Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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04/19/2001 | DE19944740A1 Shrinkage-free filling of trenches in integrated circuits comprises producing a growth-promoting layer on surfaces parallel to the substrate and then removing on the surfaces that are parallel to bumps |
04/19/2001 | DE19944303A1 Production of integrated semiconductor circuit comprises deforming and/or making smaller mask islands before applying sink dopants to produce low ohmic contacts |
04/19/2001 | DE19943385A1 Production of electrical connection between front and rear sides of semiconductor chips comprises applying metal seed forming layer, radiating the metal seed forming layer and forming conducting path |
04/19/2001 | DE19941148A1 Speicher mit Grabenkondensator und Auswahltransistor und Verfahren zu seiner Herstellung Storage capacitor with grave and selection transistor and method for its preparation |
04/19/2001 | DE19929615C1 Vorrichtung und Verwendung der Vorrichtung zur Überwachung von absichtlichen oder unvermeidbaren Schichtabscheidungen A device and use of the device for monitoring of deliberate or unavoidable layer depositions |
04/19/2001 | DE10050636A1 Process for surface treating silicon wafers comprises preparing a treatment device, producing a foam by blowing a gas into a liquid containing a surfactant |
04/19/2001 | DE10050577A1 Production of semiconductor component used in solar cells comprises forming first semiconductor layer on substrate, producing second semiconductor layer on first layer and removing second layer by laser abrasion |
04/19/2001 | DE10050413A1 Electrostatic clamp for supporting dielectric wafer, has wafer contact electrode which contacts wafer to create electrical current path leading to wafer |
04/19/2001 | DE10049148A1 Metamorphic heterojunction bipolar transistor for high power transistor amplifier has heavily doped n type InGaAs layer which represents ohmic contact for emitter |
04/19/2001 | DE10047136A1 Electrical property testing method of ICs, obtains laser and reference interference signals by enabling overlapping of primary and secondary laser signals and reference signals within given time respectively |
04/19/2001 | DE10012124A1 Semiconductor device with static random access memory has high concentration doping material region formed in contact with lower surface of contact plugs in source-drain areas of transistors |
04/19/2001 | DE10008683A1 Semiconductor device comprises a semiconductor substrate, low concentration doping regions, a gate electrode with a protective layer, an intermediate insulating layer, a high concentration doping region and a conducting layer |
04/19/2001 | DE10006638A1 Semiconductor component formed for combination with substrate or support, with array substrate containing first surface with preset conductive tracks |
04/19/2001 | CA2404832A1 Molecular scale electronic devices |
04/19/2001 | CA2386329A1 Single step pendeo- and lateral epitaxial overgrowth of group iii-nitride layers |
04/18/2001 | EP1093328A2 Laser imaging of thin layer electronic circuitry material |
04/18/2001 | EP1093322A1 Organic electroluminescence device and its manufacturing method |
04/18/2001 | EP1093228A1 Delay interpolator circuit and semiconductor integrated circuit having same |
04/18/2001 | EP1093169A1 Method of manufacturing semiconductor device, semicondutor device, narrow pitch connector, electrostatic actuator, piezoelectric actuator, ink jet head, ink jet printer, micromachine, liquid crystal panel, and electronic device |
04/18/2001 | EP1093168A2 Field-effect transistor |
04/18/2001 | EP1093167A2 Electro-optical device and manufacturing method thereof |
04/18/2001 | EP1093165A1 Integrated circuit assembly |
04/18/2001 | EP1093164A1 Lateral high-Q inductor for semiconductor devices |
04/18/2001 | EP1093163A2 Electronic interconnect structure |
04/18/2001 | EP1093161A1 Method and composite arrangement inhibiting corrosion of a metal layer following chemical mechanical polishing |
04/18/2001 | EP1093160A2 Connecting material for anisotropically electroconductive connection |
04/18/2001 | EP1093159A1 Method for encapsulating electronic components |
04/18/2001 | EP1093158A1 Self-planarizing process for shallow trench isolation |
04/18/2001 | EP1093157A2 Substrate processing method and apparatus |
04/18/2001 | EP1093155A2 Device and method for loading substrates of different sizes on a substrate holder |
04/18/2001 | EP1093154A2 Magnetron with cooling system for substrate processing system |
04/18/2001 | EP1093153A2 Device and method for introducing different transparent substrates in a high-precision measuring apparatus |
04/18/2001 | EP1093023A1 Photoresist developer compositions containing alkylated aminoalkylpiperazine surfactants |
04/18/2001 | EP1093017A2 Method and apparatus for reticle inspection using aerial imaging |
04/18/2001 | EP1092974A2 Detector for large wafers areas |
04/18/2001 | EP1092946A1 High precision mask holder for measuring thickness |
04/18/2001 | EP1092755A1 Coating composition |
04/18/2001 | EP1092505A2 Method of controlling a polishing machine |
04/18/2001 | EP1092504A1 Apparatus and method for polishing workpiece |
04/18/2001 | EP1092474A2 Chemical delivery system with ultrasonic fluid sensors |
04/18/2001 | EP1092338A1 Assembly of an electronic component with spring packaging |
04/18/2001 | EP1092240A1 Fast luminescent silicon |
