiconductor wafer having vias formed therein using non-etch technique |
10/20/1998 | US5825074 Method of making a resistor, method of making a diode, and SRAM circuitry and other integrated circuitry |
10/20/1998 | US5825073 Electronic component for an integrated circuit |
10/20/1998 | US5825070 Structure for transistor devices in an SRAM cell |
10/20/1998 | US5825069 High-density semiconductor read-only memory device |
10/20/1998 | US5825068 Integrated circuits that include a barrier layer reducing hydrogen diffusion into a polysilicon resistor |
10/20/1998 | US5825067 Dielectrically isolated IC merged with surge protection circuit and method for manufacturing the same |
10/20/1998 | US5825066 Control of juction depth and channel length using generated interstitial gradients to oppose dopant diffusion |
10/20/1998 | US5825065 Low voltage DMOS transistor |
10/20/1998 | US5825064 Semiconductor volatile/nonvolatile memory |
10/20/1998 | US5825062 Semiconductor device including a nonvolatile memory |
10/20/1998 | US5825060 Polycrystalline silicon resistors for intergrated circuits |
10/20/1998 | US5825059 Semiconductor device and an interconnection structure of same |
10/20/1998 | US5825058 Semiconductor IC with FET and capacitor having side wall spacers |
10/20/1998 | US5825057 Process for fabricating layered superlattice materials and making electronic devices including same |
10/20/1998 | US5825055 Fabricating high-dielectric constant oxides on semiconductors using a GE buffer layer |
10/20/1998 | US5825053 Heterostructure III-V nitride semiconductor device including InP substrate |
10/20/1998 | US5825050 Thin film transistor having tapered active layer formed by controlling defect density and process of fabrication thereof |
10/20/1998 | US5825049 Resonant tunneling device with two-dimensional quantum well emitter and base layers |
10/20/1998 | US5825048 Semiconductor functional device and electronic circuit provided with the same |
10/20/1998 | US5825043 Focusing and tilting adjustment system for lithography aligner, manufacturing apparatus or inspection apparatus |
10/20/1998 | US5825034 Method of compensation for electron beam dose |
10/20/1998 | US5824607 Plasma confinement for an inductively coupled plasma reactor |
10/20/1998 | US5824604 Hydrocarbon-enhanced dry stripping of photoresist |
10/20/1998 | US5824603 Method of forming a low-K layer in an integrated circuit |
10/20/1998 | US5824602 Helicon wave excitation to produce energetic electrons for manufacturing semiconductors |
10/20/1998 | US5824601 Hydrogen fluoride, sacrificial oxide |
10/20/1998 | US5824600 Method for forming a silicide layer in a semiconductor device |
10/20/1998 | US5824599 Protected encapsulation of catalytic layer for electroless copper interconnect |
10/20/1998 | US5824598 Correcting defects |
10/20/1998 | US5824597 Method of forming contact hole plug |
10/20/1998 | US5824596 POCl3 process flow for doping polysilicon without forming oxide pillars or gate oxide shorts |
10/20/1998 | US5824595 Method of separating electronic elements |
10/20/1998 | US5824594 Integrated circuit device isolating methods including silicon spacers and oxidation barrier films |
10/20/1998 | US5824593 Method for making a capacitor on a semiconductor device |
10/20/1998 | US5824592 Method for forming a stacked capacitor of a DRAM cell |
10/20/1998 | US5824591 Method for manufacturing a stacked capacitor |
10/20/1998 | US5824590 Method for oxidation and crystallization of ferroelectric material |
10/20/1998 | US5824589 Method for forming bipolar transistor having a reduced base transit time |
10/20/1998 | US5824588 Double spacer salicide MOS process and device |
10/20/1998 | US5824587 No photolithography |
10/20/1998 | US5824586 Method of manufacturing a raised source/drain MOSFET |
10/20/1998 | US5824585 Semiconductor read-only memory device and method of fabricating the same |
10/20/1998 | US5824584 Method of making and accessing split gate memory device |
10/20/1998 | US5824583 Non-volatile semiconductor memory and method of manufacturing the same |
10/20/1998 | US5824582 Stack DRAM cell manufacturing process with high capacitance capacitor |
10/20/1998 | US5824581 Method for forming a DRAM capacitor with rounded horizontal fins |
10/20/1998 | US5824580 Method of manufacturing an insulated gate field effect transistor |
10/20/1998 | US5824579 Method of forming shared contact structure |
10/20/1998 | US5824578 Fewer masking steps |
10/20/1998 | US5824577 MOSFET with reduced leakage current |