Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
09/2000
09/13/2000EP1034942A1 Semiconductor device and method of manufacturing the same
09/13/2000EP1034888A2 Wafer holding head and wafer polishing apparatus, and method for manufacturing wafers
09/13/2000EP1034887A2 Polishing apparatus
09/13/2000EP1034886A2 Polishing apparatus including attitude controller for dressing apparatus
09/13/2000EP1034883A1 Wafer, apparatus and method of chamfering wafer
09/13/2000EP1034850A2 Ultrasonic cleaner and wet treatment nozzle comprising the same
09/13/2000EP1034569A2 IN x?Ga 1-x?P STOP-ETCH LAYER FOR SELECTIVE RECESS OF GALLIUM ARSENIDE-BASED EPTITAXIAL FIELD EFFECT TRANSISTORS AND PROCESS THEREFOR
09/13/2000EP1034568A1 Field effect transistor
09/13/2000EP1034567A1 Single electron devices
09/13/2000EP1034566A1 Damage-free sculptured coating deposition
09/13/2000EP1034565A1 Ion implantation process to improve the gate oxide quality at the edge of a shallow trench isolation structure
09/13/2000EP1034564A1 Process for fabricating semiconductor device including antireflective etch stop layer
09/13/2000EP1034563A1 High selectivity etching process for oxides
09/13/2000EP1034562A1 Method and apparatus for enhanced cleaning of a workpiece with mechanical energy
09/13/2000EP1034561A1 Rapid thermal processing (rtp) system with gas driven rotating substrate
09/13/2000EP1034510A1 Method for producing a supporting element for an integrated circuit module for placement in chip cards
09/13/2000EP1034487A1 Method and system for improving a transistor model
09/13/2000EP1034457A1 Method of fine feature edge tuning with optically-halftoned mask
09/13/2000EP1034456A1 Uv optical system with reduced ageing
09/13/2000EP1034325A1 Method for producing a gallium nitride epitaxial layer
09/13/2000EP1034123A1 Semiconductor processing apparatus having wafer re-orientation mechanism
09/13/2000EP1034082A1 A method for minimizing the critical dimension growth of a feature on a semiconductor wafer
09/13/2000EP1034061A1 Method and device for assembling two structures with a weld bead
09/13/2000EP0972287A4 High-efficiency miniature magnetic integrated circuit structures
09/13/2000EP0929592A4 Thermosetting resin compositions useful as underfill sealants
09/13/2000EP0847311A4 Wafer scrubbing device
09/13/2000EP0829036B1 Lithographic scanning exposure projection apparatus
09/13/2000EP0820359B1 Method and apparatus for circuit board treatment
09/13/2000EP0799439B1 Positioning device with a force actuator system for compensating centre-of-gravity displacements
09/13/2000CN1266287A Thin film transistor using organic and inorganic hybridized material as semiconductive channel
09/13/2000CN1266285A Refractory fuse circuit for packaged DRAM repair
09/13/2000CN1266284A Influence of aluminium interlinking reliability and function influenced by the cleanliness of upper and lower titanium layer
09/13/2000CN1266283A Semiconductor device, instllation structure for smeiconductor device, liquid crystal device and electronic device
09/13/2000CN1266282A Method for making semiconductor device
09/13/2000CN1266281A Improved system and method for automatic photomask fault detection
09/13/2000CN1266280A Method containing high-temp heat treatment for making semiconductor device
09/13/2000CN1266279A Method for forming barrier layer used for copper interconnection
09/13/2000CN1266278A Method for producing semiconductor device
09/13/2000CN1266277A Method for forming bimetallic grid structure of CMOS device
09/13/2000CN1266276A Semiconductor device
09/13/2000CN1266275A Method for connecting parts in semiconductor device
09/13/2000CN1266247A Method for making sheet shaped piece
09/13/2000CN1056491C Transport-ty-suction type mold
09/13/2000CN1056473C Interconnection device for semiconductor component and making method
09/13/2000CN1056472C Method for production of capacitor of semiconductor device
09/13/2000CN1056471C Method for making complementary MOS field-effect transistor
09/13/2000CN1056470C Method for making complementary MOS field-effect transistor
09/13/2000CN1056469C Method for forming internal leading wire of high compact integrated circuit
09/13/2000CN1056468C Method for forming insulation film between every metal wiring for semiconductor device
09/13/2000CN1056467C Process for preparing standard chip