04/18/2001 | EP1092239A1 Field effect transistors, integrated circuitry, methods of forming field effect transistor gates, and methods of forming integrated circuitry |
04/18/2001 | EP1092238A1 Universal semiconductor wafer for high-voltage semiconductor components |
04/18/2001 | EP1092237A1 Method of severing electrically conductive links with ultraviolet laser output |
04/18/2001 | EP1092236A1 Ulsi mos with high dielectric constant gate insulator |
04/18/2001 | EP1092235A1 Integrated capacitor and method of fabricating the same |
04/18/2001 | EP1092234A1 Porous insulating compounds and method for making same |
04/18/2001 | EP1092233A1 Method of forming a thin film |
04/18/2001 | EP1092229A1 Multiple coil antenna for inductively-coupled plasma generation systems |
04/18/2001 | EP1092228A2 Electrode for plasma processes and method for manufacture and use thereof |
04/18/2001 | EP1092201A1 Method for storing multiple levels of design data in a common database |
04/18/2001 | EP1092175A1 Lighting system for microlithography, comprising a depolarizer |
04/18/2001 | EP1092173A1 Silver based photomasks |
04/18/2001 | EP1092145A1 A system and method for analyzing topological features on a surface |
04/18/2001 | EP1091965A1 Precursors for growth of heterometal-oxide films by mocvd |
04/18/2001 | EP1091831A1 Improved polishing pad with reduced moisture absorption |
04/18/2001 | EP1091829A2 Chemical mechanical polishing head having floating wafer retaining ring and wafer carrier with multi-zone polishing pressure control |
04/18/2001 | EP1091811A1 Selective treatment of the surface of a microelectronic workpiece |
04/18/2001 | EP1084001A4 Accurate positioning of a wafer |
04/18/2001 | EP0946980A4 Improved integrated circuit structures and methods to facilitate accurate measurement of the ic devices |
04/18/2001 | EP0929841A4 Method for forming photoresist features having reentrant profiles using a basic agent |
04/18/2001 | EP0909341B1 Process for the production of metallic coatings on semiconductor structures |
04/18/2001 | CN1292149A Methods of fabricating gallium nitride semiconductor layers by lateral overgrowth through masks, and gallium nitride semiconductor structures fabricated thereby |
04/18/2001 | CN1292148A Slip free vertical rack design having rounded horizontal arms |
04/18/2001 | CN1292110A Protection circuit for integrated circuit |
04/18/2001 | CN1292103A Improved pattern generator |
04/18/2001 | CN1292102A Pattern generator with EUV |
04/18/2001 | CN1292040A Method of coating and annealing large area glass substrates |
04/18/2001 | CN1291921A Methods of wet processing electronic components using process liquids with controlled levels of gases |
04/18/2001 | CN1291793A Method of making semi conductor device |
04/18/2001 | CN1291791A Metal wire fused wire structure possessing cavity body |
04/18/2001 | CN1291790A Crack baffle plate between adjecent fuse wires to prevent burning break of fuse wire |
04/18/2001 | CN1291789A Manufacturing method of lead-wire frame and resin sealing type semiconductor device |
04/18/2001 | CN1291787A Cleaning agent for semiconductor device and manufacturing method of semiconductor device |
04/18/2001 | CN1291786A Electro optical device and its making method |
04/18/2001 | CN1291785A Manufacturing method of semiconductor device |
04/18/2001 | CN1064780C Bottom lead semiconductor chip stack package |
04/18/2001 | CN1064779C Isolation method for use in semiconductor device |
04/17/2001 | US6219627 Architecture of a chip having multiple processors and multiple memories |
04/17/2001 | US6219400 X-ray optical system and X-ray exposure apparatus |
04/17/2001 | US6219367 Method for determining life of laser light source |
04/17/2001 | US6219275 Magnetic thin film element, memory element using the same, and method for recording and reproducing using the memory element |
04/17/2001 | US6219271 Semiconductor memory device |
04/17/2001 | US6219253 Molded electronic package, method of preparation using build up technology and method of shielding |
04/17/2001 | US6219219 Cathode assembly containing an electrostatic chuck for retaining a wafer in a semiconductor wafer processing system |
04/17/2001 | US6219130 Position detecting apparatus |
04/17/2001 | US6219118 LCD with shield film formed at overlapping portion of bus lines and pixel electrode |
04/17/2001 | US6218889 Semiconductor integrated circuit device, and method of manufacturing the same |
04/17/2001 | US6218888 Insulated gate bipolar transistor device with a current limiting circuit |
04/17/2001 | US6218886 Device for compensating process and operating parameter variations in CMOS integrated circuits |
04/17/2001 | US6218883 Semiconductor integrated circuit for electric microphone |
04/17/2001 | US6218881 Semiconductor integrated circuit device |
04/17/2001 | US6218877 Semiconductor device with delay locked loop |
04/17/2001 | US6218867 Pass transistor circuit |
04/17/2001 | US6218865 Semiconductor device having function blocks with obliquely arranged signal terminals connected through two-dimensionally extensible signal lines |
04/17/2001 | US6218861 Functional block and semiconductor integrated circuit architected by a plurality of functional blocks in combination |
04/17/2001 | US6218847 Test pattern for use in measuring thickness of insulating layer and method for using the same |
04/17/2001 | US6218736 Circuit board and semiconductor device, and method of manufacturing the same |
04/17/2001 | US6218735 Process to improve adhesion of cap layers in intergrated circuits |