09/13/2000CN1056448C Resistance-measurement based arrangement for monitoring integrity of travel path ground link in electronic components handling apparatus
09/12/2000US6119256 Apparatus for testing a fixed logic value interconnection between integrated circuits
09/12/2000US6119253 Method and device for setting a plurality of test modes using external pins
09/12/2000US6119134 Interactive graphic editing system for designing integrated circuits
09/12/2000US6118937 Method of laying out a semiconductor integrated circuit
09/12/2000US6118723 Semiconductor memory device
09/12/2000US6118696 Multi-bit memory cell array of a non-volatile semiconductor memory device and method for driving the same
09/12/2000US6118687 Nonvolatile ferroelectric memory without a separate cell plate line and method of manufacturing the same
09/12/2000US6118686 Memory device
09/12/2000US6118683 Dynamic random access memory cell layout
09/12/2000US6118671 Circuit substrate and manufacture thereof, ceramic composition for circuit substrate, and electronics computer
09/12/2000US6118669 Routing topology for identical connector point layouts on primary and secondary sides of a substrate
09/12/2000US6118624 Magneto-resistance effect element having a magnetic biasing film
09/12/2000US6118577 Diffractive element in extreme-UV lithography condenser
09/12/2000US6118559 Broadband diffractive diffuser and associated methods
09/12/2000US6118533 Method and apparatus for measuring the concentration of ions implanted in semiconductor materials
09/12/2000US6118517 Mask pattern for alignment
09/12/2000US6118506 Electro-optical device and method of fabricating same
09/12/2000US6118502 Using a temporary substrate to attach components to a display substrate when fabricating a passive type display device
09/12/2000US6118328 Semiconductor integrated circuit having virtual power supply line and power control transistor
09/12/2000US6118305 Semiconductor integrated circuit capable of preventing breakdown of a gate oxide film
09/12/2000US6118302 Interface for low-voltage semiconductor devices
09/12/2000US6118280 Method for detecting defects in dielectric film
09/12/2000US6118184 Semiconductor device sealed with a sealing resin and including structure to balance sealing resin flow
09/12/2000US6118181 System and method for bonding wafers
09/12/2000US6118178 Circuit film utilizing a power supply and ground connections
09/12/2000US6118175 Wire bonding support structure and method for coupling a semiconductor chip to a leadframe
09/12/2000US6118172 High-frequency circuit device and manufacturing method thereof
09/12/2000US6118171 Semiconductor device having a pedestal structure and method of making
09/12/2000US6118170 Resistance element having flexing portion and its manufacturing method
09/12/2000US6118169 Method for increasing power supply bypassing while decreasing chip layer density variations
09/12/2000US6118168 Trench isolation process using nitrogen preconditioning to reduce crystal defects
09/12/2000US6118167 Polysilicon coated nitride-lined shallow trench
09/12/2000US6118163 Transistor with integrated poly/metal gate electrode
09/12/2000US6118161 Self-aligned trenched-channel lateral-current-flow transistor
09/12/2000US6118160 Structure of a mask ROM device on a semiconductor substrate having a cell area for coding
09/12/2000US6118159 Electrically programmable memory cell configuration
09/12/2000US6118158 Static random access memory device having a memory cell array region in which a unit cell is arranged in a matrix
09/12/2000US6118154 Input/output protection circuit having an SOI structure
09/12/2000US6118152 Semiconductor device and method of manufacturing the same
09/12/2000US6118151 Thin film semiconductor device, method for fabricating the same and semiconductor device
09/12/2000US6118150 Insulated gate semiconductor device and method of manufacturing the same
09/12/2000US6118147 Double density non-volatile memory cells
09/12/2000US6118146 Microelectronic capacitors having tantalum pentoxide dielectrics
09/12/2000US6118145 Semiconductor device and manufacturing method thereof
09/12/2000US6118144 Semiconductor device and method for manufacturing the same
09/12/2000US6118142 CMOS sensor
09/12/2000US6118140 Semiconductor apparatus having conductive thin films
09/12/2000US6118139 Thin film transistor with reduced hydrogen passivation process time
09/12/2000US6118138 Reduced terminal testing system